CN101988948A - Member parallel test system and test method thereof - Google Patents
Member parallel test system and test method thereof Download PDFInfo
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- CN101988948A CN101988948A CN2009101640432A CN200910164043A CN101988948A CN 101988948 A CN101988948 A CN 101988948A CN 2009101640432 A CN2009101640432 A CN 2009101640432A CN 200910164043 A CN200910164043 A CN 200910164043A CN 101988948 A CN101988948 A CN 101988948A
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Abstract
The invention relates to a member parallel test system and a test method thereof. The member parallel test system comprises a power meter, a signal transceiver, a loading and unloading module, an instrument driving module, a first hot machine and a second host machine, wherein the instrument driving module provides a first authority for using the power meter and a second authority for using the signal transceiver, and controls the loading and unloading module to load and unload members at the first host machine and the second host machine, and the first host machine and the second host machine respectively request the first authority from the instrument driving module for using the power meter to carry out first test and request the second authority from the instrument driving module for using the signal transceiver to carry out second test when loading and unloading the members. The instrument driving module makes the first host machine and the second host machine parallelly execute the first test and the second test through controlling the giving modes of the first authority and the second authority. Through the invention, the equipment cost can be reduced, and the test efficiency of tested members can be maintained.
Description
Technical field
The present invention relates to a kind of element parallel test system and method for testing thereof, be meant a kind of instrument driver module especially by loading and unloading element opportunity and authority controlling and managing, so that parallel element parallel test system and the method for testing thereof of carrying out neither of two Test Hosts with the stage test jobs.
Background technology
In the prior art, manufacturer is that each component under test is carried out a test jobs after making component under test.
Please refer to shown in Figure 1ly, it is the block scheme of the element parallel test system of prior art, and it is by an instrument driver module 11, a Test Host 12, a power meter (Power Meter, PM) 15 and one signal transceiver 16.Wherein, Test Host 12 is to connect instrument driver module 11, and passes through coupling mechanism 14 power meter 15 and signal transceiver 16 in succession.Power meter 15 is in order to the signal strength of the signal (as Radio Frequency Signal, radio-frequency (RF) signal) that sends of detecting component under test and the data stability of signal transmission.
In this explanation, signal transceiver 16 refers to the master sample element of a signal receiving/transmission with standard, modulation, demodulation ability, in order to according to receiving signal, and according to signal transceiver 16 whether can be correct, complete, the wireless signal that sends of modulation or demodulation component under test 13, but the modularity of the signal of test component under test 13 outputs and the transmission usefulness of component under test 13, and the signal reception result offered Test Host 12, judge for Test Host 12 whether component under test 13 normally moves.
In the system of prior art, earlier with artificial or mechanical arm clamps component under test 13 to be loaded into a carrier of Test Host 12, when being a tested wafer as component under test 13, carrier is for disposing the testing circuit board of wafer slot (Socket); Also or, when component under test 13 was a tested network card, two carriers were card slot (Slot).Coupling mechanism 14 is switched earlier to be communicated with Test Host 12 and power meter 15, and Test Host 12 is obtained a driver to set component under test 13 from instrument driver module 11, controls component under test 13 again and sends a tested signal to power meter 15.
Then, coupling mechanism 14 is switched to be communicated with Test Host 12 and signal transceiver 16 again, and Test Host 12 control components under test 13 send a test data.Signal transceiver 16 receives this test data, and the reception result of test data is returned to Test Host 12.Test Host 12 according to the reception result of obtaining to judge whether normal operation of component under test 13.
Learn that with regard to above-mentioned in the prior art, the cover same time of test macro only can be tested a component under test.Manufacturer increases production capacity the short time, how can set up identical test macro, with a plurality of components under test of disposable test.Yet, manufacturer whenever purchases a cover test macro, only is the element test line of setting up a component under test more, and the structure of the component under test that manufactures is all identical with the testing process that component under test carries out, be that the component under test testing efficiency has promoted, the testing cost that manufacturer paid also promotes relatively.Therefore, how to effectively reduce production cost, with the production capacity that promotes component under test, the problem that should think deeply for manufacturer.
This shows that above-mentioned existing element parallel test system and method for testing thereof obviously still have inconvenience and defective, and demand urgently further being improved in product structure, manufacture method and use.In order to solve the problem of above-mentioned existence, relevant manufacturer there's no one who doesn't or isn't seeks solution painstakingly, but do not see always that for a long time suitable design finished by development, and common product and method do not have appropriate structure and method to address the above problem, and this obviously is the problem that the anxious desire of relevant dealer solves.Therefore how to found a kind of new element parallel test system and method for testing thereof, real one of the current important research and development problem that belongs to, also becoming the current industry utmost point needs improved target.
Summary of the invention
The objective of the invention is to, overcome the defective that existing element parallel test system and method for testing thereof exist, and provide a kind of new element parallel test system and method for testing thereof, technical matters to be solved is to make it can reduce equipment cost, and keep the component under test testing efficiency, be very suitable for practicality.
