CN101871995B - JTAG (Joint Test Action Group) connection control device and veneer - Google Patents
JTAG (Joint Test Action Group) connection control device and veneer Download PDFInfo
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- CN101871995B CN101871995B CN 200910137616 CN200910137616A CN101871995B CN 101871995 B CN101871995 B CN 101871995B CN 200910137616 CN200910137616 CN 200910137616 CN 200910137616 A CN200910137616 A CN 200910137616A CN 101871995 B CN101871995 B CN 101871995B
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Abstract
The embodiment of the invention discloses a JTAG connection control device and a veneer. The JTAG connection control device comprises a path selection module, a master control module and a slave control module, wherein the path selection module is used for selecting the working mode of the JTAG connection control device according to the configuration information of a path and connecting at least one JTAG chain in series into a big JTAG chain; under a master mode, the master control module receives JTAG data; the path selection module provides connection of the master control module and the big JTAG chain to meet the application demands of on-line programming, data updating and the like. Under a slave mode, the slave control module receives JTAG signals, and the path selection module provides connection of the slave control module and the big JTAG chain to meet the test demands of the one board. Compared with the prior art, due to the fact that an additional through connection mode is not needed, the accuracy of the test can be improved.
Description
Technical field
The present invention relates to communication technical field, particularly relate to a kind of JTAG and connect control device and veneer.
Background technology
JTAG (Joint Test Action Group, JTAG) is a kind of international standard test protocol, the proposition of JTAG technology, in order to solve the test problem of high complexity, highly integrated chip or veneer the earliest, along with the development of technology, JTAG also is widely used at aspects such as the online programming of veneer device, data upgradings.
The JTAG technology allows a plurality of devices to be cascaded by jtag interface, forms a JTAG chain, each device is tested respectively or data write realizing.Along with the increase of single board design complexity, also may there be many JTAG chains on the veneer, many JTAG chains access a device management module, 110 device management modules that are on the veneer as shown in fig. 1 in parallel mode.This device management module 110 can be realized the unified management to many JTAG chain data writings when carrying out online programming, data upgrading etc. and use.
Wherein, when testing by many JTAG chains on 130 pairs of veneers of testing apparatus, many JTAG chains and this device management module 110 parallel joins, these device management module 110 serial communication interfaces are difficult to be connected with the jtag interface of testing apparatus 130, like this, needing increases special-purpose interconnecting module 120, and as shown in Figure 1, testing apparatus 130 is transferred to test signal respectively on every JTAG chain by interconnecting module 120.This mode may impact the quality of signal, testing clock frequency etc., and then reduces the accuracy of test.
Summary of the invention
The embodiment of the invention provides a kind of JTAG to connect control device and veneer, to improve accuracy and the coverage rate of jtag test.
The embodiment of the invention provides a kind of JTAG to connect control device, it is characterized in that, comprising: path is selected module, main control module and from control module,
This path is selected module, is used for connecting according to via configuration Information Selection JTAG the mode of operation of control device, and realizes that with the series connection of at least one JTAG chain be a large chain of JTAG;
Wherein, this mode of operation comprises holotype and from pattern: under holotype, this path selects module that being connected of this main control module and the large chain of this JTAG is provided; Under pattern, this path selects module that this being connected from control module and the large chain of this JTAG is provided;
This main control module, be used for receiving the JTAG data, these JTAG data are resolved, select being connected of this main control module that module provides and the large chain of this JTAG by this path, JTAG data after resolving are write device on the large chain of JTAG, and the JTAG data of the large chain of writing JTAG are carried out verification;
Should be from control module, be used for receiving the JTAG signal, by this path select that module provides should be from being connected of control module and the large chain of this JTAG, this JTAG signal is sent to device on the large chain of this JTAG.
