CN101909877A - Method for manufacturing double layer copper clad laminated board, and double layer copper clad laminated board - Google Patents
Method for manufacturing double layer copper clad laminated board, and double layer copper clad laminated board Download PDFInfo
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- CN101909877A CN101909877A CN2008801227941A CN200880122794A CN101909877A CN 101909877 A CN101909877 A CN 101909877A CN 2008801227941 A CN2008801227941 A CN 2008801227941A CN 200880122794 A CN200880122794 A CN 200880122794A CN 101909877 A CN101909877 A CN 101909877A
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- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 title claims abstract description 46
- 229910052802 copper Inorganic materials 0.000 title claims abstract description 46
- 239000010949 copper Substances 0.000 title claims abstract description 46
- 238000000034 method Methods 0.000 title claims abstract description 15
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 9
- 229920001721 polyimide Polymers 0.000 claims abstract description 31
- 238000012360 testing method Methods 0.000 claims abstract description 26
- 238000004544 sputter deposition Methods 0.000 claims abstract description 19
- 238000009713 electroplating Methods 0.000 claims description 9
- 229910045601 alloy Inorganic materials 0.000 claims description 6
- 239000000956 alloy Substances 0.000 claims description 6
- 230000003746 surface roughness Effects 0.000 claims description 5
- 239000002184 metal Substances 0.000 claims description 3
- 229910052751 metal Inorganic materials 0.000 claims description 3
- 229910052759 nickel Inorganic materials 0.000 claims description 3
- 238000005253 cladding Methods 0.000 claims 1
- 238000010438 heat treatment Methods 0.000 abstract description 21
- 239000000463 material Substances 0.000 abstract description 10
- 238000007747 plating Methods 0.000 abstract description 10
- 230000000052 comparative effect Effects 0.000 description 9
- VNNRSPGTAMTISX-UHFFFAOYSA-N chromium nickel Chemical compound [Cr].[Ni] VNNRSPGTAMTISX-UHFFFAOYSA-N 0.000 description 7
- 229910001120 nichrome Inorganic materials 0.000 description 7
- 238000005452 bending Methods 0.000 description 5
- 238000005530 etching Methods 0.000 description 5
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 229910000365 copper sulfate Inorganic materials 0.000 description 2
- ARUVKPQLZAKDPS-UHFFFAOYSA-L copper(II) sulfate Chemical compound [Cu+2].[O-][S+2]([O-])([O-])[O-] ARUVKPQLZAKDPS-UHFFFAOYSA-L 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 238000009832 plasma treatment Methods 0.000 description 2
- QPLDLSVMHZLSFG-UHFFFAOYSA-N Copper oxide Chemical compound [Cu]=O QPLDLSVMHZLSFG-UHFFFAOYSA-N 0.000 description 1
- 229910021591 Copper(I) chloride Inorganic materials 0.000 description 1
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- OXBLHERUFWYNTN-UHFFFAOYSA-M copper(I) chloride Chemical compound [Cu]Cl OXBLHERUFWYNTN-UHFFFAOYSA-M 0.000 description 1
- ORTQZVOHEJQUHG-UHFFFAOYSA-L copper(II) chloride Chemical compound Cl[Cu]Cl ORTQZVOHEJQUHG-UHFFFAOYSA-L 0.000 description 1
- 239000003792 electrolyte Substances 0.000 description 1
- 239000002648 laminated material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/38—Improvement of the adhesion between the insulating substrate and the metal
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0277—Bendability or stretchability details
- H05K1/028—Bending or folding regions of flexible printed circuits
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
- H05K1/0393—Flexible materials
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/09—Treatments involving charged particles
- H05K2203/095—Plasma, e.g. for treating a substrate to improve adhesion with a conductor or for cleaning holes
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/11—Treatments characterised by their effect, e.g. heating, cooling, roughening
- H05K2203/1105—Heating or thermal processing not related to soldering, firing, curing or laminating, e.g. for shaping the substrate or during finish plating
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/14—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using spraying techniques to apply the conductive material, e.g. vapour evaporation
- H05K3/16—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using spraying techniques to apply the conductive material, e.g. vapour evaporation by cathodic sputtering
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/38—Improvement of the adhesion between the insulating substrate and the metal
- H05K3/381—Improvement of the adhesion between the insulating substrate and the metal by special treatment of the substrate
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/38—Improvement of the adhesion between the insulating substrate and the metal
- H05K3/388—Improvement of the adhesion between the insulating substrate and the metal by the use of a metallic or inorganic thin film adhesion layer
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/12—All metal or with adjacent metals
- Y10T428/12431—Foil or filament smaller than 6 mils
- Y10T428/12438—Composite
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/12—All metal or with adjacent metals
- Y10T428/12493—Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.]
