CN101988947B - Inline element testing system and method thereof - Google Patents
Inline element testing system and method thereof Download PDFInfo
- Publication number
- CN101988947B CN101988947B CN 200910160865 CN200910160865A CN101988947B CN 101988947 B CN101988947 B CN 101988947B CN 200910160865 CN200910160865 CN 200910160865 CN 200910160865 A CN200910160865 A CN 200910160865A CN 101988947 B CN101988947 B CN 101988947B
- Authority
- CN
- China
- Prior art keywords
- test
- testing apparatus
- testing
- instrument driver
- driver module
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
The invention relates to an inline element testing system and a method thereof, wherein the system comprises first testing equipment, second testing equipment, a loading and unloading module and an instrument driving module, wherein the first testing equipment is used for carrying out a first test, and the second testing equipment is used for carrying out a second test; the instrument driving module is used for loading and unloading elements to the first testing equipment and the second testing equipment through the loading and unloading module so as to control the exclusion time of element test of the first testing equipment and the second testing equipment so that the second testing equipment carries out the second test while the first testing equipment carries out the first test, and thus inline test operation on continuous and orderly tested elements is realized.
Description
Technical field
The present invention relates to a kind of test macro and method thereof, particularly relate to a kind of stagger load or the removal element in the time of two testing apparatuss, make two testing apparatuss with inline element testing system and the method thereof of pipeline form executive component test jobs.
Background technology
In prior art, manufacturer carries out a test jobs to each component under test after making component under test.
Please refer to Fig. 1, it is the block diagram of the element test system of prior art, and it is by an instrument driver module 11, a Test Host 12, a power meter (Power Meter; PM) 15 and one signal transceiver 16.Wherein, Test Host 12 connects instrument driver module 11, and sees through coupling mechanism 14 power meter 15 and signal transceiver 16 in succession.Power meter 15 is in order to the signal intensity of the signal (as Radio Frequency Signal, radiofrequency signal) detecting component under test 13 and send and the data stability that signal transmits.
In this explanation, one, signal transceiver 16 finger has signal transmitting and receiving, the modulation of standard, the master sample element of demodulation ability, in order to according to receiving signal, and according to signal transceiver 16 whether can be correct, complete, the wireless signal that sends of modulation or demodulation component under test 13, but the modularity of the signal of test component under test 13 outputs and the transmission usefulness of component under test 13, and the signal reception result is offered Test Host 12, judge whether normally operation of component under test 13 for Test Host 12.
In the system of prior art, first with artificial or mechanical arm clamps component under test 13 to be loaded into a carrier of Test Host 12, be tested chip when (or being called wafer) as component under test 13, carrier is for disposing the testing circuit board of chip pocket (Socket); Also or, when component under test 13 was a tested networking card, carrier was for disposing card slot (Slot).Coupling mechanism 14 first is switched to be communicated with Test Host 12 and power meter 15, and Test Host 12 is obtained a driver with setting component under test 13 from instrument driver module 11, then controls component under test 13 and send a measured signal to power meter 15.
Power meter 15 is analyzed the signal intensity of measured signal to return a signal intensity data to instrument driver module 11, the running parameter of the driver that instrument driver module 11 correction provides to be forming a revision program, then offers the running parameter that Test Host 12 resets component under test 13.
Coupling mechanism 14 is switched to be communicated with Test Host 12 and signal transceiver 16 again, and Test Host 12 is controlled component under test 13 and sent a test data.Signal transceiver 16 receives this test data, and the reception result of test data is returned to Test Host 12.Test Host 12 according to the reception result of obtaining to judge whether normal operation of component under test 13.
Learn with regard to above-mentioned, in prior art, the cover same time of test macro only can be tested a component under test.Manufacturer increases production capacity the short time, how can set up identical test macro, with a plurality of components under test of disposable test.Yet, manufacturer often purchases a cover test macro, is only the element test line of setting up a component under test more, and the structure of the component under test that manufactures is all identical with the testing process that component under test carries out, be that the component under test testing efficiency has promoted, the testing cost that manufacturer pays also promotes relatively.Therefore, how to effectively reduce production cost, with the production capacity that promotes component under test, the problem that should think deeply for manufacturer.
This shows, above-mentioned existing test macro obviously still has inconvenience and defective, and demands urgently further being improved in product structure, method of testing and use.In order to solve the problem of above-mentioned existence, relevant manufacturer there's no one who doesn't or isn't seeks solution painstakingly, but have no for a long time applicable design is completed by development always, and common product and method do not have appropriate structure and method to address the above problem, and this is obviously the problem that the anxious wish of relevant dealer solves.Therefore how to found a kind of new inline element testing system and method thereof, real one of the current important research and development problem that belongs to, also becoming the current industry utmost point needs improved target.
Summary of the invention
The object of the invention is to, overcome the defective that existing element test system exists, and a kind of new inline element testing system and method thereof are provided, technical matters to be solved is to make it can reduce equipment cost, and keeps certain component under test testing efficiency.
The object of the invention to solve the technical problems realizes by the following technical solutions.According to a kind of inline element testing system that the present invention proposes, it comprises: one first testing apparatus, and test in order to carry out one first, and export one first trigger pip when this first test is completed; One second testing apparatus is in order to carry out one second test; One handling module; An and instrument driver module, to control this handling module to load one first element in this first testing apparatus, this first element is carried out this first test, and this instrument driver module is when obtaining this first trigger pip, controlling this handling module unloads this first element divided by being loaded into this second testing apparatus from this first testing apparatus, with this first element is carried out this second the test, and load one second element in this first testing apparatus with this second element is carried out this first the test.
The object of the invention to solve the technical problems also can be applied to the following technical measures to achieve further.
Aforesaid inline element testing system, wherein when this second testing apparatus was carried out this second test to this first element, this first testing apparatus was carried out this first test to this second element, to reach parallel execution.
Aforesaid inline element testing system, when wherein said the second testing apparatus is completed this second test of this first element, be to send one second trigger pip, this instrument driver module is to control this handling module from this this first element of the second testing apparatus removal.
Aforesaid inline element testing system, wherein said instrument driver module judge this first testing apparatus complete to this second element this first the test, and when this second testing apparatus is not completed this second test of this first element, that this second testing apparatus of wait is completed this second test to this first element, controlling this first element of this handling module removal, then control this handling module from this this second element of the first testing apparatus removal and be loaded into this second testing apparatus.