The embodiment of the invention also provides a kind of veneer, comprises that the JTAG device is connected control device with JTAG, and this JTAG device is connected by jtag interface, form many JTAG chains, wherein, this JTAG connects control device, comprise: path is selected module, main control module and from control module
This path is selected module, is used for connecting according to via configuration Information Selection JTAG the mode of operation of control device, and realize should many in the JTAG chain at least one JTAG chain to connect be a large chain of JTAG;
This mode of operation comprises holotype and from pattern: under holotype, this path selects module that being connected of this main control module and the large chain of this JTAG is provided; Under pattern, this path selects module that this being connected from control module and the large chain of this JTAG is provided;
This main control module, be used for receiving the JTAG data, these JTAG data are resolved, select being connected of this main control module that module provides and the large chain of this JTAG by this path, JTAG data after resolving are write device on the large chain of JTAG, and the JTAG data of the large chain of writing JTAG are carried out verification;
Should be from control module, be used for receiving the JTAG signal, by this path select that module provides should be from being connected of control module and the large chain of this JTAG, this JTAG signal is sent to device on the large chain of this JTAG.
Above technical scheme can according to concrete application demand, select JTAG to connect the mode of operation of control device.When device is operated in holotype lower time, realize unified management that many JTAG chains are read and write data by the JTAG main control module, to satisfy the application such as online programming to veneer, data upgrading; When device was operated in from pattern lower time, by JTAG from control module to many JTAG chains transmission JTAG signals.Compared with prior art, owing to do not need extra substitute mode, therefore can improve the accuracy of test.
Description of drawings
Fig. 1 is the jtag test connection diagram of prior art;
Fig. 2 is the structural representation that the JTAG of the embodiment of the invention connects control device;
Fig. 3 is the structural representation that the path of the embodiment of the invention is selected module;
Fig. 4 is the large chain series system of the JTAG of embodiment of the invention synoptic diagram;
Fig. 5 is the synoptic diagram of the mode of operation configuration submodule of the embodiment of the invention;
Fig. 6 is the structural representation of the main control module of the embodiment of the invention;
Fig. 7 is the another kind of structural representation of the main control module of the embodiment of the invention;
Fig. 8 is the structural representation from control module of the embodiment of the invention;
Fig. 9 is the another kind of structural representation from control module of the embodiment of the invention;
Figure 10 is that the JTAG of the embodiment of the invention connects the system-level application scenarios synoptic diagram of control device;
Figure 11 is that the JTAG of the embodiment of the invention connects control device single-plate grade application scenarios synoptic diagram.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the invention, the technical scheme in the embodiment of the invention is clearly and completely described, obviously, described embodiment only is the present invention's part embodiment, rather than whole embodiment.Based on the embodiment among the present invention, those of ordinary skills belong to the scope of protection of the invention not making the every other embodiment that obtains under the creative work prerequisite.
At first the JTAG connection control device of the embodiment of the invention described, Figure 2 shows that JTAG that the embodiment of the invention provides connects the structural representation of control device, mainly comprises following three kinds of functional modules: path selects module 210, main control module 220, from control module 230.
Path is selected module 210, is used for connecting according to via configuration Information Selection JTAG the mode of operation of control device, and realizes that with the series connection of at least one JTAG chain be a large chain of JTAG.
Wherein, the JTAG mode of operation that connects control device comprises holotype and from two kinds of patterns:
Under holotype, path selects module 210 that being connected of main control module 220 and the large chain of JTAG is provided;
Under pattern, path selects module 210 that being connected from control module 230 and the large chain of JTAG is provided;
From control module 230, be used for to receive the JTAG signal, by described path select that module 210 provides described from being connected of control module 230 and the large chain of described JTAG, described JTAG signal is sent to device on the large chain of described JTAG.
Above-mentioned JTAG connects control device can provide the principal and subordinate two kinds of mode of operations, when connecting control device, JTAG is operated in holotype lower time, the JTAG data can be sent to many JTAG chains, realize to the data write operation of veneer device and to the verification operation of institute's data writing; Be operated in from pattern lower time when JTAG connects control device, the JTAG signal can be sent to many JTAG chains, realize test to the veneer device by testing apparatus.By via configuration information, device is switched, to satisfy different practical application request between two kinds of mode of operations of principal and subordinate.Compared with prior art, JTAG that the embodiment of the invention provides connects control device, does not need extra interconnecting module, accuracy that can the Effective Raise test.
