CN101907662B - Single-event effect detection device and method - Google Patents
Single-event effect detection device and method Download PDFInfo
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- CN101907662B CN101907662B CN2009100865161A CN200910086516A CN101907662B CN 101907662 B CN101907662 B CN 101907662B CN 2009100865161 A CN2009100865161 A CN 2009100865161A CN 200910086516 A CN200910086516 A CN 200910086516A CN 101907662 B CN101907662 B CN 101907662B
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Abstract
The invention provides a single-event effect detection device, which comprises a light-coupler sensor working unit, an SET amplitude discriminator unit and an SET counting unit, wherein the light-coupler sensor working unit is used for acquiring an SET signal from a radiation environment to be detected; the SET amplitude discriminator unit is used for comparing the SET signal amplitude obtained by the light-coupler sensor working unit with a threshold voltage to discriminate the amplitude ranges of different SET signals; and the SET counting unit is used for counting the number of the SET signals in each amplitude range. The device may also comprise a data mapping unit. The device and the method can realize the measurement of the values of several or tens of MeV.cm<2>/mg LETs and the measurement of the radiation environment of lower magnitudes and quantitatively measure the LET value for characterizing the single event effect of a specific micro electronic element, has a wider LET value quantitative measurement range. In addition, the used sensor has a small volume and small mass; the circuit structure is simple; and the lightening, miniaturization and low power consumption of the detection device can be realized easily.
Description
Technical field
The present invention relates to the Space Radiation Effects field of detecting, specifically, the present invention relates to a kind of single-event effect detection device and method.
Background technology
Space environment is harm spacecraft safety and reliable key factor.And Space Radiation Effects is the outstanding environmental effect of bringing out the unusual or fault of spacecraft.Radiation environments such as the high energy charged particles in space, magnetospheric substorm injection and aurora sedimentation plasma; Be prone to bring out a series of radiation effects such as total dose effect, single particle effect, surface and deep layer charge effects, wherein single particle effect is to bring out one of radiation effect that spacecraft is unusual or fault is maximum.On the basis that the single particle effect and the guard technology of digital integrated circuit are furtherd investigate, international space flight circle finds that the unusual and localization of fault of many cases spacecraft is in the single particle effect of photoelectric device and analog device.Variation with respect to the logical bit state in the digital circuit; After occurring in single particle effect in photoelectric device and the analog device and showing as sensitive part in these devices and hit by single particle; Output terminal at device produces unusual output pulse; Be called single-particle transient pulse (Single EventTransient, SET) effect.
Along with the development of semiconductor device technology, its ability of resisting single particle effect sharply descends, and is more serious to the threat of spacecraft.Along with the features in semiconductor devices process reaches deep-submicron, sub-micro, the device integrated level is higher, arithmetic speed is faster, shows excellent electric performance more; But because the required lowest charge of driving element cell operation reduces significantly, the modern crafts device shows single particle effect responsive more inevitably.The application of international space flight circle in nearest 5 years shows; When characteristic dimension reaches and be lower than 0.35 μ m; The above large scale integrated circuit in 1M position shows extremely responsive single particle effect; Even needed the locking single particle effect of higher LET (the LET full name is linear energy transfer, is translated into the linear energy transmission) threshold value also to be easier to now take place originally.And more the semiconductor process techniques of small-feature-size is still in fast development, and the single particle effect that Future Spacecraft faces threatens severe more.
