CN101931461B - Testing device and testing method of optical transceiver - Google Patents
Testing device and testing method of optical transceiver Download PDFInfo
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- CN101931461B CN101931461B CN2009101462469A CN200910146246A CN101931461B CN 101931461 B CN101931461 B CN 101931461B CN 2009101462469 A CN2009101462469 A CN 2009101462469A CN 200910146246 A CN200910146246 A CN 200910146246A CN 101931461 B CN101931461 B CN 101931461B
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Abstract
The invention discloses a testing device and a testing method of an optical transceiver, wherein the signal rise time, the signal fall time and the signal swing amplitude of an electric signal are changed by mainly utilizing a signal attenuation unit, and the attenuated electric signal is transferred to the optical transceiver. An optical signal is output by the optical transceiver according to the attenuated electric signal, and the optical signal is received by the testing device by utilizing a measuring unit to detect the quality of the optical transceiver.
Description
Technical field
The invention relates to a kind of testing apparatus and method of testing, and particularly relevant for a kind of testing apparatus and method of testing of optical transceiver.
Background technology
Along with the fast development of network technology, in conjunction with the photoelectricity mechanics of communication of electronics and optical principle, transmit with a large amount of information owing to can provide fast, be to be applied at large in enterprise and the home network framework.In the field of photoelectricity mechanics of communication, optical transceiver (optical transceiver) is an important key component.It is that the transform electric that will receive is light signal, perhaps the light signal of receiving is converted to electric signal.In the network equipment of photoelectric communication system, include a plurality of optical transceivers usually.
Industry is with the input signal of a desirable electric signal as optical transceiver, so as to the output characteristic of test light transceiver when carrying out the test of optical transceiver at present.But practical application is in system equipment, and the received electric signal of optical transceiver and nonideal electric signal so can have influence on the output characteristic of optical transceiver.Therefore, this kind utilizes desirable electric signal to carry out the test of optical transceiver, and the optical transceiver characteristic that obtains is can be too optimistic and unactual, the output characteristic when causing the tester can't grasp optical transceiver receiving imperfect electric signal.That is this kind test mode can't test out the output characteristic of optical transceiver when being applied to system equipment.
Summary of the invention
Therefore, the object of the present invention is to provide a kind of testing apparatus and method of testing of optical transceiver.
One embodiment of the present invention is that a kind of testing apparatus of optical transceiver is being provided, and comprises a signal source, a signal attenuation unit and a measuring unit at least.Signal source is in order to produce the electric signal of a square wave pattern.Signal attenuation unit by using one input receives electric signal, and uses signal elevating time, signal fall time and signal swing that a decay assembly changes electric signal.The signal attenuation unit and utilize output transmission decay after electric signal to an optical transceiver.Optical transceiver is exported a light signal according to the electric signal after decaying, and measuring unit is by receiving the quality that this light signal detects optical transceiver.
According to one embodiment of the invention, the decay assembly comprises a filter and an attenuator at least.Filter is in order to the signal elevating time that increases electric signal and signal fall time, and attenuator is in order to reduce the signal swing of electric signal.
According to another embodiment of the present invention, the decay assembly is an electric signal transmission line.This transmission line is the metallic circuit on the circuit board.
According to yet another embodiment of the invention, measuring unit is connected in output, in order to the electric signal after the receiving attenuation, so as to obtaining the attenuation state of electric signal.Measuring unit comprises a light signal measuring oscilloscope and an electric signal measuring oscilloscope.
Another embodiment of the present invention is a kind of method of testing of optical transceiver to be provided, to comprise following steps at least.At first, produce the electric signal of a square wave pattern.Secondly, change signal elevating time, signal fall time and the signal swing of electric signal, with this electric signal that decays.Moreover, transmit electric signal to an optical transceiver after decaying.Optical transceiver is exported a light signal according to the electric signal after decaying.Then, receiving optical signals is to detect the quality of optical transceiver.