Wherein, this testing apparatus can be test PC, and test card/ICT needle-bar is installed among the test PC.
Wherein, the JTAG data can be the jtag test file data, also can be JTAG load document data; The JTAG signal can be for meeting the signal of IEEE1149.1 standard.
Below in conjunction with accompanying drawing, the composition and the annexation that the JTAG of the embodiment of the invention are connected the modules of control device are described in further detail.
Referring to shown in Figure 3, path selects module 210 specifically can comprise arranged in series submodule 211 and mode of operation configuration submodule 212.
Arranged in series submodule 211 is connected with many upper JTAG chains of veneer, and realize being connected to the series connection between the one or more JTAG chain of this arranged in series submodule 211, referring to shown in Figure 4, among the figure 1,2......n representative is connected to many JTAG chains of this arranged in series submodule 211 respectively, the arranged in series submodule can be a large chain with these JTAG chain series connection, specifically mode can be: TDI (test data input) end of adjacent two JTAG chains is connected respectively with TDO (test data output) end, holds the TDI as the large chain of whole piece to hold and the TDO end at the TDI end of the 1st JTAG chain and the TDO of n bar JTAG chain.
Figure 4 shows that it is the situation of a large chain that all JTAG chains are all connected, in actual applications, also can write according to concrete data or testing requirement, only whole JTAG chains 1, among the 2......n one or several are sealed in the large chain, the device of avoiding will not needing to pay close attention to seals in large chain, to improve the efficient of reading and writing data or test.Arranged in series submodule 211 can be configured according to the concrete series system of via configuration information to many JTAG chains.
Need to prove, more than the numbering 1 of each bar JTAG chain, 2......n only are used for schematically illustrating, should not be construed as the restriction to many concrete series sequences of JTAG chain.
The effect of mode of operation configuration submodule 212 is according to via configuration information, select main mode of operation or from mode of operation, referring to shown in Figure 5, when connecting control device, JTAG is operated in holotype lower time, mode of operation configuration submodule 212 is communicated with main control module 220, the main control module 220 that is connected further is connected to the large chain of the JTAG that connects by arranged in series submodule 211, is implemented in that the data to device on the JTAG chain write and verification under the holotype; When connecting control device, JTAG is operated in from pattern lower time, mode of operation configuration submodule 212 is communicated with from control module 230, be connected from control module 230, further be connected to the large chain of the JTAG that connects by arranged in series submodule 211, be implemented under the pattern test to device on the JTAG chain by testing apparatus.
In sum, via configuration information specifically can comprise two parts information: on the one hand be to main mode of operation or from the configuration information of mode of operation, this part information relates to two states, therefore can represent with 1 data bit, for example represents from mode of operation with the main mode of operation of 1 expression, 0; The configuration information to the concrete series system of many JTAG chains on the other hand, can represent with the individual data bit of n (n is the number of JTAG chain), for each data bit, can the corresponding JTAG chain of this data bit be sealed in large chain with 1 expression, the corresponding JTAG chain of this data bit not sealed in large chain with 0 expression.For example, when n=4, " 1111 " representative all seals in large chain with 4 JTAG chains, and " 1101 " expression seals in large chain with JTAG chain 1,2,4.It will be appreciated by persons skilled in the art that above configuration information specific implementation only is used for schematically illustrating, do not consist of the restriction to technical solution of the present invention.
The effect of main control module 220 is under holotype, receive the JTAG data, these JTAG data are resolved, select being connected of described main control module 220 that module 210 provides and the large chain of described JTAG by described path, JTAG data after resolving are write device on the large chain of JTAG, and the JTAG data of the large chain of writing JTAG are carried out verification.
Referring to shown in Figure 6, main control module 220 can comprise communications interface unit 221 and MCU 222 (micro-control unit).