- Y10T428/12535—Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.] with additional, spatially distinct nonmetal component
- Y10T428/12556—Organic component
- Y10T428/12569—Synthetic resin
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/12—All metal or with adjacent metals
- Y10T428/12493—Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.]
- Y10T428/12771—Transition metal-base component
- Y10T428/12861—Group VIII or IB metal-base component
- Y10T428/12903—Cu-base component
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/12—All metal or with adjacent metals
- Y10T428/12493—Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.]
- Y10T428/12771—Transition metal-base component
- Y10T428/12861—Group VIII or IB metal-base component
- Y10T428/12903—Cu-base component
- Y10T428/1291—Next to Co-, Cu-, or Ni-base component
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/12—All metal or with adjacent metals
- Y10T428/12493—Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.]
- Y10T428/12771—Transition metal-base component
- Y10T428/12861—Group VIII or IB metal-base component
- Y10T428/12944—Ni-base component
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
- Y10T428/24355—Continuous and nonuniform or irregular surface on layer or component [e.g., roofing, etc.]
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/31504—Composite [nonstructural laminate]
- Y10T428/31678—Of metal
- Y10T428/31681—Next to polyester, polyamide or polyimide [e.g., alkyd, glue, or nylon, etc.]
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Laminated Bodies (AREA)
- Manufacturing Of Printed Wiring (AREA)
- Parts Printed On Printed Circuit Boards (AREA)
Abstract
Description
技术领域technical field
本发明涉及利用溅射和电镀处理在聚酰亚胺薄膜上形成有铜层的双层覆铜层压板中提高该层压板的耐折性的双层覆铜层压板的制造方法以及由此得到的双层覆铜层压板。The present invention relates to a method for manufacturing a double-layer copper-clad laminate that improves the folding resistance of the laminate in a double-layer copper-clad laminate in which a copper layer is formed on a polyimide film by sputtering and electroplating, and the resulting double layer copper clad laminate.
另外,上述双层覆铜层压板中包含为了增加接合强度而形成薄中间层,将该中间层包含在内称为聚酰亚胺薄膜与铜层的“双层覆铜层压板”。In addition, the above-mentioned two-layer copper-clad laminate includes a thin intermediate layer in order to increase the bonding strength, and this intermediate layer is called a "two-layer copper-clad laminate" including a polyimide film and a copper layer.
背景技术Background technique
近年来,作为要求细间距电路的液晶显示器等的驱动IC安装用电路材料,使用在聚酰亚胺薄膜上形成有铜层的双层覆铜层压板(CCL:Cu Clad Laminate)材料。作为COF(薄膜覆晶:Chip On Film)的层压材料使用的双层CCL材料中,特别是利用溅射和电镀处理制作的双层CCL材料引起关注。In recent years, double-layer copper clad laminates (CCL: Cu Clad Laminate) materials in which a copper layer is formed on a polyimide film have been used as circuit materials for mounting driver ICs such as liquid crystal displays that require fine-pitch circuits. Among the double-layer CCL materials used as COF (chip on film: Chip On Film) laminate materials, especially the double-layer CCL materials produced by sputtering and plating have attracted attention.
双层CCL材料是利用溅射在聚酰亚胺薄膜(PI)上形成亚微米级的铜层后,通过硫酸铜电镀处理形成铜层而得到的。基础发明如下述专利文献1所述。The double-layer CCL material is obtained by forming a submicron copper layer on a polyimide film (PI) by sputtering, and then forming a copper layer by copper sulfate electroplating. The basic invention is described in Patent Document 1 below.
