CN101706540B - Programmable integrated circuit automatic testing and sorting system - Google Patents
Programmable integrated circuit automatic testing and sorting system Download PDFInfo
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- CN101706540B CN101706540B CN2009102240827A CN200910224082A CN101706540B CN 101706540 B CN101706540 B CN 101706540B CN 2009102240827 A CN2009102240827 A CN 2009102240827A CN 200910224082 A CN200910224082 A CN 200910224082A CN 101706540 B CN101706540 B CN 101706540B
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Abstract
A programmable integrated circuit automatic testing and sorting system consists of a principal computer and a subordinate computer; the principal computer comprises a PC which is used for executing start and stop of the test, providing operating interface of editing test template for a user, monitoring working condition of the system, and displaying, analyzing and storing return parameters of component test; the subordinate computer comprises a tester which carries with a plurality of channel plates, the output pin of each channel plate is connected to a pin of the integrated circuit to be tested by a mechanical arm, the mechanical arm is used for grabbing and fixing the integrated circuit to be tested, and putting the components into a designated box according to sorting result; the principal computer downloads the test template edited according to protocol to the tester via a serial port, the tester resolves out atomic operation sequence and sorting condition sequence according to the protocol after receiving the test template so as to conduct the test. The system is applicable to various integrated circuit testing and sorting by flexible programming, and improves test efficiency greatly while reducing test cost.
Description
Technical field
The present invention relates to integrated circuit automatic testing and taxis system, relate in particular to programmable hall device test and taxis system automatically, be applicable to integrated circuit manufacturer, it is installed on the integrated circuit production line and can tests automatically and class wrapping device.
Background technology
Every integrated circuit needs designated parameters is detected to eliminate defect ware before dispatching from the factory, and simultaneously specification product is classified according to its performance index.The existing integrated circuits tester usually can only be according to several fixing parameters of the program test that is cured, so along with the continuous release of new type integrated circuit, manufacturer need constantly buy new integrated circuit tester to satisfy new testing requirement.This quasi-instrument is tested the test that often can only finish one or several device each time simultaneously, need the operator manually device to be sorted out after having surveyed and place according to test result, make testing efficiency very low like this, the artificial simultaneously error of introducing is also just unavoidable.
Summary of the invention
Programmable integrated circuit automatic testing of the present invention and taxis system are intended to solve the above-mentioned problems in the prior art, make it by supporting the User Defined testing process, the testing requirement that can constantly adapt to new unit and proposed; By supporting the User Defined classifying rules, can automatically device be classified according to the result that test obtains.
Programmable integrated circuit automatic testing of the present invention and taxis system are made up of upper and lower computer, and wherein host computer is used to carry out the start and stop of test, operation interface, supervisory system working condition and demonstration, analysis, the preservation device detection return parameters of editing test template is provided for the user; Slave computer comprises tester, carry some channel plates on the tester, the output pin of every channel plate is connected to by mechanical arm on the pin of to-be-measured integrated circuit, and this mechanical arm is used for grasping and fixing to-be-measured integrated circuit and device is dropped into the box of appointment according to sorting out the result; Host computer will download to tester according to the test template that agreement edits by communication port, and this tester goes out the atomic operation sequence according to protocol analysis after receiving test template and the condition of classification sequence is tested to instruct; Described atomic operation is the minimum operation set that uses in the test process, the data structure of every kind of atomic operation has identical three territories, be respectively atomic operation type codes territory, channel plate index territory and a classification condition number field, wherein atomic operation type codes territory is used for the action type of indicating self, channel plate index territory is used for identifying needs carry out this atomic operation for which piece channel plate, and a classification condition number field is used for identifying the number of the entrained classification condition of this atomic operation; Each classification condition comprises lower limit data field, higher limit data field and box mask data territory, wherein the box mask is used to specify a box mask value, when when the parameter that measures is between lower limit data field and higher limit data field, think that then this atomic operation satisfies this classification condition, gives this atomic operation with this box mask value; When carrying out a plurality of atomic operation at an integrated circuit, to obtain a plurality of parameters, according to the match condition of each parameter in corresponding classification condition, each atomic operation all can obtain a box mask value, with the whole step-by-steps of these box mask values ask with, and then be met all box of sorting out condition numberings, and this to-be-measured integrated circuit is put into corresponding box.