Another function of MCU 222 is according to received JTAG data, produces via configuration information and send to path to select module 210, and the indication path selects 210 pairs of current master/slave mode of operations of module to switch.And can further write demand according to concrete data, the indication path selects the concrete series system of 210 pairs many JTAG chains of module to be configured.
Referring to shown in Figure 7, main control module 220 can further include data deposit unit 223, is used to MCU 222 to provide the JTAG data to deposit function:
On the one hand, data deposit unit 223 can be deposited communications interface unit 221 received JTAG data, and according to the control of MCU 222, the JTAG data communication device is crossed path select module 210 that the JTAG data are write to the large chain of JTAG.
On the other hand, in the data check stage, MCU 222 reads on the JTAG chain behind the device data, the data that read can be deposited in data deposit unit 223, and compare with the data of depositing before, whether is correctly write device on the JTAG chain to judge data.
It will be understood by those skilled in the art that, main control module 220 can also be after device data writing on the JTAG chain, or in the process of data writing, the situation that writes of data (such as the information such as whether correctly being write) is sent it back the equipment such as webmaster, control terminal of local system by communications interface unit 221.
Under pattern from the effect of control module 230, receive the JTAG signal, described being connected from control module 230 and the large chain of described JTAG of selecting that module 210 provides by described path, described JTAG signal is sent to device on the large chain of described JTAG, realize jtag test to device on the large chain of JTAG by testing apparatus.
Referring to shown in Figure 8, can comprise that from control module 230 test interface unit 231, testing chain selected cell 232, JTAG connect the JTAG functional unit 233 of control device self:
Testing chain selected cell 232 is used for the JTAG signal according to described test interface unit 231 receptions, determines described connecting path from control module 230.Can comprise following two kinds of citation forms from the connecting path of control module 230:
1) not by the JTAG functional unit 233 of control device self, directly select module 210 to send to the large chain of JTAG by path the JTAG signal; Under this path form, be equivalent to only comprise in the testing chain the large chain of JTAG;
2) with behind the JTAG functional unit 233 of JTAG signal by JTAG connection control device self, select module 210 to send to the large chain of JTAG by path again, the functional unit 233 that is equivalent to JTAG is connected the JTAG of control device self also seals in the large chain of JTAG, the testing chain of complete participates in the jtag test of whole veneer.
Referring to shown in Figure 9, from control module 230, can also further comprise series connection control module 234, be used for realizing the JTAG functional unit 233 of control device self and connecting or disconnection of the large chain of JTAG.At above-mentioned path 2) the basis on, if disconnect the series relationship of JTAG functional unit 233 with the large chain of JTAG of control device self, then this moment control module 230 the connecting path form be:
3) only the JTAG signal is sent to the JTAG functional unit 233 that connects control device self, be equivalent to only to comprise in the testing chain functional unit 233 that JTAG connects the JTAG of control device self, the functional unit 233 that namely only JTAG is connected the JTAG of control device self is tested.
Wherein, above-mentioned path form 2) and form 3) between switching can by the series connection control module 234 finish, series connection control module 234 can be according to the indication of test access selected cell 232, and the functional unit 233 of selecting whether JTAG to be connected the JTAG of control device self seals in the large chain of JTAG.
In the scheme of prior art, device management module also is the important component part of single plate hardware, and self also has the JTAG functional unit, but owing to used the mode of switching, cause the JTAG functional unit of device management module self can not access any JTAG chain, therefore, jtag test can not cover device management module, causes comprehensively testing whole veneer.
And the JTAG that the embodiment of the invention provides connects control device, when under pattern, working, can select also to include the functional unit 233 of the JTAG of control device self in test specification, and can be according to the actual requirements, further selection is tested separately the functional unit 233 of the JTAG of control device self, or will connect control device seals in the large chain of JTAG and tests, and compares with the prior art scheme, has improved the test coverage and test dirigibility of single plate hardware.
