CN102183723B - Device for detecting single event effect of 1553B interface circuit - Google Patents

Device for detecting single event effect of 1553B interface circuit Download PDF

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CN102183723B
CN102183723B CN 201010624159 CN201010624159A CN102183723B CN 102183723 B CN102183723 B CN 102183723B CN 201010624159 CN201010624159 CN 201010624159 CN 201010624159 A CN201010624159 A CN 201010624159A CN 102183723 B CN102183723 B CN 102183723B
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1553b
test
interface circuit
circuit
single
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CN 201010624159
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CN102183723A (en )
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朱向东
周皓
赵康
李蓉
范隆
郑宏超
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北京时代民芯科技有限公司
中国航天科技集团公司第九研究院第七七二研究所
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Abstract

本发明公开了一种1553B接口电路单粒子效应检测装置,通过1553B总线与监控主机进行连接,在真实的1553B总线通信环境下,试验人员通过监控主机控制DSP向被测1553B接口电路发送各种测试模式,进行多场景多向量多轮次的单粒子效应测试,通过DSP将被测1553B接口电路在辐照源的照射下的单粒子翻转、单粒子闩锁、单粒子功能中断等各种单粒子效应检测出来,能够完成高低温、真空等不同环境条件下的试验测试,取得可靠、有效的试验数据,从而提高试验数据的可靠性和置信度;本发明通过取样电路可以对1553B电路中协议逻辑电路和收发器的电流等多路电流进行监测和控制,对接收数据和分析结果给出正确有效的反馈控制。 The present invention discloses a single-particle interface circuit 1553B effect detecting means are connected by a bus monitoring host 1553B, 1553B bus in a real communications environment, testing personnel to test various test transmission interface circuit 1553B controls the DSP host by monitoring mode, single event effects test multi-vector multi-scene multiple rounds, will be measured by the DSP interface circuit 1553B single particle irradiation the radiation source is turned over, the single latch particles, other single event functional interrupt single particle effect detected, the test can be completed in different environmental test conditions of high temperature, vacuum, etc., to obtain reliable and effective test data, thereby improving reliability and confidence test data; by sampling circuit of the present invention may protocol logic circuits 1553B transceiver circuit and the current and other multiple current monitoring and control, are given correct and effective feedback control of the received data and analysis results.

Description

—种1553B接口电路单粒子效应检测装置 - Species 1553B interface circuit detecting means SEU

技术领域 FIELD

[0001] 本发明涉及一种1553B接口电路单粒子效应检测装置,用于检测1553B接口电路单粒子翻转、单粒子闩锁、单粒子功能中断等单粒子效应。 [0001] The present invention relates to an interface circuit 1553B SEU detection means for detecting a single event upset interface circuit 1553B, a single latch particles, particles of a functional single interruption SEU.

背景技术 Background technique

[0002] 国内外的器件级单粒子试验,通常采用在同一测试向量下辐照器件和非辐照器件的输出进行比对的方法,通过比较输出结果的差异来判定单粒子效应。 [0002] Single-stage particle test device at home and abroad, by methods generally are aligned in the irradiation device and the output device under the same non-irradiated test vectors, determined by single event effects the comparison between the output. 比较手段可采用外部监听或手工操作,即在辐照环境下在测试系统中外接逻辑分析仪、示波器和电流表的方式,对辐照器件和非辐照器件进行观测,辐照器件发生单粒子闩锁时,记录数据并人工切断电源。 Comparing means can be manual or external monitor, i.e. in the radiation environment external logic analyzers, oscilloscopes and ammeter way of non-irradiated and irradiated devices were observed in the test system device, irradiating single event latch device the lock, the data recording and manually cut off the power. 但1553B接口电路内部嵌入了SRAM存储器,采用传统方法,利用示波器观测只能观测到外围接口的逻辑,对内部存储器翻转的观测能力有限,无法有效地评估出单粒子翻转的次数;同时,1553B作为串行通信总线,1553B接口电路单粒子效应下的功能中断,只能在实际的1553B总线通信情况下,才能评定,因此1553B接口电路的单粒子效应检测系统不能采用辐照器件与非辐照器件输出比对的方法,而应模拟真实的多节点1553B总线系统。 But the internal 1553B embedded SRAM memory interface circuit, by a conventional method, can be observed using the oscilloscope to observe the logic of the peripheral interface, the limited internal memory capacity observed inverted, can not effectively evaluate the number of SEU; Meanwhile, as 1553B serial communication bus, the function of the single event effect interrupt interface circuit 1553B, 1553B only in the actual bus communication situation, in order to assess, single event effects and therefore detection system interface circuit 1553B irradiation device can not be used with non-irradiated devices methods of alignment of the output, but should simulate the real multi-node 1553B bus system.

