CN102103067A - Spectrophotometer optical system - Google Patents

Spectrophotometer optical system Download PDF

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Publication number
CN102103067A
CN102103067A CN2009102449029A CN200910244902A CN102103067A CN 102103067 A CN102103067 A CN 102103067A CN 2009102449029 A CN2009102449029 A CN 2009102449029A CN 200910244902 A CN200910244902 A CN 200910244902A CN 102103067 A CN102103067 A CN 102103067A
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CN
China
Prior art keywords
spherical reflector
sample
slit
light
light path
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CN2009102449029A
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Chinese (zh)
Inventor
高燕
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TIANJIN TUOPU INSTRUMENT CO Ltd
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TIANJIN TUOPU INSTRUMENT CO Ltd
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Priority to CN2009102449029A priority Critical patent/CN102103067A/en
Publication of CN102103067A publication Critical patent/CN102103067A/en
Pending legal-status Critical Current

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  • Spectrometry And Color Measurement (AREA)

Abstract

The invention discloses a spectrophotometer optical system which adopts light splitting for twice and has high measurement accuracy, small volume and compact structure. Lights emitted from a light source are diverged onto a first spherical reflector, a double monochromator light splitting structure comprises a first grating, a second spherical reflector, a second grating, a third spherical reflector and a slit plate, wherein the slit plate is provided with an incident slit, a middle slit and an exit slit, the first grating, the second spherical reflector, the second grating and the third spherical reflector are respectively arranged at the two sides of the slit plate, the focal points of the second spherical reflector and the third spherical reflector are arranged at the middle slit, and the middle slit is taken as the exit slit of the second spherical reflector and the incident slit of the third spherical reflector. The light splitting system adopts the double monochromator to realize the light splitting for twice, thus the stray light is reduced, and the measurement accuracy is high; besides, only three slits are used, the spectrophotometer optical system has the advantages of convenience and compactness for structure design and small volume.

