CN101975557B - Ceramic plate detection equipment and detection method - Google Patents
Ceramic plate detection equipment and detection method Download PDFInfo
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- CN101975557B CN101975557B CN201010272220A CN201010272220A CN101975557B CN 101975557 B CN101975557 B CN 101975557B CN 201010272220 A CN201010272220 A CN 201010272220A CN 201010272220 A CN201010272220 A CN 201010272220A CN 101975557 B CN101975557 B CN 101975557B
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Abstract
The invention relates ceramic plate detection equipment and detection method thereof, which can rapidly and accurately detect the technical parameters of a ceramic plate to be detected and can mark the ceramic plate according to the detection result. The ceramic plate detection equipment comprises a conveying mechanism and a support, wherein the conveying mechanism is positioned in the support; four sides of the support, which are arranged above the conveying mechanism are respectively provided with a linear laser transmitter with adjustable angle, the linear laser lines obliquely transmitted by the linear laser transmitters from top to down form a rectangular linear laser frame on the conveying surface of the conveying mechanism; the four angles of the upper part of the support and the conveying mechanism are respectively provided with an ultra high-resolution industrial camera the signal output end of which is connected with the signal input end of a computer. The invention has the following advantages: 1, the diction process is simple and fast, the detection is accurate and the detection efficiency is high; and 2, the structure is simple, the equipment has the function of automatically identifying marks so as to effectively prevent artificial sorting errors.
Description
Technical field
The present invention relates to a kind ofly can either accurate detection go out seized ceramic wafer technical parameter, can carry out ceramic wafer checkout equipment and the detection method that mark is handled to ceramic wafer according to testing result again, belong to ceramic wafer checkout equipment manufacturing technology field.
Background technology
CN101169452A, name are called " ceramic tile quality detection method and equipment ".It comprises transport, data collector, data transmission dress, pause device and the data processing equipment that is arranged on the frame; The pause device is made up of preceding floater guide block detent mechanism, back floater guide block detent mechanism, centering body, dome brick mechanism, upper limit mechanism, optoelectronic switch support, and the pause device is the CS that sensor is controlled or manually controlled or the programmed control transport moves; The detector of data collector is installed on the detector frame, and the both sides of detector are provided with the power supply tube respectively.Its testing process is: measured object is transported on the detection position of checkout equipment; The pause device starts floater guide block mechanism and earlier measured object is blocked; Centering body is with measured object centering location, and lifting table rises the measured object ceramic tile and moves to the position that limit for height mechanism sets, and measured object is paused carry out data acquisition; After image data finishes; Blocking mechanism is removed and is blocked measured object, and general who has surrendered's measured object is put back into and is transported to later process on the transport under the lifting table, and data transmission device is handled the data delivery that collects and the display process result to data processing equipment.Its weak point: 1, testing process is complicated, and efficient is lower; 2, detection method is advanced inadequately, make detect stable inadequately with accurately; 3, detect good product needed manual sort, increased manpower; 4, complex structure, manufacturing cost is high, and breaks down easily.
Summary of the invention
Purpose of design: avoid the weak point in the background technology, it is simple, accurate, quick, efficient to design a kind of testing process, and can carry out ceramic wafer checkout equipment and the detection method that mark is handled to the ceramic wafer product according to testing result.
