Summary of the invention
The object of the invention is to, overcome the defective that existing element parallel test system and method for testing thereof exist, and provide a kind of new element parallel test system and method for testing thereof, technical matters to be solved is to make it can reduce equipment cost, and keep the component under test testing efficiency, be very suitable for practicality.
The object of the invention to solve the technical problems realizes by the following technical solutions.according to a kind of element parallel test system that the present invention proposes, it comprises: a power meter, one signal transceiver, one handling module, one first main frame, that detecting one first element is when being loaded, the request of sending is to obtain one first authority, with by this power meter, this first element is carried out and complete one first the test after, discharge this first authority, and request to be obtaining one second authority, with after by this signal transceiver, this first element being carried out and completing one second test, discharges this second authority, one second main frame, that detecting one second element is when being loaded, the request of sending is to obtain this first authority, with by this power meter, this second element is carried out and complete this first the test after, discharge this first authority, and request to be obtaining this second authority, with after by this signal transceiver, this second element being carried out and completing this second test, discharges this second authority, an and instrument driver module, control this handling module and load this first element, according to the request of this first main frame to give this first authority, control simultaneously this handling module and load this second element in this second main frame, when this first main frame discharges this first authority, request according to this first main frame and this second main frame, synchronously give this first authority to this second main frame, give this second authority to this first main frame, and after this first main frame discharges this second authority, control this first element of this handling module removal, while is according to the request of this second main frame, give this second authority to this second main frame, when discharging this second authority, this second main frame controls this second element of this handling module removal.
The object of the invention to solve the technical problems also can be applied to the following technical measures to achieve further.
aforesaid element parallel test system, after wherein this first main frame is completed this second test, this instrument driver module is control handling module this first element of removal and load a three element in this first main frame, this first main frame is to obtain this first authority to this instrument driver module request, by this power meter, this three element is carried out this first test, after this first test is completed, discharge this first authority, and to this instrument driver module request to obtain this second authority, by this signal transceiver, this three element is carried out this second test, after this second test is completed, discharge this second authority.
aforesaid element parallel test system, when wherein this first main frame has offered this second main frame to this this first authority of instrument driver module request and this first authority, this instrument driver module is to wait for that this second main frame discharges this first authority, provide again this first authority to this first main frame, when this first main frame has offered this second main frame to this this second authority of instrument driver module request and this second authority, this instrument driver module is to wait for that this second main frame discharges this second authority, provide again this second authority to this first main frame, when this second main frame has offered this first main frame to this this first authority of instrument driver module request and this first authority, this instrument driver module is to wait for that this first main frame discharges this first authority, provide again this first authority to this second main frame, when this second main frame has offered this first main frame to this this second authority of instrument driver module request and this second authority, this instrument driver module is to wait for that this first main frame discharges this second authority, provide again this second authority to this second main frame.
Aforesaid element parallel test system, wherein this instrument driver module comprises a plurality of drivers, and take out the running parameter that one first program gives this this first element of the first host setting from those drivers, and take out the running parameter that one second program gives this this second element of the second host setting from those drivers.
aforesaid element parallel test system, when wherein this first main frame is obtained this first authority, this first element of this first host computer control output one first signal to this power meter to export one first signal strength data, this instrument driver module gives this first main frame to revise at least one running parameter of this first element according to this first signal strength offering of materials one first revision program, when this first main frame is obtained this second authority, this first element of this first host computer control output one first test data to this signal transceiver to export one first data as a result, this first main frame according to this first as a result data determine the whether normally operation of this first element.
aforesaid element parallel test system, when wherein this second main frame is obtained this first authority, this the second element output one second signal to this power meter of this second host computer control is to export one second signal strength data, this instrument driver module gives this second main frame to revise at least one running parameter of this second element according to this second signal strength offering of materials one second revision program, when this second main frame is obtained this second authority, this second element of this second host computer control output one second test data to this signal transceiver is to export one second data as a result, this second main frame according to this second as a result data determine the whether normally operation of this second element.