发明内容 SUMMARY

[0003] 本发明的技术解决问题是:克服现有技术的不足,提供一种1553B接口电路单粒子效应检测装置,在真实的1553B总线通信环境下将1553B接口电路配置为各种运行模式,进行符合1553B总线标准的单粒子效应测试和评估。 [0003] The techniques of the present invention is to solve the problem: to overcome the deficiencies of the prior art, to provide an interface circuit 1553B SEU detecting means in a real communications environment will 1553B 1553B bus interface circuit is configured for a variety of operating mode, single event effects testing and evaluation in line with 1553B bus standard.

[0004] 本发明方法的技术解决方案是:一种1553B接口电路单粒子效应检测装置,包括测试电路板、辐射源、电流监测模块、监控主机,辐射源用于对被测1553B接口电路进行辐射,测试电路板由DSP、CPLD, SRAM、FLASH、取样电路组成,被测1553B接口电路连接在测试电路板中,DSP通过CPLD与被测1553B接口电路相连接用于对被测1553B接口电路进行各种测试模式的初始化配置以及接收发生单粒子效应时被测1553B接口电路中寄存器和存储器的状态数据,FLASH中存储各种测试模式的初始化程序,SRAM用于存储发生单粒子效应时被测1553B接口电路中寄存器和存储器的状态数据,取样电路对发生单粒子效应时被测1553B接口电路的闩锁电流进行取样,监控主机通过串口向DSP发送测试模式初始化指令,并对DSP接收的发生单粒子效应时被测1553B接口电路中寄存器和存储器的状态数据进行 [0004] The method of the present invention, technical solution is: A Single Event Effects 1553B interface circuit detecting device, comprising a test circuit board, the radiation source, a current monitoring module, the monitoring host, a radiation source for irradiating the interface circuit under test 1553B , the test circuit board by the DSP, CPLD, SRAM, FLASH, a sampling circuit, connected to the interface circuit under test in the test 1553B circuit board, by the DSP test CPLD and 1553B are connected to an interface circuit for the interface circuit of each test 1553B initialization and configuration of the test patterns are measured 1553B interface circuit status registers and memory data received single event effect occurs, FLASH memory in the initialization procedure various test modes, SRAM 1553B test interface is used for storage SEU occurs circuit status registers and memory data, a sampling circuit of the measured single event effect occurs latching current 1553B interface circuit for sampling, monitoring host through the serial port transmitting a test mode initialization command to the DSP, and single event effect occurs DSP received the measured data 1553B interface circuit status registers and memory is 示,监控主机通过1553B总线与被测1553B接口电路进行通信用于收发满足1553B标准的消息,电流监测模块对取样电路取样的闩锁电流进行数据采集并由监控主机进行显 Shown, monitoring host communication standard for transmitting and receiving messages satisfy 1553B 1553B 1553B bus interface circuit under test, a current monitoring module latching current sampling circuit sampling by the data collection to monitor host significant

/Jn ο / Jn ο

[0005] 还包括远程终端,远程终端通过以太网络与监控主机通信用于远程监控。 [0005] further comprises a remote terminal, a remote terminal via the Ethernet host communication and monitoring for remote monitoring.