To the serious threat of single particle effect to spacecraft, multiple counter-measure has been taked in space flight circle both at home and abroad, like the protection design of multiple mode, and through implementing initiatively protection etc. in the rail monitoring.To single particle effect effectively, accurately survey, be to implement the initiatively important prerequisite of protection at rail, also be simultaneously to obtain and study different space environments/space weather disturbance event and human solar-system operation is influenced the important means of rule.The single particle effect Detection Techniques that developed at present both at home and abroad mainly contain two types; The first kind is directly to adopt the device (mainly be static memory SRAM) responsive to single particle effect, the frequency of the single particle effect (mainly being single-particle inversion SEU) that takes place in the rail detection means; Second type is to adopt traditional high energy charged particles detector (mainly being semiconductor detector); Detect high LET (the very high linear energy transfer that possibly bring out single particle effect targetedly; Be abbreviated as VHLET) incident, the star that deduction possibly cause is with the degree of device single particle effect.These two types of single particle effect Detection Techniques have realized the detection to single particle effect to a certain extent, but bigger drawback is all arranged.
1. with the SRAM device single particle effect Detection Techniques of sensor
With the SRAM device is that the single particle effect Detection Techniques of sensor can directly measure the single particle effect phenomenon.The deficiency that this technology is outstanding is; Measurement result can only reflect the sensor that is adopted; The single particle effect degree that promptly has the SRAM device of certain fixed L ET threshold value, the difficult single particle effect degree of accurately inferring device with other LET threshold values, so measurement result has bigger one-sidedness.In theory, can change the bias voltage of sensor SRAM, make it have different LET threshold values through certain limit ground; But the actual realization of this detection thinking is difficulty relatively; Even can realize, also can only be that timesharing is measured.Certainly, can measure through the SRAM device that multi-disc has Different L ET threshold value is set, but this parallel measurement need expend more resources.
With the SRAM device is that another deficiency of single particle effect Detection Techniques of sensor is; Adopt the such digital integrated circuit of SRAM as the single particle effect sensor; Need to make up peripheral circuit it is carried out reading and writing, detection and the statistics of bank bit; Do not have the different of essence with the data processing digital circuit of practical application, relatively complicated, corresponding detector quality, volume, power consumption etc. are also relatively large.2. with the semiconductor detector single particle effect Detection Techniques of sensor
The single particle effect Detection Techniques that with the semiconductor detector are sensor have adopted the particle energy detector, can realize the detection of many LET threshold value particle incident incident in principle.But; Because the restriction of SPACE APPLICATION reliability; The net thickness of the semiconductor detector that can adopt is thicker, be generally about 400 μ m, this with current microelectronic component to single particle effect sensitizing range thickness be to the maximum micron, ten microns magnitude differs greatly.Because it is big effectively to survey thickness, this technology is several MeV.cm for the LET value that can bring out modern crafts device single particle effect
2The heavy ion of/mg is measured inaccurate, even can't measure, and this is especially unfavorable for the complicated particle environment that Primary Component annex on the measurement star can bring out single particle effect.Proton single particle effect for the VHLET incident of surveying the secondary heavy ion formation that produces through nuclear reaction; Effectively survey the great detector measurement of thickness to the VHLET spectrum distribute with the minimum microelectronic component of size in the actual VHLET spectrum that takes place distribute and differ greatly, therefore utilize this result of detection to be difficult to correctly infer the proton single particle effect degree of the actual generation of microelectronic component.
On the other hand, what the Detection Techniques of this based semiconductor detector adopted is traditional particle energy measuring technique, and the required quality of using detector, volume, power consumption etc. are relatively large.
Summary of the invention
The technical matters that the present invention will solve is: the drawback that overcomes existing two types of single particle effect Detection Techniques; Proposition is the single-event effect detection device and the method for sensor with photoelectric coupled device (abbreviation optocoupler); This sniffer and method can accurately reflect the single particle effect level that microelectronic component takes place; Have LET measurement capability more accurately, and circuit realizes that simple, the quality of sniffer, volume, power consumption are less relatively.
For solving the problems of the technologies described above, single-event effect detection device provided by the invention comprises optocoupler working sensor unit, SET amplitude discriminator unit and SET counting unit; Said optocoupler working sensor unit is used for obtaining the SET signal in radiation environment to be measured; The SET signal amplitude that said SET amplitude discriminator unit is used for optocoupler working sensor unit is obtained is with to screen out the residing amplitude of different SET signals after starting voltage compares interval, and said SET counting unit is used to add up the occurrence number that is in the interval SET signal of each amplitude.