Description

The spectrophotometric meter optical system
Technical field
The present invention relates to a kind of spectrophotometric meter optical system.
Background technology
In spectrophotometric optical system, adopt a beam-splitting structure design at present, use single monochromator to carry out beam split, incident light enters the concave surface spherical mirror through entrance slit, reflect into into the beam split of grating spectrophotometric device through the concave surface spherical mirror, the light of telling enters another concave surface spherical mirror, penetrates from exit slit after reflection.Because only through the beam split of a grating beam splitting mechanism, parasitic light is more from the light that exit slit comes out, the precision that influence is measured.
Summary of the invention
The present invention is in order to overcome weak point of the prior art, to provide a kind of employing twice beam split, the measuring accuracy height, and volume is little, the spectrophotometric meter optical system of compact conformation.
The present invention is achieved through the following technical solutions:
A kind of spectrophotometric meter optical system, comprise beam splitting system, the sample cell of sample, sample cell with reference to sample, receiver, be provided with the sample light path between the sample cell of described sample and the described receiver, described with reference to sample sample cell and described receiver between be provided with reference to the sample light path, it is characterized in that, described beam splitting system comprises light source, the double monochromator beam-splitting structure, the light of described light source diffuses on first spherical reflector, described double monochromator beam-splitting structure comprises first grating, second spherical reflector, second grating, the 3rd spherical reflector, slit plate, described slit plate is provided with entrance slit, middle slit and exit slit, described first grating and second spherical reflector, second grating and the 3rd spherical reflector lay respectively at the both sides of slit plate, the focus of second spherical reflector and the 3rd spherical reflector is at the middle slit place simultaneously, and described middle slit is as the exit slit of second spherical reflector and the entrance slit of the 3rd spherical reflector; Be provided with the guiding light path of forming by described first spherical reflector, first level crossing, second level crossing that set gradually before the described double monochromator beam-splitting structure, be provided with the light path of forming by the 3rd level crossing that sets gradually, bracelet face mirror, sector mirror after the described double monochromator beam-splitting structure, be provided with the 4th spherical reflector in the light path between the sample cell of described sector mirror and sample, described sector mirror and with reference to being provided with the 5th spherical reflector in the light path between the sample cell of sample.
Be respectively arranged with quartzy window in the light path before and after the sample cell of described sample, described with reference to being respectively arranged with quartzy window in the light path before and after the sample cell of sample.
Described light source comprises tungsten light source and deuterium lamp light source, and the light of described deuterium lamp light source diffuses on first spherical reflector, and the light of described tungsten light source reflexes on described first spherical reflector by first plane mirror.
The present invention has following technique effect:
1, beam splitting system of the present invention adopts double monochromator to carry out twice beam split, has reduced parasitic light, the measuring accuracy height.
2, beam splitting system of the present invention is only used 3 slits, and wherein middle slit for the exit slit of first monochromator with the entrance slit of two monochromators, is not only considered the space but also consider the easy of structure simultaneously, and structural design is easy, compact, and volume is little.
3, beam splitting system of the present invention is divided into light beam two-beam and enters the sample chamber with the sector mirror structure, adopts the symmetrical expression optical texture before the receiver, at utmost guarantees the two-beam equivalent optical path.
4, adopt bracelet face mirror in the beam splitting system of the present invention, be out of shape little.
Description of drawings
Fig. 1 is the light path synoptic diagram of spectrophotometric meter optical system of the present invention.
Embodiment
Below in conjunction with the drawings and specific embodiments to the detailed description of the invention.
The light path synoptic diagram of spectrophotometric meter optical system of the present invention as shown in Figure 1, the sample cell 15, sample cell 16, the receiver 19 that comprise beam splitting system, sample with reference to sample, be provided with the sample light path between the sample cell 15 of sample and the receiver 19, with reference to being provided with reference to the sample light path between the sample cell 16 of sample and the receiver 19.Described beam splitting system comprises tungsten light source 2, deuterium lamp light source 1, double monochromator beam-splitting structure.The light of described deuterium lamp light source 1 diffuses on first spherical reflector 4, and the light of tungsten light source 2 reflexes on first spherical reflector 4 by first plane mirror 3.Described double monochromator beam-splitting structure comprises first grating 6, second spherical reflector 7, second grating 8, the 3rd spherical reflector 26, slit plate 9, slit plate 9 is provided with entrance slit 27, middle slit 28 and exit slit 29, first grating 6 and second spherical reflector 7, second grating 8 and the 3rd spherical reflector 26 lay respectively at the both sides of slit plate 9, simultaneously, the focus of second spherical reflector and the 3rd spherical reflector is at middle slit 28 places.Middle slit 28 is as the exit slit of second spherical reflector and the entrance slit of the 3rd spherical reflector.
Be provided with the guiding light path of forming by first spherical reflector 4, first level crossing 5, second level crossing 25 that set gradually before the described double monochromator beam-splitting structure.Be provided with the light path of forming by the 3rd level crossing 10 that sets gradually, bracelet face mirror 14, sector mirror 12 after the described double monochromator beam-splitting structure.Be provided with the 4th spherical reflector 11 in the light path between the sample cell 15 of sector mirror 12 and sample.Sector mirror 12 and with reference to being provided with the 5th spherical reflector 13 in the light path between the sample cell 16 of sample.
In order to ensure the sealing of light path, be respectively arranged with quartzy window 30,31 in the light path before and after the sample cell of sample, be respectively arranged with quartzy window 32,33 in the light path before and after the sample cell of reference sample.
At first turn on the power switch, light deuterium lamp light source and tungsten light source.The light of deuterium lamp light source is diffused on first spherical reflector 4, the light of tungsten light source 2 reflexes on first spherical reflector 4 by first plane mirror 3, reflex on first plane mirror 5 by first spherical reflector 4, reflex to again on second plane mirror 25, focus converges in the porch of entrance slit 27, get on second spherical reflector 7 by entrance slit, reflect back into again on second spherical reflector 7 after reflexing on first grating 6 by second spherical reflector 7 again, reflection is got on the 3rd spherical reflector 26 through middle slit 28 again, after reflexing on second grating 8, reflect back into again on the 3rd spherical reflector 26 by the 3rd spherical reflector 26, reflection is got on the 3rd plane mirror 10 through exit slit again, reflection is got on the bracelet face mirror 14 again, reflect respectively by sector mirror 12 or direct projection is got on the 4th spherical reflector 11 and the 5th spherical reflector 13 by bracelet face mirror 14, light by 11 reflections of the 4th spherical reflector is dispersed via spherical reflector 17 after converging in the middle of the sample cell 15 of sample again, plane mirror 18, the sample light path that spherical reflector 20 is formed converges on the receiver, is dispersed via spherical reflector 24 after converging in the middle of the sample cell 16 of reference sample by the light of the 5th spherical reflector 13 reflections again, plane mirror 23, what spherical reflector 22 was formed converges on the receiver with reference to the sample light path.Vulcanized lead receives and receives by plane mirror 21.
Although relate to a kind of spectrophotometric meter optical system and carried out special description disclosed with reference to embodiment, embodiment described above is illustrative and not restrictive, under the situation that does not break away from the spirit and scope of the present invention, all variations and modification are all within the scope of the present invention.