薄膜覆晶(Chip On Film)用于液晶电视、有机EL电视等薄型电视,电路的外引线部折弯而使用,因此耐折弯性(耐折性)必须较高。Chip On Film (Chip On Film) is used in thin TVs such as LCD TVs and organic EL TVs. The outer leads of the circuit are bent and used, so the bending resistance (folding resistance) must be high.
但是,随着电路细间距化的进行,电路宽度变窄,产生强度下降的问题。结果,产生外引线部断线的问题。However, as the finer pitch of the circuit progresses, the width of the circuit becomes narrower, resulting in a problem of lowering the strength. As a result, there is a problem of disconnection of the outer lead portion.
专利文献1:美国专利第5685970号公报Patent Document 1: US Patent No. 5,685,970
发明内容Contents of the invention
鉴于以上问题,本申请发明的目的在于提供在利用溅射和电镀处理在聚酰亚胺薄膜上形成有铜层的双层覆铜层压板(双层CCL材料)中,耐折性提高、可以防止电路的外引线部断裂的双层覆铜层压板的制造方法及由此得到的双层覆铜层压板。In view of the above problems, the purpose of the invention of the present application is to provide in utilizing sputtering and electroplating process to be formed with the double-layer copper-clad laminate (double-layer CCL material) of copper layer on polyimide film, folding resistance improves, can A method of manufacturing a double-layer copper-clad laminate for preventing breakage of an outer lead portion of a circuit, and a double-layer copper-clad laminate obtained thereby.
本发明人等为了解决上述问题进行了广泛深入的研究,结果发现,在通过溅射和电镀处理在聚酰亚胺薄膜上形成有铜层的双层CCL材料的制造时,通过在特定的条件下进行热处理,可以显著提高耐折性。The inventors of the present invention have carried out extensive and in-depth research in order to solve the above-mentioned problems, and found that when processing a double-layer CCL material with a copper layer on a polyimide film by sputtering and electroplating, by applying certain conditions Under heat treatment, the folding resistance can be significantly improved.
基于这样的发现,本申请提供以下发明。Based on such findings, the present application provides the following inventions.
1)一种耐折性提高的双层覆铜层压板的制造方法,其特征在于,通过在100℃以上且175℃以下的温度下对利用溅射和电镀处理在聚酰亚胺薄膜上形成有铜层的双层覆铜层压板进行热处理,而具有通过基于JIS C6471的耐折性试验测定的150次以上的耐折性。1) A method for manufacturing a double-layer copper-clad laminate with improved folding resistance, characterized in that the polyimide film is formed on a polyimide film by sputtering and electroplating at a temperature above 100°C and below 175°C. The double-layer copper-clad laminate with the copper layer undergoes heat treatment, and has a folding resistance of more than 150 times measured by a folding resistance test based on JIS C6471.
2)如上述1)所述的双层覆铜层压板的制造方法,其中,通过溅射在聚酰亚胺薄膜上形成NiCr合金,并且在聚酰亚胺薄膜与铜层之间形成NiCr合金层。2) The method for manufacturing a double-layer copper-clad laminate as described in 1) above, wherein a NiCr alloy is formed on the polyimide film by sputtering, and a NiCr alloy is formed between the polyimide film and the copper layer layer.
另外,本申请提供以下发明。In addition, this application provides the following inventions.
3)一种双层覆铜层压板,具有聚酰亚胺薄膜和在其上形成的铜层,其特征在于,具有由基于JIS C6471的耐折性试验测定的150次以上的耐折性。3) A double-layer copper-clad laminate having a polyimide film and a copper layer formed thereon, characterized in that it has a folding endurance of 150 times or more as measured by a folding endurance test based on JIS C6471.
4)如上述3)所述的双层覆铜层压板,其特征在于,在所述聚酰亚胺薄膜与铜层之间还具有NiCr合金层。4) The double-layer copper-clad laminate described in 3) above is characterized in that a NiCr alloy layer is further provided between the polyimide film and the copper layer.