Design proposal: to achieve these goals.1, the centre of ladder frame cross bar is provided with the design of generating laser, is one of technical characterictic of the present invention.The purpose of doing like this is: because generating laser can go out laser in the edge illumination of tested ceramic wafer; If ceramic wafer is smooth; Laser rays will be straight, do not have certain angularity or lack problems such as limit, unfilled corner, drum limit with regard to the explanation ceramic wafer if laser is straight.2, the design of backlight luminous board is two of a technical characterictic of the present invention.The purpose of doing like this is: through the irradiation of backlight luminous board to the ceramic wafer edge, can demonstrate the edge contour of ceramic wafer, finally handle drawing the length at ceramic wafer edge and the angle between the adjacent side through analytical calculation.3, prismatoid upper end camera installing plate is provided with the design of industrial camera, is three of technical characterictic of the present invention.The purpose of doing like this is: can the image taking storage of ceramic wafer be transferred to computer system with image then automatically through industrial camera, through computer system image be carried out analyzing and processing.4, the design of carriage one side marking pen is four of a technical characterictic of the present invention.The purpose of doing like this is: because marking pen divides the marking pen of two kinds of different colours; Detect the ceramic wafer of accomplishing; Data according to analytical calculation draws are carried out mark to ceramic wafer; The color line of up-to-standard a kind of appointment of mark, the color line of the another kind of appointment of underproof mark has so just made things convenient for the classification of product quality.5, the design of test side detection probe and mark end detection probe is five of a technical characterictic of the present invention.The purpose of doing like this is: the detection through test side detection probe and mark end detection probe can position tested ceramic wafer, and servomotor stops operating, and makes tested ceramic wafer stop motion, and respectively tested ceramic wafer is detected and marking operation.6, the outside of conveying belt is provided with the design of backplate, is six of technical characterictic of the present invention.The purpose of doing like this is: backplate can prevent that tested ceramic wafer from dropping in the process of carrying, and has certain guide effect.7, the first half of prismatoid is coated with the design of case, is seven of technical characterictic of the present invention.The purpose of doing like this is: because case enveloped the test section, can prevent that therefore dust from falling on the backlight luminous board, avoid light-source brightness to be affected, guarantee the accuracy of testing result.8, the left and right sides, top of case is provided with the design of exhaust fan, is eight of technical characterictic of the present invention.The purpose of doing like this is: can produce certain heat during owing to backlight luminous board work; The hot-fluid that produces can influence the exposure pathways of laser; Thereby influence the accuracy of testing result, can heat discharge be gone out, guaranteed the accuracy of testing result through exhaust fan.
Technical scheme 1: ceramic wafer checkout equipment; It comprises conveying mechanism and support; The said conveying mechanism that is provided with is positioned at support; Four limits that are positioned at conveying mechanism top support are respectively equipped with linear laser transmitter and adjustable angle, and the linear laser line of linear laser transmitter oblique fire from top to bottom forms rectangle linear laser frame on the conveyor surface of conveying mechanism; The cantilever tip installing plate is provided with four ultrahigh resolution industrial cameras and over against four jiaos of tested ceramic wafers, ultrahigh resolution industrial camera signal output part is connected with the Computer signal input end.
Technical scheme 2: a kind of ceramic wafer detection method; (1) optical detection that is positioned at streamline one side is popped one's head in; After detecting the ceramic wafer arrival; Stop to carry through controller instruction conveying mechanism, the shared area of four backlight luminous boards is greater than the area of ceramic wafer to be detected, and the illumination of therefore locating four backlight luminous boards projections under the ceramic wafer is mapped to the ceramic wafer edge; The profile that manifests ceramic wafer; The ceramic wafer that four ultrahigh resolution industrial cameras directly over be arranged in this moment set off flicker free planar backlight source is immediately taken pictures and is inputed to computing machine and deposits figure, after quick graph image analytical calculation is handled through computer software, draws the angle of the ceramic wafer four limit length of sides and formation; (2) be positioned at the linear laser line irradiation ceramic plate edge that four linear laser transmitters of ceramic wafer oblique upper are launched; Four ultrahigh resolution industrial cameras are taken pictures and the standard picture that is input to once more in the computing machine with built-in computer compares; Calculate the ceramic plate angularity; Whether have edge lack drum corner phenomenon, and through the marking pen on two groups of cylinders, respectively qualified and underproof product is marked if drawing.
The present invention compares with background technology, and the one, testing process is simple and direct, detects accurately, and detection efficiency is efficient; The 2nd, simple in structure, have the function of automatic identification marking, prevent that effectively artificial go-on-go from makeing mistakes.