The testing apparatus of the optical transceiver of the embodiment of the invention and method of testing, utilize the signal attenuation unit to change the signal properties of electric signal, and the electric signal after the transmission decay is to optical transceiver, so as to the relation between the light signal of the electric signal that detects the specific extent of deterioration of tool and optical transceiver, and then the quality of understanding optical transceiver.It has advantage simple in structure, with low cost.
Description of drawings
For above and other objects of the present invention, feature, advantage and embodiment can be become apparent, appended the description of the drawings is as follows:
Fig. 1 illustrates the schematic diagram according to the testing apparatus of a kind of optical transceiver of an embodiment of the present invention;
Fig. 2 A illustrates the schematic diagram according to the testing apparatus of a kind of optical transceiver of another execution mode of the present invention;
Schematic diagram when Fig. 2 B illustrates optical transceiver and is connected in another electric signal transmission line.
[primary clustering symbol description]
100: testing apparatus 251: input
110: signal source 253: circuit board
150: signal attenuation unit 255: the electric signal transmission line
151: input 255 ': the electric signal transmission line
155: decay assembly 257: output
155a: filter 270: measuring unit
155b: attenuator L1: length
157: output L2: length
170: measuring unit O: light signal
171: light signal measuring oscilloscope S: electric signal
172: electric signal measuring oscilloscope S ': electric signal
200: testing apparatus S ": electric signal
210: signal source T: optical transceiver
250: the signal attenuation unit
Embodiment
Please refer to Fig. 1, it illustrates the schematic diagram according to the testing apparatus of a kind of optical transceiver of an embodiment of the present invention.Testing apparatus 100 mainly comprises a signal source 110, a signal attenuation unit 150 and a measuring unit 170.Testing apparatus 100 is used signal source 110 and is produced an electric signal S, and utilizes signal attenuation unit 150 this electric signal of decay S, and then the electric signal S ' after the transmission decay is to an optical transceiver T.Optical transceiver T is according to electric signal S ' the output one light signal O after decaying, and measuring unit 170 receiving optical signals O are by the quality of light signal O detection optical transceiver T.
In one embodiment, signal source 110 for example is a square-wave signal generator.For instance, can utilize a bit error rate tester (Bit-Error Rate Tester) as signal source 110 in the testing apparatus 100, in order to produce the fixedly electric signal S of the square wave pattern of output voltage swing.
Furthermore, decay assembly 155 for example is to comprise a filter (filter) 155a and an attenuator (attenuator) 155b.Signal elevating time (risingtime) and signal fall time (falling time) of filter 155a in order to change electric signal S, attenuator 155b is in order to change the signal swing of electric signal S.In one embodiment, the electric signal S ' after the decay has signal elevating time and the signal fall time greater than electric signal S before the decay, and has the signal swing less than electric signal S before the decay.
In the practical application, can see through the mode of experiment simulation according to the specification of optical transceiver T, design the decay assembly 155 with a prearranged signals attenuation characteristic.Thus, the tester can be according to demand, the decay waveform after determining electric signal S by signal attenuation unit 150.Moreover signal attenuation unit 150 also can use the decay assembly 155 with differential declines characteristic, changes the decay waveform by the electric signal S ' behind the signal attenuation unit 150.So as to utilizing the electric signal S ' of differential declines waveform, carry out the detection of optical transceiver T.
As shown in Figure 1, optical transceiver T is the output 157 that is connected in signal attenuation unit 150, in order to the electric signal S ' after the receiving attenuation.Optical transceiver T is according to electric signal S ' the output one light signal O after decaying.In one embodiment, measuring unit 170 comprises a light signal measuring oscilloscope 171, and it is in order to receiving optical signals O, to detect the quality of optical transceiver T by the signal properties of light signal O.
In another embodiment, measuring unit 170 also comprises an electric signal measuring oscilloscope 172, and it is connected in the output 157 of signal attenuation unit 150, in order to the electric signal S ' after the receiving attenuation, so as to obtaining the actual attenuation state of electric signal S '.Via light signal measuring oscilloscope 171 and electric signal measuring oscilloscope 172, the tester can understand the relation of attenuation state and the light signal O of electric signal S '.Drive the light signal O that produces by detecting optical transceiver T by the electric signal S ' after decaying, can understand optical transceiver T when the electric signal S of imperfect square wave drives, its running situation and output quality can more completely reach and carry out the quality management and control of optical transceiver T exactly.