The object of the invention to solve the technical problems realizes by the following technical solutions.According to a kind of element parallel test system that the present invention proposes, it comprises: a power meter; One signal transceiver; One handling module; One first main frame, be that detecting one first element is when being loaded, the request of sending is to obtain one first authority, with by this power meter this first element is carried out and finish one first the test after, discharge this first authority, and request to be obtaining one second authority, with after by this signal transceiver this first element being carried out and finishing one second test, discharges this second authority; One second main frame, be that detecting one second element is when being loaded, the request of sending is to obtain this first authority, with by this power meter this second element is carried out and finish this first the test after, discharge this first authority, and request to be obtaining this second authority, with after by this signal transceiver this second element being carried out and finishing this second test, discharges this second authority; An and instrument driver module, control this handling module and load this first element, according to the request of this first main frame to give this first authority, control this handling module simultaneously and load this second element in this second main frame, when this first main frame discharges this first authority, request according to this first main frame and this second main frame, give this first authority synchronously to this second main frame, give this second authority to this first main frame, and after this first main frame discharges this second authority, control this first element of this handling module removal, while is according to the request of this second main frame, give this second authority to this second main frame, when this second main frame discharges this second authority, control this second element of this handling module removal.
The object of the invention to solve the technical problems also can be applied to the following technical measures to achieve further.
Aforesaid element parallel test system, after wherein this first main frame is finished this second test, this instrument driver module is control handling module this first element of removal and loads a three element in this first main frame, this first main frame is to obtain this first authority to this instrument driver module request, this three element is carried out this first test by this power meter, after this first test is finished, discharge this first authority, and to this instrument driver module request to obtain this second authority, this three element is carried out this second test by this signal transceiver, after this second test is finished, discharge this second authority.
Aforesaid element parallel test system, wherein this first main frame is when this this first authority of instrument driver module request and this first authority have offered this second main frame, this instrument driver module is to wait for that this second main frame discharges this first authority, provide this first authority to this first main frame again, when this first main frame when this this second authority of instrument driver module request and this second authority have offered this second main frame, this instrument driver module is to wait for that this second main frame discharges this second authority, provide this second authority to this first main frame again, when this second main frame when this this first authority of instrument driver module request and this first authority have offered this first main frame, this instrument driver module is to wait for that this first main frame discharges this first authority, provide this first authority to this second main frame again, when this second main frame when this this second authority of instrument driver module request and this second authority have offered this first main frame, this instrument driver module is to wait for that this first main frame discharges this second authority, provides this second authority to this second main frame again.
Aforesaid element parallel test system, wherein this instrument driver module comprises a plurality of drivers, and from those drivers, take out the running parameter that one first program gives this this first element of first host setting, and from those drivers, take out the running parameter that one second program gives this this second element of second host setting.
Aforesaid element parallel test system, when wherein this first main frame is obtained this first authority, this first element of this first host computer control export one first signal to this power meter to export one first signal strength data, this instrument driver module according to this first signal strength data provide one first revision program to this first main frame to revise at least one running parameter of this first element, when this first main frame is obtained this second authority, this first element of this first host computer control export one first test data to this signal transceiver exporting one first data as a result, this first main frame according to this first as a result data determine the whether normally operation of this first element.
Aforesaid element parallel test system, when wherein this second main frame is obtained this first authority, it is to export one second signal strength data that this second element of this second host computer control is exported one second signal to this power meter, this instrument driver module according to this second signal strength data provide one second revision program to this second main frame to revise at least one running parameter of this second element, when this second main frame is obtained this second authority, it is exporting one second data as a result that this second element of this second host computer control is exported one second test data to this signal transceiver, this second main frame according to this second as a result data determine the whether normally operation of this second element.
The object of the invention to solve the technical problems also realizes by the following technical solutions.A kind of element parallel test method according to the present invention's proposition, it comprises: control this handling module via this instrument driver module and load one first element in this first main frame, this first main frame to obtain one first authority, carries out one first test to utilize a power meter to this first element to this instrument driver module request; When this first main frame was carried out this first test, this instrument driver module was controlled this handling module and is loaded one second element in this second main frame, and this second main frame is to this this first authority of instrument driver module request; When this first main frame is finished this first when test to this first element, this first main frame discharge this first authority and to this instrument driver module request to obtain one second authority, to utilize a signal transceiver that this first element is carried out one second test, this instrument driver module is to give this first authority of this second main frame this second element is carried out this first test, to reach executed in parallel; And finish this second when test when this first main frame to this first element, be to control this first element of this handling module removal and discharge this second authority, then this second main frame is in this first when test of finishing this second element, to obtain this second authority, this second element is carried out this second test to this instrument driver module request to utilize this signal transceiver.
The object of the invention to solve the technical problems also can be applied to the following technical measures to achieve further.
Aforesaid element parallel test method, wherein more comprise the following step: this instrument driver module is to load a three element to this first main frame, when this second main frame carries out this second test to this second element, this first main frame to this instrument driver module request with obtain this first authority with this three element is carried out this first the test, to reach executed in parallel.
Aforesaid element parallel test method, wherein this first main frame is when this this first authority of instrument driver module request and this first authority have offered this second main frame, this instrument driver module is to wait for that this second main frame discharges this first authority, provide this first authority to this first main frame again, when this first main frame when this this second authority of instrument driver module request and this second authority have offered this second main frame, this instrument driver module is to wait for that this second main frame discharges this second authority, provide this second authority to this first main frame again, when this second main frame when this this first authority of instrument driver module request and this first authority have offered this first main frame, this instrument driver module is to wait for that this first main frame discharges this first authority, provide this first authority to this second main frame again, when this second main frame when this this second authority of instrument driver module request and this second authority have offered this first main frame, this instrument driver module is to wait for that this first main frame discharges this second authority, provides this second authority to this second main frame again.
Aforesaid element parallel test method, wherein this instrument driver module comprises a plurality of drivers, and from those drivers, take out the running parameter that one first program gives this this first element of first host setting, and from those drivers, take out the running parameter that one second program gives this this second element of second host setting.