Wherein, atomic operation comprises that the magnetic-field measurement operation is opened in (1) constant voltage output function, (2) constant current output function, (3) stationary magnetic field output function, (4) delay operation, (5) current measurement operation, (6) voltage measurement operation, the operation of (7) period measurement, (8) and (9) close the magnetic-field measurement operation.
Further, be numbered (5)～(9) these 5 kinds of atomic operations can produce parameter, the user can dispose several classification conditions respectively for this class atomic operation, and wherein each atomic operation classification condition number of carrying is by the number field decision of the classification condition in the corresponding data structure.
Wherein, provide stable magnetic field by Helmholtz coils for test, proofread and correct by the magnetic field correction table in this magnetic field.
In addition, channel plate comprises amplifying circuit, feedback model selector switch and metering circuit.
Further, selector switch adopts ending of triode and state of saturation to finish the function of electronic switch.
Preferably, described integrated circuit is a hall device.
Adopt the programmable integrated circuit automatic testing of said structure and test and the classification that taxis system can be applicable to various integrated circuit by flexible programming, when reducing testing cost, greatly improved testing efficiency.
Description of drawings
Fig. 1 is the system chart of programmable integrated circuit automatic testing of the present invention and taxis system;
Fig. 2 is the structural drawing of the test template of programmable integrated circuit automatic testing of the present invention and taxis system;
Fig. 3 is the test flow chart of programmable integrated circuit automatic testing of the present invention and taxis system;
Fig. 4 is the design concept block diagram of the channel plate of programmable integrated circuit automatic testing of the present invention and taxis system;
Fig. 5 is the circuit theory diagrams of the channel plate of programmable integrated circuit automatic testing of the present invention and taxis system;
Fig. 6 is the Helmholtz coils driving circuit theory diagram of programmable integrated circuit automatic testing of the present invention and taxis system;
Fig. 7 is the Helmholtz coils driving circuit schematic diagram of programmable integrated circuit automatic testing of the present invention and taxis system;
Fig. 8 is the electronic switch schematic diagram of programmable integrated circuit automatic testing of the present invention and taxis system.
Embodiment
For ease of explanation, will specify automatic test of programmable hall device of the present invention and taxis system at this integrated circuit of hall device.Should be understood that, the invention is not restricted to this integrated circuit of hall device, but go for other integrated circuit.
The composition of automatic test of programmable hall device and taxis system as shown in Figure 1, host computer 401 comprises a PC, and its major function is editor, the monitoring of system health and the display analysis and the preservation of device detection return parameters of being responsible for the start and stop of test, providing operation interface to be used for test template to the user.402 of slave computers are the hardware systems that designs voluntarily, comprise tester, and it is linked to each other by serial ports 403,404 with the communication of host computer, and Data Transport Protocol is drafted voluntarily.Carry three channel plates 407,408,409 on the tester, their output pin is connected to by mechanical arm on the pin of hall device to be measured, and mechanical arm is responsible for grasping and fixing hall device to be measured and according to sorting out the result device is dropped in the box of appointment.Providing the equipment of stabilizing magnetic field to test is a Helmholtz coils 406, some is to design for the Helmholtz coils power supply specially in the circuit of slave computer, we are referred to as Helmholtz coils driving circuit 405, it is actual to be a controlled constant current source, and the size of output current is controlled by a digital to analog converter.