In addition on the one hand, the method for testing of the optical transceiver T of one embodiment of the invention, but application of aforementioned is carried out according to the testing apparatus 100 of one embodiment of the invention.Method of testing at first produces the step of electric signal S, utilizes signal source 110 to produce the electric signal S of square wave pattern.
Then, method of testing changes the step of electric signal S characteristic, utilizes signal elevating time, signal fall time and the signal swing of decay assembly 155 change electric signal S, with decay electric signal S.
Come, the electric signal S ' after the transmission decay is to optical transceiver T again.Optical transceiver T is according to electric signal S ' the output one light signal O after decaying.
Next the method for testing of present embodiment carries out the step of receiving optical signals O.Utilize measuring unit 170 receiving optical signals O, to detect the quality of optical transceiver T.
Please be simultaneously with reference to Fig. 2 A and Fig. 2 B, Fig. 2 A illustrates the schematic diagram according to the testing apparatus of a kind of optical transceiver of another execution mode of the present invention, the schematic diagram when Fig. 2 B illustrates optical transceiver and is connected in another electric signal transmission line.Be to utilize two electric signal transmission lines 255 and 255 ' as the decay assembly in the testing apparatus 200.In addition, in the testing apparatus 200, signal source 210 for example produces the electric signal S of square wave pattern, and optical transceiver T is according to electric signal S ' the output light signal O after decaying, and measuring unit 270 receiving optical signals O are so as to detecting the quality of optical transceiver T.Its content is identical with aforementioned testing apparatus 100 as shown in Figure 1, repeats no more herein.
Two electric signal transmission lines 255 and 255 ' have the prearranged signal attenuation characteristic respectively, in order to signal elevating time, signal fall time and the signal swing that changes electric signal S, with decay electric signal S.In the practical application, can see through experiment and obtain the length L 1 of electric signal transmission line 255 and 255 ' and the relation of L2 and its signal attenuation characteristic.Therefore, can design length L 1 and the L2 of electric signal transmission line 255 and 255 ' respectively according to actual testing requirement, to determine its prearranged signals attenuation characteristic.
Furthermore, this two electric signals transmission line 255 and 255 ' length L 1 and L2 are unequal.In one embodiment, the length L 1 of one of them electric signal transmission line 255 is greater than another length L 2.Because the length by transmission line in the testing apparatus 200 determines its signal attenuation characteristic, therefore two electric signal transmission lines 255 and 255 ' have different signal attenuation characteristics.After electric signal S passes through two electric signal transmission lines 255 and 255 ', decay to electric signal S ' and S respectively ".
In one embodiment, signal attenuation unit 250 also comprises a circuit board 253, and input 251 and output 257 are positioned on the circuit board 253, and two electric signal transmission lines 255 and 255 ' are the metallic circuit on the circuit board 253.Utilization forms metallic circuit as the mode of decay assembly at circuit board 253, does not need additionally to arrange other signal processing component, has advantage simple in structure and with low cost.
In the practical application, via electric signal S ' and the S after two electric signal transmission lines 255 and the 255 ' decay ", have different decay waveforms.When optical transceiver T is connected in another electric signal transmission line 255 ', the electric signal S of another decay waveform of signal attenuation unit 250 outputs " to optical transceiver T.Electric signal S ' and S by the differential declines waveform " export the mode of optical transceiver T respectively to, can detect under the situation of unlike signal consume the light signal O characteristic of optical transceiver T output, and then quality that can complete test light transceiver T.
The testing apparatus of above-mentioned optical transceiver according to the embodiment of the invention, the action that utilizes the signal attenuation unit that electric signal is decayed exports optical transceiver to the electric signal after will decaying.So can detect optical transceiver when imperfect electric signal drives, its running situation and output quality.Moreover, utilize the electric signal transmission line of different line lengths to carry out signal attenuation, can the test light transceiver when the electric signal of difference consume drives, the quality of the light signal of optical transceiver output can be complete and the quality of test light transceiver exactly.