The object of the invention to solve the technical problems also realizes by the following technical solutions.A kind of element parallel test method according to the present invention's proposition, it comprises: control this handling module via this instrument driver module and load one first element in this first main frame, this first main frame to obtain one first authority, carries out one first test to utilize a power meter to this first element to this instrument driver module request; When this first main frame was carried out this first test, this instrument driver module was controlled this handling module and is loaded one second element in this second main frame, and this second main frame is to this this first authority of instrument driver module request; When this first main frame is completed this first when test to this first element, this first main frame discharge this first authority and to this instrument driver module request to obtain one second authority, to utilize a signal transceiver to carry out one second test to this first element, this instrument driver module is to give this first authority of this second main frame this second element is carried out this first test, to reach executed in parallel; And complete this second when test to this first element when this first main frame, control this first element of this handling module removal and discharge this second authority, this second main frame is in this first when test of completing this second element, to obtain this second authority, to utilize this signal transceiver, this second element is carried out this second test to this instrument driver module request.
The object of the invention to solve the technical problems also can be applied to the following technical measures to achieve further.
Aforesaid element parallel test method, wherein more comprise the following step: this instrument driver module is to load a three element to this first main frame, when this second main frame carries out this second test to this second element, this first main frame to this instrument driver module request with obtain this first authority with this three element is carried out this first the test, to reach executed in parallel.
aforesaid element parallel test method, when wherein this first main frame has offered this second main frame to this this first authority of instrument driver module request and this first authority, this instrument driver module is to wait for that this second main frame discharges this first authority, provide again this first authority to this first main frame, when this first main frame has offered this second main frame to this this second authority of instrument driver module request and this second authority, this instrument driver module is to wait for that this second main frame discharges this second authority, provide again this second authority to this first main frame, when this second main frame has offered this first main frame to this this first authority of instrument driver module request and this first authority, this instrument driver module is to wait for that this first main frame discharges this first authority, provide again this first authority to this second main frame, when this second main frame has offered this first main frame to this this second authority of instrument driver module request and this second authority, this instrument driver module is to wait for that this first main frame discharges this second authority, provide again this second authority to this second main frame.
Aforesaid element parallel test method, wherein this instrument driver module comprises a plurality of drivers, and take out the running parameter that one first program gives this this first element of the first host setting from those drivers, and take out the running parameter that one second program gives this this second element of the second host setting from those drivers.
The present invention compared with prior art has obvious advantage and beneficial effect.By above technical scheme as can be known, main technical content of the present invention is as follows:
For achieving the above object, the invention provides a kind of element parallel test system.This element parallel test system comprises: a power meter, a signal transceiver, a handling module, an instrument driver module, one first main frame and one second main frame.
Power meter carries out the signal strength analysis in order to the signal that will receive, and signal transceiver is in order to receive a test data to produce the reception result of test data.The instrument driver module is to provide one first authority that can use power meter, and provides the second authority that can use signal transceiver.
The first main frame is that detecting one first element is when being loaded, to the request of instrument driver module to obtain the first authority, to be undertaken by power meter and to complete one first and test rear first authority that discharges, and to obtain the second authority, afterwards discharge second authority to be undertaken by signal transceiver and to complete one second test to the request of instrument driver module.
The second main frame is that detecting one second element is when being loaded, to the request of instrument driver module to obtain the first authority, with control the second element undertaken by power meter and complete above-mentioned first the test after, discharge the first authority, and to the request of instrument driver module to obtain the second authority, with after controlling the second element and being undertaken by signal transceiver and complete one second test, discharge the second authority.
the instrument driver module loads the first element in order to control handling module, according to the request of the first main frame to give the first authority, control simultaneously handling module and load the second element in the second main frame, when the first main frame discharges the first authority, request according to the first main frame and the second main frame, synchronously give the first authority to the second main frame, give the second authority to the first main frame, and first after main frame discharges the second authority, control handling module removal the first element, while is according to the request of the second main frame, give the second authority to the second main frame, when discharging the second authority, the second main frame controls handling module removal the second element.
In addition, for achieving the above object, the present invention also provides a kind of element parallel test method, it comprises: control handling module via the instrument driver module and load one first element in the first main frame, the first main frame to obtain one first authority, carries out one first test to utilize a power meter to the first element to the request of instrument driver module.When the first main frame was carried out the first test, the instrument driver module was controlled handling module and is loaded one second element in the second main frame, and the second main frame is to instrument driver module request the first authority.When the first main frame is completed first when test to the first element, the first main frame to the request of instrument driver module to obtain one second authority, to utilize a signal transceiver to carry out one second test to the first element, the instrument driver module is to give second main frame the first authority the second element is carried out the first test, to reach executed in parallel.When the first main frame is completed second when test to the first element, to control handling module removal the first element, the second main frame in first when test of completing the second element, to obtain the second authority, carries out the second test to utilize signal transceiver to the second element to the request of instrument driver module.