Testing chain selected cell 232 can also according to received JTAG signal, produce via configuration information and send to path and select module 210 under mode of operation, and the indication path selects 210 pairs of current master/slave mode of operations of module to switch.And can be further according to concrete testing requirement, the indication path selects the concrete series system of 210 pairs many JTAG chains of module to be configured.
It will be appreciated by persons skilled in the art that can also be the jtag test process from control module 230, or after test finishes, receives the detecting information of device feedback on the JTAG chain, and these detecting informations are further sent it back testing apparatus.
Can find out by above explanation, be used to indicate the via configuration information that path selects module 210 to select master/slave mode of operation and dispose many JTAG chain series systems, can be provided according to the JTAG data by main control module 220, also can be by providing according to the JTAG signal from control module 230, it will be appreciated by those skilled in the art that, this via configuration information also can realize with hardware mode, for example when the connection control device powers on or resets, according to path being selected the hardware configuration information of module 210 generate via configuration information, select initial mode of operation or dispose many JTAG chain series systems.After this, can also further carry out via configuration by main control module 220 or from control module 230.Aspect priority, the priority of hardware information configuration mode is minimum, and is the highest by the mode priority of main control module 220 configurations.
Need to prove, it only is schematic that JTAG described above connects control device embodiment, wherein said module as separating component explanation can or can not be physically to separate also, and the parts that show as the unit can be or can not be physical locations also.Can select according to the actual needs wherein some or all of module to realize the purpose of present embodiment scheme.Those of ordinary skills namely can understand and implement in the situation of not paying performing creative labour.
The JTAG that the embodiment of the invention provides connects control device, can solidify on veneer with the form of SOC chip, satisfies the application of JTAG technology under several scenes.
Figure 10 shows that JTAG connects the system-level typical application scenarios of control device SOC.FE is network interface, realizes with far-end/near-end webmaster mutual.MPU 1001 is the master control veneer business CPU, the functions such as the storage of realization JTAG data or JTAG signal, transmission, maintenance, and Board 0-Board n is a plurality of service boards.Master control veneer is connected by universal serial bus with each service board, is equivalent to each service board and seals in a large chain of JTAG.By the master/slave mode of operation of configuration SOC 1002 chips, finish the system-level application such as JTAG loading, test.
Single-plate grade application scenarios when Figure 11 is production test, maintenance position application.Wherein, testing apparatus is test PC, and test card/ICT needle-bar is installed among the test PC, and JTAG connects control device and solidifies in veneer with the form of SOC.In the test process, test PC produces signal, send to the JTAG signaling interface that SOC provides, SOC elects the mode of operation of self from mode of operation as, and selects the series system of the large chain of JTAG according to concrete testing requirement, (for example one or more of veneer is sealed in the large chain of JTAG, JTAG functional unit with JTAG control device self seals in the large chain of JTAG etc.), after path is selected to finish, SOC will be sent to device on the chain by the signal that signaling interface receives, and finish jtag test and use.
In the description of above-mentioned embodiment, comprise MCU 222 in the main control module, can carry out dissection process and data write to the JTAG data, data write the operations such as verification, and therefore main mode of operation relatively is fit to online programming, the application scenarioss such as data upgrading; And can select whether control device self also to be sealed in the large chain of JTAG from control module, therefore be more suitable in satisfying testing requirement from mode of operation.It should be appreciated by those skilled in the art that above description only is a kind of better embodiment of the present invention, does not consist of the restriction to technical solution of the present invention.In fact, the connecting path that provides under the master/slave mode of operation can be realized respectively writing and jtag test of JTAG data.If under holotype, test, although can't make Test coverage to control device self, still the JTAG signal can be sent to the large chain of JTAG, realize the proper testing to the device on the large chain of JTAG; Correspondingly, under pattern, also can be implemented in the operations such as line programming, data upgrading, and will be finished by equipment such as the webmaster of local system, control terminals tasks such as the dissection process of JTAG data, read-write operations.