Define a generic operation, they are the minimum operation set that use in the hall device test process, for example constant current output, constant voltage output, time-delay or the like, the measurement of any one hall device parameter all can be finished by several operations combination in certain sequence in this minimum operation set, claims that this generic operation is an atomic operation.For data structure of each atomic operation definition is used for describing this operation and parameter thereof, thereby can represent each atomic operation easily, the data structure length of each atomic operation is fixed.The realization of this generic operation is finished by a cover hardware circuit, and we are called channel plate this cover circuit.Define 9 kinds of atomic operations altogether, be respectively:
1) constant voltage output function
2) constant current output function
3) stationary magnetic field output function
4) delay operation
5) current measurement operation
6) voltage measurement operation
7) period measurement operation
8) open the magnetic-field measurement operation
9) close the magnetic-field measurement operation
The data structure of these 9 kinds of atomic operations has identical three territories, they are respectively atomic operation type codes territory, channel plate index territory, a classification condition number field, wherein atomic operation type codes territory is used for the action type of indicating self, when She Ji purpose was a pointer when the atomic operation structure that obtains a unknown like this, the byte that only needs to resolve this pointed just can be known the type of this atomic operation.Channel plate index territory is used for identifying needs carry out this atomic operation for which piece channel plate, and tester will start corresponding channel plate circuit and carry out this atomic operation after having resolved this territory.A classification condition number field is used for identifying the number of the entrained classification condition of this atomic operation, and such design makes tester be parsed the ownership that each sorts out condition.
The criterion that device is sorted out is exactly to work out at the parameters of device to sort out grade, when process measures a parameter, thereby finds a grade that satisfies condition to finish classification in sorting out grade.Each is sorted out grade and can be regarded as a classification condition, comprising lower limit data field, higher limit data field and box mask data territory.The width of higher limit data field and lower limit data field all is designed to 4 bytes, wherein deposits single precision floating datum; Box mask data field width degree is designed to 4 bytes, wherein deposits no symbol double word.Its structure is as shown in table 1.Wherein lower limit and higher limit are used to specify two boundary values, when when the parameter that measures is in this interval, think that then this measured device satisfies this classification condition.The box mask is used to specify a 32Bits number, when satisfying above-mentioned boundary value, device will be put into the box of this mask value appointment, for example play first when being 1 when the right side of box mask, then explanation can be put into box No. 1, being 0 and can not putting into box No. 1, is more than one of 1 o'clock box of satisfying condition of explanation as multidigit.
Table 1 is sorted out the condition data structure
| Lower limit | The upper limit | The box mask | |
| Length | 4B | 4B | 4B |
| Content | The lower limit that satisfies condition is deposited with the form of single smart floating number | The higher limit that satisfies condition is deposited with the form of single smart floating number | When satisfying upper and lower bound, the mask of the box correspondence of putting into, certain position is that corresponding box is put in 1 explanation, otherwise does not put into.For instance, playing first when the right side of this 32bit number is that 1 explanation can be put into box No. 1, by that analogy. |
Being numbered 5～9 these 5 kinds of atomic operations is to produce parameter, the user can dispose several classification conditions respectively for this class atomic operation, and wherein each atomic operation classification condition number of carrying is by this data field decision of the classification condition number in the enantiomorph.A plurality of parameters that when carrying out a plurality of atomic operation, will obtain at a device, search on the coupling in corresponding classification condition at each parameter, thereby each atomic operation that produces parameter all can obtain a box mask data, with these whole step-by-steps in box mask data territory ask with, can be met all box of sorting out condition numberings, get final product in the test macro box that the driving device arm is corresponding with the device input again this moment.For after the last suitable classification condition of each atomic operation configuration, test macro will be realized the automatic clustering to device to the user according to demand.
As if being combined, some kinds of atomic operations just can measure the parameter that needs at certain class Devices Characteristics, mix several classification conditions for each atomic operation simultaneously and just can realize automatic clustering device, so a kind of structure of definition, one group of atomic operation sequence and one group of classification condition sequence have wherein been comprised, wherein the data of each atomic operation structure are compact arranged in turn by byte, each sorts out the construction of condition volume data also is by individual compact arranged according to byte, logical relation in this structure between the data as shown in Figure 2, we claim that this structure is a test template.Tester is when batch testing one class hall device, need to tester a test template that pre-edit is good be set by operating personnel, then tester can be measured each device successively according to atomic operation of describing in this template and classification condition thereof, thereby the user need not to participate and realizes full automatic test and classification.
The data organization of test template is carried out according to certain protocol, the PC end needs after having received user's input information according to agreement organizations test template data, tester also goes out related data according to protocol analysis and instructs test after receiving test template, the data layout of its agreement is as shown in table 2.
