CN101930030A - 电子信号走线特性阻抗测试系统及方法 - Google Patents
电子信号走线特性阻抗测试系统及方法 Download PDFInfo
- Publication number
- CN101930030A CN101930030A CN2009103037651A CN200910303765A CN101930030A CN 101930030 A CN101930030 A CN 101930030A CN 2009103037651 A CN2009103037651 A CN 2009103037651A CN 200910303765 A CN200910303765 A CN 200910303765A CN 101930030 A CN101930030 A CN 101930030A
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- Prior art keywords
- test
- electronic signal
- signal wires
- measured
- characteristic impedance
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- 238000012360 testing method Methods 0.000 title claims abstract description 280
- 238000000034 method Methods 0.000 title claims description 11
- 238000004458 analytical method Methods 0.000 claims abstract description 33
- 238000010998 test method Methods 0.000 claims abstract description 10
- 239000000523 sample Substances 0.000 claims description 11
- 238000010586 diagram Methods 0.000 description 5
- 230000005856 abnormality Effects 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 238000004590 computer program Methods 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2805—Bare printed circuit boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
Description
Claims (10)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN200910303765.1A CN101930030B (zh) | 2009-06-26 | 2009-06-26 | 电子信号走线特性阻抗测试系统及方法 |
US12/732,201 US8332177B2 (en) | 2009-06-26 | 2010-03-26 | System and method for testing a characteristic impedance of a signal path routing of a printed circuit board |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN200910303765.1A CN101930030B (zh) | 2009-06-26 | 2009-06-26 | 电子信号走线特性阻抗测试系统及方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101930030A true CN101930030A (zh) | 2010-12-29 |
CN101930030B CN101930030B (zh) | 2014-12-03 |
Family
ID=43369320
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN200910303765.1A Active CN101930030B (zh) | 2009-06-26 | 2009-06-26 | 电子信号走线特性阻抗测试系统及方法 |
Country Status (2)
Country | Link |
---|---|
US (1) | US8332177B2 (zh) |
CN (1) | CN101930030B (zh) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102636698A (zh) * | 2011-02-10 | 2012-08-15 | 鸿富锦精密工业(深圳)有限公司 | 电路板自动化测试系统及方法 |
CN102788922A (zh) * | 2011-05-18 | 2012-11-21 | 鸿富锦精密工业(深圳)有限公司 | 印刷电路板电源布线的安全检查系统及方法 |
CN104502715A (zh) * | 2014-12-31 | 2015-04-08 | 广州兴森快捷电路科技有限公司 | 阻抗板的阻抗测试方法 |
CN106940401A (zh) * | 2017-03-13 | 2017-07-11 | 郑州云海信息技术有限公司 | 一种阻抗测试方法及系统 |
CN110531162A (zh) * | 2019-08-30 | 2019-12-03 | 苏州浪潮智能科技有限公司 | 一种测试方法及装置 |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101876674B (zh) * | 2009-04-30 | 2012-11-21 | 鸿富锦精密工业(深圳)有限公司 | 特性阻抗测试系统及方法 |
US8508248B1 (en) * | 2011-02-10 | 2013-08-13 | Juniper Networks, Inc. | Testing vias formed in printed circuit boards |
US9430346B2 (en) * | 2013-03-26 | 2016-08-30 | Texas Instruments Incorporated | Processor power measurement |
US10267846B1 (en) * | 2014-05-02 | 2019-04-23 | EMC IP Holding Company LLC | Printed circuit board (PCB) interconnect defect detection |
US10917976B1 (en) | 2017-07-12 | 2021-02-09 | Juniper Networks, Inc. | Designing a printed circuit board (PCB) to detect slivers of conductive material included within vias of the PCB |
CN113125855B (zh) * | 2021-04-25 | 2023-02-28 | 无锡江南计算技术研究所 | 一种印制板差分信号线阻抗测量方法 |
TWI815345B (zh) * | 2022-03-10 | 2023-09-11 | 興城科技股份有限公司 | 印刷電路板阻抗檢測裝置 |
Citations (1)
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CN1952673A (zh) * | 2005-10-20 | 2007-04-25 | 鸿富锦精密工业(深圳)有限公司 | 电压调整电路效能量测系统及方法 |
Family Cites Families (16)
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US2586319A (en) * | 1948-02-24 | 1952-02-19 | Gen Electric | Electric device continuity tester |
US2610229A (en) * | 1950-09-16 | 1952-09-09 | Western Electric Co | Continuity test apparatus |
US2887622A (en) * | 1953-08-07 | 1959-05-19 | Charles C Rayburn | Electrical circuit pattern tester |
US2950437A (en) * | 1954-08-16 | 1960-08-23 | Textron Inc | Circuit testing apparatus |
US2839723A (en) * | 1954-12-27 | 1958-06-17 | Amelco Inc | Impedance measuring device |
US2874351A (en) * | 1956-09-14 | 1959-02-17 | Western Electric Co | Impedance measuring system |
US3082374A (en) * | 1959-06-12 | 1963-03-19 | Itt | Automatic testing system and timing device therefor |
