CN109243349A - Measure signal circuit and its method for measurement - Google Patents
Measure signal circuit and its method for measurement Download PDFInfo
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- CN109243349A CN109243349A CN201811331502.7A CN201811331502A CN109243349A CN 109243349 A CN109243349 A CN 109243349A CN 201811331502 A CN201811331502 A CN 201811331502A CN 109243349 A CN109243349 A CN 109243349A
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- electric property
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- property coupling
- end electric
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Abstract
The application provides a kind of measurement signal circuit and its method for measurement, the measurement signal circuit, it include: a first switch, one first node of a control terminal electric property coupling of the first switch, one first test unit of a first end electric property coupling of the first switch, one second node of a second end electric property coupling of the first switch；And a second switch, first node described in a control terminal electric property coupling of the second switch, one second test cell of a first end electric property coupling of the second switch, second node described in a second end electric property coupling of the second switch；Wherein one data line of first test unit other end electric property coupling；The second test cell other end electric property coupling scan line.
Description
Technical field
This application involves display fields, more particularly to a kind of measurement signal circuit and its method for measurement.
Background technique
Liquid crystal display (Liquid Crystal Display, LCD) is to show image using the characteristic of liquid crystal material
A kind of panel display apparatus, compared to having many advantages, such as frivolous, low driving voltage and low-power consumption for other display devices.
And usually there is gate driving circuit, source electrode drive circuit and pixel array in liquid crystal display.Pixel array
In have multiple pixel circuits, each pixel circuit according to gate driving circuit provide scanning signal open and close, and
According to the data signals that source electrode drive circuit provides, data display is shown.
And Thin Film Transistor-LCD (Thin Film Transistor Liquid Crystal Display,
TFT-LCD) it is one of principal item that current flat panel is shown, has become present information science and technology, important in video product
Display platform.The main driving principle of TFT-LCD, system board by the compressed signal of red/green picture element, control signal
And power supply is connected by wire rod with the connector on printed circuit board, data are by the sequence controller on printed circuit board
After (Timing Controller, TCON) chip processing, through printed circuit board, pass through source level film driving chip
(Source-Chip on Film, S-COF) and grid film driving chip (Gate-Chip on Film, G-COF) and display
Area's connection, transmits voltage by data line (Data line) in array substrate and scan line (Scan line), from
And display panel is made to realize display function.
Because there are certain capacitor and resistance for array substrate upward wiring, by data line (Data line) and sweep
After the transmission for retouching line (Scan line), signal can be distorted.In the exploitation of product and subsequent resolving, it is often necessary to measure
Voltage signal after surveying the data line (Data line) by array substrate and scan line (Scan line) transmission attenuation, and
In actual application, because the end of data line (Data line) and scan line (Scan line) is located at the edge of glass, only
It can could be measured after carrying out glass sliver, the method takes a long time, and product is destroyed after glass sliver, is caused
Waste, while sliver will cause liquid crystal volatilization, it is unfavorable to health after human body sucking.
Therefore, the main purpose of the application is to provide a kind of measurement signal circuit and its method for measurement, on more optimized
State the problem proposed.
Summary of the invention
In order to solve the above-mentioned technical problem, the purpose of the application is, provides a kind of measurement signal circuit, comprising: one
One switch, one first node of a control terminal electric property coupling of the first switch, a first end electrical property coupling of the first switch
Connect a first test unit, one second node of a second end electric property coupling of the first switch；And a second switch, it is described
One first end electric property coupling one second of first node described in one control terminal electric property coupling of second switch, the second switch is surveyed
Try unit, second node described in a second end electric property coupling of the second switch；The wherein first test unit other end
One data line of electric property coupling；The second test cell other end electric property coupling scan line.
The another object of the application is a kind of measurement signal circuit, comprising: a first switch, a control of the first switch
Electric property coupling one first node in end processed, one first test unit of a first end electric property coupling of the first switch, described first
One second node of a second end electric property coupling of switch；One second switch, a control terminal electric property coupling institute of the second switch
State first node, one second test cell of a first end electric property coupling of the second switch, the one second of the second switch
Hold second node described in electric property coupling；One first end of one trigger, the trigger electrically receives a voltage signal, the touching
The second end for sending out device electrically receives a frequency input signal, first segment described in a third end electric property coupling of the trigger
Point；The other end of one resistance unit, first node described in one end electric property coupling of the resistance unit, the resistance unit is electrical
Ground connection；And a diode, second node described in one end electric property coupling of the diode, the other end of the diode are electrical
Couple a gasket；Wherein, when the measurement signal circuit is without measurement circuit signal, the first test unit other end
One data line of electric property coupling, the second test cell other end electric property coupling scan line；When the measurement signal circuit into
When row measurement circuit signal, the first test unit need to melt insulator portion so that other end electric property coupling through laser
One data line and the gasket；Second test cell need to melt insulator portion so that other end electrical property coupling through laser
Connect scan line and the gasket；The first test unit and second test cell are respectively provided with conductor part and insulation
Body portion.