Wherein, Said single-event effect detection device also comprises SET signal data map unit; The amplitude of the SET signal that said SET signal data map unit is used for being drawn according to said SET amplitude discriminator unit is interval, and mapping draws the corresponding LET value of said SET signal.
Wherein, Said optocoupler working sensor unit comprises optocoupler unit and amplitude translation circuit; Said optocoupler unit is used for forming original SET in radiation environment to be measured; Said amplitude translation circuit is used for original SET is carried out amplifying or attenuation transform undistortedly, the SET of output amplitude in 0.8V～10V scope.
The present invention also provides a kind of and has utilized above-mentioned single-event effect detection device to carry out the method that single particle effect is surveyed, and may further comprise the steps:
1) the photoelectric sensor working cell with said single-event effect detection device places radiation environment to be measured, output SET signal;
2) analyze the amplitude range of screening the SET signal, distinguish SET corresponding to Different L ET value scope;
3) statistics is in the interval SET occurrence number of different amplitudes, draws the occurrence number of corresponding single particle effect.
Wherein, said single-event effect detection device also comprises SET signal data map unit, and said single particle effect detection method also comprises step:
The amplitude range of the SET signal that SET signal data map unit is drawn according to said SET amplitude discriminator unit, and the SET amplitude of measuring in advance and the corresponding relation of incident particle LET value draw the LET value of said SET signal correspondence.
Wherein, before the said step 1), also comprise step:
With known irradiation bomb simulated space radiation environment, record the pulse height of the SET signal that said single-event effect detection device obtains and the corresponding relation of said LET value.
Wherein, said single particle effect detection method also comprises step:
Select a device under test; According to said optocoupler working sensor unit and device under test response cross section to the single particle effect of Different L ET value; And the occurrence number for the single particle effect of said optocoupler working sensor unit that draws of step 3), calculate the single particle effect frequency number of the radiating particle of Different L ET value for said device under test.
Compared with prior art, the present invention's technique effect that can reach comprises:
One, can the inner single particle effect level of quantitatively characterizing microelectronic component.
Two, can realize to several, a MeV.cm surplus in the of ten
2The measurement of the radiating particle below the value of/mg LET even this magnitude.
Three, the LET value quantitative measurment scope that has broad.
Four, employed sensor bulk and quality are little, and circuit structure is simple, are beneficial to the small light and the low power consumption of sniffer device.
Description of drawings
Below, specify embodiments of the invention in conjunction with accompanying drawing, wherein:
Fig. 1 is the sniffer general frame synoptic diagram in the embodiment of the invention;
Fig. 2 is the optocoupler working sensor element circuit structural representation in the embodiment of the invention;
Fig. 3 is the electrical block diagram of a discriminator in the SET amplitude discriminator unit in the embodiment of the invention;
Fig. 4 is the SET amplitude discriminator principle schematic in the embodiment of the invention;
Fig. 5 is the SET amplitude of optocoupler sensor unit output and the relation curve exemplary plot of LET value.
Embodiment
Below in conjunction with accompanying drawing and embodiment the present invention is described in further detail.
After occurring in single particle effect in photoelectric device and the analog device and showing as sensitive part in these devices and hit by single particle; Output terminal at device produces unusual output pulse; Be called single-particle transient pulse (Single Event Transient, SET) effect.Utilize this single-particle transient pulse effect, the present invention proposes a kind of single-event effect detection device and method of the single-particle transient pulse (SET) based on photoelectric coupled device (abbreviation optocoupler).In the present embodiment; SET simulating signal through single high-energy particle bombardment optocoupler generation in the measuring radiation environment; Correlativity according to the LET value of the amplitude of SET and incident particle; To SET signal amplitude analysis and corresponding, realize the measurement of the single particle effect in certain LET value scope with relevant particle LET value.