The present invention compared with prior art has tangible advantage and beneficial effect.By above technical scheme as can be known, major technique of the present invention thes contents are as follows:
For achieving the above object, the invention provides a kind of element parallel test system.This element parallel test system comprises: a power meter, a signal transceiver, a handling module, an instrument driver module, one first main frame and one second main frame.
Power meter carries out the signal strength analysis in order to the signal that will be received, and signal transceiver is in order to receive a test data to produce the reception result of test data.The instrument driver module provides one first authority that can use power meter, and provides second authority that can use signal transceiver.
First main frame is that detecting one first element is when being loaded, to the request of instrument driver module to obtain first authority, discharge first authority to be undertaken by power meter and to finish one first test back, and to obtain second authority, discharge second authority to be undertaken by signal transceiver and to finish one second test back to the request of instrument driver module.
Second main frame is that detecting one second element is when being loaded, to the request of instrument driver module to obtain first authority, with control second element undertaken by power meter and finish above-mentioned first the test after, discharge first authority, and to the request of instrument driver module to obtain second authority, with control second element undertaken by signal transceiver and finish one second the test after, discharge second authority.
The instrument driver module loads first element in order to the control handling module, according to the request of first main frame to give first authority, control handling module simultaneously and load second element in second main frame, when first main frame discharges first authority, request according to first main frame and second main frame, give first authority to the second main frame synchronously, give second authority to the first main frame, and first after main frame discharges second authority, control handling module removal first element, according to the request of second main frame, give second authority to the second main frame simultaneously, control handling module removal second element when second main frame discharges second authority.
In addition, for achieving the above object, the present invention also provides a kind of element parallel test method, it comprises: load one first element in first main frame via instrument driver module control handling module, first main frame to obtain one first authority, carries out one first test to utilize a power meter to first element to the request of instrument driver module.When first main frame was carried out first test, instrument driver module control handling module loaded one second element in second main frame, and second main frame is to instrument driver module request first authority.When first main frame is finished first when test to first element, first main frame to the request of instrument driver module to obtain one second authority, to utilize a signal transceiver that first element is carried out one second test, the instrument driver module is to give second main frame, first authority second element is carried out first test, to reach executed in parallel.When first main frame is finished second when test to first element, it is control handling module removal first element, then second main frame to obtain second authority, carries out second test to utilize signal transceiver to second element to the request of instrument driver module in first when test of finishing second element.
By technique scheme, element parallel test system of the present invention and method of testing thereof have following advantage and beneficial effect at least: the present invention disclosed element test system and method thereof, can form an instrument control module and cooperate two Test Hosts, two Test Hosts are to carry out neither testing with second with first test in stage at one time, to reduce equipment cost.Yet each testing apparatus is that element is carried out the components identical test when obtaining element.In the method, the instrument control module cooperates two Test Hosts to stagger to the time of two test jobs, effectively reduces the T.T. of component under test test, and then promotes the execution efficient of test jobs.
In sum, the invention relates to a kind of element parallel test system and method for testing thereof.This element parallel test system comprises a power meter, and a signal transceiver, a handling module, an instrument driver module provide one first authority that can use power meter and one second authority, one first main frame and one second main frame that use signal transceiver.Instrument driver module control handling module loading and unloading element is in first main frame and second main frame, first main frame and second main frame are when loading member, ask for first authority so that carry out one first test to the instrument driver module respectively, and ask for second authority to the instrument driver module and carry out one second test to use signal transceiver with power meter.The instrument driver module is the mode that gives of control first authority and second authority, to make first main frame and first test of the second main frame executed in parallel and second test.By the present invention, can reduce equipment cost, and keep the component under test testing efficiency.The present invention has obvious improvement technically, and has tangible good effect, really is a new and innovative, progressive, practical new design.
Above-mentioned explanation only is the general introduction of technical solution of the present invention, for can clearer understanding technological means of the present invention, and can be implemented according to the content of instructions, and for above-mentioned and other purposes, feature and advantage of the present invention can be become apparent, below especially exemplified by preferred embodiment, and conjunction with figs., be described in detail as follows.
Description of drawings
Fig. 1 is the block scheme of the element parallel test system of prior art.
Fig. 2 A is the test macro Organization Chart of the embodiment of the invention.
Fig. 2 B is the test system block diagram of the embodiment of the invention.
Fig. 3 is the test sequence figure of element parallel test system of the present invention.
Fig. 4 is the element parallel test method process flow diagram of the embodiment of the invention.
11: instrument driver module 12: Test Host
13: component under test 14: coupling mechanism
15: power meter 16: signal transceiver
20: instrument driver module 21: power meter
22: 31: the first main frames of signal transceiver
41: the second main frames of 32: the first carriers
51: the first elements of 42: the second carriers
53: the three element of 52: the second elements
Signal divided storage 611 in 61: the first: high-order signal interface
612: 62: the second signals of low-level signal interface divide storage
621: high-order signal interface 622: low-level signal interface
Signal divided storage 631 in 63: the three: high-order signal interface
632: 64: the four signals of low-level signal interface divide storage
641: high-order signal interface 642: low-level signal interface
70: handling module
Embodiment
Reach technological means and the effect that predetermined goal of the invention is taked for further setting forth the present invention, below in conjunction with accompanying drawing and preferred embodiment, the element parallel test system that foundation the present invention is proposed and embodiment, structure, method, step, feature and the effect thereof of method of testing thereof, describe in detail as after.