The embodiment of the invention also provides a kind of veneer, comprises that the JTAG device is connected control device with JTAG, and this JTAG device is connected by jtag interface, form many JTAG chains, wherein, this JTAG connects control device, comprise: path is selected module, main control module and from control module
This path is selected module, is used for connecting according to via configuration Information Selection JTAG the mode of operation of control device, and realize should many in the JTAG chain at least one JTAG chain to connect be a large chain of JTAG;
This mode of operation comprises holotype and from pattern: under holotype, this path selects module that being connected of this main control module and the large chain of this JTAG is provided; Under pattern, this path selects module that this being connected from control module and the large chain of this JTAG is provided;
This main control module, be used for receiving the JTAG data, these JTAG data are resolved, select being connected of this main control module that module provides and the large chain of this JTAG by this path, JTAG data after resolving are write device on the large chain of JTAG, and the JTAG data of the large chain of writing JTAG are carried out verification;
Should be from control module, be used for receiving the JTAG signal, by this path select that module provides should be from being connected of control module and the large chain of this JTAG, this JTAG signal is sent to device on the large chain of this JTAG.
As seen from the above, be operated in holotype lower time when the JTAG of veneer connects control device, the JTAG data can be sent to many JTAG chains, realize to the data write operation of veneer device and to the verification operation of institute's data writing; Be operated in from pattern lower time when JTAG connects control device, the JTAG signal can be sent to many JTAG chains, realize test to the veneer device by testing apparatus.By via configuration information, device is switched, to satisfy different practical application request between two kinds of mode of operations of principal and subordinate.Compared with prior art, JTAG in the embodiment of the invention veneer connects control device, does not need extra interconnecting module, accuracy that can the Effective Raise test.
Wherein, this veneer can be the master control veneer among Figure 10, also can be Board 0......Boardn-1, any veneer among the Board n.The embodiment of the invention is not limited to this.
Wherein, this JTAG connects main control module in control device, selects module to connect consistent that control device (please refer to the elaboration to Fig. 2 to Fig. 9) sets forth with JTAG above-described embodiment from control module and path, no longer repeats at this.
The above only is the specific embodiment of the present invention; should be pointed out that for those skilled in the art, under the prerequisite that does not break away from the principle of the invention; can also make some improvements and modifications, these improvements and modifications also should be considered as protection scope of the present invention.
Claims (16)
1. a JTAG connects control device, it is characterized in that, comprising: path is selected module, main control module and from control module,
Described path is selected module, is used for connecting according to via configuration Information Selection JTAG the mode of operation of control device, and realizes that with the series connection of at least one JTAG chain be a large chain of JTAG;
Wherein, described mode of operation comprises holotype and from pattern: under holotype, described path selects module that being connected of described main control module and the large chain of described JTAG is provided; Under pattern, described path selects module that described being connected from control module and the large chain of described JTAG is provided;
Described main control module, be used for receiving the JTAG data, described JTAG data are resolved, select being connected of described main control module that module provides and the large chain of described JTAG by described path, JTAG data after resolving are write device on the large chain of JTAG, and the JTAG data of the large chain of writing JTAG are carried out verification;
Described from control module, be used for to receive the JTAG signal, by described path select that module provides described from being connected of control module and the large chain of described JTAG, described JTAG signal is sent to device on the large chain of described JTAG.
2. device according to claim 1 is characterized in that, described path is selected module, comprising:
The arranged in series submodule is connected with many upper JTAG chains of veneer, is used for according to described via configuration information, and the mode of the large chain of the described JTAG of sealing in of described many JTAG chains is configured;
Mode of operation configuration submodule is used for according to described via configuration information, selects JTAG to connect the mode of operation of control device;
Wherein, described arranged in series submodule is connected with described mode of operation configuration submodule.
3. device according to claim 1 is characterized in that, described main control module comprises:
Communications interface unit is used for receiving the JTAG data;
Micro-control unit, be used for the JTAG data that described communications interface unit receives are resolved, select being connected of described main control module that module provides and the large chain of described JTAG by described path, JTAG data after resolving are write device on the large chain of JTAG, and the JTAG data of the large chain of writing JTAG are carried out verification.
