CN101949978A - Impedance test element - Google Patents
Impedance test element Download PDFInfo
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- CN101949978A CN101949978A CN 201010265991 CN201010265991A CN101949978A CN 101949978 A CN101949978 A CN 101949978A CN 201010265991 CN201010265991 CN 201010265991 CN 201010265991 A CN201010265991 A CN 201010265991A CN 101949978 A CN101949978 A CN 101949978A
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- impedance
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- spare
- test
- line district
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Abstract
The invention discloses an impedance test element, which is divided into a characteristic impedance line area and a differential impedance line area, wherein the characteristic impedance line area and the differential impedance line area are provided with at least one group of test holes respectively. In the technical scheme, the impedance test element is divided into the characteristic impedance line area and the differential impedance line area so as to be used for correspondingly testing characteristic impedance and differential impedance in the two areas. Compared with the scheme in which two test elements are required to finish the tests in the prior art, the impedance test element of the technical scheme saves materials and reduces the manufacturing cost.
Description
Technical field
The present invention relates to the printed-board technology field, relate in particular to a kind of testing impedance spare.
Background technology
Printed circuit board (PCB) is meant the insulcrete that is printed with circuit diagram.The design of printed circuit board is to be basis with circuit theory diagrams, realizes the needed function of circuit designers.The design of printed circuit board (PCB) mainly refers to layout design, need to consider various factorss such as the optimizing distribution of the optimizing distribution of the outside layout that connects, internal electronic element, metal connecting line and through hole, electromagnetic protection, heat dissipation.
At present, serigraphy has become the main method of making circuit board.So-called serigraphy is the extruding by scraper plate, makes printing ink transfer to carrier by the mesh of picture and text part.It adopts automatic screen printing machine production, has high efficiency, silk-screen reliable quality advantage.
After print circuit plates making is finished, need whether to meet user's requirement through the tester testing printed circuit board.If fruit is directly tested printed circuit board (PCB), can cause in the operating process damage to printed circuit board (PCB).Therefore, in order to guarantee that printed circuit board (PCB) is not damaged, simultaneously again can testing printed circuit board whether meet user's requirement, need to make the testing impedance spare identical with the circuit layout of printed circuit board (PCB), replace printed circuit board (PCB), the use test instrument is tested this testing impedance spare, can address the above problem.
The impedance of printed circuit board (PCB) has two kinds of characteristic impedance and differential impedances, but existing testing impedance spare only has a kind of impedance, during tester test testing impedance spare, can only test a kind of impedance, therefore, if will finish to the characteristic impedance of printed circuit board (PCB) and the test of differential impedance, need make two characteristic impedance and corresponding testing impedance spares of differential impedance with the printed circuit board (PCB) that needs test respectively, promptly a testing impedance spare has characteristic impedance, and another piece testing impedance spare has differential impedance.The use test instrument to two testing impedance spare tests, can be finished the characteristic impedance of printed circuit board (PCB) corresponding with it and the test of differential impedance, and then judge whether printed circuit board (PCB) meets user's requirement respectively.
In sum, because existing testing impedance spare only has a kind of impedance, therefore, during the impedance of testing printed circuit board, need two test blocks of design just can finish the characteristic impedance and the differential impedance of testing printed circuit board, the material use amount increases, and increases cost of manufacture.
Summary of the invention
In view of this, the object of the present invention is to provide a kind of testing impedance spare, finish on the same test block the characteristic impedance of printed circuit board (PCB) and the test of differential impedance to be implemented in, economical with materials reduces cost of manufacture.
For achieving the above object, the technical scheme of a kind of testing impedance spare provided by the invention is as follows:
A kind of testing impedance spare, described test block is divided characteristic impedance line district and differential impedance line district, and described characteristic impedance line district and described differential impedance line district are provided with at least one group of instrument connection respectively.
Preferably, the edge of described test block is provided with two pilot holes.
Preferably, the group number of the instrument connection of described characteristic impedance line district and described differential impedance line district setting mostly is 10 groups most.
Preferably, described test porose disc be shaped as circular and square.
Preferably, the diameter of described instrument connection is 1.0mm.
Preferably, the diameter of described pilot hole is 3.2mm.
Preferably, the length of described test block is 235mm, and width is 16mm.
Preferably, the distance between described two pilot holes is 228mm.
Preferably, described characteristic impedance line district and described differential impedance line district are marked with level, impedance magnitude and tolerance code name sign respectively.