Aforesaid inline element testing system, wherein said instrument driver module is to load a three element in this first testing apparatus, when this second testing apparatus is carried out this second test to this second element, this first testing apparatus is carried out this first test to this three element, to reach parallel execution.
Aforesaid inline element testing system, wherein said instrument driver module comprises a plurality of drivers, and taking-up one program gives this first testing apparatus from described a plurality of drivers, sets the running parameter of this first element that loads or the running parameter of this second element that setting is loaded for this first testing apparatus.
aforesaid inline element testing system, wherein said this first testing apparatus comprises: one first main frame, connect this instrument driver module, control this first element output one first signal when loading this first element, and adjust at least one running parameter of this first element and output when obtaining first revision program to this first trigger pip that should the first element, and control this second element and export a secondary signal when loading this second element, and adjust at least one running parameter of this second element and output when obtaining second revision program to this first trigger pip that should the second element, an and power meter, analyze this first signal to export a first signal intensity data, this instrument driver module is given this first main frame according to this this first revision program of first signal intensity offering of materials, and analyze this secondary signal to export a secondary signal intensity data, this instrument driver module is given this first main frame according to this this second revision program of secondary signal intensity offering of materials.
Aforesaid inline element testing system, at least one running parameter of this of wherein said the first element is selected from by this first element and exports at least one control setting value, an operating voltage, a working current of this first signal and the group that a running power forms, and this at least one running parameter of this second element is selected from least one control setting value, an operating voltage, a working current and of exporting this secondary signal by this second element and operates the group that power forms.
aforesaid inline element testing system, wherein said the second testing apparatus comprises: one second main frame, connect this first main frame, obtain this at least one running parameter of this first element and control this first element output one first test data from this first main frame when loading this first element, and obtain this at least one running parameter of this second element and control this second element output one second test data from this first main frame when loading this second element, and obtain one first and determine whether this first element operates normally during data as a result, with obtain one second and determine whether this second element operates normally during data as a result, and a signal transceiver, receive this first test data with export this first as a result data to this second main frame, and receive this second test data with export this second as a result data to this second main frame.
The object of the invention to solve the technical problems also realizes by the following technical solutions.A kind of inline element testing method according to the present invention's proposition, to use an inline element testing system, this inline element testing system comprises an instrument control module, a handling module, one first testing apparatus and one second testing apparatus, and this inline element testing method comprises the following steps: control this handling module via this instrument driver module and load one first element in this first testing apparatus; After this first testing apparatus is carried out one first test to this first element, output one first trigger pip; When this instrument driver module is obtained this first trigger pip, control this first element of this handling module removal and be loaded into this second testing apparatus and carry out one second test, and load one second element and carry out this first test in this first testing apparatus; And when this second testing apparatus was carried out this second test to this first element, this first testing apparatus was carried out this first test to this second element, to reach parallel execution.
The object of the invention to solve the technical problems also can be applied to the following technical measures to achieve further.
Aforesaid inline element testing method wherein also comprises following steps: this second testing apparatus is output one second trigger pip after completing this first element being carried out this second test; And when obtaining this second trigger pip via this instrument driver module, control this handling module from this this first element of the second testing apparatus removal.
Aforesaid inline element testing method wherein also comprises following steps: after this first testing apparatus was carried out this first test to this second element, output was to this first trigger pip that should the second element;
Obtain this first trigger pip that should the second element when this instrument driver module, judge whether to obtain to this second trigger pip that should the first element; When this instrument driver module is obtained this first trigger pip that should the second element but do not obtained this second trigger pip that should the first element, be to return to this to judge whether to obtain step to this second trigger pip that should the first element; And when this instrument driver module is obtained this first trigger pip that should the second element and obtained this second trigger pip that should the first element, be control this handling module from this this second element of the first testing apparatus removal and be loaded into this second testing apparatus.
Aforesaid inline element testing method wherein also comprises following steps: via this second testing apparatus, this second element is carried out this second test; Control this handling module loading one three element to this first testing apparatus via this instrument driver module and carry out this first test; And via this first testing apparatus, this three element is carried out this first when test, this second testing apparatus is carried out this to this second element and second is tested to reach parallel execution.
Aforesaid inline element testing method, this step that wherein said the first testing apparatus is carried out this first test to this first element comprises: obtain one first program from this instrument driver module; According to this first element output one first signal of this first programmed control; Utilize a power meter to analyze this first signal to export a first signal intensity data to this instrument driver module, this instrument driver module produces one first revision program according to this first signal intensity data; And obtain this first revision program to set at least one running parameter of this first element from this instrument driver module.
Aforesaid inline element testing method, this step that wherein said the second testing apparatus is carried out this second test to this first element comprises: this at least one running parameter of obtaining this first element from this first testing apparatus; Control this first element output one first test data; Utilize a signal transceiver to receive this first test data to produce one first data as a result; And according to this first as a result data determine whether this first element operates normally.
Aforesaid inline element testing method, the running parameter of wherein said the first element are selected from by this first element and export at least one control setting value, an operating voltage, a working current of this first signal and the group that a running power forms.
Aforesaid inline element testing method, this step that wherein said the first testing apparatus is carried out this first test to this second element comprises: obtain one second program from this instrument driver module; According to this second element output one secondary signal of this second programmed control; Analyze this secondary signal to export a secondary signal intensity data to this instrument driver module, this instrument driver module produces one second revision program according to this secondary signal intensity data; And obtain this second revision program to set at least one running parameter of this second element from this instrument driver module.
Aforesaid inline element testing method, this step that wherein said the second testing apparatus is carried out this second test to this second element comprises: this at least one running parameter of obtaining this second element from this first testing apparatus; Control this second element output one second test data; Utilize a signal transceiver to receive this second test data to produce one second data as a result; And whether operate normally according to this this second element of the second analysis as a result.
Aforesaid inline element testing method, the running parameter of wherein said the second element are selected from least one control setting value, an operating voltage, a working current and a running group that power formed that is exported this secondary signal by this second element.
The present invention compared with prior art has obvious advantage and beneficial effect.By technique scheme, inline element testing system of the present invention and method thereof have following advantages and beneficial effect at least: the disclosed inline element testing system of the present invention and method, the first testing apparatus is carried out the time of the first test, and the time of carrying out the second test with the second testing apparatus forms parallel or synchronous.Therefore can test simultaneously the second test of n element and the first test of n+1 element by an inline element testing system within the time, with effective reduction equipment needed thereby, and the execution efficient of lifting component under test test.