Description of drawings
Fig. 1 is the main TV structure figure of ceramic wafer checkout equipment.
Fig. 2 is the sectional structure chart at B-B place among Fig. 1.
Fig. 3 is the sectional structure chart at A-A place among Fig. 1.
Embodiment:
Embodiment 1: with reference to accompanying drawing 1～3.A kind of ceramic wafer checkout equipment; It comprises conveying mechanism 1 and support 16; The said conveying mechanism 1 that is provided with is positioned at support 16; Four limits that are positioned at conveying mechanism 1 top support 16 are respectively equipped with linear laser transmitter 7 and adjustable angle, and the linear laser line of linear laser transmitter 7 oblique fire from top to bottom forms rectangle linear laser frame on the conveyor surface of conveying mechanism; Four jiaos of support 16 and conveying mechanism 1 cross-shaped portion top are respectively equipped with ultrahigh resolution industrial camera 18, and ultrahigh resolution industrial camera 18 signal output parts are connected with computing machine 2 signal input parts.
Said support 16 up-small and down-big prismatoids, institute's support 16 inner zones that constitute with conveying mechanism 1 crossing place are surveyed area.Be provided with 25, four cross bars of four cross bars 25 at the detection position of prismatoid and form a square, the centre of every cross bar 25 is provided with generating laser 7, and the angle of generating laser 7 can be regulated.
On four angles below the square that four cross bars 25 are formed, be provided with the area of the shared area of 22, four backlight luminous boards of four backlight luminous boards 22 greater than ceramic wafer to be detected; The prismatoid upper end is provided with camera installing plate 9, and corresponding backlight luminous board 22 is provided with four ultrahigh resolution industrial cameras 18 on the camera installing plate 9; Said ultrahigh resolution industrial camera 18 belows are respectively equipped with backlight luminous board 22 on four angles, and detection probe 24 is positioned at backlight luminous board 22 1 sides.
Said conveying mechanism 1 output terminal one side is provided with two groups of cylinders 5 and 26, and every group of cylinder 5 is different with the color of the intrinsic marking pen 20 of 26 piston rod and two marking pens.That is to say; Conveying mechanism 1 one sides are provided with two cylinders 5 and 26; All be connected with a marking pen 20 on two cylinders 5 and 26 the piston rod, 20 fens two kinds of various colors of marking pen draw the mark of different colours respectively to up-to-standard product and underproof product; The left side of mark assembly 5 is provided with mark end detection probe 4.
The first half of said prismatoid is coated with case 10, and the front and back of case 10 are provided with door 11, and the left and right sides, top of case 10 is provided with exhaust fan 8.
Conveying mechanism 1 is made up of servomotor 21, rotating shaft 27, two groups of rollers 3 and two conveying belt 23; The outside of the conveying belt 23 in the conveying mechanism 1 is provided with backplate 14; Backplate 14 is connected on the connecting shaft 19; Connecting shaft 19 is fixedly mounted on the backplate support column 13, and backplate support column 13 is fixedly mounted on mechanism's cross bar 15.
The shared area of said four backlight luminous boards 22 is greater than the area of ceramic wafer to be detected.
One side of conveying mechanism 1 is provided with pilot lamp 6, one sides and is provided with control knob box 12, and the below of conveying mechanism 1 is provided with panel box 17; The information of Equipment Inspection is through computing machine 2 and detection head is gathered and analytical calculation; The manufacture craft of above-mentioned each parts and installation method all adopt existing feasible technology.