In the present embodiment; At first measure single-particle transient pulse (SET) simulating signal that single high-energy particle bombardment produces; Analyze the SET signal amplitude, according to the correlativity of the LET value of the amplitude of SET and incident particle, said signal amplitude is shone upon with the LET value of relevant particle then; Obtain the LET value of radiation environment to be measured, thereby realize occurring in microelectronic component measurement inner, that have the single particle effect of certain LET value scope.Concrete single-event effect detection device is following:
As shown in Figure 1, the single-event effect detection device based on the SET of optocoupler that present embodiment provides mainly comprises optocoupler working sensor unit, SET amplitude discriminator unit and SET counting unit.
As shown in Figure 2, optocoupler working sensor unit is realized the radiating particle of trigger device SET effect is produced response, mainly comprises optocoupler unit and amplitude translation circuit two parts.Wherein, said optocoupler unit is made up of photistor and the inner wave-shaping circuit 1 that amplifies.Said photistor can be accepted the bombardment of single particle; Produce low light level electric signal; The said inner wave-shaping circuit 1 that amplifies becomes the bigger SET pumping signal of amplitude to low light level electrical signal conversion; Export SET after the pre-service of said SET pumping signal process amplitude translation circuit, deliver to said SET amplitude discriminator unit.Said amplitude translation circuit mainly is SET to be carried out undistorted signal amplify or attenuation transform, is adjusted in the predefined scope to guarantee pulse amplitude, and the amplitude range that present embodiment sets is 0.8V～10V.
SET amplitude discriminator unit is made up of a plurality of discriminators.Discriminator is pulse-amplitude discriminator just, and its circuit structure is as shown in Figure 3.Each said discriminator has starting voltage, i.e. a discrimination threshold.When input pulse amplitude during greater than discrimination threshold, LET amplitude decision signal of said discriminator output; When input pulse amplitude during less than discrimination threshold, then said discriminator no signal output.Suppose the amplitude of LET is divided into n+1 interval, then SET amplitude discriminator unit is provided with n+1 discriminator, corresponds respectively to the starting voltage VT by low paramount ordering
0, VT
1... VT
n, pairing LET amplitude decision signal is respectively LET
0, LET
1... LET
nThen when SET is hunted down, the maximum LET of numbering in the LET amplitude decision signal of exporting according to n+1 discriminator
i(i=0,1...n), it is interval to draw the residing amplitude of the current SET that catches.SET signal screening principle schematic is as shown in Figure 4.The single event in the different LET value scopes can be distinguished through different examination threshold values in the SET amplitude discriminator unit of present embodiment.Discriminator is output as digital signal, and the signal of screening after handling is admitted to n+1 the SET counting unit that the back level is connected in series.The LET value of described i (i=0,1...n) SET counting unit output optocoupler working sensor unit generation is LET
iThe SET number of (i=0,1...n) realizes the single event in the Different L ET value scope is carried out statistical counting.
In the present embodiment, can further increase SET signal data map unit.SET signal data map unit is used for according to the LET value that records in advance and the corresponding relation of SET amplitude the current measured SET amplitude range in SET amplitude discriminator unit being mapped as the LET value, thus draw the current LET value of the radiation environment of surveying.Fig. 5 is the example that concerns of the SET amplitude of optocoupler sensor unit output and LET value; The experiment test result shows that there is certain correlativity in the LET value of SET amplitude and incident particle; According to the correlativity of the LET value of this SET characteristic and incident particle, can measure the one-to-one relationship of the LET value of SET characteristic and incident particle in advance.For the single-event effect detection device based on optocoupler in the present embodiment, the corresponding relation of said LET value and SET amplitude can use the existing radiation source in ground to test in advance and draw.