Above-mentioned explanation is only the general introduction of technical solution of the present invention, for can clearer understanding technological means of the present invention, and can be implemented according to the content of instructions, and for above and other purpose of the present invention, feature and advantage can be become apparent, below especially exemplified by preferred embodiment, and the cooperation accompanying drawing, be described in detail as follows.
Description of drawings
It is the block diagram of the element test system of prior art with Fig. 1.
It is the configuration diagram of inline element testing system preferred embodiment of the present invention with Fig. 2 A.
It is the block diagram of inline element testing system preferred embodiment of the present invention with Fig. 2 B.
It is the element loading and unloading schematic diagram of inline element testing system preferred embodiment of the present invention with Fig. 2 C.
It is the parallel testing block diagram of inline element testing system preferred embodiment of the present invention with Fig. 2 D.
Fig. 3 is the process flow diagram of inline element testing method of the present invention preferred embodiment.
Fig. 4 A is a sequential chart of inline element testing flow implementation example of the present invention.
Fig. 4 B is another sequential chart of inline element testing flow implementation example of the present invention.
Fig. 5 A is the second testing apparatus loading and unloading element decision flow chart in inline element testing method of the present invention.
Fig. 5 B is the first testing apparatus loading and unloading element decision flow chart in inline element testing method of the present invention.
Fig. 6 is the schematic flow sheet of the test of first in inline element testing method of the present invention.
Fig. 7 is the schematic flow sheet of the test of second in inline element testing method of the present invention.
11: instrument driver module 12: Test Host
13: component under test 14: coupling mechanism
15: power meter 16: signal transceiver
20: instrument driver module 21: power meter
22: 31: the first main frames of signal transceiver
41: the second main frames of 32: the first carriers
51: the first elements of 42: the second carriers
53: the three element of 52: the second elements
60: handling module
Embodiment
Reach for further setting forth the present invention technological means and the effect that predetermined goal of the invention is taked, below in conjunction with accompanying drawing and preferred embodiment, inline element testing system and its embodiment of method, structure, step, feature and effect thereof that foundation the present invention is proposed are elaborated.
Please be simultaneously with reference to shown in Fig. 2 A and Fig. 2 B, Fig. 2 A is the configuration diagram of inline element testing system preferred embodiment of the present invention, Fig. 2 B is the block diagram of inline element testing system preferred embodiment of the present invention.The inline element testing system of preferred embodiment of the present invention comprises an instrument driver module 20, a handling module 60, one first testing apparatus and one second testing apparatus.
The first testing apparatus comprises one first main frame 31 and power meter 21, the second testing apparatuss comprise one second main frame 41 and a signal transceiver 22.The first main frame 31 and the second main frame 41 have to load the first carrier 32 and second carrier 42 of component under test (Device Under Test) separately, be tested chip when (or being called wafer) as component under test, the first carrier 32 and the second carrier 42 are for disposing the testing circuit board of chip pocket (Socket); Also or, when component under test was a tested networking card, the first carrier 32 and the second carrier 42 were for disposing card slot (Slot).Power meter 21 is the signal intensities of testing the component under test output signal.
In the present embodiment, the output signal of component under test is radiofrequency signal (Radio FrequencySignal) but not as limit.Signal transceiver 22 refers to one according to the reaction that receives signal and transmitted signal at this, adjust the setup parameter value that is best suited for this test jobs, and carry out according to this setup parameter value the element master sample that signal received and sent operation, it has standardization, near running parameter and the running status of desired quantity, mainly the signal that receives component under test output, but and the signal transmission efficiency of the signal accepting state judgement component under test of component under test output with to the output signal modularity.
Handling module 60 is used for component under test is loaded with removal at the first carrier 32 and the second carrier 42.Handling module 60 can configure different structure types according to the form of component under test, when being a tested chip as component under test, handling module 60 can be the vacuum type sucker to attract tested chip; Also or, when component under test was a tested networking card, handling module 60 can be the mechanical arm with gripping object ability of immigrants, with clamping tested networking card, in the present embodiment, handling module 60 is that mechanical arm describes.
As Fig. 2 A and Fig. 2 B, instrument driver module 20 is to control handling module 60 one first element 51 is loaded into the first carrier 32 that the first main frame 31 connects.When first main frame 31 detecting the first elements 51 have been loaded, can obtain one first program to drive, to set and to control the first element 51 from instrument driver module 20.
The first main frame 31 is to control the first element 51 to send a first signal, this first signal is received by power meter 21, power meter 21 is signal intensities of analyzing first signal, and producing a first signal intensity data, and transmission first signal intensity data is to instrument driver module 20.Instrument driver module 20 is to adjust at least one running parameter of the first element 51 according to the first revision program to the first main frame 31, the first main frames 31 according to first signal intensity offering of materials one first revision program.The running parameter of the first element 51 is that at least one control setting value, an operating voltage, the working current and that are selected from by the first element 51 output first signals operate the group that power forms.
Please be simultaneously with reference to Fig. 2 C and Fig. 2 D, Fig. 2 C is the element loading and unloading schematic diagram of inline element testing system preferred embodiment of the present invention, Fig. 2 D is the parallel testing block diagram of inline element testing system preferred embodiment of the present invention.When first main frame 31 judgement the first elements 51 have been completed the first test, be that output one first trigger pip is to instrument driver module 20.It is tested that instrument driver module 20 is that judgement the first element 51 has been completed, controlling handling module 60 from first testing apparatus removal the first element 51 and to be loaded into the second testing apparatus, and loads one second element 52 in the first testing apparatus.Further illustrating, is namely that instrument driver module 20 is controlled handling modules 60 from first carrier 32 removal the first elements 51, loading the first element 51 in the second carrier 42, and loads the second element 52 in the first carrier 32.
When second main frame 41 detecting the first elements 51 had been loaded, the second main frame 41 was to obtain the running parameter of the first element 51 from the first main frame 31, to control the first element 51 output one first test datas.
This first test data is received by signal transceiver 22, as previously mentioned.Signal transceiver 22 is an element master sample, has standardized running parameter and signal transmitting and receiving pattern.After signal transceiver 22 receives the first test data, the soon reception result of the first test data formation one first is data as a result, this first as a result data can be transferred into the first main frame 31, and transfer to the second main frame 41 by the first main frame 31, the second main frame 41 namely according to this first as a result data determine whether the first element 51 running normal, namely complete the second testing apparatus to the second test of the first element 51.When the second testing apparatus was completed the second test of the first element 51, the second main frame was to send one second trigger pip to instrument driver module 20, and instrument driver module 20 can be from second carrier 42 removal the first elements 51.So far complete the global test of test the first element 51.