4. device according to claim 3 is characterized in that, described main control module also comprises:
The data deposit unit is used to described micro-control unit to provide the JTAG data to deposit function.
5. device according to claim 3 is characterized in that,
Described micro-control unit also is used for the JTAG data according to described communications interface unit reception, produces described via configuration information and send to described path to select module.
6. device according to claim 1 is characterized in that, and is described from control module, comprising: test interface unit, testing chain selected cell, JTAG connect the JTAG functional unit of control device self;
Described test interface unit is used for receiving the JTAG signal;
Described testing chain selected cell is used for the JTAG signal according to described test interface unit reception, determines described connecting path from control module, and described connecting path from control module comprises:
Comprise the large chain of described JTAG in the testing chain; Or
Comprise the large chain of described JTAG in the testing chain and be connected JTAG and connect the JTAG functional unit of control device self.
7. device according to claim 6 is characterized in that, and is described from control module, also comprises:
The series connection control module is used for controlling the large chain of described JTAG and is connected JTAG and connects series connection or the disconnection of the JTAG functional unit of control device self;
Described series connection control module is controlled the large chain of described JTAG and is connected the JTAG functional unit that JTAG connects control device self and disconnects, and described connecting path from control module also comprises:
Comprise the JTAG functional unit that described JTAG connects control device self in the testing chain.
8. device according to claim 6 is characterized in that,
Described testing chain selected cell also is used for according to described JTAG signal, produces described via configuration information and send to described path to select module.
9. device according to claim 1 is characterized in that, described via configuration information comprises:
The via configuration information that generates according to hardware configuration information, the via configuration information that is generated according to described JTAG data by described main control module or by the described via configuration information that generates according to described JTAG signal from control module.
10. device according to claim 9, it is characterized in that, in described three kinds of via configuration information, the priority of the via configuration information that is generated according to described JTAG data by described main control module is the highest, and the priority of the via configuration information that generates according to hardware configuration information is minimum.
11. a veneer comprises that the JTAG device is connected control device with JTAG, described JTAG device is connected by jtag interface, forms many JTAG chains, and wherein, described JTAG connects control device, comprising: path is selected module, main control module and from control module,
Described path is selected module, is used for connecting according to via configuration Information Selection JTAG the mode of operation of control device, and realizes that with at least one JTAG chain series connection in described many JTAG chains be a large chain of JTAG;
Described mode of operation comprises holotype and from pattern: under holotype, described path selects module that being connected of described main control module and the large chain of described JTAG is provided; Under pattern, described path selects module that described being connected from control module and the large chain of described JTAG is provided;
Described main control module, be used for receiving the JTAG data, described JTAG data are resolved, select being connected of described main control module that module provides and the large chain of described JTAG by described path, JTAG data after resolving are write device on the large chain of JTAG, and the JTAG data of the large chain of writing JTAG are carried out verification;
Described from control module, be used for to receive the JTAG signal, by described path select that module provides described from being connected of control module and the large chain of described JTAG, described JTAG signal is sent to device on the large chain of described JTAG.
12. veneer according to claim 11 is characterized in that, described path is selected module, comprising:
The arranged in series submodule is connected with many upper JTAG chains of described veneer, is used for according to described via configuration information, and the mode that described many JTAG chains are sealed in the large chain of described JTAG is configured;
Mode of operation configuration submodule is used for according to described via configuration information, selects JTAG to connect the mode of operation of control device;
Wherein, described arranged in series submodule is connected with described mode of operation configuration submodule.
13. veneer according to claim 11 is characterized in that, described main control module comprises:
Communications interface unit is used for receiving the JTAG data;
Micro-control unit, be used for the JTAG data that described communications interface unit receives are resolved, select being connected of described main control module that module provides and the large chain of described JTAG by described path, JTAG data after resolving are write device on the large chain of JTAG, and the JTAG data of the large chain of writing JTAG are carried out verification.
