CN108169785A - A kind of component Space Radiation Effects detection device - Google Patents
A kind of component Space Radiation Effects detection device Download PDFInfo
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- CN108169785A CN108169785A CN201711287554.4A CN201711287554A CN108169785A CN 108169785 A CN108169785 A CN 108169785A CN 201711287554 A CN201711287554 A CN 201711287554A CN 108169785 A CN108169785 A CN 108169785A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
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Abstract
The invention discloses a kind of component Space Radiation Effects detection devices, increase radiation environment probe, while the in-orbit experiment of progress electronic component, obtain the space radiation environment information of current position in real time.The present invention combines the space radiation environment measured in real time and tested component is examined, and improves the precision of electronic component space environment adaptability teaching.
Description
Technical field
The present invention relates to Space environment detection technical fields, and in particular to a kind of electronic component is visited with space radiation environment
Survey the device being combined.
Background technology
The validating in orbit of domestic electronic component is one of vital task of spaceship-carried experiment.Electronic component is in-orbit to be tested
Card main purpose is examined in space radiation environment, the radiation resistance of electronic component.Such as it is carried in China's satellite
Space Radiation Effects experimental considerations unit, examine under space radiation effect, the space adaptability of electronic component, so as to for future
Support is made in the in-orbit application assessment of electronic component.In the design of experimental provision, electricity is detected mainly around measured device
Situations such as road is designed, and detection circuit can detect the voltage, electric current, single-particle inversion of measured device in real time.This is also current
The prevailing design approach of component experimental provision.Since the space radiation environment of space different location, different time is often not
With, this method only examines the electronic component under the conditions of space radiation, and fails to combine in-orbit space environment information,
Therefore, the result of appraisal have certain inaccuracy.
Invention content
In view of this, the present invention provides a kind of component Space Radiation Effects detection device, with reference to the sky measured in real time
Between radiation environment tested component is examined, improve the precision of electronic component space environment adaptability teaching.
Specific embodiments of the present invention are as follows：
A kind of component Space Radiation Effects detection device, the detection device includes radiation environment probe, component is visited
Survey module, amplification module, control module, power module and casing；
The radiation environment probe is transferred to amplification module for space exploration radiation environment information；The component
Detecting module is used to detect the voltage, electric current and single particle effect information of tested component, and is transferred to amplification module；The spoke
It penetrates environmental probe and component detecting module is arranged in parallel in above casing internal；
The amplification module is popped one's head in radiation environment and component detecting module corresponds, including amplification module of popping one's head in
With component amplification module；Probe amplification module is for enhanced processing space radiation environment information and identifies effective particle thing
Part is then transferred to control module；Component amplification module is for enhanced processing voltage, electric current and single particle effect information and passes
It is defeated by control module；
The control module identifies that effective single-particle is imitated according to voltage, electric current and the single particle effect information after enhanced processing
It answers information and component detecting module is controlled to work normally, while the output information of the amplification module of acquisition is transferred to outside and is defended
Star platform；
The power module is component detecting module, amplification module and control module pressure supply, while is visited for radiation environment
Independent pressure supply.
Further, the radiation environment probe includes LET probes and proton probe.
Further, the LET probes include low LET probes and high LET probes.
Further, the low LET probes, high LET probes and proton probe are connected respectively with corresponding amplification module.
Advantageous effect：
1st, invention increases radiation environment probes, and it is true with space to solve the verification of electronic component Space Radiation Effects
The problem of radiation environment is combined improves the precision of electronic component space environment adaptability teaching, is electronic component
Space adaptability assessment provides new carrier；In addition to component verification demand is met, space radiation environment section can also be met
Learn the demand of detection.Meanwhile radiation environment probe is mutual indepedent with amplification module, and it is small, it is easily installed.
2nd, LET probes of the present invention include low LET probes and high LET probes, using different probe detection different spectral coverages, make
Result of detection is more accurate.
3rd, LET probes and proton sonde configuration of the present invention are independent, are connected respectively with corresponding amplification module, small, and
It is easily installed debugging.
Description of the drawings
Fig. 1 is the composition schematic diagram of the present invention；
Fig. 2 is the structural perspective of the present invention；
Fig. 3 is the structural perspective of Fig. 2 different visual angles；
Fig. 4 is the side view of the present invention；
Fig. 5 is the vertical view of the present invention；
Fig. 6 is probe amplification module composition schematic diagram；
Fig. 7 is equipment power module schematic diagram；
Fig. 8 is circuit for producing high voltage module diagram.