Please be simultaneously with reference to shown in Fig. 2 A and Fig. 2 B, Fig. 2 A is the test macro Organization Chart of the embodiment of the invention, Fig. 2 B is the test system block diagram of the embodiment of the invention.The disclosed element parallel test system of the present invention comprises a handling module 70, an instrument driver module 20, one first main frame (FirstPC) 31, one second main frame (Second PC), 41, one power meter (Power Meter), 21 and one signal transceiver 22.
Learn that from Fig. 2 A instrument driver module 20 is to connect handling module 70, first main frame 31, second main frame 41 and power meter 21.First main frame 31 and second main frame 41 respectively have in order to load first carrier 32 and second carrier 42 of component under test (Device Under Test), when being a tested wafer as component under test, first carrier 32 and second carrier 42 are for disposing the testing circuit board of wafer slot (Socket); Also or, when component under test was a tested network card, first carrier 32 and second carrier 42 were card slot (Slot).Power meter 21 is in order to the signal strength of test component under test output signal, and power meter 21 connects first carrier 32 and second carrier 42, and signal transceiver 22 is connected with second carrier 42 with first main frame 31, second main frame 41, first carrier 32.
In the present embodiment, the output signal of component under test is to be radio-frequency (RF) signal (Radio FrequencySignal) (but not as limit).Signal transceiver 22 refers to a kind of according to receiving signal and the reaction that sends signal at this, adjust the setup parameter value that is suitable for this test jobs most, and the element master sample that carries out signal reception and transmission operation according to this setup parameter value, it has signal receiving/transmission, modulation, demodulation (promptly separate modulation, below all the be called demodulation) ability of standard.The element master sample has standardization, near the running parameter and the running status of desired quantity, mainly be in order to receive the signal of component under test output, and according to component under test output signal state, but transmit usefulness with whether normal to the output signal modulation capability with the signal of judging component under test.Other says it, the signal transceiver 22 signal receiving/transmission equipment that the component under test manufacturing of having finished test forms of can serving as reasons.
Shown in Fig. 2 B, this element parallel test system more comprises one first signal and divides storage (FirstSignal Combiner/Divider) 61,1 second signal to divide storage (Second SignalCombiner/Divider) 62,1 the 3rd signal to divide storage (Third SignalCombiner/Divider) 63 and 1 the 4th signal to divide storage (Fourth SignalCombiner/Divider) 64.It is that to divide storage 62 be that to divide storage 63 be to connect power meter 21, the four signals to divide storage 64 be to connect signal transceiver 22 for second carrier, 42, the three signals that connect second main frame for first carrier, 32, the second signals that connect first main frame that first signal divides storage 61.The specification that first signal divides the storage 61 and second signal to divide the signal interface of storage 62 is difference 100dB, and the specification that the 3rd signal divides storage 62 and the 4th signal to divide the signal interface of storage 64 is difference 20dB.It is to connect the high-order signal interface 631 that the 3rd signal divides storage 63 that first signal divides the high-order signal interface 611 of storage 61, it is to connect the low-level signal interface 642 that the 4th signal divides storage 64 that first signal divides the low-level signal interface 612 of storage 61, it is to connect the 4th signal to divide high-order signal interface 641, the second signals of storage 64 to divide the low-level signal interface 622 of storage 62 be to connect the low-level signal interface 632 that the 3rd signal divides storage 63 that second signal divides the high-order signal interface 621 of storage 62.Mode is connected power meter 21 and the signal of signal transceiver 22, the transfer path of data, the situation of avoiding signal to leak and obscure simultaneously to mark off first carrier 32 in fact separately with second carrier 42 by this.
In the present embodiment, instrument driver module 20 is to store one first authority and one second authority, and first authority is that representative can be used, the authority of elastic calibration device 21, and second authority is that representative can be used, the authority of controlling signal transceiver 22.
Please be simultaneously with reference to shown in Figure 3, the element parallel test system is by instrument driver module 20 control handling modules 70 loading and unloading components under test.Instrument driver module 20 is that control handling module 70 loads first element 51 in first carrier 32.First main frame 31 can be loaded by detecting first element 51, to take out one first program to set the running parameter of this first element from instrument driver module 20.Then first main frame 31 can send request to obtain first authority, to carry out first test by 21 pairs first elements of power meter 51 to instrument driver module 20.
When first main frame 31 was obtained first authority, first main frame 31 can be exported one first signal to power meter 21 by control first element 51, and power meter 21 can be according to the signal reception result to export one first signal strength data.Instrument driver module 20 according to the first signal strength data provide one first revision program to first main frame revising at least one running parameter of first element, those parameters comprise the combination that first element is exported more than one parameters such as at least one control setting value of first signal, an operating voltage, a working current and a running power.
After first test was finished, first main frame 31 can discharge first authority, and asked to obtain second authority, to carry out second test by 22 pairs first elements of signal transceiver 51 to instrument driver module 20.When first main frame 31 was obtained second authority, first main frame, 31 controls, first element, 51 outputs, first test data was to signal transceiver 22.Signal transceiver 22 according to the signal reception result exporting first data as a result, first main frame 31 according to first as a result data determine the whether normally operation of first element 51.When first main frame 31 after second test is finished, discharge second authority, instrument driver module 20 is control handling module 70 removals first elements 51.