By technique scheme, element parallel test system of the present invention and method of testing thereof have following advantages and beneficial effect at least: the disclosed element test system of the present invention and method thereof, can form an instrument control module and coordinate two Test Hosts, at one time, two Test Hosts are first tests and the second test of carrying out two different phases, to reduce equipment cost.Yet each testing apparatus when obtaining element, is that element is carried out identical element test.In the method, the instrument control module coordinates two Test Hosts to stagger to the time of two test jobs, effectively reduces the T.T. of component under test test, and then promotes the execution efficient of test jobs.
In sum, the invention relates to a kind of element parallel test system and method for testing thereof.This element parallel test system comprises a power meter, and a signal transceiver, a handling module, an instrument driver module provide one first authority that can use power meter and one second authority, one first main frame and one second main frame that use signal transceiver.The instrument driver module is controlled handling module loading and unloading element in the first main frame and the second main frame, the first main frame and the second main frame are when loading member, ask for the first authority so that carry out one first test with power meter to the instrument driver module respectively, and ask for the second authority to use signal transceiver to carry out one second test to the instrument driver module.The instrument driver module is the mode that gives of controlling the first authority and the second authority, to make the first main frame and the second the first test of main frame executed in parallel and the second test.By the present invention, can reduce equipment cost, and keep the component under test testing efficiency.The present invention has significant progress technically, and has obvious good effect, is really a new and innovative, progressive, practical new design.
Above-mentioned explanation is only the general introduction of technical solution of the present invention, for can clearer understanding technological means of the present invention, and can be implemented according to the content of instructions, and for above and other purpose of the present invention, feature and advantage can be become apparent, below especially exemplified by preferred embodiment, and the cooperation accompanying drawing, be described in detail as follows.
Embodiment
Reach for further setting forth the present invention technological means and the effect that predetermined goal of the invention is taked, below in conjunction with accompanying drawing and preferred embodiment, to the element parallel test system of foundation the present invention proposition and embodiment, structure, method, step, feature and the effect thereof of method of testing thereof, be described in detail as follows.
Please be simultaneously with reference to shown in Fig. 2 A and Fig. 2 B, Fig. 2 A is the test macro Organization Chart of the embodiment of the present invention, Fig. 2 B is the test system block diagram of the embodiment of the present invention.The disclosed element parallel test system of the present invention comprises a handling module 70, an instrument driver module 20, one first main frame (FirstPC) 31, one second main frame (Second PC), 41, one power meter (Power Meter), 21 and one signal transceiver 22.
Learn from Fig. 2 A, instrument driver module 20 is to connect handling module 70, the first main frame 31, the second main frame 41 and power meter 21.The first main frame 31 and the second main frame 41 respectively have to load the first carrier 32 and second carrier 42 of component under test (Device Under Test), when being a tested wafer as component under test, the first carrier 32 and the second carrier 42 are for disposing the testing circuit board of wafer slot (Socket); Also or, when component under test was a tested network card, the first carrier 32 and the second carrier 42 were card slot (Slot).Power meter 21 is in order to test the signal strength of component under test output signal, and power meter 21 connects the first carrier 32 and the second carrier 42, and signal transceiver 22 is connected with the second carrier 42 with the first main frame 31, the second main frame 41, the first carrier 32.
In the present embodiment, the output signal of component under test is to be radio-frequency (RF) signal (Radio FrequencySignal) (but not as limit).Signal transceiver 22 refers to a kind of according to receiving signal and the reaction that sends signal at this, adjust the setup parameter value that is best suited for this test jobs, and carry out according to this setup parameter value the element master sample that signal received and sent operation, it has signal receiving/transmission, modulation, demodulation (namely separate modulation, below all the be called demodulation) ability of standard.The element master sample has standardization, near running parameter and the running status of desired quantity, it is mainly the signal that receives component under test output, and according to component under test output signal state, but with the signal transmission usefulness that judges component under test with whether normal to the output signal modulation capability.Another speech, the signal transceiver 22 signal receiving/transmission equipment that the component under test manufacturing of having completed test forms of can serving as reasons.