Wherein, 1- radiation environments are popped one's head in, 2- component detecting modules, 3- amplification modules, 4- control modules, 5- power supply moulds
Block, 6- casings, 7- connecting screws.
Specific embodiment
The present invention will now be described in detail with reference to the accompanying drawings and examples.
The present invention provides a kind of component Space Radiation Effects detection devices, as shown in Figure 1, Figure 2, Figure 3 shows, detection device
Including radiation environment probe 1, component detecting module 2, amplification module 3, control module 4, power module 5 and casing 6, casing 6
Protecgulum be fixedly connected with rear cover by connecting screw 7.
Radiation environment probe 1 is used to obtain space radiation environment data；Radiation environment probe 1 includes LET probes and proton
Probe, LET probes are again including low LET probes and high LET probes.These three probes are attached separately in absolute construction, each by
Electric wire is drawn with corresponding amplification module 3 to be connected.Amplification module 3 is independent, can reduce the volume of whole device.
Low LET probes are mainly to 0.01-0.1MeV/mg/cm2LET spectral coverages detected；High LET probes are main right
0.1-37MeV/mg/cm2LET spectral coverages detected.Low LET probes and high LET probes use the lens barrel structure of telescope,
Two panels silicon sensor is equivalent to the eyepiece and object lens of telescope.The geometrical factor G of cylindrical telescope：
Wherein R0For radius sensor, θ0For detection viewing field, tg is tangent trigonometric function.
LET spectrums and the relationship of average flux can obtain by emulation, consider detector size, particle counting and detection
Visual field determines semiconductor transducer effective diameter, field angle, geometrical factor.The comprehensive factors such as sedimentary energy and mechanical environment, choosing
Determine the thickness of semiconductor transducer, the two panels silicon sensor thickness that every group of LET probe uses is 300um.Different LET values are incident
The Space Particle of sensor, in sensor internal loss energy Δ E differences, the sedimentary energy of particle in the sensor is with LET value lines
Property increase.
Comprehensive simulating and result of calculation further obtain LET spectral coverages, energy loss, the generation quantity of electric charge and particle counting
Relationship, these parameters will provide reference for circuit design below.
Proton, which is popped one's head in, is made of the lens barrel knot of telescope entrance window, collimator and two panels ion implantation type semiconductor transducer
Structure, two panels ion implantation type semiconductor transducer are equivalent to the eyepiece and object lens of telescope.Space matter can be obtained by emulation
Son spectrum and the relationship of average flux, consider the factors such as particle counting, sensor size, detection viewing field, determine that semiconductor passes
Sensor effective diameter, field angle, geometrical factor, and provide particle counting.
Through Multi simulation running, and consider reduce measure when electronics caused by pollution (sedimentary energy of the electronics in detector with
The sedimentary energy of proton has coincidence), finally determine the thickness per chip semiconductor sensor, the two panels silicon sensor thickness of use is equal
For 1000um.
Summary emulates and result of calculation, obtains the relationship of detection proton spectral coverage, energy loss and particle counting, provides
Sedimentary energy of the proton of different-energy in silicon sensor corresponding particle counting in energy road with the generation quantity of electric charge and each,
Input is provided for circuit design below.
Component detecting module 2 is used to detect the voltage, electric current and single particle effect information of tested component, by tested electricity
Sub- component and electronic module are formed, and radiation environment probe 1 and component detecting module 2 are arranged in parallel in 6 inner upper of casing,
Component detecting module 2 includes multiple tested electronic components, is arranged on the electronic component of 6 inner upper of casing, top is removed
Equipment shell 6 is outer to be blocked without other, as shown in Figure 4；Three son probes of radiation environment probe 1, low LET probes, high LET probes
It is in equipment shell 6 and parallel with close to the electronic component upper surface at 6 top of casing with the entrance window of proton probe, ensure
Unidirectional Space Particle is detected, as shown in Figure 5.
Electronic module includes memory refress and accesses submodule, the detection sub-module of operating current and working power control
Module.
Memory refress accesses submodule：It is periodically read by control module 4 and refreshes memory data, detect memory block
The single-particle inversion caused by single particle effect；
The detection sub-module of operating current：Component operating current is tested by 4 timing acquiring of control module, detect due to
Locking single particle caused by single particle effect；
Working power control submodule：When tested component is due to locking single particle working condition exception caused by,
The break-make of the working power of tested component is controlled by control module 4, realizes the functions such as unlock, component is made to restore normal work
Make state.