US3086170A (en) * | 1960-07-27 | 1963-04-16 | Robert E Kemelhor | Ohmmeter with power-source-isolating transducers for testing hazardous or sensitive circuits |
US3134077A (en) * | 1961-09-18 | 1964-05-19 | Tektronix Inc | Electrical probe apparatus for measuring the characteristics of semiconductor material |
US3094212A (en) * | 1961-12-14 | 1963-06-18 | Gen Precision Inc | Automatic component tester |
US3441849A (en) * | 1967-01-13 | 1969-04-29 | Ibm | Testing and addressing apparatus for an array of circuit elements |
US5479610A (en) * | 1993-11-01 | 1995-12-26 | Northrop Grumman Corporation | System interface fault isolator test set |
US6791336B2 (en) * | 2000-04-21 | 2004-09-14 | H. Youval Krigel | Apparatus and method for validating wiring diagrams and creating wirelists |
KR100486972B1 (ko) | 2002-07-09 | 2005-05-03 | 신용준 | 시간-주파수 영역 반사파 처리 방법 |
US20050240831A1 (en) * | 2004-03-31 | 2005-10-27 | Balkman William D | Universal controller and graphical user interface |
US7800385B2 (en) * | 2008-03-13 | 2010-09-21 | Oracle America, Inc. | Apparatus and method for testing electrical interconnects |
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2009
- 2009-06-26 CN CN200910303765.1A patent/CN101930030B/zh active Active
-
2010
- 2010-03-26 US US12/732,201 patent/US8332177B2/en active Active
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1952673A (zh) * | 2005-10-20 | 2007-04-25 | 鸿富锦精密工业(深圳)有限公司 | 电压调整电路效能量测系统及方法 |
Non-Patent Citations (1)
Title |
---|
李更祥: "数字电路板自动测试与故障诊断技术的研究", 《第十一届全国VXI总线与故障诊断技术研讨会论文集》 * |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102636698A (zh) * | 2011-02-10 | 2012-08-15 | 鸿富锦精密工业(深圳)有限公司 | 电路板自动化测试系统及方法 |
CN102788922A (zh) * | 2011-05-18 | 2012-11-21 | 鸿富锦精密工业(深圳)有限公司 | 印刷电路板电源布线的安全检查系统及方法 |
CN104502715A (zh) * | 2014-12-31 | 2015-04-08 | 广州兴森快捷电路科技有限公司 | 阻抗板的阻抗测试方法 |
CN104502715B (zh) * | 2014-12-31 | 2017-07-04 | 广州兴森快捷电路科技有限公司 | 阻抗板的阻抗测试方法 |
CN106940401A (zh) * | 2017-03-13 | 2017-07-11 | 郑州云海信息技术有限公司 | 一种阻抗测试方法及系统 |
CN110531162A (zh) * | 2019-08-30 | 2019-12-03 | 苏州浪潮智能科技有限公司 | 一种测试方法及装置 |
Also Published As
Publication number | Publication date |
---|---|
US8332177B2 (en) | 2012-12-11 |
CN101930030B (zh) | 2014-12-03 |
US20100332169A1 (en) | 2010-12-30 |
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Effective date of registration: 20141027 Address after: Futian District King Road Shenzhen city Guangdong province 518000 No. 108 Tze Wei court 1218 Applicant after: Shenzhen Qichuangmei Technology Co., Ltd. Applicant after: FUXIN POWER SUPPLY COMPANY OF STATE GRID LIAONING ELECTRIC POWER SUPPLY CO., LTD. Address before: 518109 Guangdong city of Shenzhen province Baoan District Longhua Town Industrial Zone tabulaeformis tenth East Ring Road No. 2 two Applicant before: Hongfujin Precise Industry (Shenzhen) Co., Ltd. Applicant before: Hon Hai Precision Industry Co., Ltd. |
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Effective date of registration: 20150514 Address after: 518057 Guangdong, Futian District Binhe Road, Binjiang village, East District, building 8,, 502 Patentee after: Feng Lin Address before: Futian District King Road Shenzhen city Guangdong province 518000 No. 108 Tze Wei court 1218 Patentee before: Shenzhen Qichuangmei Technology Co., Ltd. Patentee before: FUXIN POWER SUPPLY COMPANY OF STATE GRID LIAONING ELECTRIC POWER SUPPLY CO., LTD. |
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Effective date of registration: 20151116 Address after: 226299 508 Xin Hong Road, Qidong Economic Development Zone, Jiangsu, Nantong Patentee after: Kunshan Yuquan Mold Industry Co., Ltd. Address before: 518057 Guangdong, Futian District Binhe Road, Binjiang village, East District, building 8,, 502 Patentee before: Feng Lin |
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Effective date of registration: 20200107 Address after: 226200 industrial concentration zone, Minzhu Town, Beixin Town, Qidong City, Nantong City, Jiangsu Province Patentee after: Qidong lvtu Electromechanical Technology Co., Ltd Address before: 226299 508 Xin Hong Road, Qidong Economic Development Zone, Jiangsu, Nantong Patentee before: Jiangsu Yalian Mechatronics Manufacturing Co., Ltd. |
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