In like manner, instrument driver module 20 is that control handling module 70 loads second element 52 in second carrier 42.Second main frame 41 can be loaded by detecting second element 52, to take out one second program to set the running parameter of second element from instrument driver module 20.Then second main frame 41 can send request to obtain first authority, to carry out first test by 21 pairs second elements of power meter 52 to instrument driver module 20.
Learn that from Fig. 3 second main frame 41 is when instrument driver module 20 requests first authority, first main frame 31 remains unfulfilled first test.Instrument driver module 20 can just be given first authority to the second main frame 41 after first main frame 31 discharges first authority.
When second main frame 41 was obtained first authority, second main frame 41 can be exported one second signal to power meter 21 by control second element 52, and power meter 21 can be according to the signal reception result to export one second signal strength data.Instrument driver module 20 according to the second signal strength data provide one second revision program to second main frame 41 revising at least one running parameter of second element, those parameters comprise the combination that second element is exported more than one parameters such as at least one control setting value of second signal, an operating voltage, a working current and a running power.
After first test was finished, second main frame 41 can discharge first authority, and asked to obtain second authority, to carry out second test by 22 pairs first elements of signal transceiver 51 to instrument driver module 20.
In like manner, second main frame 41 is when instrument driver module 20 requests second authority, if first main frame 31 remains unfulfilled second test.Instrument driver module 20 is just given second authority to the second main frame 41 after can waiting for that first main frame 31 discharges second authority.
When second main frame 41 was obtained second authority, second main frame, 41 controls, second element, 52 outputs, second test data was to signal transceiver 22.Signal transceiver 22 according to the signal reception result exporting second data as a result, second main frame 41 according to second as a result data determine the whether normally operation of second element 52.When second main frame 41 in second the test finish after, discharge second authority.
Otherwise in follow-up relevant operation, when first main frame 31 during to instrument driver module 20 request first authority, second main frame 41 remains unfulfilled first test.Instrument driver module 20 can just be given first authority to the first main frame 31 after second main frame 41 discharges first authority.And when first main frame 31 during to instrument driver module 20 request second authority, if second main frame 41 remains unfulfilled second test.Instrument driver module 20 is just given second authority to the first main frame 31 after can waiting for that second main frame 41 discharges second authority.
Learn that with regard to Fig. 3 when first main frame, 31 controls, first element 51 was carried out second test, then second main frame, 41 controls, second element 52 was carried out first test to reach executed in parallel; And a three element 53 exists and when being loaded on first carrier 32 of first main frame 31, first main frame 31 is the patterns according to above-mentioned test first element 51, three element 53 is carried out first test and second test.And when first main frame, 31 control three element 53 were carried out first test, then second main frame, 41 controls, second element 52 was carried out second test to reach executed in parallel.
Please be simultaneously with reference to Fig. 3 and shown in Figure 4, Fig. 3 is the test sequence figure of element parallel test system of the present invention, Fig. 4 is an element parallel test method process flow diagram of the present invention, please understand with reference to being beneficial to shown in Fig. 2 A and Fig. 2 B simultaneously.In the present embodiment, the deadline that each component under test is loaded on first carrier 32 or second carrier 42 takes 8 seconds, each component under test is taken 8 seconds by removal in the deadline of first carrier 32 or second carrier 42, the required time of first test is 30.6 seconds, and the required time of second test is 19.6 seconds.This flow process is as described below:
Load one first element 51 in first main frame 31 via instrument driver module 20 control handling modules 70, first main frame 31 to obtain one first authority, carries out one first test (step S110) to utilize 21 pairs first elements of a power meter 51 to 20 requests of instrument driver module.
During from 0 second, instrument driver module 20 control handling modules 70 are loaded into first main frame, 31, the first elements 51 and can be loaded on first carrier 32.In the time of 8 seconds, first element 51 is loaded to be finished, and first main frame 31 is to detect first carrier 32 to be mounted with first element 51, and according to the specification of first element 51, from instrument driver module 20, obtain one first program, to drive, to set and control first element 51.
During from 8 seconds, first main frame 31 sends request to instrument driver module 20, and to ask for first authority, instrument driver module 20 is to judge whether first authority is shared by second main frame 41.When instrument driver module 20 judges that first authority is unoccupied, will give first authority to the first main frame, 31, the first main frames 31 and promptly control first element 51 and carry out first test by power meter 21.
When first main frame 31 was carried out first test, instrument driver module 20 can be asked first authorities (step S120) in second main frame, 41, the second main frames 41 to instrument driver module 20 by synchro control handling module 70 loadings one second element 52.
During 8 seconds to 16 seconds, second element 52 can be loaded on second carrier, 42, the second main frames 41 and detect second carrier 42 when being mounted with second element 52, according to the specification of second element 52, from instrument driver module 20, obtain one second program, to drive, to set and control second element 52.Second main frame 41 can send request to instrument driver module 20 equally, to ask for first authority.But instrument driver module 20 is judged first authority and has given first main frame 31 that promptly first main frame 31 is just being carried out first test, so first authority can not given second main frame 41.
As shown in Figure 3, second element 52 is done and is loaded into second carrier 42, and second main frame 41 sends time from request to instrument driver module 20 is after 8 seconds (in the present embodiment, second element 52 was finished loading at 16 seconds), instrument driver module 20 has given first authority first main frame 31 at this moment, therefore can't give second main frame 41 again.Second main frame 41 is not obtained first authority, so uncontrollable second element 52 carries out first test by power meter 21.