发明效果Invention effect
根据本发明得到的双层覆铜层压板,可以得到提高耐折性、能够有效防止电路的外引线部断裂的优良效果。According to the double-layer copper-clad laminate obtained by the present invention, the excellent effects of improving the folding resistance and effectively preventing the outer lead part of the circuit from breaking can be obtained.
附图说明Description of drawings
图1是耐折性试验(JIS C6471)中使用的试验片的说明图。Fig. 1 is an explanatory diagram of a test piece used in a folding test (JIS C6471).
具体实施方式Detailed ways
关于通过本发明得到的双层覆铜层压板,首先设置在真空室内并通过等离子体处理将聚酰亚胺薄膜表面活化后,利用溅射附着10~30nm的Ni、Co、Cr的单金属层或包含它们中两种以上而成的合金层例如NiCr层(20%Cr),之后利用溅射形成亚微米级的铜层。Regarding the double-layer copper-clad laminate obtained by the present invention, first place it in a vacuum chamber and activate the surface of the polyimide film by plasma treatment, and then attach a single metal layer of 10 to 30 nm of Ni, Co, and Cr by sputtering Or an alloy layer comprising two or more of them, such as a NiCr layer (20% Cr), and then sputtering is used to form a submicron copper layer.
这样得到的铜层,由于是用于后面进行的电解铜层形成的种子,因此称为铜种子层。The copper layer thus obtained is called a copper seed layer because it is a seed for the formation of the electrolytic copper layer to be performed later.
然后,使用铜种子层进行电镀处理。电镀处理通过硫酸铜电镀等进行。通过调节电镀时的电流密度、电解液温度,可以任意地调节镀层厚度。由此,可以得到聚酰亚胺薄膜与铜层的双层覆铜层压板。电镀处理可以使用本申请人以前开发的电镀液(参考WO2006/080148)。镀层的表面粗糙度使用非接触式表面粗糙度计(Veeco公司制)进行测定,其结果,Ra为0.01-0.04,Rt为0.14-1.0、Rz为0.1-0.90。Then, electroplating treatment is performed using a copper seed layer. The plating treatment is performed by copper sulfate plating or the like. By adjusting the current density and electrolyte temperature during electroplating, the thickness of the coating can be adjusted arbitrarily. Thus, a double-layer copper-clad laminate of a polyimide film and a copper layer can be obtained. For the plating treatment, a plating solution previously developed by the present applicant can be used (refer to WO2006/080148). The surface roughness of the plating layer was measured using a non-contact surface roughness meter (manufactured by Veeco). As a result, Ra was 0.01-0.04, Rt was 0.14-1.0, and Rz was 0.1-0.90.
通过溅射形成亚微米级的铜层前,可以通过溅射在聚酰亚胺薄膜表面形成包含NiCr的连接层(Tie Coat)。聚酰亚胺薄膜表面的等离子体处理和连接层在提高粘接性方面是有效的手段。本申请发明包括这些处理。Before forming a submicron copper layer by sputtering, a connection layer (Tie Coat) containing NiCr can be formed on the surface of the polyimide film by sputtering. Plasma treatment of polyimide film surface and tie layer are effective means in improving adhesion. The invention of this application includes these processes.
如前所述,本发明包括为了增大接合强度而形成薄中间层即包含NiCr的连接层,连同该中间层在内称为聚酰亚胺薄膜与铜层的“双层覆铜层压板”。As mentioned above, the present invention includes forming a thin intermediate layer, that is, a connection layer containing NiCr in order to increase the bonding strength, together with this intermediate layer called "double-layer copper-clad laminate" of polyimide film and copper layer .
本发明的双层CCL材料中使用的聚酰亚胺薄膜只要能够实现本发明则没有特别限制,优选使用BPDA-PPD系聚酰亚胺薄膜。The polyimide film used for the double-layer CCL material of the present invention is not particularly limited as long as the present invention can be realized, but a BPDA-PPD-based polyimide film is preferably used.
