CN101694455A - Horizontal sample frame of Fourier infrared spectrograph - Google Patents
Horizontal sample frame of Fourier infrared spectrograph Download PDFInfo
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- CN101694455A CN101694455A CN200910272335A CN200910272335A CN101694455A CN 101694455 A CN101694455 A CN 101694455A CN 200910272335 A CN200910272335 A CN 200910272335A CN 200910272335 A CN200910272335 A CN 200910272335A CN 101694455 A CN101694455 A CN 101694455A
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- infrared spectrograph
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Abstract
The invention relates to a horizontal sample frame of Fourier infrared spectrograph, wherein a sample bin is an optical path system which steers horizontal light beams in a Nicolet-6700 Fourier infrared spectrograph original sample bin into vertical light beams, and samples which need testing can be horizontally placed after adding into the sample bin of the invention. The optical path system comprises a concave lens and four plane reflectors which are fixed on a metal folded plate (1) in 45 degrees through a supporting stand, the optical system conducts four times of optical path steering, horizontal-leftward focusing infrared light beams emitted by a Fourier infrared spectrograph outgoing mirror are firstly steered through one plane reflector, and are secondarily steered and collected through the concave reflector after primary steering, and are further thirdly and fourthly steered through two plane reflectors, and finally, all light beams enter the receiving mirror of the spectrograph. The total reflectance of the horizontal sample frame is above 90%, and the layout of each lens is reasonable, and the installation is convenient.
Description
Technical field
The present invention relates to specimen holder, particularly a kind of Nicolet 6700 horizontal sample frame of Fourier infrared spectrograph.
Background technology
Nicolet 6700 Fourier infrared spectrographs (FT-IT) are the useful tools of laboratory study and conventional applied analysis, be scientific research, produce indispensable analytical and testing instrument, it combines current up-to-date optics, electronics, material science and artificial intelligence technology, have easy and simple to handle, performance brilliance, powerful, characteristics such as sample preparation is easy, intelligence operation, maintenance cost are low can be widely used in every field such as pharmacy, oil, chemical industry, environmental protection, food, material science, public security, national defence.During the work of this spectrometer, material sample is placed on the specimen holder in the sample bin, and that launches from sample bin the right one focuses on mid-infrared light bundle penetrable material, enters the infrared light receiver window on the left side again, receives the character that analysis of material is come by the spectral absorption situation in the back.Because light path is a horizontal direction in the spectrometer primary sample storehouse, require specimen vertically to place, the vertical stock support that spectrometer carries can satisfy the test of general solid-state material, but after analytical test fluent material or solid material melted by heating, can be when specimen material is vertically placed owing to action of gravity flows downward, cause the material thickness inequality, at this moment spectrometer can't carry out quantitative test under the alternating temperature to this material.
Summary of the invention
Technical matters to be solved by this invention is: a kind of horizontal sample frame of Fourier infrared spectrograph is provided, this specimen holder can turn to into normal beam with the focused beam of level trend in the Nicolet 6700 Fourier infrared spectrograph primary sample storehouses, the specimen of focused beam through-fall placing flat, thus can overcome conventional specimen holder can not fluid materials or the solid material melted by heating after carry out quantitative test shortcoming.
The present invention solves the technical scheme that its technical matters adopts: the present invention adopts one Nicolet 6700 Fourier infrared spectrograph primary sample storehouse horizontal light beams are turned to optical system into normal beam, this optical system is provided with 1 concave mirror and 3 plane mirrors, and they are fixed on the metal flap by support; This optical system is carried out four light paths and turned to: the level that Fourier infrared spectrograph outgoing mirror sends focusing infrared beam left turns to by 1 plane mirror of 45 ° of placements earlier, after turning to for the first time again the concave mirror by 45 ° of placements turn to for the second time and assemble, plane mirror mirror by 2 45 ° of placements carries out turning to the 4th time for the third time successively again, the direction that turns to for four times is vertically downward successively, level left, vertically upward, level enters the reception mirror of spectrometer left at last.