When the second testing apparatus is carried out the second test period to the first element 51, the first main frame 31 is detecting second elements 52 when being loaded on the first carrier 32, and the first main frame 31 can be obtained one second program to drive, to set and control the second element 52 from instrument driver module 20.In this explanation, in the present embodiment, the first element 51 and the second element 52 are components under test of same architecture, function, are identical therefore instrument driver module 20 provides the first program with the second program.
The first main frame 31 is to control the second element 52 to send a secondary signal, this secondary signal is received by power meter 21, power meter 21 is signal intensities of analyzing secondary signal, and producing a secondary signal intensity data, and transmission secondary signal intensity data is to instrument driver module 20.Instrument driver module 20 is to adjust at least one running parameter of the second element 52 according to the second revision program to the first main frame 31, the first main frames 31 according to secondary signal intensity offering of materials one second revision program.The running parameter of the second element 52 is to be selected from the group that is comprised of in order at least one control setting value, an operating voltage, a working current and a running power of exporting secondary signal the first element 51.
After the first main frame 31 is completed the first test to the second element 52, namely send the first trigger pip of corresponding the second element 52.Instrument driver module 20 is to control handling module 60 from first testing apparatus removal the second element 52, and is loaded into the second testing apparatus.When a three element 53 exists, instrument driver module 20 is to load three element 53 in the first testing apparatus, the second testing apparatus can be carried out the second test to the second element 52, the first testing apparatus is carried out the first test to three element 53, tests with the first test and second of the second element 52 of reaching parallel execution three element 53.
in this hypothesis, the time of the second test is when longer than the time of the first test, complete when instrument driver module 20 judgement the first testing apparatuss first of the second element 52 is tested, when the second testing apparatus is not completed the second test of the first element 51 (obtain the first trigger pip but do not obtain the second trigger pip), instrument driver module 20 meeting wait the second testing apparatuss are completed the second test (namely obtaining the second trigger pip) to the first element 51, to control handling module 60 removal the first elements 51, control again handling module 60 from first testing apparatus removal the second element 52 and be loaded into the second testing apparatus.
In like manner, when instrument driver module 20 judgement the first testing apparatuss are completed three-element the first test, and when the second testing apparatus is not completed the second test of the second element 52 (obtain the first trigger pip but do not obtain the second trigger pip), instrument driver module 20 meeting wait the second testing apparatuss are completed the second test (namely obtaining the second trigger pip) to the second element 52, with control handling module 60 removal the second elements 52, then control handling module 60 from the first testing apparatus removal three element 53 and be loaded into the second testing apparatus.
Learn thus, instrument driver module 20 judgement the first testing apparatuss have been completed the first test, but the second testing apparatus is still when carrying out the second test, need to wait for that the second test is completed carries out the operation of element removal again.
Opposite hypothesis, the time of the second test is shorter than the time of the first test.When instrument driver module 20 judgement the second testing apparatuss were completed the second test to the first element 51, instrument driver module 20 can be controlled handling module 60 removal the first elements 51.The first testing apparatus is completed when first of the second element 52 is tested, the second testing apparatus has been completed the second test to the first element 51, instrument driver module 20 can after the first element 51 be completed removal, be controlled handling module 60 from first testing apparatus removal the second element 52 and be loaded into the second testing apparatus.
In like manner, when instrument driver module 20 judgement the second testing apparatuss were completed the second test to the second element 52, instrument driver module 20 can be controlled handling module 60 removal the second elements 52.The first testing apparatus is completed when first of three element 53 is tested, the second testing apparatus has been completed the second test to the second element 52, instrument driver module 20 can after the second element 52 be completed removal, be controlled handling module 60 from the first testing apparatus removal three element 53 and be loaded into the second testing apparatus.
So far learn, the second testing apparatus is carried out the action of the second test, carry out the first action of testing with the first testing apparatus, to form parallel execution, within the time, simultaneously the testing element of two consecutive orders is carried out different test events by an inline element testing system, with effective reduction equipment needed thereby, and keep the execution efficient that component under test is to a certain degree tested.
Please refer to Fig. 3, it is for the process flow diagram of inline element testing method of the present invention preferred embodiment, please be beneficial to understand with reference to Fig. 4 A or Fig. 4 B simultaneously, Fig. 4 A is an example of the inline element testing flow process sequential chart of the embodiment of the present invention, Fig. 4 B is another example of the inline element testing flow process sequential chart of the embodiment of the present invention, and in Fig. 4 A, the time of the first test is higher than the execution time of the second test, in Fig. 4 B, the time of the first test is lower than the execution time of the second test.Inline element testing flow process shown in Figure 3 is to be applied to the inline element testing system shown in Fig. 2 A and Fig. 2 B.This inline element testing method comprises:
Control handling module 60 via instrument driver module 20 and load one first element 51 in the first testing apparatus (step S110).
In the present embodiment, the flow gauge that is subjected to each element is divided into several operations.Suppose that the time that handling module loads component under test to the first testing apparatus is 8 seconds, from time of the second testing apparatus removal component under test be also 8 seconds, component under test is all 8 seconds from the first testing apparatus removal and time of being loaded into the second testing apparatus.In Fig. 4 A, the time that the first testing apparatus is carried out the first test is 32.8 seconds, and the time that the second testing apparatus is carried out the second test is 21.2 seconds.In Fig. 4 B, the time that the first testing apparatus is carried out the first test is 21.2 seconds, and the time that the second testing apparatus is carried out the second test is 32.8 seconds.
As Fig. 4 A and Fig. 4 B, during from 0 second, instrument driver module 20 is to control handling module 60 to load the first carrier 32 that the first element 51 to first main frames 31 connect, and completes the loading operation of the first element 51 about 8 seconds.Yet more accurate for making the activity duration, the first main frame 31 can be in detecting arbitrary component under test when being loaded on the first carrier 32, and output one first alert signal prompting instrument driver module 20: element has been loaded and has completed.
After the first testing apparatus is carried out one first test to the first element 51, output one first trigger pip (step S120).
Shown in Fig. 4 A and Fig. 4 B, the first main frame 31 can in the time of 8 seconds, begin the first test to the first element 51.The first main frame 31 can be informed the specification of the first element 51 that instrument driver module 20 loads, the first program that provides to obtain instrument driver module 20.The first main frame 31 can be according at least one running parameter of first program setting the first element 51, to begin that the first element 51 is carried out the first test.The first main frame 31 can be after the first test be completed, and output the first trigger pip is to instrument driver module 20.