Signal transceiver 22 is in order to according to receiving signal, and according to signal transceiver 22 whether can be correct, complete, the signal (no matter wired or wireless) that sends of modulation or demodulation component under test, but the modularity of the signal of test component under test output and the transmission usefulness of component under test, and tested signal reception result is offered Test Host (the present embodiment refers to the first main frame 31 or the second main frame 41), judge whether normally operation of component under test for Test Host.
Instrument driver module 20 stores a plurality of drivers, and taking-up one program gives the first main frame 31 and the second main frame 41 from all drivers, for the running parameter of the first main frame 31 and second main frame 41 its components under test that load separately of setting.Be identical at this hypothesis first main frame 31 with the component under test that the second main frame 41 loads, thus instrument driver module 20 to offer the first main frame 31 be for identical with the program of the second main frame 41.
As shown in Fig. 2 B, this element parallel test system more comprises one first signal and divides storage (FirstSignal Combiner/Divider) 61,1 second signal to divide storage (Second SignalCombiner/Divider) 62,1 the 3rd signal to divide storage (Third SignalCombiner/Divider) 63 and 1 the 4th signal to divide storage (Fourth SignalCombiner/Divider) 64.It is that to divide storage 62 be that to divide storage 63 be to connect power meter 21, the four signals to divide storage 64 be to connect signal transceiver 22 for the second carrier 42, the three signals of connecting the second main frame for the first carrier 32, the second signals of connecting the first main frame that the first signal divides storage 61.The specification that the first signal divides storage 61 and the second signal to divide the signal interface of storage 62 is difference 100dB, and the specification that the 3rd signal divides storage 62 and the 4th signal to divide the signal interface of storage 64 is difference 20dB.It is to connect the high-order signal interface 631 that the 3rd signal divides storage 63 that the first signal divides the high-order signal interface 611 of storage 61, it is to connect the low-level signal interface 642 that the 4th signal divides storage 64 that the first signal divides the low-level signal interface 612 of storage 61, it is to connect the 4th signal to divide high-order signal interface 641, the second signals of storage 64 to divide the low-level signal interface 622 of storage 62 be to connect the low-level signal interface 632 that the 3rd signal divides storage 63 that the second signal divides the high-order signal interface 621 of storage 62.Mode, be connected power meter 21 and the signal of signal transceiver 22, the transfer path of data separately to mark off in fact the first carrier 32 and the second carrier 42 by this, avoids simultaneously signal to leak and the situation of obscuring.
In the present embodiment, instrument driver module 20 is to store one first authority and one second authority, and the first authority is that representative can be used, the authority of elastic calibration device 21, and the second authority is the authority that signal transceiver 22 can be used, be controlled to representative.
Please be simultaneously with reference to shown in Figure 3, the element parallel test system is controlled handling module 70 loading and unloading components under test by instrument driver module 20.Instrument driver module 20 is to control handling module 70 to load the first element 51 in the first carrier 32.The first main frame 31 can be loaded by detecting the first element 51, to take out one first program to set the running parameter of this first element from instrument driver module 20.Then the first main frame 31 can be to instrument driver module 20 request of sending to obtain the first authority, to carry out the first test by 21 pairs of the first elements 51 of power meter.
When the first main frame 31 was obtained the first authority, the first main frame 31 can be controlled the first element 51 output one first signals to power meter 21, and power meter 21 can be according to the signal reception result to export one first signal strength data.Instrument driver module 20 gives the first main frame to revise at least one running parameter of the first element according to the first signal strength offering of materials one first revision program, and those parameters comprise the combination of more than one parameters such as at least one control setting value, an operating voltage, a working current and a running power of first element output the first signal.
After the first test was completed, the first main frame 31 can discharge the first authority, and asks to obtain the second authority to instrument driver module 20, to carry out the second test by 22 pairs of the first elements 51 of signal transceiver.When the first main frame 31 was obtained the second authority, the first main frame 31 was controlled first element 51 output the first test datas to signal transceiver 22.Signal transceiver 22 according to the signal reception result exporting the first data as a result, the first main frame 31 according to first as a result data determine the whether normally operation of the first element 51.After the second test is completed, discharge the second authority when the first main frame 31, instrument driver module 20 is to control handling module 70 removal the first elements 51.