When first main frame 41 is finished first when test to first element 51, first main frame 31 discharges first authority and asks to obtain one second authority to instrument driver module 20, to utilize 22 pairs first elements of a signal transceiver 51 to carry out one second test, instrument driver module 20 is to give second main frame, 41 first authorities so that second element 52 is carried out first test, to reach executed in parallel (step S130).
About 38.6 seconds, first main frame 31 is finished first test to first element 51, and first main frame 31 can discharge first authority, and sends request to instrument driver module 20 immediately, to ask for second authority.Instrument driver module 20 can be obtained first authority from first main frame 31, and gives second authority to first main frame 31, and first authority can be given second main frame 41 by instrument driver module 20.First main frame 31 is promptly controlled first element 51 and is carried out one second test by signal transceiver 22 when obtaining second authority.
Second main frame 41 can be obtained first authority (first element 51 is finished the first test back) in the time of about 38.6 seconds, carry out first test to control second element 52 by power meter 21, make second main frame 41 carry out first test and carry out second test with first main frame 31 and reach the executed in parallel state.
When first main frame 31 is finished second when test to first element 51, be to control handling module 70 removals, first element 51 and discharge second authority, then second main frame 41 is in first when test of finishing second element 52, to obtain second authority, carry out second test (step S140) to 20 requests of instrument driver module to utilize 22 pairs second elements of signal transceiver 52.
About 58.2 seconds, first main frame 31 is finished second test to first element 51, and first main frame 31 can discharge second authority.Instrument driver module 20 can control handling modules 70 with first element 51 removal from first carrier 32, first element 51 can be finished by the operation of removal when 66.2 seconds left and right sides.
When 69.2 seconds left and right sides, second main frame 41 is finished first test to second element 52, and discharges first authority.Second main frame 41 can send request to ask for second authority to instrument driver module 20.Yet instrument driver module 20 can be fetched second authority from first main frame 31 in the time of the 58.2nd second, so in the time of the 69.2nd second, give second authority to the second main frame 41.Second main frame 41 is that control second element 52 carries out second test by signal transceiver 22 when obtaining second authority.
When a three element exists, instrument driver module 20 can load a three element 53 to first main frames 20 by control handling module 70, when 41 pairs second elements of second main frame 52 carry out second test, first main frame 31 is tested three element 53 is carried out first to obtain first authority to 20 requests of instrument driver module, to reach executed in parallel (step S150).
As above-mentioned, three element 53 can be loaded in first carrier 32, and three element 53 can be finished the operation that is loaded on first carrier 32 at the 74.2nd second, and first main frame 31 can detect the existence of three element 53.
In this explanation, three element 53 was finished the time point that is loaded about 74.2 seconds, just discharged first authority at second main frame 41, and obtained second authority second element 52 is carried out second test.Therefore, first main frame 31 can be obtained first authority from instrument driver module 20 smoothly, tests to carry out first by power meter 21 to control three element 53.At this moment, first main frame, 31 control three element 53 are carried out first test, carry out second test with second main frame, 41 controls, second element 52, and both reach the executed in parallel state.
Yet, if first element 51 is finished ahead of time by the operation that removal and three element 53 are loaded on first carrier 32, or second the test duration quite in short-term, cause first main frame before 69.2 seconds, to ask first authority to instrument driver module 20, instrument driver module 20 can still carried out first test to second element 52 because of second main frame 41, and can't give first main frame 31 first authorities.Need to wait for that instrument driver module 20 is fetched first authority from second main frame 41 after 69.2 seconds, first main frame 31 could be obtained first authority from instrument driver module 20.
Can reason out by above-mentioned explanation, instrument driver module 20 is when giving first authority and second authority, be that following state possible take place: when (1) first main frame 31 asks first authorities and first authority to offer second main frame 41 to instrument driver module 20, instrument driver module 20 is to wait for that second main frame 41 discharges first authority, provides first authority to first main frame 31 again.When (2) first main frames 31 asked second authorities and second authority to offer second main frame 41 to instrument driver module 20, instrument driver module 20 was to wait for that second main frame 41 discharges second authorities, provides second authority to first main frame 31 again.When (3) second main frames 41 asked first authorities and first authority to offer first main frame 31 to instrument driver module 20, instrument driver module 20 was to wait for that first main frame 31 discharges first authorities, provides first authority to second main frame 41 again.When (4) second main frames 41 asked second authorities and second authority to offer first main frame 31 to instrument driver module 20, instrument driver module 20 was to wait for that first main frame 31 discharges second authorities, provides second authority to second main frame 41 again.
Illustrating further first test and second flow process of testing at this, below is to load first element 51 with first main frame 31, and the situation of second main frame, 41 loadings, second element 52 as an illustration.
As described above, first main frame 31 is according to first driven by program, setting, control first element 51.First main frame 31 is when obtaining first authority, and first main frame 31 is control first element 51 outputs one first signals.First signal can divide high-order signal interface 611 outputs of storage 61 by first signal, and divides the high-order signal interface 631 of storage 63 to be received by the 3rd signal, to pass to power meter 21.Power meter 21 is signal strengths of analyzing first signal, producing one first signal strength data, and transmits the first signal strength data to instrument driver module 20.Instrument driver module 20 is to provide one first revision program to adjust at least one running parameter of first element 51 according to first revision program to first main frame, 31, the first main frames 31 according to the first signal strength data.The running parameter of first element 51 is to be selected from the group that is made up of at least one control setting value, an operating voltage, a working current and a running power of first element, 51 outputs, first signal.