Embodiment 2: on the basis of embodiment 1; A kind of ceramic wafer detection method; (1) is positioned at the optical detection probe 24 of streamline one side, after detecting ceramic wafer and arriving, stops to carry through controller instruction conveying mechanism; The shared area of four backlight luminous boards 22 is greater than the area of ceramic wafer to be detected; The illumination of therefore locating four backlight luminous boards, 22 projections under the ceramic wafer is mapped to the ceramic wafer edge, manifests the profile of ceramic wafer, and the ceramic wafer that four ultrahigh resolution industrial cameras 18 directly over be arranged in this moment set off flicker free planar backlight source is immediately taken pictures and inputed to computing machine and deposits figure; After quick graph image analytical calculation is handled through computer software, draw the angle of the ceramic wafer four limit length of sides and formation; (2) be positioned at the linear laser line oblique fire ceramic plate edge that four linear laser transmitters 7 of ceramic wafer oblique upper are launched; Four ultrahigh resolution industrial cameras 18 are taken pictures and the standard picture that is input to once more in the computing machine with built-in computer compares; Calculate the ceramic plate angularity; Whether have edge lack drum corner phenomenon, and through the marking pen on two groups of cylinders 5 and 26, respectively qualified and underproof product is marked if drawing.
When test side detection probe 24 detects ceramic wafer; Stop operating through controller instruction servomotor 21, this moment, four backlight luminous boards 22 were on four corners of ceramic wafer, and part backlight luminous board 22 is sheltered from by ceramic wafer; The profile of ceramic wafer is revealed; Four linear laser transmitter 7 emitted laser line oblique fires are at the edge of ceramic wafer, and wherein the linear laser transmitter 7 emitted laser lines of left side and front end are radiated at the right side edge and the back edge of ceramic wafer respectively, and the linear laser transmitter 7 emitted laser lines of right side and rear end are radiated at the left side and the front edge of ceramic wafer respectively; If ceramic wafer is smooth, laser rays will be straight; If the ceramic wafer out-of-flatness, laser rays will produce bending, and four high resolution industrial cameras 18 that are positioned at prismatoid 16 upper end are taken pictures ceramic wafer and transferred to computing machine and deposit figure; And compare, analyze with the standard picture of calculation machine 2 internal memories, after Image Information Processing was accomplished, computing machine was through 21 work of controller instruction servomotor; Ceramic wafer moves forward, and when detection probe 4 detected ceramic wafer, servomotor stopped operating again; Marking pen 20 on this moment two groups of cylinders 5 carries out marking according to measured result to ceramic wafer; If certified products are then drawn the line of certain designated color, if be non-certified products then draw the line of another kind of designated color, servomotor remained in operation after line was accomplished; Operating personnel take off ceramic wafer, and equipment continues to detect other ceramic wafers.
It will be appreciated that: though the foregoing description has been done more detailed description to mentality of designing of the present invention; But mentality of designing of the present invention is not limited only to foregoing description; Any combination, increase or modification that does not exceed mentality of designing of the present invention all falls in the technical scope of the present invention.
Claims (8)
1. ceramic wafer checkout equipment; It comprises conveying mechanism (1) and support (16); It is characterized in that: said conveying mechanism (1) is positioned at support (16), and conveying mechanism (1) output terminal one side is provided with two groups of cylinders (5), and the color of the intrinsic marking pen of the piston rod of every group of cylinder (5) (20) and two marking pens is different; The outside of the conveying belt (23) in the conveying mechanism (1) is provided with backplate (14); Backplate (14) is connected on the connecting shaft (19), and connecting shaft (19) is fixedly mounted on the backplate support column (13), and backplate support column (13) is fixedly mounted on mechanism's cross bar (15); Four limits that are positioned at conveying mechanism (1) top support (16) are respectively equipped with linear laser transmitter (7) and adjustable angle; The linear laser line of linear laser transmitter (7) oblique fire from top to bottom forms rectangle linear laser frame on the conveyor surface of conveying mechanism; Support (16) top installing plate (9) is provided with four ultrahigh resolution industrial cameras (18) and over against four jiaos of tested ceramic wafers, ultrahigh resolution industrial camera (18) signal output part is connected with computing machine (2) signal input part.
2. ceramic wafer checkout equipment according to claim 1 is characterized in that: the inner zone that constitutes with the crossing place of conveying mechanism (1) of said support (16) is a surveyed area.