In like manner, instrument driver module 20 is to control handling module 70 to load the second element 52 in the second carrier 42.The second main frame 41 can be loaded by detecting the second element 52, to take out one second program to set the running parameter of the second element from instrument driver module 20.Then the second main frame 41 can be to instrument driver module 20 request of sending to obtain the first authority, to carry out the first test by 21 pairs of the second elements 52 of power meter.
Learn from Fig. 3, when the second main frame 41 was asked the first authority to instrument driver module 20, the first main frame 31 remained unfulfilled the first test.Instrument driver module 20 can after the first main frame 31 discharges the first authority, just be given the first authority to the second main frame 41.
When the second main frame 41 was obtained the first authority, the second main frame 41 can be controlled the second element 52 output one second signals to power meter 21, and power meter 21 can be according to the signal reception result to export one second signal strength data.Instrument driver module 20 gives the second main frame 41 to revise at least one running parameter of the second element according to the second signal strength offering of materials one second revision program, and those parameters comprise the combination of more than one parameters such as at least one control setting value, an operating voltage, a working current and a running power of second element output the second signal.
After the first test was completed, the second main frame 41 can discharge the first authority, and asks to obtain the second authority to instrument driver module 20, to carry out the second test by 22 pairs of the first elements 51 of signal transceiver.
In like manner, when the second main frame 41 is asked the second authority to instrument driver module 20, if the first main frame 31 remains unfulfilled the second test.Instrument driver module 20 is just given the second authority to the second main frame 41 after can waiting for that the first main frame 31 discharges the second authority.
When the second main frame 41 was obtained the second authority, the second main frame 41 was controlled second element 52 output the second test datas to signal transceiver 22.Signal transceiver 22 according to the signal reception result exporting the second data as a result, the second main frame 41 according to second as a result data determine the whether normally operation of the second element 52.After the second test is completed, discharge the second authority when the second main frame 41.
Otherwise in follow-up relevant operation, when the first main frame 31 was asked the first authority to instrument driver module 20, the second main frame 41 remained unfulfilled the first test.Instrument driver module 20 can after the second main frame 41 discharges the first authority, just be given the first authority to the first main frame 31.And when the first main frame 31 is asked the second authority to instrument driver module 20, if the second main frame 41 remains unfulfilled the second test.Instrument driver module 20 is just given the second authority to the first main frame 31 after can waiting for that the second main frame 41 discharges the second authority.
Learn with regard to Fig. 3, when the first main frame 31 was controlled first element 51 execution the second test, the second main frame 41 was controlled the second elements 52 execution first and is tested to reach executed in parallel; And a three element 53 exists and when being loaded on the first carrier 32 of the first main frame 31, the first main frame 31 is the patterns according to above-mentioned test the first element 51, three element 53 is carried out the first test and the second test.And when the first main frame 31 was controlled three element 53 execution the first test, the second main frame 41 was controlled the second elements 52 execution second and is tested to reach executed in parallel.
Please be simultaneously with reference to Fig. 3 and shown in Figure 4, Fig. 3 is the test sequence figure of element parallel test system of the present invention, Fig. 4 is element parallel test method process flow diagram of the present invention, please understand with reference to being beneficial to shown in Fig. 2 A and Fig. 2 B simultaneously.In the present embodiment, the deadline that each component under test is loaded on the first carrier 32 or the second carrier 42 takes 8 seconds, each component under test is taken 8 seconds by removal in the deadline of the first carrier 32 or the second carrier 42, the required time of the first test is 30.6 seconds, and the required time of the second test is 19.6 seconds.This flow process is as described below:
Control handling module 70 via instrument driver module 20 and load one first element 51 in the first main frame 31, the first main frame 31 asks to obtain one first authority to instrument driver module 20, carries out one first test (step S110) to utilize 21 pairs of the first elements 51 of a power meter.
During from 0 second, instrument driver module 20 control handling modules 70 are loaded into the first main frame 31, the first elements 51 and can be loaded on the first carrier 32.In the time of 8 seconds, the first element 51 is loaded to be completed, and the first main frame 31 is to detect the first carrier 32 to be mounted with the first element 51, and according to the specification of the first element 51, obtain one first program from instrument driver module 20, to drive, to set and to control the first element 51.