The present invention compared with prior art has following major advantage:
The present invention takes the array mode of 3 silver-plated plane mirrors and 1 silver-plated concave mirror, and overall light transmittance has reduced after adding eyeglass because the error that optical energy loss causes to a great extent more than 90%; The equal 45 ° of placements of eyeglass are convenient to install; Location layout between the eyeglass is reasonable, has only occupied in the available 85mm vertical space below original light path and has been no more than the 40mm space, and the middle space of reserving 45mm is used to place the horizontal sample frame of material; For some material that need heat test, there are enough spaces on specimen holder, to place well heater; Horizontal sample frame is movable, adapts to the sample of different-thickness; The device of mirror support fixing len is mobilizable, can adapt to the eyeglass of different-diameter.
Description of drawings
Fig. 1 is a structural representation of the present invention.
Fig. 2 is the front view of Fig. 1.
Fig. 3 is the vertical view of Fig. 1.
Fig. 4 is the synoptic diagram of mirror support 5 among Fig. 1.
Fig. 5 is a Zemax index path of the present invention.
Fig. 6 is the FT-IR figure that adopts the polystyrene standards (1mil) of testing behind the horizontal sample frame of the present invention.
The FT-IR figure of the polystyrene standards (1mil) of testing behind the vertical specimen holder that Fig. 7 is to use instrument to carry.
Among the figure: 1. big flap; 2. spectrometer light beam; 3. concave mirror; 4. plane mirror; 5. mirror support; 6. screw; 7. adjustable screw; 8. mounting hole; 9. mirror support chute; 10. specimen material support; 11. specimen material bracket chute; 12. bolt; 13. convex lens; 14. convex lens.
Embodiment
The invention will be further described below in conjunction with embodiment and accompanying drawing, but do not limit the present invention.
Horizontal sample frame of Fourier infrared spectrograph provided by the invention, this specimen holder is applicable to the Nicolet of U.S. Thermo company 6700 Fourier infrared spectrographs, specimen holder is one horizontal light beam in the primary sample storehouse is turned to optical system into normal beam that this optical system fixedly forms (seeing Fig. 1 to Fig. 4) by 1 concave mirror, 3 plane mirrors by the support on the metal flap.This optical system turns to into capwise with the infrared beam of former horizontal focusing, and light beam is assembled in vertical direction, and material can lie in a horizontal plane in the focus place.
Described metal flap is big flap 1, and its support of installing above has specimen material support 10, mirror support 5 and concave reflection mirror support.Described big flap is made up of vertical plate and leveling board, and vertical plate becomes 90 ° vertically with leveling board; The size of leveling board is generally length * wide=180mm * 85mm.The size of vertical plate is generally length * height=180mm * 105mm.Big flap is used to install the bulk sample support, and proposed materials is metals such as steel or aluminium.On the riser of big flap 1, connect 2 specimen material supports 10 and 4 mirror supports 5 by screw.
Described specimen material support 10 is used for the material of horizontal positioned test, middle perforate printing opacity.Specimen material support 10 links to each other by 2 specimen material bracket chute, 11 slips on the vertical plate of its bottom mounting hole 12 usefulness screws and big flap 1.
Described mirror support 5 has four, is folding shape support, and its folding shape base plate is equipped with mounting hole 8.2 sample mirror support chutes 9 on the mounting hole 8 usefulness screws of the folding shape base plate of each mirror support and big flap 1 vertical plate slide and link to each other.Described four mirror supports 5, on the folding shape riser of one of them concave mirror 3 that is attached thereto is housed, on the folding shape riser of other three mirror supports 1 plane mirror that is attached thereto 4 is housed respectively, all mirror supports fix eyeglass by the screw 6 at its middle part and the adjustable screw 7 at top.
Above-mentioned concave mirror 3 can and turn to beam convergence, and plane mirror 4 can be with beam steering.
The glasses lens plated material of above-mentioned concave mirror 3 and plane mirror 4 is selected: owing to what be suitable for is middle infrared spectrum, and wave number is at 4000-400cm
-1Between, so all eyeglasses all adopt silver-plated reflectance coating, each eyeglass to the reflectivity of mid-infrared light more than 98%.Through after four eyeglass reflections, total optical energy loss is no more than 10% like this, and error is within the acceptable scope.
ZEMAX light path provided by the invention is as shown in Figure 5: comprise six eyeglasses, wherein: convex lens 13 and convex lens 14 are 2 convex lens that Fourier infrared spectrograph carries, and numbering 3 is concave mirrors, and other eyeglass is a plane mirror 4.