3. ceramic wafer checkout equipment according to claim 1 is characterized in that: said ultrahigh resolution industrial camera (18) below is respectively equipped with a backlight luminous board (22) on four angles, and detection probe (24) is positioned at backlight luminous board (22) one sides.
4. ceramic wafer checkout equipment according to claim 1 is characterized in that: said support (16) is up-small and down-big prismatoid.
5. ceramic wafer checkout equipment according to claim 4 is characterized in that: the first half of said prismatoid is coated with case (10), and the front and back of case (10) are provided with door (11), and the left and right sides, top of case (10) is provided with exhaust fan (8).
6. ceramic wafer checkout equipment according to claim 3 is characterized in that: the shared area of four backlight luminous boards (22) is greater than the area of ceramic wafer to be detected.
7. ceramic wafer detection method; It is characterized in that: ⑴ is positioned at the optical detection probe (24) of streamline one side; After detecting the ceramic wafer arrival; Stop to carry through controller instruction conveying mechanism, the shared area of four backlight luminous boards (22) is greater than the area of ceramic wafer to be detected, and the illumination of therefore locating four backlight luminous boards (22) projection under the ceramic wafer is mapped to the ceramic wafer edge; The profile that manifests ceramic wafer; The ceramic wafer that four ultrahigh resolution industrial cameras (18) directly over be arranged in this moment set off flicker free planar backlight source is immediately taken pictures and is inputed to computing machine and deposits figure, after quick graph image analytical calculation is handled through computer software, draws the angle of the ceramic wafer four limit length of sides and formation; ⑵ be positioned at the linear laser line irradiation ceramic plate edge that four linear laser transmitters (7) of ceramic wafer oblique upper are launched; Four ultrahigh resolution industrial cameras (18) are taken pictures and the standard picture that is input to once more in the computing machine with built-in computer compares; Calculate the ceramic plate angularity; Whether have edge lack drum corner phenomenon, and through the marking pen (20) on two groups of cylinders (5), respectively qualified and underproof product is marked if drawing.
8. ceramic wafer detection method according to claim 7; It is characterized in that: when test side detection probe (24) when detecting ceramic wafer; Stop operating through controller instruction servomotor (21), four backlight luminous boards this moment (22) are on four corners of ceramic wafer, and part backlight luminous board (22) is sheltered from by ceramic wafer; The profile of ceramic wafer is revealed; The laser rays of four linear laser transmitters (7) oblique fire is radiated at the edge of ceramic wafer, and wherein linear laser transmitter (7) the emitted laser line of left side and front end is radiated at the right side edge and the back edge of ceramic wafer respectively, and linear laser transmitter (7) the emitted laser line of right side and rear end is radiated at the left side and the front edge of ceramic wafer respectively; If ceramic wafer is smooth, laser rays will be straight; If the ceramic wafer out-of-flatness, laser rays will produce bending, and four high resolution industrial cameras (18) are taken pictures ceramic wafer and transferred to computing machine and deposit figure; And and the standard picture of computing machine (2) internal memory compares, analyzes, and after Image Information Processing was accomplished, computing machine was through controller instruction servomotor (21) work; Ceramic wafer moves forward, and when detection probe (4) when detecting ceramic wafer, servomotor stops operating again; Marking pen (20) on two groups of cylinders this moment (5) carries out marking according to measured result to ceramic wafer; If certified products are then drawn the line of certain designated color, if be non-certified products then draw the line of another kind of designated color, servomotor remained in operation after line was accomplished; Operating personnel take off ceramic wafer, and equipment continues to detect other ceramic wafers.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201010272220A CN101975557B (en) | 2010-08-31 | 2010-08-31 | Ceramic plate detection equipment and detection method |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201010272220A CN101975557B (en) | 2010-08-31 | 2010-08-31 | Ceramic plate detection equipment and detection method |
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| CN101975557A CN101975557A (en) | 2011-02-16 |
| CN101975557B true CN101975557B (en) | 2012-10-10 |
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