The present invention also provides corresponding single particle effect detection method, may further comprise the steps:
1) the photoelectric sensor working cell with said single-event effect detection device places radiation environment to be measured, output SET signal;
2) analyze the amplitude range of screening single-particle transient pulse signal, distinguish single-particle transient pulse corresponding to different linear energy transmission value scopes;
3) statistics is in the interval single-particle transient pulse occurrence number of different amplitudes, draws the occurrence number of corresponding single particle effect.
Further, said single particle effect detection method can also comprise step:
The amplitude range of the SET signal that SET signal data map unit is drawn according to said SET amplitude discriminator unit, and the SET amplitude of measuring in advance and the corresponding relation of incident particle LET value draw the LET value of said SET signal correspondence.
Further, in the said single particle effect detection method, before said step 1), can also comprise step:
With known irradiation bomb simulated space radiation environment, record the pulse height of the SET signal that said single-event effect detection device obtains and the corresponding relation of said LET value.
Further, said single particle effect detection method also comprises step:
Select a device under test; According to said optocoupler working sensor unit and device under test response cross section to the single particle effect of Different L ET value; And the occurrence number for the single particle effect of said optocoupler working sensor unit that draws of step 3), calculate the single particle effect frequency number of the radiating particle of Different L ET value for said device under test.
Below, single particle effect detection method provided by the invention is done more in depth to describe.Said single particle effect detection method mainly may further comprise the steps:
One, selects known irradiation particle simulation cosmic space radiating particle for use with Different L ET value L; Record the pulse height of the SET signal that said single-event effect detection device obtains and the corresponding relation of Different L ET value L, record the number N of the SET that said single-event effect detection device obtains
0With Different L ET value L
0Simulation irradiation particle fluence F
0Corresponding relation.Wherein, N
0/ F
0Be said detection single-event effect detection device to concrete LET value L
0Irradiation particle single particle effect response cross section σ
d(L
0), that is to say that the single particle effect that obtains said detection single-event effect detection device responds the corresponding relation of cross section and Different L ET value.
Two, the optocoupler sensor with said single-event effect detection device places radiation environment to be measured, and the response to radiation environment to be measured is realized in optocoupler working sensor unit, output SET signal.
After starting single-event effect detection device; Can carry out preliminary debugging to single-event effect detection device earlier; Guarantee that optocoupler working sensor unit can support the photistor operate as normal in the optocoupler unit; Make said photistor can accept the bombardment of single high energy particle, form original SET signal, handle output SET through the amplitude translation circuit.
Three, the SET that exported of optocoupler working sensor unit that radiating particle is triggered, the SET amplitude discriminator unit in the single-event effect detection device carries out the amplitude discriminator analysis; Realization is distinguished the SET of different LET value scopes, shines upon the concrete LET value that draws the radiating particle that triggers SET for SET signal data map unit the discriminant analysis result transmission.
Four, SET amplitude discriminator unit is realized the SET of different LET value scopes is distinguished, and SET counting unit realizes SET effect generation frequency number in the Different L ET value scope is carried out statistical counting, obtains counting N
1Utilize this statistical counting, according to the response cross section σ of device under test to the single particle effect of Different L ET value
2(for the present invention, response cross section σ
2Be known parameter), can infer that device under test counts N to the single particle effect frequency of this LET value radiating particle
2=N
1* σ
2/ σ
d
The present invention is novel single particle effect Detection Techniques of utilizing the exploitation of the SET effect of photoelectric coupled device.Be simultaneously accurately characterization of microelectronic device single particle effect, have the novel single particle effect Detection Techniques of certain multiple advantages such as LET value quantitative measurment scope, small light and low power consumption.
The single particle effect Detection Techniques based on static memory and large scale semiconductor detector that the present invention is more traditional have if any following technical advantage:
● what the present invention detected is the single particle effect of microelectronic component level, and result of detection can be used in the degree of other device generation single particle effects of accurate supposition.