在100℃以上且175℃以下的温度下对利用溅射和电镀处理在聚酰亚胺薄膜上形成铜层而得到的双层覆铜层压板进行热处理。由此,可以具有通过基于JIS C6471的耐折性试验测定的150次以上的耐折性。A two-layer copper-clad laminate obtained by forming a copper layer on a polyimide film by sputtering and plating is heat-treated at a temperature of 100° C. or higher and 175° C. or lower. Accordingly, it is possible to have a folding endurance of 150 times or more measured by a folding endurance test based on JIS C6471.
所述热处理条件如果是低于100℃或者超过175℃的温度,则均不具有150次以上的耐折性。因此,需要在100℃以上且175℃以下的温度下进行热处理。If the heat treatment conditions are lower than 100° C. or higher than 175° C., none of them will have a folding resistance of 150 times or more. Therefore, heat treatment needs to be performed at a temperature of 100°C or higher and 175°C or lower.
基于JIS C6471的耐折性试验的试验条件如下所述。The test conditions of the folding test based on JIS C6471 are as follows.
使用R=0.38、负荷500gf、折弯角度:135°±5°、175cpm(每分钟175次的比例的折弯)、L/S为1mm的耐折性试验片,将直到断裂为止的次数作为耐折性。Using a folding resistance test piece with R=0.38, load 500gf, bending angle: 135°±5°, 175cpm (175 bending times per minute), and L/S of 1mm, the number of times until breaking was defined as Folding resistance.
在制作试验片时,在所述热处理后的双层覆铜层压板上压接干膜,将其曝光而形成图案,进行蚀刻处理而除去铜的不需要的部分。并且,最后除去干膜,在聚酰亚胺薄膜上形成电路。使用这样制作的试验片。When producing a test piece, a dry film was crimped on the heat-treated two-layer copper-clad laminate, exposed to light to form a pattern, and an etching process was performed to remove unnecessary portions of copper. And, finally, the dry film is removed, and a circuit is formed on the polyimide film. The test piece produced in this way was used.
该电路形成法是通常进行的方法,也可以进行其它方法。铜层的蚀刻液通常使用下述液体组成的蚀刻液。This circuit forming method is a method generally performed, and other methods may also be performed. The etchant of the copper layer generally uses an etchant of the following liquid composition.
(液体组成)(liquid composition)
氯化铜溶液(CuCl2)、氧化铜(CuO)Copper Chloride Solution (CuCl 2 ), Copper Oxide (CuO)
盐酸(HCl):3.50mol/L(在0~6mol/L的范围内调节)Hydrochloric acid (HCl): 3.50mol/L (adjust within the range of 0-6mol/L)
过氧化氢(H2O2):30.0Cap(在0~99.9Cap的范围内调节)Hydrogen peroxide (H 2 O 2 ): 30.0Cap (adjust within the range of 0-99.9Cap)
实施例Example
以下,基于实施例和比较例对本发明的特征进行具体说明。另外,以下说明用于容易地理解本申请发明,本发明不限于此。即,本申请发明也包括基于本申请发明的技术思想的变形、实施方式以及其它例子。Hereinafter, the characteristic of this invention is demonstrated concretely based on an Example and a comparative example. In addition, the following description is for easy understanding of the present invention, and the present invention is not limited thereto. That is, the invention of this application also includes modifications, embodiments, and other examples based on the technical idea of the invention of this application.
(实施例1)(Example 1)
使用厚度34μm的聚酰亚胺薄膜(宇部兴产株式会社制,UpilexSGA),通过溅射附着25nm的NiCr层(20%Cr)后,通过溅射和电镀处理形成厚度8μm的铜层。使用真空热处理炉在100℃下对该双层覆铜层压板进行2小时热处理。Using a polyimide film with a thickness of 34 μm (Ube Industries, Ltd., UpilexSGA), a NiCr layer (20% Cr) of 25 nm was deposited by sputtering, and then a copper layer with a thickness of 8 μm was formed by sputtering and plating. The double-layer copper-clad laminate was heat-treated at 100° C. for 2 hours using a vacuum heat-treatment furnace.