During from 8 seconds, the first main frame 31 sends request to instrument driver module 20, and to ask for the first authority, instrument driver module 20 is to judge whether the first authority is shared by the second main frame 41.When instrument driver module 20 judgement the first authorities when being unoccupied, will give the first authority to the first main frame 31, the first main frames 31 and namely control the first element 51 and carry out the first test by power meter 21.
When the first main frame 31 was carried out the first test, instrument driver module 20 meeting synchro control handling modules 70 loading one second elements 52 are 20 request the first authorities (step S120) in the second main frame 41, the second main frames 41 to the instrument driver module.
During 8 seconds to 16 seconds, the second element 52 can be loaded on the second carrier 42, the second main frames 41 and detect the second carrier 42 when being mounted with the second element 52, according to the specification of the second element 52, obtain one second program from instrument driver module 20, to drive, to set and to control the second element 52.The second main frame 41 can send request to instrument driver module 20 equally, to ask for the first authority.But instrument driver module 20 judgement the first authorities have been given the first main frame 31, and namely the first main frame 31 is just being carried out the first test, therefore the first authority can not given the second main frame 41.
As shown in Figure 3, the second element 52 is done and is loaded into the second carrier 42, and the second main frame 41 sends time from request to instrument driver module 20 is after 8 seconds (in the present embodiment, the second element 52 was completed loading at 16 seconds), instrument driver module 20 has given the first authority the first main frame 31 at this moment, therefore can't give the second main frame 41 again.The second main frame 41 is not obtained the first authority, therefore uncontrollable the second element 52 carries out the first test by power meter 21.
When the first main frame 41 is completed first when test to the first element 51, the first main frame 31 discharges the first authority and asks to obtain one second authority to instrument driver module 20, to utilize 22 pairs of the first elements 51 of a signal transceiver to carry out one second test, instrument driver module 20 is to give the second main frame 41 first authorities so that the second element 52 is carried out the first test, to reach executed in parallel (step S130).
About 38.6 seconds, the first main frame 31 is completed the first test to the first element 51, and the first main frame 31 can discharge the first authority, and sends request to instrument driver module 20 immediately, to ask for the second authority.Instrument driver module 20 can be obtained the first authority from the first main frame 31, and gives the second authority to the first main frame 31, and the first authority can be given the second main frame 41 by instrument driver module 20.The first main frame 31 is namely controlled the first element 51 and is carried out one second test by signal transceiver 22 when obtaining the second authority.
The second main frame 41 can approximately obtained the first authority (the first element 51 is completed the first test afterwards) 38.6 seconds the time, carry out the first test to control the second element 52 by power meter 21, make the second main frame 41 carry out the first test and carry out the second test with the first main frame 31 and reach the executed in parallel state.
When the first main frame 31 is completed second when test to the first element 51, control handling module 70 removal the first elements 51 and discharge the second authority, the second main frame 41 is in first when test of completing the second element 52, ask to obtain the second authority to instrument driver module 20, carry out the second test (step S140) to utilize 22 pairs of the second elements 52 of signal transceiver.
About 58.2 seconds, the first main frame 31 is completed the second test to the first element 51, and the first main frame 31 can discharge the second authority.Instrument driver module 20 can be controlled handling modules 70 with the first element 51 removal from the first carrier 32, and the first element 51 can be completed by the operation of removal when 66.2 seconds left and right.
When 69.2 seconds left and right, the second main frame 41 is completed the first test to the second element 52, and discharges the first authority.The second main frame 41 can be to instrument driver module 20 request of sending to ask for the second authority.Yet instrument driver module 20 can be fetched the second authority from the first main frame 31 in the time of the 58.2nd second, therefore in the time of the 69.2nd second, give the second authority to the second main frame 41.The second main frame 41 when obtaining the second authority, is to control the second element 52 to carry out the second test by signal transceiver 22.
When a three element exists, instrument driver module 20 can be controlled handling module 70 and load three element 53 to first main frames 20, when second 41 pairs, main frame the second element 52 carries out the second test, the first main frame 31 asks to obtain the first authority three element 53 is carried out the first test, to reach executed in parallel (step S150) to instrument driver module 20.