[0006] 本发明与现有技术相比有益效果为: [0006] The present invention relates to beneficial effects over the prior art:

[0007] (I)本发明通过1553B总线与监控主机进行连接,在真实的1553B总线通信环境下,试验人员通过监控主机控制DSP向被测1553B接口电路发送各种测试模式,进行多场景多向量多轮次的单粒子效应测试,通过DSP将被测1553B接口电路在辐照源的照射下的单粒子翻转、单粒子闩锁、单粒子功能中断等各种单粒子效应检测出来,能够完成高低温、真空等不同环境条件下的试验测试,取得可靠、有效的试验数据,从而提高试验数据的可靠性和置信度; [0007] (I) of the present invention is connected via a bus monitoring host 1553B, 1553B bus in a real communications environment, testing personnel to test all test modes transmission interface circuit 1553B controls the DSP by monitoring host, multi-vector multiple scenes SEU multiple rounds of testing, will be measured by the DSP interface circuit 1553B single particle irradiation the radiation source is turned over, the single latch particles, other single event functional interrupt SEU detected, to complete high Experimental tests under different environmental conditions, temperature, vacuum, etc., to obtain reliable and effective test data, thereby improving the reliability and confidence of the test data;

[0008] (2)本发明通过取样电路可以对1553B电路中协议逻辑电路和收发器的电流等多路电流进行监测和控制,对接收数据和分析结果给出正确有效的反馈控制。 [0008] (2) The present invention may be monitored by sampling and control circuit 1553B circuit current protocol transceivers and logic circuit like multiple current, given correct and effective feedback control of the received data and the analysis results.

附图说明 BRIEF DESCRIPTION

[0009] 图I为本发明单粒子效应检测装置组成结构图; [0009] FIG I component structure for SEU detection apparatus of the present invention;

[0010] 图2为本发明测试电路板的组成结构图; [0010] FIG 2 is a configuration diagram of the test circuit board composition of the present invention;

[0011] 图3为本发明单粒子效应检测流程图。 [0011] FIG. 3 flowchart for detecting a single event effect of the present invention.