The further object of the application is a kind of method for measurement for measuring signal circuit, comprising: a first switch is provided, it is described
One first node of a control terminal electric property coupling of first switch, a first end electric property coupling one first test of the first switch
Unit, one second node of a second end electric property coupling of the first switch；One second switch is provided, the one of the second switch
First node described in control terminal electric property coupling, one second test cell of a first end electric property coupling of the second switch are described
Second node described in one second end electric property coupling of second switch；A trigger is provided, a first end of the trigger is electrical
A voltage signal is received, a second end of the trigger electrically receives a frequency input signal, a third of the trigger
Hold first node described in electric property coupling；One resistance unit is provided, first node described in one end electric property coupling of the resistance unit,
The other end electrical ground of the resistance unit；One diode, the second section described in one end electric property coupling of the diode are provided
Point, one gasket of other end electric property coupling of the diode；Through the connection of the gasket and a data line, the data is measured
The waveform signal of line；And the connection through the gasket and scan line, measure the waveform signal of the scan line；Wherein institute
It states first test unit and second test cell is respectively provided with conductor part and insulator portion.
It the purpose of the application and solves its technical problem and adopts the following technical solutions to realize.
In the embodiment of the application, a trigger is further included, a first end of the trigger electrically receives an electricity
Signal is pressed, a second end of the trigger electrically receives a frequency input signal, a third end electrical property coupling of the trigger
Connect the first node.
In the embodiment of the application, a resistance unit is further included, described in one end electric property coupling of the resistance unit
First node, the other end electrical ground of the resistance unit.
In the embodiment of the application, a diode is further included, second described in one end electric property coupling of the diode
Node, one gasket of other end electric property coupling of the diode.
In the embodiment of the application, the method for measurement, the first test unit other end electric property coupling one is provided
Stockline.
In the embodiment of the application, the method for measurement, the second test cell other end electric property coupling is swept
Retouch line.
In the embodiment of the application, the method for measurement measures institute through the connection of the gasket and a data line
The step of stating the waveform signal of data line includes: to be melted the insulator portion of the first test unit using laser
Solution, thus make one data line of a first end electric property coupling of the first switch；Transmit a signal make to the trigger it is described
First switch is opened and the second switch is closed；And the waveform signal of the data line is measured by the gasket.
In the embodiment of the application, the method for measurement measures institute through the connection of the gasket and scan line
The step of stating the waveform signal of scan line includes: to be melted the insulator portion of second test cell using laser
Solution, thus make a first end electric property coupling scan line of the second switch；It acts on, thus makes by the ground connection of resistance unit
The first switch and the grid control signal of the second switch are low potential, so that the second switch is opened and described the
One switch is closed；And the waveform signal of the scan line is measured by the gasket.
The application, which provides one kind, does not influence properties of product, while can quickly measure when needed to desired signal
Circuit and method for measurement, and not will increase additional equipment cost, eliminate the damage during glass sliver to human body.
Detailed description of the invention
Fig. 1 is exemplary liquid crystal display schematic diagram.
Fig. 2 is the measurement signal circuit schematic diagram of one embodiment of the application.
Fig. 3 a is the test cell structure top view of one embodiment of the application measured in signal circuit.
Fig. 3 b is the test cell structural side view of one embodiment of the application measured in signal circuit.
Fig. 4 is the method for measurement flow chart of the measurement signal circuit of one embodiment of the application.
Specific embodiment
The explanation of following embodiment is to can be used to the particular implementation of implementation to illustrate the application with reference to additional schema
Example.The direction term that the application is previously mentioned, such as "upper", "lower", "front", "rear", "left", "right", "inner", "outside", " side "
Deng being only the direction with reference to annexed drawings.Therefore, the direction term used be to illustrate and understand the application, rather than to
Limit the application.