● the SET analog output signal that utilizes optocoupler produced by the single particle bombardment carries out single particle effect to be surveyed, and has the advantage of series:
1) utilizes the SET simulating signal to survey, avoided complex processing design the such Digital Circuit Signal of SRAM;
2) optocoupler has inner preferably the amplification and the shaping effect to the SET signal of output, and subsequent conditioning circuit is realized simpler;
3) the LET value of the amplitude of SET and incident particle has certain correlativity; Can realize the single particle effect of certain LET value scope is measured through analysis, and overcome the blind area of large-sized semiconductor transducer less LET value particle measurement to signal amplitude;
4) detector quality, size, power consumption etc. are less.
The present invention proposes the technical scheme that the SET based on optocoupler surveys single particle effect, can realize the detection to low radiation environment, the present invention can realize several MeV.cm surplus ten
2The measurement of the radiating particle below/mg even this magnitude.In addition; The quality of detector work system of the present invention can be controlled in the 0.5kg; Volume estimation is 100*70*70mm, the about 1W of power consumption; Specification than conventional single-event effect detection device (mass number kilogram, volume are about 150*150*150mm, power consumption figure watt) is little, is beneficial to the small light and the low power consumption of sniffer device, is particularly suitable for SPACE APPLICATION.
The present invention is space physics, the innovation of space environment field important use basis, can be widely used in having broad application prospects in the detection and research of space physics and space environment.In addition, the present invention is particularly suitable for being applied to various spacecrafts and carries use, for ensureing the spacecraft safe operation information of single particle effect harm accurately is provided.
It should be noted last that above embodiment is only unrestricted in order to technical scheme of the present invention to be described.Although the present invention is specified with reference to embodiment; Those of ordinary skill in the art is to be understood that; Technical scheme of the present invention is made amendment or is equal to replacement, do not break away from the spirit and the scope of technical scheme of the present invention, it all should be encompassed in the middle of the claim scope of the present invention.
Claims (7)
1. a single-event effect detection device comprises optocoupler working sensor unit, single-particle transient pulse amplitude discriminator unit and single-particle transient pulse counting unit; Said optocoupler working sensor unit is used for obtaining single-particle transient pulse signal in radiation environment to be measured; The single-particle transient pulse signal amplitude that said single-particle transient pulse amplitude discriminator unit is used for optocoupler working sensor unit is obtained is with to screen out the residing amplitude of different single-particle transient pulse signals after starting voltage compares interval, and said single-particle transient pulse counting unit is used to add up the occurrence number that is in the interval single-particle transient pulse signal of each amplitude.
2. single-event effect detection device according to claim 1; It is characterized in that; Said single-event effect detection device also comprises single-particle transient pulse signal data map unit; The amplitude of the single-particle transient pulse signal that said single-particle transient pulse signal data map unit is used for being drawn according to said single-particle transient pulse amplitude discriminator unit is interval, and mapping draws the corresponding linear energy transmission value of said single-particle transient pulse signal.
3. single-event effect detection device according to claim 1; It is characterized in that; Said optocoupler working sensor unit comprises optocoupler unit and amplitude translation circuit; Said optocoupler unit is used for forming original single-particle transient pulse in radiation environment to be measured, and said amplitude translation circuit is used for original single-particle transient pulse is carried out amplifying or attenuation transform undistortedly, the single-particle transient pulse of output amplitude in 0.8V～10V scope.
4. one kind is utilized the described single-event effect detection device of claim 1 to carry out the method that single particle effect is surveyed, and may further comprise the steps:
1) the photoelectric sensor working cell with said single-event effect detection device places radiation environment to be measured, output single-particle transient pulse signal;
2) analyze the amplitude interval of screening single-particle transient pulse signal, distinguish single-particle transient pulse corresponding to different linear energy transmission value scopes;
3) statistics is in the interval single-particle transient pulse occurrence number of different amplitudes, draws the occurrence number of corresponding single particle effect.