When instrument driver module 20 is obtained the first trigger pip, control handling module removal the first element 51 and be loaded into the second testing apparatus and carry out one second test, and load one second element 52 and carry out this first test (step S130) in the first testing apparatus.
With regard to Fig. 4 A, the first test duration needed the time of 32.8 seconds, so instrument driver module 20 can be obtained the first trigger pip in the time of 40.8 seconds.At this moment, instrument driver module 20 can be controlled handling module 60 connects to load (load) the first element 51 removals (unload) from the first carrier 32 in the second main frame 41 the second carrier 42, then loads the first carrier 32 that one second element 52 connects in the first main frame 31.
With regard to Fig. 4 B, the first test duration needed the time of 21.8 seconds, so instrument driver module 20 can be obtained the first trigger pip in the time of 29.2 seconds.
The second testing apparatus is loaded in the first element and carries out one second test (step S140) when completing.Learn from Fig. 4 A, handling module 60 with the first element 51 from the first carrier 32 removals, and the time that is loaded into the second carrier 42 need 8 seconds.Therefore to complete the time that is loaded into the second carrier 42 be 48.8 seconds to the first element 51, and the second main frame 41 detects the first element 51 and is all 48.8 seconds by the complete time that is loaded into the second carrier 42.Therefore, the second main frame 41 can begin at 48.8 seconds the first element 51 is carried out the second test, and completes at 70.0 seconds.
About 48.8 seconds, instrument driver module 20 can be controlled handling module 60 and load one second elements 52 in the first carrier 32 after the first element 51 loadings be completed immediately, and the second element 52 can be loaded about 56.8 seconds to be completed.
Learn from Fig. 4 B, it is about 37.2 seconds that the first element 51 is completed the time that is loaded into the second carrier 42, is all about 37.2 seconds by the complete time that is loaded into the second carrier 42 and the second main frame 41 detects the first element 51.Therefore, the second main frame 41 can begin at 37.2 seconds the first element 51 is carried out the second test, and completes at 70.0 seconds.
In the time of 37.2 seconds, instrument driver module 20 can be controlled handling module 60 and load one second elements 52 in the first carrier 32 after the first element 51 loadings be completed immediately, and the second element 52 can be loaded at 45.2 seconds to be completed.
Yet more accurate for making the activity duration, the second main frame 41 can be in detecting any component under test when being loaded on the second carrier 42, and output one second alert signal prompting instrument driver module 20 elements have been loaded to be completed.
When the second testing apparatus was carried out one second test to the first element 51, the first testing apparatus was carried out the first test to the second element 52, to reach parallel execution (step S150).
Learn from Fig. 4 A, the second element 52 can be loaded at 56.8 seconds to be completed, and the first testing apparatus can begin at 56.8 seconds test the second element 52 is carried out the first test, and completes at 89.6 seconds.
Learn from Fig. 4 B, the second element 52 can be loaded about 45.2 seconds to be completed, and the first testing apparatus can begin at 45.2 seconds test the second element 52 is carried out the first test, and completes at 66.4 seconds.The second testing apparatus is carried out the action of one second test to the first element 51, the action of the second element 52 being carried out the first test with the first testing apparatus is to form parallel execution.
When execution the second test was completed in the second main frame 41 judgements to the first element 51 after, the second main frame 41 can output one second trigger pips.When instrument driver module 20 was obtained the second trigger pip, instrument driver module 20 was preferentially to control removal module 60 from second testing apparatus removal the first element 51.
Please be simultaneously with reference to Fig. 5 A and Fig. 5 B, Fig. 5 A is the second testing apparatus loading and unloading element process flow diagram of inline element testing method of the present invention preferred embodiment, and Fig. 5 B is the second testing apparatus loading and unloading element process flow diagram of inline element testing method of the present invention preferred embodiment.Cooperative figure 4A and Fig. 4 B are beneficial to understand simultaneously.These loading and unloading operation be by instrument driver module 20 judge execution, the second testing apparatus removal element mode is as shown in Fig. 5 A:
After the second testing apparatus is completed the first element execution one second test, it is output one second trigger pip (step S201).Instrument drives 20 groups of moulds when obtaining this second trigger pip, controls handling module 60 from second testing apparatus removal the first element (step S202).
This two step represents that namely the second testing apparatus informs that instrument driver module 20 completes the second test of the first element 51, please 20 pairs of the first elements 51 of instrument driver module carry out the operation of element removal, namely completes the global test operation of the first element 51.With regard to Fig. 4 A and Fig. 4 B, the second testing apparatus can be asked instrument driver module 20 removal the first elements 51 in the time of 70 seconds, and removal is completed in the time of 78 seconds.
On the other hand, the first testing apparatus removal element mode is as shown in Fig. 5 B:
When instrument driver module 20 is obtained the first trigger pip of corresponding the second element 52, it is the second trigger pip (step S210) that judges whether to obtain corresponding the first element 51.
Obtain the first trigger pip of corresponding the second element 52 when instrument driver module 20, can learn the first testing apparatus completed to the second element 52 first the test, and judge whether first to obtain the second trigger pip of corresponding the first element 51, whether complete the second test to the first element 51 to judge the second testing apparatus.
Obtain the first trigger pip of corresponding the second element 52 when instrument driver module 20, but when not obtaining the second trigger pip of corresponding the first element 51, represent that namely the second testing apparatus do not complete the second test to the first element 51.At this moment, instrument driver module 20 can be to the handling module 60 any steering orders of output, and handling module 60 is to be in to stop situation.Instrument driver module 20 can continue to judge whether to obtain the second trigger pip of corresponding the first element 51.In this explanation, these types are the test duration test macros longer than the test duration of the first test that are applied to the second test.As shown in Figure 4 B, the second element was completed the time of the first test at 66.4 seconds, instrument driver module 20 is not yet obtained the second trigger pip of corresponding the first element 51, therefore can not do any action, until after obtaining the second trigger pip of the first element 51 in 70 seconds, and after the first element 51 is done removal, in the time of namely 78.0 seconds, then controls handling module 60 and load the second element 52 to second testing apparatuss.