Attached drawing and explanation are considered inherently illustrative, rather than restrictive.The similar list of structure in the figure
Member is to be given the same reference numerals.In addition, in order to understand and be convenient for description, the size and thickness of each component shown in the accompanying drawings are
It is arbitrarily shown, but the application is without being limited thereto.
In the accompanying drawings, for clarity, the thickness in layer, film, panel, region etc. is exaggerated.In the accompanying drawings, in order to understand
With convenient for description, the thickness of some layer and region is exaggerated.It will be appreciated that ought such as layer, film, region or substrate component quilt
Referred to as " " another component "upper" when, the component can be directly on another component, or there may also be middle groups
Part.
In addition, in the description, unless explicitly described as opposite, otherwise word " comprising " will be understood as meaning to wrap
The component is included, but is not excluded for any other component.In addition, in the description, " above " means to be located at target group
Part either above or below, and be not intended to must be positioned on the top based on gravity direction.
Some vocabulary has been used in specification and claims to censure specific component.The general skill in this field
Art personnel are, it is to be appreciated that electronic equipment set manufacturer may call same component with different nouns.This specification and right
In claim not in such a way that the difference of title is as difference component, but with the difference of component functionally as area
Other benchmark." comprising " in the whole text in specification and claims mentioned in is open term, therefore should be explained
At " including but not limited to ".In addition, " coupling " word is comprising any direct and indirect electrical connection herein.Cause
This, if it is described herein that first device is electrically connected at second device, then representing the first device may be directly connected to second dress
It sets, or is coupled indirectly to the second device by other devices or connection means.
Further to illustrate that the application is the technical means and efficacy reaching predetermined goal of the invention and being taken, below in conjunction with
Attached drawing and specific embodiment, to a kind of measurement signal circuit and its method for measurement proposed according to the application, specific implementation
Mode, structure, feature and its effect, detailed description is as follows.
Fig. 1 is exemplary liquid crystal display schematic diagram, referring to FIG. 1, a kind of exemplary liquid crystal display 10, including one
Colored filter substrate 100, array basal plate 110, a grid film driving chip 120, a source level film driving chip 130 and
One printed circuit board 150；Plural scan line 122 and plural data line 132 are provided in the array substrate 110；It is described
Grid film driving chip 120 described in 122 electric property coupling of scan line；Source level film described in 132 electric property coupling of data line drives
Dynamic chip 130.
The measurement news that Fig. 2 is the measurement signal circuit schematic diagram of one embodiment of the application, Fig. 3 a is one embodiment of the application
Test cell structure top view and Fig. 3 b in number circuit are the test cell of one embodiment of the application measured in signal circuit
Structural side view, referring to FIG. 2, in the embodiment of the application, a kind of measurement signal circuit 20 a, comprising: first switch
The a control terminal 101a electric property coupling one first node P1 (n) of T10, the first switch T10, the one of the first switch T10
One first test unit 240 of first end 101b electric property coupling, a second end 101c electric property coupling one of the first switch T10
Two node P2 (n)；And one second switch T20, the second switch T20 a control terminal 201a electric property coupling described in first segment
One second test cell 250 of a first end 201b electric property coupling of point P1 (n), the second switch T20, the second switch
Second node P2 (n) described in a second end 201c electric property coupling of T20；Wherein 240 other end of first test unit is electrical
Couple a data line D1；Second test cell, 250 other end electric property coupling scan line S1.
In the embodiment of the application, a trigger 200 is further included, a first end 202 for the trigger 200 is electrically
A voltage signal VDD is received, a second end 204 for the trigger 200 electrically receives a frequency input signal A, the triggering
First node P1 (n) described in 206 electric property coupling of a third end of device 200.
In the embodiment of the application, a resistance unit 210, one end electrical property coupling of the resistance unit 210 are further included
Connect the first node P1 (n), the other end electrical ground of the resistance unit 210.
In the embodiment of the application, a diode 220, one end electric property coupling institute of the diode 220 are further included
State second node P2 (n), one gasket 230 of other end electric property coupling of the diode 220.