Amplification module 3 and radiation environment probe 1 and component detecting module 2 correspond, including probe amplification module and
Component amplification module.Probe amplification module is for enhanced processing space radiation environment information and identifies effective particle event,
It is then transferred to control module 4；Component amplification module is for enhanced processing voltage, electric current and single particle effect information and transmits
To control module 4, single particle effect information mainly includes single-particle inversion information and locking single particle information etc., single-particle inversion
Information can be transferred directly to control module 4 without amplification module 3.
Wherein, probe amplification module includes the circuits such as amplification, forming, the peak holding of probe output electric signal, makes probe
It can be acquired after the electric signal of output is conditioned by control module 4.As shown in fig. 6, including main amplifier circuit, the effective thing of particle
Part decision circuit, peak holding circuit and engineering parameter detection circuit.
Probe pre-amplification circuit output signal is further amplified, and form quasi- gaussian shape main amplifier circuit.
Particle validity event decision circuit by compared with the activation threshold value that control module 4 is set by effective particle event
It screens out and, generate trigger pulse, inform that effective particle event occurs for control module 4.
The peak value for the pulse that peak holding circuit generates main amplifier is kept, so that AD converter is acquired.
Peak signal is removed after the completion of AD acquisitions, with the peak value of pulse of next particle event to be held.
Engineering parameter detection circuit includes characteristic tester for sensor, power sense circuit and temperature sensing circuit.
Control module 4 sets the activation threshold value of effective particle event and single particle effect, according to after enhanced processing voltage,
Electric current and single particle effect information identify that effective single particle effect information control component detecting module 2 works normally, if tested
Component is abnormal under single particle effect, then the break-make of the tested component working power of the control of control module 4, realizes unlock
Etc. functions, make component restore normal operating conditions；The output information of the amplification module 3 of acquisition is transferred to external satellite simultaneously
Platform completes Data Gathering, the acquisition of component running parameter, system function control etc..The initialization of system can be completed,
The read-write and refreshing of the tested component of control, complete the monitoring and control to each module working condition, acquire Various types of data and with
The communication of spacecraft platform, while reception, parsing and the execution of complete paired data and instruction.
Power module 5 includes two standalone modules, respectively：Equipment power module and circuit for producing high voltage module.One side
Face is equipment, i.e., component detecting module 2, amplification module 3 and control module 4 are powered, on the other hand for radiation environment probe 1 solely
It is vertical that bias high voltage is provided.
Equipment power module is main by the+5.2V of external power supply conversion forming apparatus needs and ± 12V secondary power supplies, the module
Including：Current foldback circuit, surge restraint circuit, wave filter and DC/DC modules, as shown in fig. 7, external power supply provides 28V's
Voltage, the processing successively through current foldback circuit, surge restraint circuit, wave filter and DC/DC modules, respectively output+5.2V and
± 12V secondary power supplies.
Circuit for producing high voltage module provides high pressure bias, about 150V and 60V by+5.2V to input to equipment probe, whole
A circuit for producing high voltage can be divided into oscillation voltage changing module, voltage multiplying rectifier and filter module, error feedback module and telemetering output mould
Block, as shown in Figure 8.Voltage multiplying rectifier and filter module are connected respectively with error feedback module and telemetering output module, telemetering output
Module exports telemetered signal and PERCOM peripheral communication, and error feedback module provides feedback for oscillation voltage changing module, vibrates voltage changing module root
According to feedback control voltage multiplying rectifier and filter module, voltage multiplying rectifier and filter module export height under the control of oscillation voltage changing module
Pressure.
In conclusion the foregoing is merely a prefered embodiment of the invention, it is not intended to limit the scope of the present invention.
All within the spirits and principles of the present invention, any modification, equivalent replacement, improvement and so on should be included in the present invention's
Within protection domain.
Claims (4)
1. a kind of component Space Radiation Effects detection device, which is characterized in that the detection device include radiation environment probe,
Component detecting module, amplification module, control module, power module and casing；
The radiation environment probe is transferred to amplification module for space exploration radiation environment information；The component detection
Module is used to detect the voltage, electric current and single particle effect information of tested component, and is transferred to amplification module；The radiation ring
Border is popped one's head in and component detecting module is arranged in parallel in above casing internal；
The amplification module is popped one's head in radiation environment and component detecting module corresponds, including probe amplification module and first device
Part amplification module；Probe amplification module is for enhanced processing space radiation environment information and identifies effective particle event, then
It is transferred to control module；Component amplification module is for enhanced processing voltage, electric current and single particle effect information and is transferred to control
Molding block；
The control module identifies that effective single particle effect is believed according to voltage, electric current and the single particle effect information after enhanced processing
It ceases and component detecting module is controlled to work normally, while the output information of the amplification module of acquisition is transferred to external satellite and is put down
Platform；
The power module is component detecting module, amplification module and control module pressure supply, while only for radiation environment probe
Vertical pressure supply.