Though the present invention discloses as above with execution mode; right its is not in order to limiting the present invention, any person skilled in the art, without departing from the spirit and scope of the present invention; when can being used for a variety of modifications and variations, so protection scope of the present invention is as the criterion when looking the scope that claims define.
Claims (8)
1. the testing apparatus of an optical transceiver is characterized in that, comprises at least:
One signal source is in order to produce the electric signal of a square wave pattern;
One signal attenuation unit comprises at least:
One input is in order to receive this electric signal;
One decay assembly is in order to signal elevating time, signal fall time and the signal swing that changes this electric signal, with this electric signal that decays; And
One output, in order to transmit this electric signal to one optical transceiver after decaying, wherein this optical transceiver is exported a light signal according to this electric signal after decaying; And
One measuring unit, in order to receiving this light signal, detecting the quality of this optical transceiver,
Wherein this measuring unit is connected in this output, in order to this electric signal after the receiving attenuation, to obtain the attenuation state of this electric signal.
2. the testing apparatus of optical transceiver according to claim 1 is characterized in that, this decay assembly comprises:
One filter is in order to the signal elevating time that increases this electric signal and signal fall time; And
One attenuator is in order to reduce the signal swing of this electric signal.
3. the testing apparatus of optical transceiver according to claim 1 is characterized in that, this decay assembly is an electric signal transmission line.
4. the testing apparatus of optical transceiver according to claim 3 is characterized in that, this electric signal transmission line is the metallic circuit on the circuit board.
5. the testing apparatus of optical transceiver according to claim 1 is characterized in that, this decay assembly is many unequal electric signal transmission lines of length.
6. the testing apparatus of optical transceiver according to claim 5 is characterized in that, those electric signal transmission lines are the many metallic traces on the circuit board.
7. the testing apparatus of optical transceiver according to claim 1 is characterized in that, this measuring unit comprises a light signal measuring oscilloscope.
8. the testing apparatus of optical transceiver according to claim 1 is characterized in that, this measuring unit comprises a light signal measuring oscilloscope and an electric signal measuring oscilloscope.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009101462469A CN101931461B (en) | 2009-06-24 | 2009-06-24 | Testing device and testing method of optical transceiver |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009101462469A CN101931461B (en) | 2009-06-24 | 2009-06-24 | Testing device and testing method of optical transceiver |
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| Publication Number | Publication Date |
|---|---|
| CN101931461A CN101931461A (en) | 2010-12-29 |
| CN101931461B true CN101931461B (en) | 2013-07-17 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN2009101462469A Expired - Fee Related CN101931461B (en) | 2009-06-24 | 2009-06-24 | Testing device and testing method of optical transceiver |
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Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4580274A (en) * | 1984-10-02 | 1986-04-01 | The United States Of America As Represented By The Secretary Of The Air Force | Transceiver test device |
| US5345230A (en) * | 1992-04-13 | 1994-09-06 | Dr. Johannes Heidenhain Gmbh | Method and apparatus for optical transceiver testing |
-
2009
- 2009-06-24 CN CN2009101462469A patent/CN101931461B/en not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4580274A (en) * | 1984-10-02 | 1986-04-01 | The United States Of America As Represented By The Secretary Of The Air Force | Transceiver test device |
| US5345230A (en) * | 1992-04-13 | 1994-09-06 | Dr. Johannes Heidenhain Gmbh | Method and apparatus for optical transceiver testing |
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| Publication number | Publication date |
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| CN101931461A (en) | 2010-12-29 |
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Effective date of registration: 20161209 Address after: No. 86 West Xicheng District, Beijing, Chang'an Avenue Patentee after: State Grid Corporation of China Patentee after: ANYANG POWER SUPPLY COMPANY, STATE GRID HENAN ELECTRIC POWER CO., LTD. Address before: Taipei City, Taiwan Chinese Shilin District Hougang Street No. sixty-six Patentee before: Inventec Corporation |
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Granted publication date: 20130717 Termination date: 20170624 |