在该热处理后的双层覆铜层压板上层压干膜,并将其曝光而形成图案,利用上述蚀刻液通过蚀刻处理除去铜的不需要的部分,形成L/S=1mm的电路。A dry film was laminated on the heat-treated double-layer copper-clad laminate, and patterned by exposure. Unnecessary parts of copper were removed by etching using the above-mentioned etching solution to form a circuit with L/S=1 mm.
然后,最后除去干膜,制成15mm×130mm尺寸的试验片。聚酰亚胺薄膜上的电路由连续的一条构成,沿聚酰亚胺薄膜的长度方向折返,成为平行并排6条电路的结构。试验片的说明图如图1所示。Then, the dry film was finally removed to prepare a test piece with a size of 15 mm×130 mm. The circuit on the polyimide film is composed of a continuous one, which is folded back along the length direction of the polyimide film to form a structure of six parallel circuits. An explanatory diagram of the test piece is shown in FIG. 1 .
使用该试验片,进行基于JIS C6471的耐折性试验。使用テスタ一产业制的试验机。试验在R=0.38、负荷500gf、折弯角度:135度、175cpm(每分钟175次的比例的折弯)的条件下实施。包含后述的实施例和比较例,结果如表1所示。Using this test piece, a folding test based on JIS C6471 was performed. A testing machine manufactured by Testa Industrial Co., Ltd. was used. The test was carried out under the conditions of R=0.38, load 500gf, bending angle: 135 degrees, and 175 cpm (bending at a ratio of 175 times per minute). The results are shown in Table 1 including Examples and Comparative Examples described later.
如表1所示,直到断裂为止的耐折性(MIT)为154次。本例子具有本申请发明的150次以上的耐折性。As shown in Table 1, the folding endurance (MIT) until breaking was 154 times. This example has a folding endurance of 150 times or more in the invention of the present application.
表1Table 1
耐折性:MIT(直到断裂为止的折弯次数)、-:无热处理Folding resistance: MIT (number of bends until fracture), -: no heat treatment
(实施例2)(Example 2)
使用真空热处理炉,在125℃下对上述实施例1中使用的双层覆铜层压板进行2小时热处理。The double-layer copper-clad laminate used in Example 1 above was heat-treated at 125° C. for 2 hours using a vacuum heat-treatment furnace.
与实施例1同样地在该热处理后的双层覆铜层压板上层压干膜,再将其曝光而形成图案,并进行蚀刻处理而除去铜的不需要的部分,形成宽度1mm的电路。In the same manner as in Example 1, a dry film was laminated on the heat-treated double-layer copper-clad laminate, and then exposed to form a pattern, and an etching treatment was performed to remove unnecessary parts of copper to form a circuit with a width of 1 mm.
然后,与实施例1同样地进行基于JIS C6471的耐折性试验。如表1所示,直到断裂为止的耐折性(MIT)为178次。本例子具有本申请发明的150次以上的耐折性。另外,耐折性(MIT)比实施例1进一步提高。Then, a folding test based on JIS C6471 was performed in the same manner as in Example 1. As shown in Table 1, the folding endurance (MIT) until breaking was 178 times. This example has a folding endurance of 150 times or more in the invention of the present application. In addition, folding endurance (MIT) was further improved compared with Example 1.
(实施例3)(Example 3)
使用真空热处理炉,在150℃下对上述实施例1中使用的双层覆铜层压板进行2小时热处理。The double-layer copper-clad laminate used in Example 1 above was heat-treated at 150° C. for 2 hours using a vacuum heat treatment furnace.
与实施例1同样地在该热处理后的双层覆铜层压板上层压干膜,并将其曝光而形成图案,并进行蚀刻处理而除去铜的不需要的部分,形成宽度1mm的电路。In the same manner as in Example 1, a dry film was laminated on the heat-treated two-layer copper-clad laminate, exposed to light, patterned, and etched to remove unnecessary copper to form a circuit with a width of 1 mm.