Preferably, described characteristic impedance line district is provided with and replaces the hole.
Use technique scheme, testing impedance spare is divided characteristic impedance line district and differential impedance line district, can use impedance instrument to finish test to characteristic impedance and differential impedance accordingly in above-mentioned two districts.Compare with the scheme that prior art need adopt two test blocks to finish test, economical with materials reduces cost of manufacture.
Description of drawings
In order to be illustrated more clearly in the embodiment of the invention, to do simple introduction to the accompanying drawing of required use among the embodiment below, apparently, accompanying drawing in describing below only is some embodiments of the present invention, for those of ordinary skills, under the prerequisite of not paying creative work, can also obtain other accompanying drawing according to these accompanying drawings.
The structural representation of the testing impedance spare that Fig. 1 provides for the embodiment of the invention;
The another kind of structural representation of the testing impedance spare that Fig. 2 provides for the embodiment of the invention;
Fig. 3 is the enlarged drawing of C square frame among Fig. 2.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the invention, the technical scheme in the embodiment of the invention is clearly and completely described, obviously, described embodiment only is the present invention's part embodiment, rather than whole embodiment.Based on the embodiment among the present invention, those of ordinary skills are not making under the creative work prerequisite, and the every other embodiment that is obtained belongs to protection domain of the present invention.
Whether meet user's requirement for testing printed circuit board, simultaneously can guarantee that again printed circuit board (PCB) is not damaged, need to make the testing impedance spare identical with the circuit layout of printed circuit board (PCB) and replace printed circuit board (PCB), the use test instrument is tested this testing impedance spare.
The applicant finds after deliberation, the impedance of printed circuit board (PCB) has two kinds of characteristic impedance and differential impedances, but existing testing impedance board test spare only has a kind of impedance, during tester test testing impedance spare, can only test a kind of impedance, characteristic impedance or differential impedance that promptly can only testing printed circuit board, therefore, the testing impedance of finishing printed circuit board (PCB) need design two testing impedance spares, the impedance that each testing impedance spare has is corresponding with a kind of impedance phase of printed circuit board (PCB), cause the material use amount big, increase cost of manufacture.
In order to address the above problem, the embodiment of the invention provides a kind of testing impedance spare, this testing impedance spare is identical with the specification of the printed circuit board (PCB) that need test, its structural representation as shown in Figure 1, it is divided into: characteristic impedance line district 1 and differential impedance line district 2, test block is boundary with drawn dotted line in scheming as shown in fig. 1, and dotted line top is divided into characteristic impedance line district 1, and the bottom is divided into differential impedance line district 2.Characteristic impedance line district 1 has characteristic impedance, and this characteristic impedance is corresponding with the characteristic impedance of printed circuit board (PCB), and characteristic impedance line district 1 is provided with at least one group of instrument connection 3, i.e. two instrument connections 3 are shown in frame of broken lines A among Fig. 1.Equally, differential impedance line district 2 has the corresponding differential impedance with printed circuit board (PCB), also is provided with at least one group of instrument connection 3 on it, i.e. four instrument connections 3 are shown in frame of broken lines B among Fig. 1.
When using the testing impedance spare that TDR (Time Domain Reflectometer, domain reflectometer) the 2000 impedance instruments test embodiment of the invention provides, test probe need be inserted in the instrument connection 3.Correct in order to guarantee that test probe inserts, adopt difformity to carry out mark to instrument connection 3, shown in frame of broken lines A among Fig. 1.Being shaped as of instrument connection 3 is circular and square, and circular instrument connection 3 is a connecting hole, and square instrument connection 3 is a ground hole.Certainly, instrument connection 3 can also take different shapes distinguishes connecting hole and ground hole, also can be with above-mentioned shape displacement, and promptly circular instrument connection 3 is a ground hole, and square instrument connection 3 is a connecting hole, and this present embodiment is no longer set forth.
During TDR2000 impedance instrument test testing impedance spare, with facing up of this testing impedance spare, be placed on the TDR2000 impedance instrument, because the position of the test probe in the testing impedance spare on the position of instrument connection 3 and the tester tester is corresponding, so when the testing impedance plate is placed on the TDR2000 tester, test probe can insert corresponding with it instrument connection 3, when being the test characteristic impedance, in the instrument connection 3 of test probe insertion shown in frame of broken lines A among Fig. 1, and to guarantee that test probe inserts connecting hole and ground hole is correct.Equally, during the test differential impedance, in the instrument connection 3 of test probe insertion shown in frame of broken lines B among Fig. 1, to guarantee that also test probe inserts connecting hole and ground hole is correct.Utilize impedance of this impedance instrument test characteristic and test differential impedance to carry out simultaneously.