2. component Space Radiation Effects detection device as described in claim 1, which is characterized in that the radiation environment probe
Including LET probes and proton probe.
3. component Space Radiation Effects detection device as claimed in claim 2, which is characterized in that the LET probes include
Low LET probes and high LET probes.
4. component Space Radiation Effects detection device as claimed in claim 3, which is characterized in that the low LET probes, height
LET pops one's head in and proton probe is connected respectively with corresponding amplification module.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711287554.4A CN108169785A (en) | 2017-12-07 | 2017-12-07 | A kind of component Space Radiation Effects detection device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711287554.4A CN108169785A (en) | 2017-12-07 | 2017-12-07 | A kind of component Space Radiation Effects detection device |
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| Publication Number | Publication Date |
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| CN108169785A true CN108169785A (en) | 2018-06-15 |
Family
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| CN201711287554.4A Pending CN108169785A (en) | 2017-12-07 | 2017-12-07 | A kind of component Space Radiation Effects detection device |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109003645A (en) * | 2018-06-27 | 2018-12-14 | 山东航天电子技术研究所 | A kind of in-orbit single particle effect verifying system of electronic system |
| CN114280987A (en) * | 2021-12-14 | 2022-04-05 | 北京卫星环境工程研究所 | Spacecraft space environment effect on-orbit monitoring device |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101907662A (en) * | 2009-06-04 | 2010-12-08 | 中国科学院空间科学与应用研究中心 | Single-event effect detection device and method |
| CN105738936A (en) * | 2016-02-25 | 2016-07-06 | 北京卫星环境工程研究所 | Space radiation environment and effect combination detection structure |
| US20170011808A1 (en) * | 2015-07-10 | 2017-01-12 | Stmicroelectronics S.R.L. | Memory cell and corresponding device |
| CN106526500A (en) * | 2016-11-22 | 2017-03-22 | 上海卫星工程研究所 | Device used for testing DC-DC power supply module single particle effect |
| CN106841845A (en) * | 2016-12-15 | 2017-06-13 | 华中师范大学 | A kind of electronic device radiation resistance method of testing and system |
| CN107356856A (en) * | 2017-06-26 | 2017-11-17 | 中国空间技术研究院 | A kind of triple channel voltage feedback VDMOS device single particle effect high-precision detection device |
-
2017
- 2017-12-07 CN CN201711287554.4A patent/CN108169785A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101907662A (en) * | 2009-06-04 | 2010-12-08 | 中国科学院空间科学与应用研究中心 | Single-event effect detection device and method |
| US20170011808A1 (en) * | 2015-07-10 | 2017-01-12 | Stmicroelectronics S.R.L. | Memory cell and corresponding device |
| CN105738936A (en) * | 2016-02-25 | 2016-07-06 | 北京卫星环境工程研究所 | Space radiation environment and effect combination detection structure |
| CN106526500A (en) * | 2016-11-22 | 2017-03-22 | 上海卫星工程研究所 | Device used for testing DC-DC power supply module single particle effect |
| CN106841845A (en) * | 2016-12-15 | 2017-06-13 | 华中师范大学 | A kind of electronic device radiation resistance method of testing and system |
| CN107356856A (en) * | 2017-06-26 | 2017-11-17 | 中国空间技术研究院 | A kind of triple channel voltage feedback VDMOS device single particle effect high-precision detection device |
Non-Patent Citations (2)
| Title |
|---|
| 薛玉熊，等: "空间单粒子锁定效应研究", 《核技术》 * |
| 邵思霈，等: "结合空间辐射探测技术的航天电子元器件验证方法", 《国家安全地球物理丛书（十）——地球物理环境与国家安全》 * |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109003645A (en) * | 2018-06-27 | 2018-12-14 | 山东航天电子技术研究所 | A kind of in-orbit single particle effect verifying system of electronic system |
| CN109003645B (en) * | 2018-06-27 | 2022-01-21 | 山东航天电子技术研究所 | Electronic system on-orbit single event effect verification system |
| CN114280987A (en) * | 2021-12-14 | 2022-04-05 | 北京卫星环境工程研究所 | Spacecraft space environment effect on-orbit monitoring device |
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Application publication date: 20180615 |
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