然后,与实施例1同样地进行基于JIS C6471的耐折性试验。如表1所示,直到断裂为止的耐折性(MIT)为161次。本例子具有本申请发明的150次以上的耐折性。另外,耐折性(MIT)比实施例1进一步提高。Then, a folding test based on JIS C6471 was performed in the same manner as in Example 1. As shown in Table 1, the folding endurance (MIT) until breaking was 161 times. This example has a folding endurance of 150 times or more in the invention of the present application. In addition, folding endurance (MIT) was further improved compared with Example 1.
(实施例4)(Example 4)
使用真空热处理炉,在175℃下对上述实施例1中使用的双层覆铜层压板进行2小时热处理。The double-layer copper-clad laminate used in Example 1 above was heat-treated at 175° C. for 2 hours using a vacuum heat treatment furnace.
与实施例1同样地在该热处理后的双层覆铜层压板上层压干膜,并将其曝光而形成图案,并进行蚀刻处理而除去铜的不需要的部分,形成宽度1mm的电路。In the same manner as in Example 1, a dry film was laminated on the heat-treated two-layer copper-clad laminate, exposed to light, patterned, and etched to remove unnecessary copper to form a circuit with a width of 1 mm.
然后,与实施例1同样地进行基于JIS C6471的耐折性试验。如表1所示,直到断裂为止的耐折性(MIT)为150次。本例子具有本申请发明的150次以上的耐折性,但是耐折性(MIT)比实施例2、3下降。Then, a folding test based on JIS C6471 was performed in the same manner as in Example 1. As shown in Table 1, the folding endurance (MIT) until breaking was 150 times. This example has the folding endurance of 150 times or more of the invention of the present application, but the folding endurance (MIT) is lower than that of Examples 2 and 3.
从以上例子可以看出,100~175℃的热处理提高耐折性,但是可知在下限附近或上限附近耐折性均几乎没有提高。As can be seen from the above examples, heat treatment at 100 to 175° C. improves the folding resistance, but it can be seen that the folding resistance is hardly improved near the lower limit or near the upper limit.
因此,实施例2和实施例3的条件可以说是更合适的条件。实施例中进行2小时热处理,但是由于热处理本身在比较低的温度下进行,因此即使热处理时间超过2小时而为较长的时间,耐折性也几乎没有变化。长时间的热处理是生产率变差的原因,因此可以说希望在约1小时~约5小时的范围内进行。Therefore, the conditions of Example 2 and Example 3 can be said to be more suitable conditions. In the examples, the heat treatment was performed for 2 hours, but since the heat treatment itself is performed at a relatively low temperature, even if the heat treatment time is longer than 2 hours, the folding resistance hardly changes. Long-time heat treatment is a cause of poor productivity, so it can be said that it is desirable to perform it within a range of about 1 hour to about 5 hours.
(比较例1)(comparative example 1)
将上述实施例1中使用的双层覆铜层压板不进行热处理而作为试验片。与实施例1同样地在该双层覆铜层压板上层压干膜,并将其曝光而形成图案,并进行蚀刻处理而除去铜的不需要的部分,形成宽度1mm的电路。The two-layer copper-clad laminate used in Example 1 above was used as a test piece without heat treatment. In the same manner as in Example 1, a dry film was laminated on this two-layer copper-clad laminate, exposed to light to form a pattern, and an etching process was performed to remove unnecessary portions of copper to form a circuit with a width of 1 mm.
然后,与实施例1同样地进行基于JIS C6471的耐折性试验。如表1所示,直到断裂为止的耐折性(MIT)为124次。本例子完全不具有本申请发明的150次以上的耐折性。本例子为现有技术的双层覆铜层压板,不能应对由于进行电路细间距化造成电路宽度变窄而强度下降的问题,可以容易地预测会发生外引线部产生断线的故障。Then, a folding test based on JIS C6471 was performed in the same manner as in Example 1. As shown in Table 1, the folding endurance (MIT) until breaking was 124 times. This example does not have the folding endurance of 150 times or more in the invention of the present application at all. This example is a conventional double-layer copper-clad laminate, which cannot cope with the problem of narrowing the circuit width and reducing the strength due to the fine pitch of the circuit, and it is easy to predict the occurrence of a failure of the outer lead part to be disconnected.