For testing impedance spare being fixed on the TDR2000 impedance instrument, the edge of testing impedance spare is provided with two pilot holes 4, as shown in Figure 1.When testing printed circuit board, pilot hole 4 is put on the register pin of TDR2000 impedance instrument, come assignment test spare with register pin.
Above-mentionedly test testing impedance spare automatically for the TDR impedance instrument, can also adopt artificial mode certainly, promptly operating personnel are connected test probe one by one with instrument connection 3, to finish test.
The group number of the instrument connection that the characteristic impedance line district of testing impedance spare shown in Figure 1 and differential impedance line district are provided with is respectively 10 groups at most, promptly can test out 10 groups of characteristic impedance values and 10 groups of differential impedance values respectively.
The diameter of instrument connection 3 is 1.0mm, and this diameter is to be provided with according to the diameter of test probe, therefore, if the test probe diameter changes, then needs to change the diameter of instrument connection 3.As shown in Figure 1, the spacing that is positioned at two adjacent instrument connections of delegation is 2.4mm.The diameter of pilot hole 4 is 3.2mm, is to be determined by the diameter of register pin.
The length of this testing impedance spare is 235mm, and width is 16mm.Why to be made as 235mm be that the minimum testing length of differential impedance is not less than 55mm because the minimum testing length of characteristic impedance line is not less than 60mm on request to length, for practicing every conceivable frugality material and can guarantee to test effect, so length adopts 235mm.And the setting of width is to be provided with according to the group number of testing impedance line, and 10 groups of characteristic impedance lines and 10 groups of differential impedance line minimum widiths are 16mm.According to the length of test block, the minimum testing length of characteristic impedance line and the minimum testing length of differential impedance, determine two distances between the pilot hole 4, the distance of two pilot holes 4 is 228mm in the embodiment of the invention.
Characteristic impedance value and differential impedance value respectively are divided into many levels, are which level in order to distinguish the resistance value that records, and characteristic impedance line district 1 and differential impedance line district 2 are marked with level, impedance magnitude and tolerance code name sign 5 respectively, as shown in Figure 2.The another kind of structural representation of the testing impedance spare that Fig. 2 provides for the embodiment of the invention.Other structure is identical with Fig. 1 among Fig. 2.
Fig. 3 is the enlarged drawing of C square frame among Fig. 2, with the purposes of better explanation level, impedance magnitude and tolerance code name sign 5.Sign 5 totally 7 bit digital, wherein: front two representational level number, middle four representatives have the resistance value of a decimal, unit is ohm, last letter is the tolerance code name, and for example among Fig. 3: 010500A represents the ground floor impedance line, its resistance value is: 50.0 Ω, the tolerance code name is: A.Its tolerance can stipulate voluntarily, for example, and tolerance code name A=+/-10%; B=+/-15%; C=+/-5%; The special tolerance of T=is represented the tolerance commonly used that non-code name A, B, C represent, needs the inquiry engineering to make indication and obtains.When the resistance value of the ground floor impedance line of institute's mark on the printed circuit board (PCB) in the scope of tolerance code name A, represent that then the resistance value of the ground floor impedance line of this printed circuit board (PCB) meets user's demand.Adopt sign 6 to identify, avoid operating personnel when a plurality of resistance value of test, to obscure the resistance value of being tested, for example: think the resistance value of the second layer impedance line tested by mistake to be the resistance value of the 3rd layer impedance line.
Characteristic impedance line district 1 four holes of first row from left to right is: replace hole 6, use as ground hole.Because during every layer of characteristic impedance of manual testing, all need test probe is reconnected a connecting hole and a ground hole at every turn, during for fear of characteristic impedance of every test, all need test probe is reconnected ground hole, therefore, use replacement hole 6 to replace ground hole, it is square instrument connection 3, so when testing the characteristic impedance of each level, only test probe and connecting hole need be reconnected and get final product, thereby simplify the operation.And differential impedance line district 2 need connect two ground holes when testing differential impedance more simultaneously, therefore is not provided with in differential impedance line district to replace hole 6.
Use technique scheme, testing impedance spare is divided characteristic impedance line district and differential impedance line district, can use impedance instrument to finish test to characteristic impedance and differential impedance accordingly in above-mentioned two districts.Compare with the scheme that prior art need adopt two test blocks to finish test, economical with materials reduces cost of manufacture.