Fig. 2, Fig. 3 a and Fig. 3 b are please referred to, in the embodiment of the application, a kind of measurement signal circuit 20, comprising: one
The one first node P1 (n) of a control terminal 101a electric property coupling of first switch T10, the first switch T10, the first switch
One second end 101c of one first test unit 240 of a first end 101b electric property coupling of T10, the first switch T10 is electrical
Couple a second node P2 (n)；Described in a control terminal 201a electric property coupling of one second switch T20, the second switch T20
One second test cell 250 of a first end 201b electric property coupling of one node P1 (n), the second switch T20, described second opens
Close second node P2 (n) described in a second end 201c electric property coupling of T20；One trigger 200, the one of the trigger 200
One end 202 electrically receives a voltage signal VDD, and a second end 204 for the trigger 200 electrically receives a frequency input signal
A, first node P1 (n) described in 206 electric property coupling of a third end of the trigger 200；One resistance unit 210, the resistance
First node P1 (n) described in one end electric property coupling of unit 210, the other end electrical ground of the resistance unit 210；And one
Diode 220, second node P2 (n) described in one end electric property coupling of the diode 220, the other end of the diode 220
One gasket 230 of electric property coupling；Wherein, when the measurement signal circuit 20 is without measurement circuit signal, first test
240 other end electric property coupling of unit one data line D1,250 other end electric property coupling scan line S1 of the second test cell；
When the measurement signal circuit 20 carries out measurement circuit signal, the first test unit 240 need to penetrate laser for insulator
Part 314 melts so that one data line D1 of other end electric property coupling and the gasket 230；Second test cell 250 needs saturating
Laser is crossed to melt insulator portion 314 so that other end electric property coupling scan line S1 and the gasket 230；Described first surveys
Examination unit 240 and second test cell 250 are respectively provided with conductor part 310,312 and insulator portion 314.
In the embodiment of the application, first switch T10 is N-MOS, when its grid control signal is high potential, institute
First switch T10 unlatching is stated, when its grid control signal is low potential, the first switch T10 is closed.
In the embodiment of the application, second switch T20 is P-MOS, when its grid control signal is low potential, institute
Second switch T20 unlatching is stated, when its grid control signal is high potential, the second switch T20 is closed.
Fig. 4 is the method for measurement flow chart of the measurement signal circuit of one embodiment of the application.Please refer to Fig. 2, Fig. 3 a, Fig. 3 b
And Fig. 4, in the embodiment of the application, a kind of method for measurement measuring signal circuit 20 a, comprising: first switch is provided
The a control terminal 101a electric property coupling one first node P1 (n) of T10, the first switch T10, the one of the first switch T10
One first test unit 240 of first end 101b electric property coupling, a second end 101c electric property coupling one of the first switch T10
Two node P2 (n)；First segment described in a control terminal 201a electric property coupling of one second switch T20, the second switch T20 is provided
One second test cell 250 of a first end 201b electric property coupling of point P1 (n), the second switch T20, the second switch
Second node P2 (n) described in a second end 201c electric property coupling of T20；One trigger 200 is provided, the one of the trigger 200
First end 202 electrically receives a voltage signal VDD, and a second end 204 for the trigger 200 electrically receives frequency input news
Number A, first node P1 (n) described in 206 electric property coupling of a third end of the trigger 200；One resistance unit 210, institute are provided
State first node P1 (n) described in one end electric property coupling of resistance unit 210, the other end electrical ground of the resistance unit 210；
One diode 220 is provided, second node P2 (n) described in one end electric property coupling of the diode 220, the diode 220
One gasket 230 of other end electric property coupling；Through the connection of the gasket 230 and a data line D1, measure the data line D1's
Waveform signal；And the connection through the gasket 230 and scan line S1, measure the waveform signal of the scan line S1；Its
Described in first test unit 240 and second test cell 250 be respectively provided with conductor part 310,312 and insulator portion
314。
Fig. 2, Fig. 3 a and Fig. 3 b are please referred to, in the embodiment of the application, the method for measurement, the first test list
One data line D1 of first 240 other end electric property coupling.
Fig. 2, Fig. 3 a and Fig. 3 b are please referred to, in the embodiment of the application, the method for measurement, the second test list
250 other end electric property coupling scan line S1 of member.
Fig. 2, Fig. 3 a and Fig. 3 b are please referred to, in the embodiment of the application, the method for measurement, through the gasket
230 and one data line D1 connection, the step of measuring the waveform signal of the data line D1 includes: will be described using laser
The insulator portion 314 of first test unit 240 is melted, thus makes a first end 101b electricity of the first switch T10
Property coupling one data line D1；Transmit a signal (citing: by the sequence controller chip or outer filling letter on printed circuit board
Number) (illustrate to the trigger 200: the numerical value of this signal being assigned to a third end 206 of the trigger 200, at this time institute
The grid control signal for stating the first switch T10 and second switch T20 is high potential) make the first switch T10 open and
The second switch T20 is closed；And the waveform signal of the data line D1 is measured by the gasket 230.