具体实施方式 detailed description

[0012] 如图1、2所示,本检测装置包括测试电路板、监控主机、电流监测模块、电源和辐照源,测试电路板由处理器(DSP)、CPLD, SRAM、FLASH、取样电路组成,被测1553B接口电路连接在测试电路板中,DSP通过CPLD与被测1553B接口电路相连接用于对被测1553B接口电路进行各种测试模式的初始化配置以及接收发生单粒子效应时被测1553B接口电路中寄存器和存储器的状态数据,FLASH中存储各种测试模式的初始化程序,通过编制各种测试模式程序,可将1553B接口电路配置为各种运行模式,完成单粒子效应测试,SRAM用于存储发生单粒子效应时被测1553B接口电路中寄存器和存储器的状态数据,监控主机通过RS232接口向DSP发送测试模式初始化指令,DSP通过CPLD对被测1553B接口电路进行各种测试模式的初始化配置,DSP收到被测1553B接口电路反馈的中断信息后,监控主机通过1553B总 [0012] FIG. 1 and 2, the detection means comprises a circuit board testing, monitoring host, current monitoring module, and a radiation source power, test circuit board by a processor (DSP), CPLD, SRAM, FLASH, a sampling circuit when the composition, 1553B test interface circuit is connected in the test circuit board, the DSP is connected to the interface circuit 1553B tested for various test modes received initial configuration and single event effect occurs through the CPLD interface circuit under test measured 1553B 1553B interface circuit status register and data memory, FLASH memory in the various test mode initialization program, by the preparation of various test mode program, an interface circuit 1553B may be configured in various operating modes, test complete single event effects, SRAM with 1553B test interface circuit registers and memory at the time of the occurrence of single event effect storing state data, monitoring host through the RS232 interface to transmit the test mode initialization instruction DSP, DSP initial configuration of the various test modes by the test interface circuit 1553B CPLD after, the DSP receives the test interface circuit 1553B interruption feedback information by monitoring host 1553B total 与被测1553B接口电路进行通信,监控主机向被测1553B接口电路收发满足1553B标准的消息,辐射源工作对被测1553B接口电路进行辐照,被测1553B接口电路在辐射源的辐射下发生单粒子效应,DSP通过CPLD接收发生单粒子效应时被测1553B接口电路中寄存器和存储器的状态数据,取样电路对发生单粒子效应时被测1553B接口电路的闩锁电流进行取样,电流监测模块对取样电路取样的闩锁电流进行数据采集并由监控主机进行显示,该检测装置可以用于在真实的1553B总线通信环境下,可以检测1553B接口电路单粒子翻转(SEU)、单粒子闩锁(SEL)、单粒子功能中断(SEFI)等各种单粒子效应。 Messages to communicate with the test interface circuit 1553B, 1553B meet the criteria to monitor the host interface circuit transmitting and receiving test 1553B, 1553B of the measured radiation source are irradiated interface circuit, the interface circuit 1553B single test occurs under irradiation of the radiation source particle effect, 1553B test interface circuit and the memory status register of the DSP data received by the CPLD, SEU occurs, the latching current sampling circuit test interface circuit 1553B samples the single event effect occurs, the sampled current monitoring module latch circuit sampling current data acquisition by the host display monitor, the detection means may be used in a real communications environment bus 1553B, 1553B interface circuitry can detect single event upset (the SEU), single-particle latch (SEL) single-particle function interrupt (SEFI) and other single event effect.

[0013] 通过配置转接电缆、法兰盘,可将测试电路板置于真空罐或高低温试验箱中,以完成高低温、真空等不同环境条件下的测试试验。 [0013] By configuring the adapter cable, flange, the test circuit board may be placed under vacuum or high and low temperature tank in order to complete the test under different environmental conditions Test high temperature, vacuum and the like.

[0014] 处理器采用通用的TMS320C32DSP,被测1553B接口电路采用广泛应用的、主流的B61580。 [0014] The common processor TMS320C32DSP, test interface circuit 1553B widely, mainstream B61580. CPLD通过JTAG接口进行程序注入,取样电路对发生单粒子效应时被测1553B接口电路中协议逻辑电路和收发器的闩锁电流进行取样并输出至电流监测模块。 CPLD injection procedure performed by the JTAG interface, a sampling circuit for latching current measured when the interface circuit 1553B SEU occurs protocol and transceiver logic sampled and outputted to the current monitoring module. 监控主机通过RS232接口与处理器通信,并通过面向测试应用的人机界面,可以完成多场景多向量的测试,根据每一被测电路的不同要求,灵活方便地定制不同的试验流程和测试模式。 Monitoring host via RS232 interface in communication with the processor, and via the HMI for test applications, multiple scenes can be done multi-vector test, according to the different requirements of each circuit under test, flexibility to customize different test procedures and test mode .

[0015] 本发明采用网络连接方式对监控主机进行远程登录,将远程终端通过网络与监控主机连接,实现对监控主机的控制,对单粒子效应检测系统的状态进行实时的监控,实时处理检测系统发送来的数据,并生成图形化的试验报告,对检测系统上电、复位或启动自检,并可以有效保障人员的安全。 [0015] The present invention is a network connection to the monitored hosts for remote login, remote terminal connected through the network monitoring host, to achieve control of the monitoring host, the state of single event effects detection system for real-time monitoring, real-time processing detection system transmitted data and generates graphical test report, the electrical detection system, reset or self-test, and can effectively protect the safety of personnel. [0016] 如图3所示,本发明单粒子效应检测流程为: [0016] As shown, the present invention detects the single event effect to Scheme 3:

[0017] (I)设置单粒子闩锁阈值等参数; [0017] (I) a single particle set the latch threshold parameters;

[0018] (2)监控主机控制主控处理器对被测1553B接口电路设置对应的工作模式参数; [0018] (2) arranged to monitor the host processor main control parameter corresponding to the working mode 1553B interface circuit under test;

[0019] (3)被测1553B接口电路按设定的模式开始工作,执行内部存储器/寄存器的读写,或BC/RT节点的通信;同时将操作结果实时反馈到处理器,处理器并将测试结果通过串口反馈到监控主机; [0019] (3) test interface circuit 1553B according to the set mode to work, the internal communication perform memory read / register, or the BC / RT node; real-time feedback while the operation result to the processor, and the processor the test results back to the monitoring host through the serial port;

[0020] (4)监控主机对测试结果进行处理,根据处理后的结果判断是否需要重新配置测试场景,若需要对测试场景重新进行配置,则根据处理结果确 [0020] (4) monitoring host processing test results, whether the processing is determined based on a result of test scenarios need to be reconfigured, if necessary to reconfigure test scenario, the determined processing result

Claims (2)

  1. 1. 一种1553B接口电路单粒子效应检测装置,其特征在于包括:测试电路板、辐射源、电流监测模块、监控主机,辐射源用于对被测1553B接口电路进行辐射,测试电路板由DSP、CPLD、SRAM、FLASH、取样电路组成,被测1553B接口电路连接在测试电路板中,DSP通过CPLD与被测1553B接口电路相连接用于对被测1553B接口电路进行各种测试模式的初始化配置以及接收发生单粒子效应时被测1553B接口电路中寄存器和存储器的状态数据,FLASH中存储各种测试模式的初始化程序,SRAM用于存储发生单粒子效应时被测1553B接口电路中寄存器和存储器的状态数据,取样电路对发生单粒子效应时被测1553B接口电路的闩锁电流进行取样,监控主机通过串口向DSP发送测试模式初始化指令,并对DSP接收的发生单粒子效应时被测1553B接口电路中寄存器和存储器的状态数据进行显示,监控主机通过15 The interface circuit SEU 1553B detecting means A, characterized by comprising: a test circuit board, the radiation source, a current monitoring module to monitor the host, the radiation source for radiation under test interface circuit 1553B, a DSP board test , CPLD, SRAM, FLASH, a sampling circuit, connected to the interface circuit under test in the test 1553B circuit board, the test CPLD and 1553B by the DSP interface circuit 1553B is connected to the interface circuit under test for a variety of initial configuration of a test mode and the status register and memory when tested 1553B interface circuit SEU received data occurs, FLASH memory in the initialization procedure various test modes, SRAM memory test occurs when a single event effects 1553B interface circuit registers and memory status data, measured on the single sampling circuit particle latching current effect occurs 1553B interface circuit for sampling, monitoring host through the serial port transmitting a test mode initialization command to the DSP, and the test interface circuit 1553B single event effect occurs when the received DSP status data registers and memory to display, by monitoring host 15 53B总线与被测1553B接口电路进行通信用于收发满足1553B标准的消息,电流监测模块对取样电路取样的闩锁电流进行数据采集并由监控主机进行显示。 53B 1553B bus test message and an interface circuit for transmitting and receiving communication 1553B meet criteria, current monitoring module latching current sampling circuit sampling by the data collection to monitor the host display.
  2. 2.如权利要求I所述的一种1553B接口电路单粒子效应检测装置,其特征在于:还包括远程终端,远程终端通过以太网络与监控主机通信用于远程监控。 2. I claim the A interface circuit 1553B SEU detecting means, characterized by: further comprising a remote terminal, a remote terminal via the Ethernet host communication and monitoring for remote monitoring.
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