Table 2 test template protocol data form
| Numbering | Width | Describe |
| 1 | 3Bytes | The passage binding |
| 2 | 1Byte | Whether the sign device periodic duty |
| 3 | 2Bytes | Class condition piece sequence length |
| 4 | 2Bytes | Atomic operation piece sequence length |
| 5 | 20 Bytes | Device name |
| 6 | 80 Bytes | Box capacity (20 each box 4Bytes of box) |
| 7 | nBytes | Class condition piece sequence (length is by field 3 decisions) |
| 8 | nBytes | The fast sequence of atomic operation (length is by field 4 decisions) |
Tester need be resolved it after receiving test template, thereby obtains atomic operation sequence and the condition of classification sequence.The test template data of receiving from serial ports can leave in the known ram space of one section first address of tester, according to agreement as can be known, data in the test template data block are arranged by byte order, the first address of sorting out IF block also is available, this address is left in the classification IF block pointer, sort out the IF block sequence length according to the value of field in the protocol data 3 simultaneously, can obtain the start address of the fast sequence of atomic operation with moving this length byte behind this pointer, this address is left in the atomic operation block pointer.Because first byte in all atomic operation block data structure always indicates the atomic operation type of self, so the time atomic operation block pointer byte pointed to indicate the type codes of first atomic operation in the atomic operation sequence just, again because the data structure length of every kind of atomic operation is a fixed value, so just can know the length of this atomic operation data structure according to current atomic operation type codes, thereby the atomic operation block pointer is moved first atomic operation that can parse in the atomic operation sequence in proper order, and because the atomic operation in the atomic operation sequence is by closely discharging of byte, so the atomic operation block pointer has pointed to second atomic operation just after parsing first atomic operation.Method according to such can parse atomic operations all in the atomic operation sequence in turn.Whole resolving is arranged in the circulation carries out, and the round-robin exit condition is the atomic operation piece sequence length that reaches protocol fields 4 appointments when the total length that the atomic operation block pointer moves.
The parsing of sorting out IF block also is arranged in the circulation that the atomic operation piece resolves to be carried out.Whenever parsing an atomic operation, according to the value of a self-contained classification condition digital section wherein, this atomic operation has carried several classification conditions altogether as can be known, again because each length of sorting out the IF block data structure is a fixed value, so only need the mobile IF block pointer of sorting out of order just can parse all classification conditions that atomic operation is entrained, when atomic operation piece parse cycle withdrawed from, all just classification IF blocks were also all resolved and are finished.
Whole testing process is arranged in the circulation, and its idiographic flow as shown in the figure.Need to tester nominative testing template and magnetic field correction table before the beginning, then enter a test loop and test each measured device hall device.After PC end sends the beginning test command, test will enter in this test loop, know that the PC end sends to stop test command, and tester just withdraws from this testing process.
Whole testing process is from step 101, at first in the process shown in the step 102, resolve the selected test template of PC, this operation will obtain one group of atomic operation sequence, it is some that wherein each atomic operation can carry corresponding classification condition, and they can be stored in, and the testing process for the back uses in the chained list.Grasp device and fixedly be to be finished by mechanical arm, so the step that the wait device puts in place is exactly the signal of monitoring on the mechanical arm, in case detect this signal then prove that device puts in place, this process is finished in step 103.Then jump in the step 104 and indexed variable dwBoxMask to be changed to " 1 " entirely, then jump in the step 105 and take out and to carry out next pending atomic operation from the atomic operation sequence, this moment is pending should be first atomic operation in the atomic operation sequence.After finishing this atomic operation, jump to and judge in the step 106 whether current atomic operation not only produces parameter but also carried the classification condition, if meet then jump in the step 107 all classification conditions that this atomic operation of traversal carries to seek the classification condition of coupling, after finding the logical and operation is asked in wherein box mask and indexed variable dwBoxMask step-by-step, and the result is kept among the indexed variable dwBoxMask; If do not meet, then jump to and judge in the step 108 whether the atomic operation sequence finishes, and promptly whether all atomic operations in the atomic operation sequence all are performed, do not continue to carry out next atomic operation in the step 105 if meet then jump to; If meet then jump in the step 109, this is put into which box and driving device arm and finishes and throw in action to judge device according to the position that among the dwBoxMask is 1.Then jump in the step 110 and to judge on serial ports, whether the having received order of withdrawing from test, if do not meet then jump to and continue in the step 103 to wait for that thereby next measured device puts in place enters the testing process of next device; If meet then jump out whole testing process and finish test job.