As above-mentioned, three element 53 can be loaded in the first carrier 32, and three element 53 can be completed the operation that is loaded on the first carrier 32 at the 74.2nd second, and the first main frame 31 can detect the existence of three element 53.。
In this explanation, three element 53 was completed the time point that is loaded about 74.2 seconds, namely discharged the first authorities at the second main frame 41, and obtained the second authority the second element 52 is carried out the second test.Therefore, the first main frame 31 can be obtained the first authority from instrument driver module 20 smoothly, tests to carry out first by power meter 21 to control three element 53.At this moment, the first main frame 31 is controlled three element 53 and is carried out the first test, controls the second element 52 with the second main frame 41 and carries out the second test, and both reach the executed in parallel state.
Yet, if the first element 51 is completed ahead of time by the operation that removal and three element 53 are loaded on the first carrier 32, or second the test duration quite in short-term, cause the first main frame to ask the first authorities to instrument driver module 20 before 69.2 seconds, instrument driver module 20 can still carried out the first test to the second element 52 because of the second main frame 41, and can't give the first main frame 31 first authorities.Need to wait for that instrument driver module 20 is fetched the first authority from the second main frame 41 after 69.2 seconds, the first main frame 31 could be obtained the first authority from instrument driver module 20.
Can be reasoned out by above-mentioned explanation, instrument driver module 20 is when giving the first authority and the second authority, that following state possible occur: when (1) first main frame 31 asks the first authorities and the first authority to offer the second main frame 41 to instrument driver module 20, instrument driver module 20 is to wait for that the second main frame 41 discharges the first authority, then provides the first authority to the first main frame 31.When (2) first main frames 31 asked the second authorities and the second authority to offer the second main frame 41 to instrument driver module 20, instrument driver module 20 was to wait for that the second main frame 41 discharges the second authorities, then provides the second authority to the first main frame 31.When (3) second main frames 41 asked the first authorities and the first authority to offer the first main frame 31 to instrument driver module 20, instrument driver module 20 was to wait for that the first main frame 31 discharges the first authorities, then provides the first authority to the second main frame 41.When (4) second main frames 41 asked the second authorities and the second authority to offer the first main frame 31 to instrument driver module 20, instrument driver module 20 was to wait for that the first main frame 31 discharges the second authorities, then provides the second authority to the second main frame 41.
Illustrating further the first test and the second flow process of testing at this, be below to load the first elements 51 with the first main frame 31, and the situation of second main frame 41 loading the second elements 52 as an illustration.
As aforementioned, the first main frame 31 is according to the first driven by program, setting, control the first element 51.The first main frame 31 is when obtaining the first authority, and the first main frame 31 is to control the first element 51 output one first signals.The first signal can divide by the first signal high-order signal interface 611 outputs of storage 61, and divides the high-order signal interface 631 of storage 63 to be received by the 3rd signal, to pass to power meter 21.Power meter 21 is signal strengths of analyzing the first signal, producing one first signal strength data, and transmits the first signal strength data to instrument driver module 20.Instrument driver module 20 is to adjust at least one running parameter of the first element 51 according to the first revision program to the first main frame 31, the first main frames 31 according to the first signal strength offering of materials one first revision program.The running parameter of the first element 51 is that at least one control setting value, an operating voltage, the working current and that are selected from by first element 51 output the first signals operate the group that power forms.
When the first main frame 31 was obtained the second authority, the first main frame 31 was to control the first element 51 output one first test datas.This first test data is to divide low-level signal interface 612 outputs of storage 61 by the first signal, divides the low-level signal interface 642 of storage 64 to be received by the 4th signal, then is passed to signal transceiver 22.
As previously mentioned.Signal transceiver 22 is an element master sample, has standardized running parameter and signal receiving/transmission pattern.After signal transceiver 22 received the first test data, the soon reception situation of the first test data formation one first is data as a result.At this moment, the second main frame 41 is the clients (Client) that form the first main frame 31, in order to control signal transceiver 22.The second main frame 41 can receive this first data as a result, then with first as a result data be back to the first main frame 31, the first main frames 31 namely according to this first as a result data determine whether the first element 51 runnings normal.So far, the first main frame 31 is completed all tests of the first element 51.