When first main frame 31 was obtained second authority, first main frame 31 was control first element 51 outputs one first test datas.This first test data is low-level signal interface 612 outputs that divide storage 61 by first signal, divides the low-level signal interface 642 of storage 64 to be received by the 4th signal, is passed to signal transceiver 22 again.
As previously mentioned.Signal transceiver 22 is an element master sample, has standardized running parameter and signal receiving/transmission pattern.After signal transceiver 22 received first test data, the reception situation that is about to first test data formed one first data as a result.At this moment, second main frame 41 is the clients (Client) that form first main frame 31, in order to controlling signal transceiver 22.Second main frame 41 can receive this first data as a result, again with first as a result data be back to first main frame, 31, the first main frames 31 promptly according to this first as a result data determine whether 51 runnings of first element normal.So far, first main frame 31 is finished all tests of first element 51.
As described above, second main frame 41 is according to second driven by program, setting, control second element 52.Second main frame 41 is when obtaining first authority, and second main frame 41 is control second element 52 outputs one second signals.Second signal can divide low-level signal interface 622 outputs of storage 62 by second signal, and divides the low-level signal interface 632 of storage 63 to be received by the 3rd signal, to pass to power meter 21.Power meter 21 is signal strengths of analyzing second signal, producing one second signal strength data, and transmits the second signal strength data to instrument driver module 20.Instrument driver module 20 is to provide one second revision program to adjust at least one running parameter of second element 52 according to second revision program to second main frame, 41, the second main frames 41 according to the second signal strength data.The running parameter of second element 52 is to be selected from the group that is made up of at least one control setting value, an operating voltage, a working current and a running power of second element, 52 outputs, first signal.
When second main frame 41 was obtained second authority, second main frame 41 was control second element 52 outputs one second test datas.This second test data is high-order signal interface 621 outputs that divide storage 62 by second signal, divides the high-order signal interface 641 of storage 64 to be received by the 4th signal, is passed to signal transceiver 22 again.
After signal transceiver 22 received second test data, the reception situation that is about to second test data formed one second data as a result.At this moment, first main frame 31 is the clients (Client) that form second main frame 41, in order to controlling signal transceiver 22.First main frame 31 can receive this second data as a result, again with second as a result data be back to second main frame, 41, the second main frames 41 promptly according to this second as a result data determine whether 52 runnings of second element normal.So far, second main frame 41 is finished all tests of second element 52.Below, the follow-up component under test that first main frame 31 and 41 tests of second main frame are loaded, its gimmick is identical with the method for aforementioned first main frame, 31 test first elements 51 and second main frame, 41 tests, second element 52, does not promptly give unnecessary details at this.
Learn following service condition by above-mentioned element parallel test system: (1) first main frame 31 and second main frame 41 can be carried out first test and second test in regular turn; (2) instrument driver module 20 only gives first authority first main frame 31 or second main frame 41 in the time, only second authority is given first main frame 31 or second main frame 41; (3) first main frames and second main frame 41 can not obtained identical authority at one time; (4) after later main frame of test execution time need wait for that the execution time, main frame was early finished test, just can carry out and the performed same test operation of early carrying out of main frame.
Therefore, give method according to the stagger authority of the time that gives of first authority and second authority of instrument driver module 20, the flow process of first main frame 31 and the test of second main frame, 41 executive components can form certain circulation pattern.From Fig. 3, learn, originally be implemented in the 38.6th second after, with 66.2 seconds be a time unit, in each chronomere, first main frame and second main frame 41 can be finished first test and second test once separately.First main frame is carried out the action of second test and the action that second main frame 41 is carried out first test, is to reach executed in parallel; Second main frame 41 is carried out the action of second test and the action that first main frame is carried out first test, is to reach executed in parallel.
In the prior art, the time that component under test is finished takes 66.2 seconds, and two component under test essence deadlines are 132.4 seconds, and four component under test essence deadlines are 264.8 seconds.
By the disclosed element parallel test system of present embodiment, two element tests are finished and are taken 96.8 seconds, than 132.4 seconds, shorten 35 seconds at least.Four element tests are finished and are taken 163 seconds, than 264.8 seconds, shorten 100 seconds at least.Therefore, component under test is many more, can shorten in fact than the general more test duration of element parallel test system.And need not to set up hardware device, effectively reduce the equipment needed thereby cost really, and keep the execution efficient of component under test test to a certain degree.
The above, it only is preferred embodiment of the present invention, be not that the present invention is done any pro forma restriction, though the present invention discloses as above with preferred embodiment, yet be not in order to limit the present invention, any those skilled in the art, in not breaking away from the technical solution of the present invention scope, when the method that can utilize above-mentioned announcement and technology contents are made a little change or be modified to the equivalent embodiment of equivalent variations, in every case be the content that does not break away from technical solution of the present invention, according to technical spirit of the present invention to any simple modification that above embodiment did, equivalent variations and modification all still belong in the scope of technical solution of the present invention.