When instrument driver module 20 is obtained the first trigger pip of corresponding the second element 52 and has been obtained the second trigger pip of corresponding the first element 51, be control handling module 60 from first testing apparatus removal the second element 52 and be loaded into the second testing apparatus, via the second testing apparatus, the second element 52 carried out the second test (step S220).As Fig. 4 A, when instrument driver module 20 was obtained the second trigger pip of corresponding the first element 51 at 70.0 seconds, represent the second test that the second testing apparatus is carried out before having completed, instrument driver module 20 can be after the element removal operation of completing the second testing apparatus, in the time of namely 89.6 seconds, control handling module 60 with the second element 52 from the first testing apparatus removal and be loaded into the second testing apparatus.
When having a three element to exist, instrument driver module 20 can be controlled handling module 60 and load three element to the first testing apparatus during the second test execution, for the first testing apparatus, three element 53 is carried out the first test (step S230).
Yet when the second testing apparatus was carried out the second test to the second element 52, the first testing apparatus was carried out the action of the first test to three element 53, to reach parallel execution.
Please refer to Fig. 6, it is to describe with the first element 51 at this, but is applicable to respectively be loaded into the component under test of the first testing apparatus for the schematic flow sheet of the first test of inline element testing method of the present invention preferred embodiment.The method comprises:
The first testing apparatus obtains one first program (step S121) from instrument driver module 20, to drive, set and to control the first element 51 by the first program.
The first testing apparatus is controlled the first element 51 output one first signals (step S122).The first main frame 31 after obtaining the first program, is the running parameter according to first program setting the first element 51, and controls the first element 51 output one first signals.
Utilize a power meter 21 to analyze first signal to export a first signal intensity data to instrument driver module 20, instrument driver module 20 is to produce one first revision program (step S123) according to first signal intensity data.
In this explanation, instrument driver module 20 is the optimal operation data with first element 51, instrument driver module 20 can with first signal intensity data therewith the optimal operation data compare, determine the first more suitable running parameter of element 51, adjust the first program according to this running parameter and form the first revision program, then export to the first main frame 31.
The first testing apparatus obtains the first revision program from instrument driver module 20, setting at least one running parameter (step S124) of the first element 51, then adjusts the running parameter of the first element 51 according to the first revision program.
The running parameter of the first element 51 is that at least one control setting value, an operating voltage, the working current and that are selected from by the first element 51 output first signals operate the group that power forms.
Please refer to Fig. 7, it is to describe with the first element 51 at this, but is applicable to respectively be loaded into the component under test of the second testing apparatus for the schematic flow sheet of the second test of inline element testing method of the present invention preferred embodiment.The method comprises:
The second testing apparatus obtains at least one running parameter (step S141) of the first element 51 from the first testing apparatus.The reason that obtains the running parameter of the first element 51 from the first testing apparatus has two, one to be that control parameter that the second main frame 41 can be identical is controlled the first element 51 and carried out work; Another one is, obtains all data of the first element 51 from the first main frame 31, and to carry out data matching ratio pair, the running parameter of avoiding the second main frame 41 to use other component under test is controlled the first element 51.
The second testing apparatus is controlled the first element 51 output one first test datas (step S142).The second main frame 41 is set and control first element 51 output the first test datas according to above-mentioned running parameter.
Utilize a signal transceiver 22 to receive the first test datas to produce one first data (step S143) as a result.As previously mentioned, signal transceiver 22 itself is exactly the element master sample of standard specification, signal transceiver 22 produces the first data as a result according to the reception situation of the first test data when obtaining this first test data, first as a result data can be returned to the second main frame 41.
The second testing apparatus according to first as a result data determine whether the first element 51 operates normal (step S144).The second main frame 41 obtains first as a result during data, its first test data with output can be compared, but to judge that the first element 51 is whether as the element of normal operation.With regard to time flow shown in Fig. 4 A or Fig. 4 B, so far, the total test jobs of the first element 51 is completed, and is completed in 70 seconds.
In like manner, the second element 52 in two the test the following explanations of flow process:
The first testing apparatus obtains one second program from instrument driver module 20, to drive, set and to control the second element 52 by the second program.The first main frame 31 after obtaining the second program, is the running parameter according to second program setting the second element 52, and controls the second element 52 output one secondary signals.
The second testing apparatus obtains the first revision program from instrument driver module 20, setting at least one running parameter of the second element 52, then adjusts the running parameter of the second element 52 according to the second revision program.The running parameter of the second element 52 is that at least one control setting value, an operating voltage, the working current and that are selected from by the second element 52 output secondary signals operate the group that power forms.
After the second element 52 was loaded on the second testing apparatus, the second testing apparatus obtained at least one running parameter of the second element 52 from the first testing apparatus.The second main frame 41 is set and control second element 52 output the second test datas according to above-mentioned running parameter.
The second main frame 41 obtains second as a result during data, its second test data with output can be compared, but to judge that the second element 52 is whether as the element of normal operation.With regard to flow process shown in Fig. 4 A or Fig. 4 B, so far, the total test jobs of the second element 52 is completed, and is completed in 118.8 seconds.
Learn from Fig. 4, instrument driver module 20 is that loading member is interspersed in the time of the first testing apparatus the time that the second testing apparatus is carried out the second test, to be interspersed in from the time of the second testing apparatus removal element the first testing apparatus and carry out the time of the first test, and the time that will shift loading member is interspersed in the neutral gear of time and second time of testing of the first test.
With regard to the present embodiment, the execution time of inline element testing equipment is divided into a plurality of same time units, carry out separately the first test of the first testing apparatus in very first time unit, carry out separately outside the second test of the second testing apparatus with last chronomere.In unit At All Other Times, each chronomere is the first test of synchronous or parallel execution the first testing apparatus and the second test of the second testing apparatus, makes the behavioral test that can complete in fact a plurality of components under test in a chronomere.
With regard to Fig. 4 A, each time interval is about 48.8 seconds.Complete the first element 51 and be loaded into the first testing apparatus in the time of 0 second to 8 seconds, completed the first test of the first element 51 at 8 seconds to 40.8 seconds.And during 40.8 seconds to 48.8 seconds, the first element 51 shifts from the first testing apparatus and is loaded into the second testing apparatus, and at this moment, first chronomere finishes.
48.8 during second, the second testing apparatus began the second test of the first element 51, completed the second test of the first element 51 to 70.0 seconds, and completed the removal of the first element 51 in 78 seconds.The second element 52 can be completed the action that is loaded on the first testing apparatus during 48.8 seconds to 56.8 seconds, the first testing apparatus was to begin in 56.8 seconds the second element 52 is carried out the first test, completed the first test to the second element 52 at 89.6 seconds.And during 89.6 seconds to 97.6 seconds, the second element 52 is to complete to be transferred to be loaded into the second testing apparatus, and at this moment, second chronomere finishes.And second chronomere starts at, and each chronomere meets the first test of above-mentioned parallel execution the first testing apparatus and the second test of the second testing apparatus.