The hall device parameter measurement need be tested following parameter: the leakage current of power, cut-off state, the saturation voltage drop of state of saturation, open magnetic field, close magnetic field and time domain response.Finish above parameter measurement channel plate and need satisfy following function: (1) channel plate can be operated in the constant voltage output state, the backward channel current value; The hall device working power is provided, for leakage current with close magnetic-field measurement test condition is provided, and returns test result.(2) channel plate can be operated in the constant current output state, the backward channel output voltage; For saturation voltage drop, unlatching magnetic-field measurement provide test condition, and return test result.(3) has good frequency response characteristic, the part hall device is operated in the higher circuit of frequency, the switching frequency of duty between saturated and cut-off state is very fast, requires test circuit to have higher frequency response characteristic at the high frequency characteristics of hall device.
Traditional testing tool generally is to carry out duty with relay as gauge tap to switch, and the mechanical contact reaction is slow and mechanical shaking is comparatively severe.The switching characteristic that channel plate is used triode has solved the slow and unsettled shortcoming of test parameter of testing apparatus speed in the past well.
The schematic diagram of the nonlinear characteristic formation branch electronic switch of application triode as shown in Figure 8.Test circuit is used the function of finishing electronic switch with state of saturation of ending of triode.When control end is high level, triode Q
1Be in state of saturation, current collection is low level very, triode Q
2Enter state of saturation, Q
2Collector and emitter be equivalent to closed switch ends.When control end is low level, triode Q
1Be in cut-off state, triode Q
2Be in cut-off state equally, triode Q
2Emitter and collector between be equivalent to electronic switch and disconnect.
Channel plate mainly is divided into four functional modules, theory diagram as shown in Figure 4, circuit diagram is as shown in Figure 5.
First's function realizes module: select control circuit 205, measuring resistance 206 to form by forward scale operation circuit 202, feedback system control circuit 203, output channel.Forward scale operation circuit 202 and feedback system control circuit 203 are finished voltage amplification function or electric current enlarging function jointly.Circuit working is amplified to the measurement voltage signal of 0-30V to the input analog voltage signal of 0-2.5V in the voltage amplification pattern, can satisfy the hall device test condition for test cell provides working power or constant voltage output under this mode of operation.If circuit working is when the electric current amplification mode, amplifying circuit is put into the current signal of 0-1A to the input analog voltage signal of 0-2.5V, satisfies the test condition of hall device.Output circuit selects control circuit to finish automatically measuring resistance selection work, in order to improve measuring accuracy, circuit design five drive test amount passages, be respectively applied for the measurement of different measuring parameter.
The second portion metering circuit, metering circuit is made up of differential amplifier circuit 210, low-pass filter circuit 210 and AD translation circuit 212.Metering circuit is finished the voltage and current of output pin and is measured.The output voltage that output voltage equals forward scale operation circuit deducts the voltage difference of differential amplifier circuit input port, output current equals differential amplifier circuit input voltage difference and arranges divided by measuring resistance, ignore output channel and select the resistance value of control circuit, because measuring resistance row's resistance is far longer than the resistance value that output verdigris is selected control circuit.Differential amplifier circuit is amplified to faint test signal within the AD measurement range, and in order to improve the precision of AD sampling, the circuit application low-pass filter circuit reduces voltage dithering.
Third part voltage follower circuit 204,208,209, in order to reduce the influence of feedback circuit and test circuit to functional circuit, the all sampled point of channel plate design process is the applied voltage follow circuit all, and is very little to the influence of functional circuit, improved measuring accuracy.
The 4th part control circuit, feedback model control circuit 203 and path switch operating are finished by electronic switch on the channel plate, circuit application triode cooperating the characteristic that latchs of trigger to finish the switching of circuit between the different operating state by the switching characteristic of state and state of saturation.