5. single particle effect detection method according to claim 4 is characterized in that, said single-event effect detection device also comprises single-particle transient pulse signal data map unit, and said single particle effect detection method also comprises step:
Single-particle transient pulse signal data map unit is interval according to the amplitude of the single-particle transient pulse signal that said single-particle transient pulse amplitude discriminator unit is drawn; And the single-particle transient pulse amplitude of measuring in advance and the corresponding relation of incident particle linear energy transmission value, draw the corresponding linear energy transmission value of said single-particle transient pulse signal.
6. single particle effect detection method according to claim 5 is characterized in that, before the said step 1), also comprises step:
With known irradiation bomb simulated space radiation environment, record the pulse height of the single-particle transient pulse signal that said single-event effect detection device obtains and the corresponding relation of said linear energy transmission value.
7. single particle effect detection method according to claim 4 is characterized in that, also comprises step:
Select a device under test; According to said optocoupler working sensor unit and the response cross section of device under test to the single particle effect of different linear energy transmission values; And the occurrence number for the single particle effect of said optocoupler working sensor unit that draws of step 3), calculate the single particle effect frequency number of the radiating particle of different linear energy transmission values for said device under test.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9690578B2 (en) | 2013-02-20 | 2017-06-27 | Intel Corporation | High dose radiation detector |
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| CN104267327A (en) * | 2014-09-05 | 2015-01-07 | 兰州空间技术物理研究所 | Space single-particle transient state impulse testing system |
| CN105738936B (en) * | 2016-02-25 | 2019-04-09 | 北京卫星环境工程研究所 | Space radiation environment and effect combination detecting structure |
| CN107345998B (en) * | 2017-06-30 | 2019-08-13 | 西安电子科技大学 | Flouride-resistani acid phesphatase integrated circuit single particle effect section predictor method |
| CN108169785A (en) * | 2017-12-07 | 2018-06-15 | 山东航天电子技术研究所 | A kind of component Space Radiation Effects detection device |
| CN108287302A (en) * | 2018-01-29 | 2018-07-17 | 北京卫星环境工程研究所 | The single particle effect detection circuit structure of space-oriented radiation environment |
| CN110208608B (en) * | 2019-05-10 | 2021-05-14 | 中国人民解放军国防科技大学 | Low-power-consumption miniaturized single-particle transient parameter testing device and method |
| CN110646833B (en) * | 2019-09-18 | 2021-04-13 | 北京空间飞行器总体设计部 | Satellite single event upset monitoring method based on monolithic array particle detector |
| CN112649833B (en) * | 2020-09-27 | 2023-02-17 | 中国科学院国家空间科学中心 | Silicon micro-strip detector reading circuit and method |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101115985A (en) * | 2004-09-28 | 2008-01-30 | 神谷来克斯公司 | System and method for spectroscopic analysis of single particles |
| CN101158705A (en) * | 2007-11-22 | 2008-04-09 | 北京圣涛平试验工程技术研究院有限责任公司 | Method for acquiring single particle phenomenon intersecting surface and heavy ion linear energy transfer relationship |
-
2009
- 2009-06-04 CN CN2009100865161A patent/CN101907662B/en not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101115985A (en) * | 2004-09-28 | 2008-01-30 | 神谷来克斯公司 | System and method for spectroscopic analysis of single particles |
| CN101158705A (en) * | 2007-11-22 | 2008-04-09 | 北京圣涛平试验工程技术研究院有限责任公司 | Method for acquiring single particle phenomenon intersecting surface and heavy ion linear energy transfer relationship |
Non-Patent Citations (2)
| Title |
|---|
| JP特开2007-312278A 2007.11.29 |
| 封国强等.光电耦合器的单粒子瞬态脉冲效应研究.《原子能科学技术》.2008,第42卷36-40. * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9690578B2 (en) | 2013-02-20 | 2017-06-27 | Intel Corporation | High dose radiation detector |
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