With regard to Fig. 4 B, except first time interval is 37.2 seconds, other the time interval is about 40.8 seconds.Complete the first element 51 and be loaded into the first testing apparatus in the time of 0 second to 8 seconds, completed the first test of the first element 51 at 8 seconds to 29.2 seconds.And during 29.2 seconds to 37.2 seconds, the first element 51 shifts from the first testing apparatus and is loaded into the second testing apparatus, and at this moment, first chronomere finishes.
37.2 during second, the second testing apparatus began the second test of the first element 51, completed the second test of the first element 51 to 70.0 seconds, and completed the removal of the first element 51 in 78 seconds.The second element 52 can be completed the action that is loaded on the first testing apparatus during 37.2 seconds to 45.2 seconds, the first testing apparatus was to begin in 45.2 seconds the second element 52 is carried out the first test, completed the first test to the second element 52 at 66.4 seconds.But the first element was just completed removal at 78.0 seconds, therefore during 78.0 seconds to 86.0 seconds, the second element 52 just can be transferred and be loaded into the second testing apparatus, at this moment, second chronomere finishes.And second chronomere starts at, and each chronomere meets the first test of above-mentioned parallel execution the first testing apparatus and the second test of the second testing apparatus.
Learn from Fig. 4 A and Fig. 4 B, it is 78 seconds that each component under test is completed the tested time, and with two components under test, general element test system needs 156 seconds.And the inline element testing method and system that the present invention discloses, the tested time of two components under test only needs 126.8 seconds, shortens 30 seconds nearly.With four components under test, general element test system needs 316 seconds, and the inline element testing method and system that the present invention discloses, the tested time of four components under test only needs 224.6 seconds, shortens 92 seconds nearly.
Therefore, component under test is more, can shorten in fact than the more test duration of general element test system.And need not to set up hardware device, really effectively reduce the equipment needed thereby cost, and keep the execution efficient of component under test test to a certain degree.
the above, it is only preferred embodiment of the present invention, be not that the present invention is done any pro forma restriction, although the present invention discloses as above with preferred embodiment, yet be not to limit the present invention, any those skilled in the art, within not breaking away from the technical solution of the present invention scope, when the method that can utilize above-mentioned announcement and technology contents are made a little change or be modified to the equivalent embodiment of equivalent variations, in every case be the content that does not break away from technical solution of the present invention, any simple modification that foundation technical spirit of the present invention is done above embodiment, equivalent variations and modification, all still belong in the scope of technical solution of the present invention.
Claims (9)
1. inline element testing system is characterized in that comprising:
One first testing apparatus is tested in order to carry out one first, and exports one first trigger pip when this first test is completed;
One second testing apparatus is in order to carry out one second test;
One handling module; And
one instrument driver module, to control this handling module to load one first element in this first testing apparatus, this first element is carried out this first test, and this instrument driver module is when obtaining this first trigger pip, controlling this handling module unloads this first element divided by being loaded into this second testing apparatus from this first testing apparatus, this first element is carried out this second test, and load one second element in this first testing apparatus with this second element is carried out this first the test, when making this second testing apparatus carry out this second test to this first element, this first testing apparatus is carried out this first test to this second element, to reach parallel execution.
2. inline element testing system according to claim 1, it is characterized in that wherein said the second testing apparatus completes this second when test to this first element, send one second trigger pip, this instrument driver module is to control this handling module from this this first element of the second testing apparatus removal, when judging this first testing apparatus, described instrument driver module completes this first test to this second element, and when this second testing apparatus is not completed this second test of this first element, that this second testing apparatus of wait is completed this second test to this first element, to control this first element of this handling module removal, control again this handling module from this this second element of the first testing apparatus removal and be loaded into this second testing apparatus, described instrument driver module also loads a three element in this first testing apparatus afterwards, when this second testing apparatus is carried out this second test to this second element, this first testing apparatus is carried out this first test to this three element, to reach parallel execution.
3. inline element testing system according to claim 1, it is characterized in that wherein said instrument driver module comprises a plurality of drivers, and taking-up one program gives this first testing apparatus from described a plurality of drivers, sets the running parameter of this first element that loads or the running parameter of this second element that setting is loaded for this first testing apparatus.
4. inline element testing system according to claim 3 is characterized in that wherein said this first testing apparatus comprises:
One first main frame, connect this instrument driver module, control this first element output one first signal when loading this first element, and adjust at least one running parameter of this first element and output when obtaining first revision program to this first trigger pip that should the first element, and control this second element output, one secondary signal when loading this second element, and adjust at least one running parameter of this second element and output when obtaining second revision program to this first trigger pip that should the second element; And
One power meter, analyze this first signal to export a first signal intensity data, this instrument driver module is given this first main frame according to this this first revision program of first signal intensity offering of materials, and analyze this secondary signal to export a secondary signal intensity data, this instrument driver module is given this first main frame according to this this second revision program of secondary signal intensity offering of materials.
5. inline element testing system according to claim 4 is characterized in that wherein said the second testing apparatus comprises:
One second main frame, connect this first main frame, obtain this at least one running parameter of this first element and control this first element output one first test data from this first main frame when loading this first element, and obtain this at least one running parameter of this second element and control this second element output one second test data from this first main frame when loading this second element, and obtain one first and determine whether this first element operates normally during data as a result, and obtain one second and determine whether this second element operates normally during data as a result; And
One signal transceiver, receive this first test data with export this first as a result data to this second main frame, and receive this second test data with export this second as a result data to this second main frame.
6. inline element testing method, to use an inline element testing system, this inline element testing system comprises an instrument driver module, a handling module, one first testing apparatus and one second testing apparatus, it is characterized in that this inline element testing method comprises the following steps:
Control this handling module via this instrument driver module and load one first element in this first testing apparatus;
After this first testing apparatus is carried out one first test to this first element, output one first trigger pip;
When this instrument driver module is obtained this first trigger pip, control this first element of this handling module removal and be loaded into this second testing apparatus and carry out one second test, and load one second element and carry out this first test in this first testing apparatus; And
When this second testing apparatus was carried out this second test to this first element, this first testing apparatus was carried out this first test to this second element, to reach parallel execution.