To the above-mentioned explanation of the disclosed embodiments, make this area professional and technical personnel can realize or use the present invention.Multiple modification to these embodiment will be conspicuous concerning those skilled in the art, and defined herein General Principle can realize under the situation that does not break away from the spirit or scope of the present invention in other embodiments.Therefore, the present invention will can not be restricted to these embodiment shown in this article, but will meet and principle disclosed herein and features of novelty the wideest corresponding to scope.
Claims (10)
1. a testing impedance spare is characterized in that, described test block is divided characteristic impedance line district and differential impedance line district, and described characteristic impedance line district and described differential impedance line district are provided with at least one group of instrument connection respectively.
2. testing impedance spare according to claim 1 is characterized in that, the edge of described test block is provided with two pilot holes.
3. testing impedance spare according to claim 1 and 2 is characterized in that, the group number of the instrument connection that described characteristic impedance line district and described differential impedance line district are provided with mostly is 10 groups most.
4. testing impedance spare according to claim 1 and 2 is characterized in that, being shaped as of described test porose disc is circular and square.
5. testing impedance spare according to claim 1 and 2 is characterized in that, the diameter of described instrument connection is 1.0mm.
6. testing impedance spare according to claim 5 is characterized in that, the diameter of described pilot hole is 3.2mm.
7. testing impedance spare according to claim 6 is characterized in that, the length of described test block is 235mm, and width is 16mm.
8. testing impedance spare according to claim 7 is characterized in that, the distance between described two pilot holes is 228mm.
9. testing impedance spare according to claim 1 and 2 is characterized in that, described characteristic impedance line district and described differential impedance line district are marked with level, impedance magnitude and tolerance code name sign respectively.
10. testing impedance spare according to claim 9 is characterized in that, described characteristic impedance line district is provided with and replaces the hole.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201010265991 CN101949978A (en) | 2010-08-26 | 2010-08-26 | Impedance test element |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201010265991 CN101949978A (en) | 2010-08-26 | 2010-08-26 | Impedance test element |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN101949978A true CN101949978A (en) | 2011-01-19 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
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| CN 201010265991 Pending CN101949978A (en) | 2010-08-26 | 2010-08-26 | Impedance test element |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107632202A (en) * | 2017-09-22 | 2018-01-26 | 信利光电股份有限公司 | Paste impedance detecting method, system, equipment and the readable storage medium storing program for executing of steel disc circuit |
| CN107664717A (en) * | 2017-09-22 | 2018-02-06 | 信利光电股份有限公司 | Paste PI reinforcement line testing process, system, equipment and readable storage medium storing program for executing |
| CN107677890A (en) * | 2017-09-22 | 2018-02-09 | 信利光电股份有限公司 | Paste electromagnetic shielding film line testing process, system, equipment and readable storage medium storing program for executing |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004037219A (en) * | 2002-07-03 | 2004-02-05 | Toshiba Corp | Impedance measuring method and wiring board |
| CN201392368Y (en) * | 2008-11-28 | 2010-01-27 | 电子科技大学 | Characteristic impedance testing device for circuit board |
| CN101672874A (en) * | 2009-09-23 | 2010-03-17 | 深圳市博敏电子有限公司 | Microstrip transmission line impedance parameter test method |
-
2010
- 2010-08-26 CN CN 201010265991 patent/CN101949978A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004037219A (en) * | 2002-07-03 | 2004-02-05 | Toshiba Corp | Impedance measuring method and wiring board |
| CN201392368Y (en) * | 2008-11-28 | 2010-01-27 | 电子科技大学 | Characteristic impedance testing device for circuit board |
| CN101672874A (en) * | 2009-09-23 | 2010-03-17 | 深圳市博敏电子有限公司 | Microstrip transmission line impedance parameter test method |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107632202A (en) * | 2017-09-22 | 2018-01-26 | 信利光电股份有限公司 | Paste impedance detecting method, system, equipment and the readable storage medium storing program for executing of steel disc circuit |
| CN107664717A (en) * | 2017-09-22 | 2018-02-06 | 信利光电股份有限公司 | Paste PI reinforcement line testing process, system, equipment and readable storage medium storing program for executing |
| CN107677890A (en) * | 2017-09-22 | 2018-02-09 | 信利光电股份有限公司 | Paste electromagnetic shielding film line testing process, system, equipment and readable storage medium storing program for executing |
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Application publication date: 20110119 |