All electric performance tests of hall device all will carry out in certain magnetic field environment, so a programmable magnetic field output environment need be provided.We use Helmholtz coils as the magnetic field output unit, Helmholtz coils has good magnetic field intensity and the linear relationship between the electric current, the electric current that flows through coil by control is the controlling magnetic field output intensity accurately, and being embodied in the circuit is exactly a constant current source able to programme.The theory diagram of field drives circuit as shown in Figure 6, circuit theory diagrams are as shown in Figure 7.The field drives circuit needs DA input end 301 and datum 302, and constitute high-power amplifying circuit by differential amplifier circuit 303 and current driving circuit 304 and promote Helmholtz coils 306, need a voltage follower circuit 305 as feedback simultaneously, the current value that flows through precision resistance 307 by control is controlled the electric current that flows through Helmholtz coils, thereby reaches the test magnetic field intensity of control hall device.
In channel plate schematic diagram shown in Figure 5, constitute forward scale operation amplifying circuit, magnification ratio K=1+R by amplifier
1/ R
3, the positive input of amplifier links to each other with DA.Integrated circuit testing all needs the operating voltage that provides stable, works as S
2Output voltage is when closed:
V
OUT2＝[V
IN1+R
1/R
3] (1)
According to formula (1) be at the input voltage that the constant voltage output state obtains DA:
V
IN＝V
OUT2/1+R
1/R
3 (2)
The output voltage that can control DA according to formula (2) accurately obtains the output voltage values that we want.
When hall device carries out the saturation voltage drop measurement, need provide a constant electric current output as test condition at output terminal.Switch S in Fig. 5
1When closed, switch S
1The right-hand member output voltage V
OUT1=[V
IN1+R
1/ R
3].Obtaining output current at the constant current output state is:
I
OUT＝V
OUT1-V
OUT2/R
TEST＝[V
IN1+R
1/R
3-V
OUT2]/R
TEST (3)
V in the formula (3)
OUT2Be the saturation voltage drop of hall device, hall device when normal operating conditions saturation voltage drop less than 0.1 volt, and test resistance R
TESTResistance generally all bigger, so the test condition of measuring and calculating during saturation voltage drop can be ignored the influence of saturation voltage drop to output current, promptly
I
OUT＝V
OUT1/R
TEST＝[V
IN1+R
1/R
3]/R
TEST (4)
Can draw the DA output voltage according to formula (4)
V
IN＝I
OUT*R
TEE\ST/1+R
1/R
3 (5)
The performance of integrated circuits test can be divided into voltage measurement, current measurement and sequential logic and measure.The test condition of hall device current characteristics is that output voltage is a rated voltage, and being embodied on the circuit is exactly test output current under the constant voltage output state.Constitute forward scale operation amplifying circuit by amplifier among Fig. 5, as electronic switch S
2When closed, output mode constant voltage output state according to formula (1) output voltage is:
V
OUT2＝[V
IN1+R
1/R
3] (6)
Feedback circuit and metering circuit all should be used voltage follower, and metering circuit is almost very little to the influence of amplifying circuit, has reduced the influence to output current, so load current I
LOADEqual to flow through test resistance R
TESTOn electric current I
RTEST, promptly
I
LOAD＝I
RTEST＝V
RTEST/R
TEST (7)
Metering circuit is made of voltage follower circuit and differential amplifier circuit, at last reads magnitude of voltage after the amplification by AD.The enlargement factor K of differential amplifier circuit.If the output voltage of differential amplifier circuit is V
AD, the forward input voltage of differential amplifier circuit is V
1, oppositely input voltage is V
2, the amplifier output voltage is V
OUT1, load voltage is V
OUT2
V
AD＝K*V
OUT1-V
OUT2 (8)
V
OUT1-V
OUT2＝I
RTEST*R
TEST (9)
I
LOAD＝I
RTEST＝V
AD/K/R
TEST (10)
The test condition of hall device voltage characteristic is that output current is a ratings, and being embodied on the circuit is exactly test output voltage under the constant current output state, as electronic switch S
1When closed, be output as the crossing current output mode, be according to formula (4) output current:
I
OUT＝V
OUT1/R
TEST＝[V
IN1+R
1/R
3]/R
TEST (11)
Output voltage is V
OUT2, the amplifier output voltage V
OUT1With test resistance voltage V
RTESTBetween the pass be:
V
OUT2＝V
OUT1-V
RTEST (12)
Metering circuit is made of voltage follower circuit and differential amplifier circuit, at last reads magnitude of voltage after the amplification by AD.The enlargement factor K of differential amplifier circuit.If the output voltage of differential amplifier circuit is V
AD, the forward input voltage of differential amplifier circuit is V
1, oppositely input voltage is V
2, the amplifier output voltage is V
OUT1, load voltage is V
OUT2
V
AD＝K*V
RTEST (13)
V
OUT2＝V
OUT1-V
RTEST＝[V
IN1+R
1/R
3]-V
AD/K (14)
All electric performance tests of hall device all will carry out in certain magnetic field environment, so a programmable magnetic field output environment need be provided.Helmholtz coils has good magnetic field intensity and the linear relationship between the electric current, and the electric current that flows through coil by control can very accurate controlling magnetic field output intensity, and being embodied in the circuit is exactly a constant current source able to programme.Its principle as shown in Figure 7.