Claims (3)

1. spectrophotometric meter optical system, comprise beam splitting system, the sample cell of sample, sample cell with reference to sample, receiver, be provided with the sample light path between the sample cell of described sample and the described receiver, described with reference to sample sample cell and described receiver between be provided with reference to the sample light path, it is characterized in that, described beam splitting system comprises light source, the double monochromator beam-splitting structure, the light of described light source diffuses on first spherical reflector, described double monochromator beam-splitting structure comprises first grating, second spherical reflector, second grating, the 3rd spherical reflector, slit plate, described slit plate is provided with entrance slit, middle slit and exit slit, described first grating and second spherical reflector, second grating and the 3rd spherical reflector lay respectively at the both sides of slit plate, the focus of second spherical reflector and the 3rd spherical reflector is at the middle slit place simultaneously, and described middle slit is as the exit slit of second spherical reflector and the entrance slit of the 3rd spherical reflector; Be provided with the guiding light path of forming by described first spherical reflector, first level crossing, second level crossing that set gradually before the described double monochromator beam-splitting structure, be provided with the light path of forming by the 3rd level crossing that sets gradually, bracelet face mirror, sector mirror after the described double monochromator beam-splitting structure, be provided with the 4th spherical reflector in the light path between the sample cell of described sector mirror and sample, described sector mirror and with reference to being provided with the 5th spherical reflector in the light path between the sample cell of sample.
2. spectrophotometric meter optical system according to claim 1 is characterized in that, is respectively arranged with quartzy window in the light path before and after the sample cell of described sample, and is described with reference to being respectively arranged with quartzy window in the light path before and after the sample cell of sample.
3. spectrophotometric meter optical system according to claim 1, it is characterized in that, described light source comprises tungsten light source and deuterium lamp light source, the light of described deuterium lamp light source diffuses on first spherical reflector, and the light of described tungsten light source reflexes on described first spherical reflector by first plane mirror.
CN2009102449029A 2009-12-18 2009-12-18 Spectrophotometer optical system Pending CN102103067A (en)

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CN102103067A true CN102103067A (en) 2011-06-22

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105973855A (en) * 2016-06-03 2016-09-28 苏州百源基因技术有限公司 Infrared visible light fluorescence detection system
CN107407630A (en) * 2015-03-13 2017-11-28 株式会社岛津制作所 Fourier transformation type spectrophotometer
CN109187428A (en) * 2018-10-26 2019-01-11 广州市怡文环境科技股份有限公司 spectrometer and water quality detecting device

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN85107948A (en) * 1985-10-14 1987-04-15 株式会社岛津制作所 Monochromator
US5715050A (en) * 1995-01-25 1998-02-03 New Creation Co., Ltd. Optical inspection apparatus including a telecentric optical system, an aperture stop and a screen
JPH11132847A (en) * 1997-10-28 1999-05-21 Yokogawa Electric Corp Optical spectrum analyzer
CN1280298A (en) * 1999-07-08 2001-01-17 上海春晓光电科技有限公司 Optical system of multifunction spectrophotometer
CN1752739A (en) * 2005-10-21 2006-03-29 中国科学院上海光学精密机械研究所 The spectrophotometer of quick measure spectrum
CN1869614A (en) * 2005-05-25 2006-11-29 株式会社岛津制作所 Detection device of UV visual near-infrared sepctrophotometer
CN101408504A (en) * 2007-10-11 2009-04-15 上海光谱仪器有限公司 Method for reducing stray light of atomic absorption spectrum instrument using visible cut-off type optical filter and light path system thereof
CN201637486U (en) * 2009-12-18 2010-11-17 天津市拓普仪器有限公司 Ultraviolet infrared spectrophotometer optical system

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN85107948A (en) * 1985-10-14 1987-04-15 株式会社岛津制作所 Monochromator
US5715050A (en) * 1995-01-25 1998-02-03 New Creation Co., Ltd. Optical inspection apparatus including a telecentric optical system, an aperture stop and a screen
JPH11132847A (en) * 1997-10-28 1999-05-21 Yokogawa Electric Corp Optical spectrum analyzer
CN1280298A (en) * 1999-07-08 2001-01-17 上海春晓光电科技有限公司 Optical system of multifunction spectrophotometer
CN1869614A (en) * 2005-05-25 2006-11-29 株式会社岛津制作所 Detection device of UV visual near-infrared sepctrophotometer
CN1752739A (en) * 2005-10-21 2006-03-29 中国科学院上海光学精密机械研究所 The spectrophotometer of quick measure spectrum
CN101408504A (en) * 2007-10-11 2009-04-15 上海光谱仪器有限公司 Method for reducing stray light of atomic absorption spectrum instrument using visible cut-off type optical filter and light path system thereof
CN201637486U (en) * 2009-12-18 2010-11-17 天津市拓普仪器有限公司 Ultraviolet infrared spectrophotometer optical system

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107407630A (en) * 2015-03-13 2017-11-28 株式会社岛津制作所 Fourier transformation type spectrophotometer
CN107407630B (en) * 2015-03-13 2020-02-14 株式会社岛津制作所 Fourier transform type spectrophotometer
CN105973855A (en) * 2016-06-03 2016-09-28 苏州百源基因技术有限公司 Infrared visible light fluorescence detection system
CN109187428A (en) * 2018-10-26 2019-01-11 广州市怡文环境科技股份有限公司 spectrometer and water quality detecting device

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Application publication date: 20110622