14. veneer according to claim 13 is characterized in that, described micro-control unit also is used for the JTAG data according to described communications interface unit reception, produces described via configuration information and sends to described path and select module.
15. veneer according to claim 11 is characterized in that, and is described from control module, comprising: test interface unit, testing chain selected cell, JTAG connect the JTAG functional unit of control device self, wherein,
Described test interface unit is used for receiving the JTAG signal;
Described testing chain selected cell is used for the JTAG signal according to described test interface unit reception, determines described connecting path from control module, and described connecting path from control module comprises:
Comprise the large chain of described JTAG in the testing chain; Or
Comprise the large chain of described JTAG in the testing chain and be connected JTAG and connect the JTAG functional unit of control device self.
16. veneer according to claim 15 is characterized in that,
Described testing chain selected cell also is used for according to described JTAG signal, produces described via configuration information and send to described path to select module.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200910137616 CN101871995B (en) | 2009-04-23 | 2009-04-23 | JTAG (Joint Test Action Group) connection control device and veneer |
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| CN 200910137616 CN101871995B (en) | 2009-04-23 | 2009-04-23 | JTAG (Joint Test Action Group) connection control device and veneer |
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| CN101871995B true CN101871995B (en) | 2013-01-02 |
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Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN102073610B (en) * | 2010-12-31 | 2013-01-09 | 华为数字技术（成都）有限公司 | Serial information acquisition method and serial communication system |
| CN104156288B (en) * | 2014-06-26 | 2018-01-05 | 西安空间无线电技术研究所 | A kind of fault location and software upgrading circuit and its implementation based on JTAG chains |
| CN104216747A (en) * | 2014-09-03 | 2014-12-17 | 中国电子科技集团公司第三十四研究所 | Multi-JTAG (joint test action group) interface electronic equipment upgrading system |
| CN105548863B (en) * | 2015-12-29 | 2018-04-17 | 广州慧睿思通信息科技有限公司 | A kind of structure and method of the interconnection of plate level multi-chip JTAG chains |
| CN117728899A (en) * | 2024-02-06 | 2024-03-19 | 北京东远润兴科技有限公司 | Equipment joint debugging method and device, terminal equipment and storage medium |
Citations (5)
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|---|---|---|---|---|
| US6425101B1 (en) * | 1998-10-30 | 2002-07-23 | Infineon Technologies North America Corp. | Programmable JTAG network architecture to support proprietary debug protocol |
| CN1756962A (en) * | 2003-03-04 | 2006-04-05 | 皇家飞利浦电子股份有限公司 | Automatically detecting and routing of test signals |
| CN1763556A (en) * | 2004-10-20 | 2006-04-26 | 华为技术有限公司 | Automatic connecting system for JTAG chain and implementing method thereof |
| CN101183139A (en) * | 2007-11-02 | 2008-05-21 | 中兴通讯股份有限公司 | Board based on JTAG interface and design method thereof |
| CN101193326A (en) * | 2007-04-24 | 2008-06-04 | 中兴通讯股份有限公司 | Automatic testing device and method for multi-JTAG chain |
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2009
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Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6425101B1 (en) * | 1998-10-30 | 2002-07-23 | Infineon Technologies North America Corp. | Programmable JTAG network architecture to support proprietary debug protocol |
| CN1756962A (en) * | 2003-03-04 | 2006-04-05 | 皇家飞利浦电子股份有限公司 | Automatically detecting and routing of test signals |
| CN1763556A (en) * | 2004-10-20 | 2006-04-26 | 华为技术有限公司 | Automatic connecting system for JTAG chain and implementing method thereof |
| CN101193326A (en) * | 2007-04-24 | 2008-06-04 | 中兴通讯股份有限公司 | Automatic testing device and method for multi-JTAG chain |
| CN101183139A (en) * | 2007-11-02 | 2008-05-21 | 中兴通讯股份有限公司 | Board based on JTAG interface and design method thereof |
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