In Fig. 7, amplifier constitutes differential amplifier circuit, and triode Q1 and Q2 constitute current driving circuit, and voltage follower is finished Voltage Feedback, reduces the influence of feedback circuit to functional circuit.R in the circuit
1Be precision resistance, flow through R
1Electric current equal to flow through the electric current of Helmholtz coils, by changing R
1Voltage just can reach control and flow through the electric current of Helmholtz coils.I
L1For flowing through the electric current of coil, I
R1For flowing through resistance R
1Electric current.
I
L1＝I
R1 (15)
I
L1For flowing through the electric current of coil, I
R1For flowing through resistance R
1Electric current.Can regard as in the frame of broken lines among Fig. 7 is an amplifier, and Helmholtz coils is as the part of amplifier inside, and integrated circuit constitutes difference ratio operational amplification circuit, and output voltage is:
V
OUT1＝R
F/R*V
IN-V
REF (16)
Flow through resistance R
1Electric current is:
I
R1＝V
OUT1/R
1＝R
7/R
9*V
IN-V
REF/R
1 (17)
The output magnetic field intensity is:
M＝K
C*I
R1 (18)
K
CBe the characterisitic parameter of Helmholtz coils, can draw the DA input voltage according to formula (17):
V
IN＝(I
R1*R
1)/R
7/R
9+V
REF (19)
Can know by above-mentioned relation, when the value of a stationary magnetic field of needs output, can calculate corresponding output current size by formula (18), and then can obtain corresponding DA input voltage value by formula (19).K wherein
CBy Helmholtz coils self decision, so this value downloads in the tester after need being measured by the user.These mapping relations are because by the Helmholtz coils decision, the linear error of exporting for magnetic field for correcting again designs simultaneously, so be referred to as the magnetic field correction table.
Can see that from formula (19) DA is by the characteristic decision of circuit to the mapping relations of electric current, can be subjected to the influence of many factors, the zero point drift of circuit all can be different when powering at every turn.So design one cover auto-calibration circuits, automatically calibration obtains at that time one group of DA to the mapping relations of electric current when tester powers on, and test afterwards all uses these mapping relations to finish the mapping calculating of DA to electric current.
To sum up, the present invention encyclopaedizes by the above embodiments.Be described as embodiment although the present invention is the test with hall device, yet test and taxis system are equally applicable to the test of other integrated circuit (IC)-components automatically.For this reason, can be according to the quantity of the pin number of to-be-measured integrated circuit device increase and decrease channel plate, and formulate corresponding test template for corresponding devices.