Fig. 2, Fig. 3 a and Fig. 3 b are please referred to, in the embodiment of the application, the method for measurement, through the gasket
230 with the connection of scan line S1, and the step of measuring the waveform signal of the scan line S1 includes: will be described using laser
The insulator portion 314 of second test cell 250 is melted, thus makes a first end 201b electricity of the second switch T20
Property coupling scan line S1；It is acted on by the ground connection of resistance unit 210, thus opens the first switch T10 and described second
The grid control signal for closing T20 is low potential, so that the second switch T20 is opened and the first switch T10 is closed；And
The waveform signal of the scan line S1 is measured by the gasket 230.
Referring to FIG. 4, providing a first switch, a control terminal electric property coupling of the first switch in process S411
One first node, one first test unit of a first end electric property coupling of the first switch, the one second of the first switch
Hold one second node of electric property coupling.
Referring to FIG. 4, providing a second switch, a control terminal electric property coupling of the second switch in process S412
The first node, one second test cell of a first end electric property coupling of the second switch, the one of the second switch
Second node described in two end electric property couplings.
Referring to FIG. 4, providing a trigger in process S413, a first end of the trigger electrically receives an electricity
Signal is pressed, a second end of the trigger electrically receives a frequency input signal, a third end electrical property coupling of the trigger
Connect the first node.
Referring to FIG. 4, in process S414, a resistance unit is provided, described in one end electric property coupling of the resistance unit
First node, the other end electrical ground of the resistance unit.
Referring to FIG. 4, in process S415, a diode is provided, second described in one end electric property coupling of the diode
Node, one gasket of other end electric property coupling of the diode.
Referring to FIG. 4, through the connection of the gasket and a data line, measuring the data line in process S416
Waveform signal.
Referring to FIG. 4, through the connection of the gasket and scan line, measuring the scan line in process S417
Waveform signal.
Referring to FIG. 4, the first test unit and second test cell are respectively provided with conductor in process S418
Part and insulator portion.
The application, which provides one kind, does not influence properties of product, while can quickly measure when needed to desired signal
Circuit and method for measurement, and not will increase additional equipment cost, eliminate the damage during glass sliver to human body.
" in some embodiments " and " in various embodiments " terms are used repeatedly etc..The term is not usually
Refer to identical embodiment；But it may also mean that identical embodiment.The words such as "comprising", " having " and " comprising " are synonymous
Word, unless its context meaning shows other meanings.
The above is only embodiments herein, not makes any form of restriction to the application, although the application
It is disclosed above with specific embodiment, however it is not limited to the application, any person skilled in the art, not
It is detached within the scope of technical scheme, when the technology contents using the disclosure above make a little change or are modified to equivalent change
The equivalent embodiment of change, but all contents without departing from technical scheme, the technical spirit according to the application is to the above reality
Any simple modification, equivalent change and modification made by example are applied, in the range of still falling within technical scheme.
Claims (10)
1. a kind of measurement signal circuit characterized by comprising
One first switch, one first node of a control terminal electric property coupling of the first switch, the one first of the first switch
Hold one first test unit of electric property coupling, one second node of a second end electric property coupling of the first switch；And
One second switch, first node described in a control terminal electric property coupling of the second switch, the one of the second switch
One second test cell of one end electric property coupling, second node described in a second end electric property coupling of the second switch；Wherein institute
State one data line of first test unit other end electric property coupling；The second test cell other end electric property coupling scan line.
2. measuring signal circuit as described in claim 1, which is characterized in that further include a trigger, the one of the trigger
First end electrically receives a voltage signal, and a second end of the trigger electrically receives a frequency input signal, the triggering
First node described in one third end electric property coupling of device.
3. measuring signal circuit as described in claim 1, which is characterized in that further include a resistance unit, the resistance unit
One end electric property coupling described in first node, the other end electrical ground of the resistance unit.
4. measuring signal circuit as described in claim 1, which is characterized in that further include a diode, the one of the diode
Hold second node described in electric property coupling, one gasket of other end electric property coupling of the diode.