Claims (10)
1. element parallel test system is characterized in that it comprises:
One power meter;
One signal transceiver;
One handling module;
One first main frame, connect this power meter and this signal transceiver, be that detecting one first element is when being loaded, the request of sending is to obtain one first authority, with by this power meter this first element is carried out and finish one first the test after, discharge this first authority, and the request to obtain one second authority, with by this signal transceiver this first element is carried out and finish one second the test after, discharge this second authority;
One second main frame, connect this power meter and this signal transceiver, be that detecting one second element is when being loaded, the request of sending is to obtain this first authority, with by this power meter this second element is carried out and finish this first the test after, discharge this first authority, and the request to obtain this second authority, with by this signal transceiver this second element is carried out and finish this second the test after, discharge this second authority; And
One instrument driver module, connect this first main frame, this second main frame and this handling module, this instrument driver module is controlled this handling module and is loaded this first element, according to the request of this first main frame to give this first authority, control this handling module simultaneously and load this second element in this second main frame, when this first main frame discharges this first authority, request according to this first main frame and this second main frame, give this first authority synchronously to this second main frame, give this second authority to this first main frame, and after this first main frame discharges this second authority, control this first element of this handling module removal, according to the request of this second main frame, give this second authority simultaneously, when this second main frame discharges this second authority, control this second element of this handling module removal to this second main frame.
2. element parallel test system according to claim 1, it is characterized in that, after wherein this first main frame is finished this second test, this instrument driver module is control handling module this first element of removal and loads a three element in this first main frame, this first main frame is to obtain this first authority to this instrument driver module request, this three element is carried out this first test by this power meter, after this first test is finished, discharge this first authority, and to this instrument driver module request to obtain this second authority, this three element is carried out this second test, after this second test is finished, discharge this second authority by this signal transceiver.
3. element parallel test system according to claim 2, it is characterized in that, wherein this first main frame is when this this first authority of instrument driver module request and this first authority have offered this second main frame, this instrument driver module is to wait for that this second main frame discharges this first authority, provide this first authority to this first main frame again, when this first main frame when this this second authority of instrument driver module request and this second authority have offered this second main frame, this instrument driver module is to wait for that this second main frame discharges this second authority, provide this second authority to this first main frame again, when this second main frame when this this first authority of instrument driver module request and this first authority have offered this first main frame, this instrument driver module is to wait for that this first main frame discharges this first authority, provide this first authority to this second main frame again, when this second main frame when this this second authority of instrument driver module request and this second authority have offered this first main frame, this instrument driver module is to wait for that this first main frame discharges this second authority, provides this second authority to this second main frame again.
4. element parallel test system according to claim 1, it is characterized in that, wherein this instrument driver module comprises a plurality of drivers, and from those drivers, take out the running parameter that one first program gives this this first element of first host setting, and from those drivers, take out the running parameter that one second program gives this this second element of second host setting.
5. element parallel test system according to claim 4, it is characterized in that, when wherein this first main frame is obtained this first authority, this first element of this first host computer control export one first signal to this power meter to export one first signal strength data, this instrument driver module according to this first signal strength data provide one first revision program to this first main frame to revise at least one running parameter of this first element, when this first main frame is obtained this second authority, this first element of this first host computer control export one first test data to this signal transceiver exporting one first data as a result, this first main frame according to this first as a result data determine the whether normally operation of this first element.
6. element parallel test system according to claim 4, it is characterized in that, when wherein this second main frame is obtained this first authority, it is to export one second signal strength data that this second element of this second host computer control is exported one second signal to this power meter, this instrument driver module according to this second signal strength data provide one second revision program to this second main frame to revise at least one running parameter of this second element, when this second main frame is obtained this second authority, it is exporting one second data as a result that this second element of this second host computer control is exported one second test data to this signal transceiver, this second main frame according to this second as a result data determine the whether normally operation of this second element.
7. element parallel test method is characterized in that it comprises:
Control this handling module via this instrument driver module and load one first element in this first main frame, this first main frame to obtain one first authority, carries out one first test to utilize a power meter to this first element to this instrument driver module request;
When this first main frame was carried out this first test, this instrument driver module was controlled this handling module and is loaded one second element in this second main frame, and this second main frame is to this this first authority of instrument driver module request;
When this first main frame is finished this first when test to this first element, this first main frame discharge this first authority and to this instrument driver module request to obtain one second authority, to utilize a signal transceiver that this first element is carried out one second test, this instrument driver module is to give this first authority of this second main frame this second element is carried out this first test, to reach executed in parallel; And
When this first main frame is finished this second when test to this first element, be to control this first element of this handling module removal and discharge this second authority, then this second main frame is in this first when test of finishing this second element, to obtain this second authority, this second element is carried out this second test to this instrument driver module request to utilize this signal transceiver.
8. element parallel test method according to claim 7 is characterized in that, wherein more comprises the following step:
This instrument driver module is to load a three element to this first main frame, when this second main frame carries out this second test to this second element, this first main frame to this instrument driver module request with obtain this first authority with this three element is carried out this first the test, to reach executed in parallel.
9. element parallel test method according to claim 8, it is characterized in that, wherein this first main frame is when this this first authority of instrument driver module request and this first authority have offered this second main frame, this instrument driver module is to wait for that this second main frame discharges this first authority, provide this first authority to this first main frame again, when this first main frame when this this second authority of instrument driver module request and this second authority have offered this second main frame, this instrument driver module is to wait for that this second main frame discharges this second authority, provide this second authority to this first main frame again, when this second main frame when this this first authority of instrument driver module request and this first authority have offered this first main frame, this instrument driver module is to wait for that this first main frame discharges this first authority, provide this first authority to this second main frame again, when this second main frame when this this second authority of instrument driver module request and this second authority have offered this first main frame, this instrument driver module is to wait for that this first main frame discharges this second authority, provides this second authority to this second main frame again.
10. element parallel test method according to claim 7, it is characterized in that, wherein this instrument driver module comprises a plurality of drivers, and from those drivers, take out the running parameter that one first program gives this this first element of first host setting, and from those drivers, take out the running parameter that one second program gives this this second element of second host setting.
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