Claims (7)
1. programmable integrated circuit automatic testing and taxis system, this system is made up of upper and lower computer, and wherein host computer is used to carry out the start and stop of test, operation interface, supervisory system working condition and demonstration, analysis, the preservation to-be-measured integrated circuit test return parameters of editing test template is provided for the user; Slave computer comprises tester, carry some channel plates on the tester, the output pin of every channel plate is connected to by mechanical arm on the pin of to-be-measured integrated circuit, and this mechanical arm is used for grasping and fixing to-be-measured integrated circuit and to-be-measured integrated circuit is dropped into the box of appointment according to sorting out the result; Host computer will download to tester according to the test template that agreement edits by communication port, and this tester goes out the atomic operation sequence according to protocol analysis after receiving test template and the condition of classification sequence is tested to instruct; Described atomic operation is the minimum operation set that uses in the test process, the data structure of every kind of atomic operation comprises identical three territories at least, be respectively atomic operation type codes territory, channel plate index territory and a classification condition number field, wherein atomic operation type codes territory is used for the action type of indicating self, channel plate index territory is used for identifying needs carry out this atomic operation for which piece channel plate, and a classification condition number field is used for identifying the number of the entrained classification condition of this atomic operation; Each classification condition comprises lower limit data field, higher limit data field and box mask data territory, wherein the box mask is used to specify a box mask value, when when the parameter that measures is between lower limit data field and higher limit data field, think that then this atomic operation satisfies this classification condition, gives this atomic operation with this box mask value; When carrying out a plurality of atomic operation at an integrated circuit, to obtain a plurality of parameters, according to the match condition of each parameter in corresponding classification condition, each atomic operation all can obtain a box mask value, with the whole step-by-steps of these box mask values ask with, and then be met all box of sorting out condition numberings, and this to-be-measured integrated circuit is put into corresponding box.
2. programmable integrated circuit automatic testing according to claim 1 and taxis system is characterized in that: described atomic operation comprises that the magnetic-field measurement operation is opened in (1) constant voltage output function, (2) constant current output function, (3) stationary magnetic field output function, (4) delay operation, (5) current measurement operation, (6) voltage measurement operation, the operation of (7) period measurement, (8) and (9) close the magnetic-field measurement operation.
3. programmable integrated circuit automatic testing according to claim 2 and taxis system, it is characterized in that: 5 kinds of atomic operations of this of described being numbered (5)～(9) can produce parameter, the user can dispose several classification conditions respectively for this class atomic operation, and wherein each atomic operation classification condition number of carrying is by the number field decision of the classification condition in the corresponding data structure.
4. according to claim 2 or 3 described programmable integrated circuit automatic testing and taxis systems, it is characterized in that: provide stable magnetic field by Helmholtz coils for test, proofread and correct by the magnetic field correction table in this magnetic field.
5. according to each described programmable integrated circuit automatic testing and taxis system in the claim 1 to 3, it is characterized in that: described channel plate comprises amplifying circuit, feedback model selector switch and metering circuit.
6. according to each described programmable integrated circuit automatic testing and taxis system in the claim 1 to 3, it is characterized in that: described selector switch adopts ending of triode and state of saturation to finish the function of electronic switch.
7. according to each described programmable integrated circuit automatic testing and taxis system in the claim 1 to 3, it is characterized in that: described integrated circuit is a hall device.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009102240827A CN101706540B (en) | 2009-12-04 | 2009-12-04 | Programmable integrated circuit automatic testing and sorting system |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009102240827A CN101706540B (en) | 2009-12-04 | 2009-12-04 | Programmable integrated circuit automatic testing and sorting system |
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| CN101706540A CN101706540A (en) | 2010-05-12 |
| CN101706540B true CN101706540B (en) | 2011-11-16 |
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Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
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| WO2012040989A1 (en) * | 2010-09-29 | 2012-04-05 | 清华大学 | Simulation test system for integrated circuit manufacturing device |
| CN102896097A (en) * | 2012-10-17 | 2013-01-30 | 天津力神电池股份有限公司 | Battery grouping and pairing sorting method and system |
| CN106238352B (en) * | 2016-08-30 | 2018-12-11 | 扬州江新电子有限公司 | A kind of bi-directional symmetrical type integrated device sorting machine control circuit and method for separating |
| CN111610968B (en) * | 2020-05-25 | 2023-05-05 | 成都银汉易科技有限公司 | Development method and device for multi-domain MicroPython program |
| CN112462243B (en) * | 2021-02-01 | 2021-04-27 | 南京宏泰半导体科技有限公司 | Automatic programming method of open-short circuit test system |
| CN113866513A (en) * | 2021-09-26 | 2021-12-31 | 北京计算机技术及应用研究所 | Multipurpose switching value detection device |
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