CN101930402B - 具有检错/纠错电路的非挥发存储器及其读写方法 - Google Patents
具有检错/纠错电路的非挥发存储器及其读写方法 Download PDFInfo
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Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
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CN103631669B (zh) * | 2013-12-03 | 2016-06-22 | 中国科学院微电子研究所 | 一种纠错sram的回写方法 |
FR3065303B1 (fr) * | 2017-04-12 | 2019-06-07 | Stmicroelectronics (Rousset) Sas | Procede d'ecriture dans un dispositif de memoire non volatile et dispositif de memoire non volatile correspondant |
CN110660422A (zh) * | 2018-06-29 | 2020-01-07 | 上海磁宇信息科技有限公司 | 一种配合纠错磁性随机存储器使用的缓存系统 |
CN112530509A (zh) * | 2018-12-26 | 2021-03-19 | 上海忆芯实业有限公司 | 为存储设备提供ecc的方法、ecc模块及存储设备 |
CN110442044A (zh) * | 2019-08-19 | 2019-11-12 | 哈尔滨工业大学 | 一种用于飞行器制导控制算法验证的半实物仿真平台 |
CN114826283A (zh) * | 2021-01-27 | 2022-07-29 | 华为技术有限公司 | 译码方法、装置、设备以及计算机可读存储介质 |
CN114237972A (zh) * | 2021-12-13 | 2022-03-25 | 合肥芯荣微电子有限公司 | 一种用于总线传输的端到端ecc保护装置及方法 |
Citations (3)
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US5604703A (en) * | 1994-10-24 | 1997-02-18 | Nec Corporation | Semiconductor memory device with error check-correction function permitting reduced read-out time |
CN101202107A (zh) * | 2006-09-13 | 2008-06-18 | 意法半导体股份有限公司 | 具有非易失性地存储冗余数据的保留区域的与非闪存器件 |
CN101281788A (zh) * | 2007-04-06 | 2008-10-08 | 群联电子股份有限公司 | 闪存系统及其控制方法 |
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US5604703A (en) * | 1994-10-24 | 1997-02-18 | Nec Corporation | Semiconductor memory device with error check-correction function permitting reduced read-out time |
CN101202107A (zh) * | 2006-09-13 | 2008-06-18 | 意法半导体股份有限公司 | 具有非易失性地存储冗余数据的保留区域的与非闪存器件 |
CN101281788A (zh) * | 2007-04-06 | 2008-10-08 | 群联电子股份有限公司 | 闪存系统及其控制方法 |
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