5. a kind of measurement signal circuit characterized by comprising
One first switch, one first node of a control terminal electric property coupling of the first switch, the one first of the first switch
Hold one first test unit of electric property coupling, one second node of a second end electric property coupling of the first switch；
One second switch, first node described in a control terminal electric property coupling of the second switch, the one of the second switch
One second test cell of one end electric property coupling, second node described in a second end electric property coupling of the second switch；
One trigger, a first end of the trigger electrically receive a voltage signal, and a second end of the trigger is electrical
Receive a frequency input signal, first node described in a third end electric property coupling of the trigger；
One resistance unit, first node described in one end electric property coupling of the resistance unit, the other end electricity of the resistance unit
Property ground connection；And
One diode, second node described in one end electric property coupling of the diode, the other end electric property coupling of the diode
One gasket；
Wherein, when the measurement signal circuit is without measurement circuit signal, the first test unit other end electrical property coupling
Connect a data line, the second test cell other end electric property coupling scan line；When the measurement signal circuit is measured
When circuit signal, the first test unit need to melt insulator portion so that one data of other end electric property coupling through laser
Line and the gasket；Second test cell need to melt insulator portion so that other end electric property coupling is swept through laser
Retouch line and the gasket；The first test unit and second test cell are respectively provided with conductor part and insulator portion
Point.
6. a kind of method for measurement for measuring signal circuit characterized by comprising
One first switch is provided, one first node of a control terminal electric property coupling of the first switch, the one of the first switch
One first test unit of first end electric property coupling, one second node of a second end electric property coupling of the first switch；
One second switch is provided, first node described in a control terminal electric property coupling of the second switch, the second switch
One first end electric property coupling, one second test cell, second node described in a second end electric property coupling of the second switch；
A trigger is provided, a first end of the trigger electrically receives a voltage signal, a second end of the trigger
Electrically receive a frequency input signal, first node described in a third end electric property coupling of the trigger；
One resistance unit is provided, first node described in one end electric property coupling of the resistance unit, the resistance unit it is another
Hold electrical ground；
A diode is provided, the other end of second node described in one end electric property coupling of the diode, the diode is electrical
Couple a gasket；
Through the connection of the gasket and a data line, the waveform signal of the data line is measured；And
Through the connection of the gasket and scan line, the waveform signal of the scan line is measured；
Wherein the first test unit and second test cell are respectively provided with conductor part and insulator portion.
7. measuring the method for measurement of signal circuit as claimed in claim 6, which is characterized in that the first test unit is another
Hold one data line of electric property coupling.
8. measuring the method for measurement of signal circuit as claimed in claim 6, which is characterized in that second test cell is another
Hold electric property coupling scan line.
9. measuring the method for measurement of signal circuit as claimed in claim 6, which is characterized in that penetrate the gasket and a data
The connection of line, the step of measuring the waveform signal of the data line include:
The insulator portion of the first test unit is melted using laser, thus makes the one of the first switch
One data line of first end electric property coupling；
Transmitting a signal closes the first switch unlatching and the second switch to the trigger；And
The waveform signal of the data line is measured by the gasket.
10. measuring the method for measurement of signal circuit as claimed in claim 6, which is characterized in that penetrate the gasket and sweep
The connection for retouching line, the step of measuring the waveform signal of the scan line include:
The insulator portion of second test cell is melted using laser, thus makes the one of the second switch
First end electric property coupling scan line；
It is acted on by the ground connection of resistance unit, thus keeps the first switch and the grid control signal of the second switch low
Current potential, so that the second switch is opened and the first switch is closed；And
The waveform signal of the scan line is measured by the gasket.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811331502.7A CN109243349A (en) | 2018-11-09 | 2018-11-09 | Measure signal circuit and its method for measurement |
| PCT/CN2019/073191 WO2020093605A1 (en) | 2018-11-09 | 2019-01-25 | Signal measuring circuit and measuring method therefor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811331502.7A CN109243349A (en) | 2018-11-09 | 2018-11-09 | Measure signal circuit and its method for measurement |
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| Publication Number | Publication Date |
|---|---|
| CN109243349A true CN109243349A (en) | 2019-01-18 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811331502.7A Pending CN109243349A (en) | 2018-11-09 | 2018-11-09 | Measure signal circuit and its method for measurement |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN109243349A (en) |
| WO (1) | WO2020093605A1 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2020093605A1 (en) * | 2018-11-09 | 2020-05-14 | 惠科股份有限公司 | Signal measuring circuit and measuring method therefor |
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| WO2020093605A1 (en) | 2020-05-14 |
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