(比较例2)(comparative example 2)
使用真空热处理炉,在75℃下对上述实施例1中使用的双层覆铜层压板进行2小时热处理。The double-layer copper-clad laminate used in Example 1 above was heat-treated at 75° C. for 2 hours using a vacuum heat treatment furnace.
与实施例1同样地在该热处理后的双层覆铜层压板上层压干膜,并将其曝光而形成图案,并进行蚀刻处理而除去铜的不需要的部分,形成宽度1mm的电路。In the same manner as in Example 1, a dry film was laminated on the heat-treated two-layer copper-clad laminate, exposed to light, patterned, and etched to remove unnecessary copper to form a circuit with a width of 1 mm.
然后,与实施例1同样地进行基于JIS C6471的耐折性试验。如表1所示,直到断裂为止的耐折性(MIT)为136次。本例子不具有本申请发明的150次以上的耐折性。因此,可以确认是因为热处理温度不足。Then, a folding test based on JIS C6471 was performed in the same manner as in Example 1. As shown in Table 1, the folding endurance (MIT) until breaking was 136 times. This example does not have the folding endurance of 150 times or more of the invention of the present application. Therefore, it was confirmed that the heat treatment temperature was insufficient.
(比较例3)(comparative example 3)
使用真空热处理炉,在200℃下对上述实施例1中使用的双层覆铜层压板进行2小时热处理。The double-layer copper-clad laminate used in Example 1 above was heat-treated at 200° C. for 2 hours using a vacuum heat treatment furnace.
与实施例1同样地在该热处理后的双层覆铜层压板上层压干膜,并将其曝光而形成图案,并进行蚀刻处理而除去铜的不需要的部分,形成宽度1mm的电路。In the same manner as in Example 1, a dry film was laminated on the heat-treated two-layer copper-clad laminate, exposed to light, patterned, and etched to remove unnecessary copper to form a circuit with a width of 1 mm.
然后,与实施例1同样地进行基于JIS C6471的耐折性试验。如表1所示,直到断裂为止的耐折性(MIT)为138次。本例子不具有本申请发明的150次以上的耐折性。因此,可以看出即使热处理温度过高耐折性也会变差。Then, a folding test based on JIS C6471 was performed in the same manner as in Example 1. As shown in Table 1, the folding endurance (MIT) until breaking was 138 times. This example does not have the folding endurance of 150 times or more of the invention of the present application. Therefore, it can be seen that the folding resistance deteriorates even if the heat treatment temperature is too high.
产业实用性Industrial applicability
根据本发明得到的双层覆铜层压板,可以得到提高耐折性、可以有效防止电路的外引线部的断裂的优良效果,因此最适合作为要求细间距电路的液晶显示器等驱动IC安装用电路材料。According to the double-layer copper-clad laminate obtained by the present invention, the excellent effect of improving the folding resistance and effectively preventing the breakage of the outer lead part of the circuit can be obtained, so it is most suitable as a driver IC mounting circuit such as a liquid crystal display that requires a fine-pitch circuit. Material.
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- 2008-12-15 US US12/810,160 patent/US8470450B2/en not_active Expired - Fee Related
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
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CN113584537A (en) * | 2021-08-03 | 2021-11-02 | 东强(连州)铜箔有限公司 | Ultra-thin copper foil with resin layer and extremely low roughness and manufacturing method thereof |
CN116200744A (en) * | 2021-12-01 | 2023-06-02 | 东丽尖端素材株式会社 | Flexible copper-clad laminate film, method for producing same, and electrical element comprising same |
Also Published As
Publication number | Publication date |
---|---|
US20100279069A1 (en) | 2010-11-04 |
CN101909877B (en) | 2013-03-06 |
KR20100075665A (en) | 2010-07-02 |
KR101199816B1 (en) | 2012-11-12 |
TW200932939A (en) | 2009-08-01 |
WO2009084412A1 (en) | 2009-07-09 |
JP4440340B2 (en) | 2010-03-24 |
JPWO2009084412A1 (en) | 2011-05-19 |
US8470450B2 (en) | 2013-06-25 |
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