7. inline element testing method according to claim 6 is characterized in that wherein also comprising following steps:
This second testing apparatus is output one second trigger pip after completing this first element being carried out this second test; And
When obtaining this second trigger pip via this instrument driver module, control this handling module from this this first element of the second testing apparatus removal.
8. inline element testing method according to claim 7 is characterized in that wherein also comprising following steps:
After this first testing apparatus was carried out this first test to this second element, output was to this first trigger pip that should the second element;
Obtain this first trigger pip that should the second element when this instrument driver module, judge whether to obtain to this second trigger pip that should the first element;
When this instrument driver module is obtained this first trigger pip that should the second element but do not obtained this second trigger pip that should the first element, be to return to this to judge whether to obtain step to this second trigger pip that should the first element; And
When this instrument driver module is obtained this first trigger pip that should the second element and obtained this second trigger pip that should the first element, be control this handling module from this this second element of the first testing apparatus removal and be loaded into this second testing apparatus.
9. inline element testing method according to claim 8 is characterized in that wherein also comprising following steps:
Via this second testing apparatus, this second element is carried out this second test;
Control this handling module loading one three element to this first testing apparatus via this instrument driver module and carry out this first test; And
Via this first testing apparatus, this three element is carried out this first when test, this second testing apparatus is carried out this to this second element and second is tested to reach parallel execution.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200910160865 CN101988947B (en) | 2009-07-29 | 2009-07-29 | Inline element testing system and method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200910160865 CN101988947B (en) | 2009-07-29 | 2009-07-29 | Inline element testing system and method thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101988947A CN101988947A (en) | 2011-03-23 |
| CN101988947B true CN101988947B (en) | 2013-06-19 |
Family
ID=43745596
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200910160865 Expired - Fee Related CN101988947B (en) | 2009-07-29 | 2009-07-29 | Inline element testing system and method thereof |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN101988947B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2013129872A1 (en) * | 2012-02-29 | 2013-09-06 | (주)제이티 | Apparatus for testing elements |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1848712A (en) * | 2005-04-11 | 2006-10-18 | 智易科技股份有限公司 | Testing system and testing method for radio apparatus |
| CN101234382A (en) * | 2007-02-01 | 2008-08-06 | 未来产业 | System for sorting packaged chips and method for sorting packaged chips |
| CN101435853A (en) * | 2007-11-16 | 2009-05-20 | 普诚科技股份有限公司 | Test system |
-
2009
- 2009-07-29 CN CN 200910160865 patent/CN101988947B/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1848712A (en) * | 2005-04-11 | 2006-10-18 | 智易科技股份有限公司 | Testing system and testing method for radio apparatus |
| CN101234382A (en) * | 2007-02-01 | 2008-08-06 | 未来产业 | System for sorting packaged chips and method for sorting packaged chips |
| CN101435853A (en) * | 2007-11-16 | 2009-05-20 | 普诚科技股份有限公司 | Test system |
Non-Patent Citations (1)
| Title |
|---|
| JP特开2000-90692A 2000.03.31 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101988947A (en) | 2011-03-23 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR100629412B1 (en) | Device test apparatus and test method | |
| CN104169885A (en) | Circuit for monitoring abnormalities in ecu | |
| CN101968527A (en) | System-level encapsulation device batch test method and device batch test system thereof | |
| CN101988947B (en) | Inline element testing system and method thereof | |
| CN101943731B (en) | Element test system and method | |
| CN112435937B (en) | Automatic control system and method for wafer test | |
| CN115128429A (en) | Chip testing system and testing method thereof | |
| US8797046B2 (en) | Method of sharing a test resource at a plurality of test sites, automated test equipment, handler for loading and unloading devices to be tested and test system | |
| CN203813796U (en) | Testing apparatus for micro-power wireless communication module | |
| CN109104682A (en) | A kind of automobile audio multithread testing method and test macro | |
| CN1987509A (en) | Power detecting system and method | |
| CN111766836A (en) | Smart manufacturing method and system | |
| CN102759648B (en) | Method and system for testing power panel | |
| CN108627195A (en) | A kind of intelligent detecting method and intelligent checking system that memory body module is detected | |
| CN216117842U (en) | Automatic test platform for testing functions of electric control assembly of driver | |
| CN105301422A (en) | Board-level TPMS emission module batch testing system and testing method thereof | |
| JP2010537448A (en) | Wafer boat for semiconductor testing | |
| CN101988948B (en) | Member parallel test system and test method thereof | |
| CN103560841A (en) | Radio frequency circuit testing system and method | |
| CN100592097C (en) | IC with on-board characterization unit | |
| CN221078823U (en) | Automatic test fixture system of intelligent key | |
| KR100884573B1 (en) | Aging system for back light lamp of lcd | |
| CN114408461B (en) | Wireless remote control pushing mechanism control method, device and system | |
| CN114509656B (en) | Intelligent detection system for IGBT driving single board | |
| KR20070012967A (en) | Data processing method of semiconductor test equipments |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| ASS | Succession or assignment of patent right |
Owner name: ACCTON WIRELESS BROADBAND CORP. Free format text: FORMER OWNER: AICONN TECHNOLOGY CORPORATION Effective date: 20110614 |
|
| C41 | Transfer of patent application or patent right or utility model | ||
| COR | Change of bibliographic data |
Free format text: CORRECT: ADDRESS; FROM: TAIPEI CITY, TAIWAN, CHINA TO: NO. 1, YANXIN 3RD ROAD, HSINCHU SCIENCE INDUSTRIAL ZONE, TAIWAN, CHINA |
|
| TA01 | Transfer of patent application right |
Effective date of registration: 20110614 Address after: Chinese Taiwan Hsinchu City Science Park research three road No. 1 Applicant after: Aiconn Science & Technology Co., Ltd. Address before: Taipei City, Taiwan, China Applicant before: Aiconn Science & Technology Co., Ltd. |
|
| ASS | Succession or assignment of patent right |
Owner name: ZHIBANG SCIENCE AND TECHNOLOGY CO., LTD Free format text: FORMER OWNER: ACCTON WIRELESS BROADBAND CORP. Effective date: 20121227 |
|
| C41 | Transfer of patent application or patent right or utility model | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20121227 Address after: Chinese Taiwan Hsinchu City Science Park research three road No. 1 Applicant after: Accton Technology Corporation Address before: Chinese Taiwan Hsinchu City Science Park research three road No. 1 Applicant before: Aiconn Science & Technology Co., Ltd. |
|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130619 Termination date: 20150729 |
|
| EXPY | Termination of patent right or utility model |