As aforementioned, the second main frame 41 is according to the second driven by program, setting, control the second element 52.The second main frame 41 is when obtaining the first authority, and the second main frame 41 is to control the second element 52 output one second signals.The second signal can divide by the second signal low-level signal interface 622 outputs of storage 62, and divides the low-level signal interface 632 of storage 63 to be received by the 3rd signal, to pass to power meter 21.Power meter 21 is signal strengths of analyzing the second signal, producing one second signal strength data, and transmits the second signal strength data to instrument driver module 20.Instrument driver module 20 is to adjust at least one running parameter of the second element 52 according to the second revision program to the second main frame 41, the second main frames 41 according to the second signal strength offering of materials one second revision program.The running parameter of the second element 52 is that at least one control setting value, an operating voltage, the working current and that are selected from by second element 52 output the first signals operate the group that power forms.
When the second main frame 41 was obtained the second authority, the second main frame 41 was to control the second element 52 output one second test datas.This second test data is to divide high-order signal interface 621 outputs of storage 62 by the second signal, divides the high-order signal interface 641 of storage 64 to be received by the 4th signal, then is passed to signal transceiver 22.
After signal transceiver 22 received the second test data, the soon reception situation of the second test data formation one second is data as a result.At this moment, the first main frame 31 is the clients (Client) that form the second main frame 41, in order to control signal transceiver 22.The first main frame 31 can receive this second data as a result, then with second as a result data be back to the second main frame 41, the second main frames 41 namely according to this second as a result data determine whether the second element 52 runnings normal.So far, the second main frame 41 is completed all tests of the second element 52.Below, the follow-up component under test that the first main frame 31 and the second main frame 41 tests are loaded, its gimmick is identical with the method for aforementioned first main frame 31 test the first elements 51 and second main frame 41 test the second elements 52, does not namely give unnecessary details at this.
Learn following service condition by above-mentioned element parallel test system: (1) first main frame 31 and the second main frame 41 can sequentially be carried out the first test and the second test; (2) instrument driver module 20 only gives the first authority the first main frame 31 or the second main frame 41 within the time, only the second authority is given the first main frame 31 or the second main frame 41; (3) first main frames and the second main frame 41 can not obtained identical authority at one time; (4) after more late main frame of test execution time need wait for that the execution time, main frame was early completed test, just can carry out the same test operation performed with the main frame of early carrying out.
Therefore, give method according to the stagger authority of the time that gives of the first authority and the second authority of instrument driver module 20, the flow process of the first main frame 31 and the second main frame 41 executive components tests can form certain circulation pattern.Learn from Fig. 3, after originally being implemented in the 38.6th second, take 66.2 seconds as a time unit, in each chronomere, the first main frame and the second main frame 41 can be completed the first test and the second test once separately.The first main frame is carried out the action of the second test and the action that the second main frame 41 is carried out the first test, is to reach executed in parallel; The second main frame 41 is carried out the action of the second test and the action that the first main frame is carried out the first test, is to reach executed in parallel.
In prior art, the time that component under test is completed takes 66.2 seconds, and two component under test essence deadlines are 132.4 seconds, and four component under test essence deadlines are 264.8 seconds.
By the disclosed element parallel test system of the present embodiment, two element tests are completed and are taken 96.8 seconds, than 132.4 seconds, shorten at least 35 seconds.Four element tests are completed and are taken 163 seconds, than 264.8 seconds, shorten at least 100 seconds.Therefore, component under test is more, can shorten in fact than the general more test duration of element parallel test system.And need not to set up hardware device, really effectively reduce the equipment needed thereby cost, and keep the execution efficient of component under test test to a certain degree.
the above, it is only preferred embodiment of the present invention, be not that the present invention is done any pro forma restriction, although the present invention discloses as above with preferred embodiment, yet be not to limit the present invention, any those skilled in the art, within not breaking away from the technical solution of the present invention scope, when the method that can utilize above-mentioned announcement and technology contents are made a little change or be modified to the equivalent embodiment of equivalent variations, in every case be the content that does not break away from technical solution of the present invention, any simple modification that foundation technical spirit of the present invention is done above embodiment, equivalent variations and modification, all still belong in the scope of technical solution of the present invention.