The parameter of the eyeglass of concave mirror 3 and 3 plane mirrors and the suggestion designed distance between the eyeglass are: plane reflection eyeglass diameter is 30mm, and thickness is 4mm; Concave reflection eyeglass diameter is 30mm, and thickness is 2mm.The distance of plane mirror 4-1 and convex lens 13 is 70mm, the 45 ° of placements of tilting; Concave mirror 3 is 60mm with the distance of plane mirror 4-1, the 45 ° of placements of tilting; The distance of plane mirror 4-2 and concave mirror 3 is 60mm, the 45 ° of placements of tilting; The distance of plane mirror 4-3 and plane mirror 4-2 is 60mm, the 45 ° of placements of tilting; The distance of plane mirror 4-3 and convex lens 14 is 70mm.
The fixed form of light path system of the present invention as shown in Figure 1.Because sample bin is size-constrained, the overall dimension scope of big flap 1 for long * wide * high=(180mm～200mm) * (80mm～100mm) * (100mm～120mm), the suggestion design size is length * wide * height=180mm * 85mm * 105mm.
From Fig. 6 and Fig. 7 polystyrene COMPARISON OF CALCULATED RESULTS WITH EXPERIMENTAL DATA figure as can be seen, added after the specimen holder of the present invention, the shape of absorption curve is just the same, and the two is superposition fully, can be very accurately the sample of horizontal positioned be carried out test analysis.
Sketch principle of work of the present invention below in conjunction with Fig. 5.
Primary light route convex lens 13 send, and enter convex lens 14 after penetrating the material of placement.Specific as follows:
Light path trend behind the adding sample bin is as the spectrometer light beam 2 among Fig. 1, and the converging ray that sends from convex lens 13 turns to vertically downward through plane mirror 4-1, can disperse after focusing on; Vertically downward light beam is assembled again through concave mirror 3, becomes approximately parallel light beam, level turn left to; Horizontal light left turns to vertically upward through plane mirror 4-2; Vertically upward light through plane mirror 4-3 level turn left to; Last light all enters the convex lens 14 of spectrometer.The material horizontal that need test is placed on convergence of rays place between plane mirror 4-1 and the concave mirror 3.
Claims (10)
1. horizontal sample frame of Fourier infrared spectrograph, it is characterized in that this sample bin is that a primary sample storehouse horizontal light beam with Nicolet 6700 Fourier infrared spectrographs turns to the optical system into normal beam, this optical system is provided with 1 concave mirror (3) and 3 plane mirrors, and they are 45 ° of levels by support and are fixed on the metal flap (1); This optical system is carried out four light paths and turned to: the level that Fourier infrared spectrograph outgoing mirror (13) sends focusing infrared beam left turns to by 1 plane mirror earlier, turn to convergence for the second time by concave mirror again after turning to for the first time, undertaken turning to the 4th time for the third time by 2 plane mirror mirrors successively again, the direction that turns to for four times is vertically downward successively, level left, vertically upward, level left, final beam all enters the reception mirror (14) of spectrometer.
2. Fourier infrared spectrograph horizontal sample according to claim 1 storehouse is characterized in that described plane mirror is silver-plated circular reflector, and diameter is 30mm, and thickness is 4mm.
3. Fourier infrared spectrograph horizontal sample according to claim 1 storehouse, the material that it is characterized in that concave mirror (3) is silver-plated circular reflector, and diameter is 30mm, and thickness is 2mm, and focal length is-60mm.
4. Fourier infrared spectrograph horizontal sample according to claim 1 storehouse is characterized in that described metal flap is big flap (1), and vertical plate becomes 90 ° vertically with leveling board.
5. according to claim 1 or 4 described Fourier infrared spectrograph horizontal sample storehouses, it is characterized in that described support has mirror support (5) and specimen material support (10).
6. horizontal sample frame of Fourier infrared spectrograph according to claim 5 is characterized in that described specimen material support (10) is used for the material of horizontal positioned test, middle perforate printing opacity; The specimen material bracket chute (11) of this support by being slidingly connected with it is fixed on screw on the vertical plate of big flap (1).
7. horizontal sample frame of Fourier infrared spectrograph according to claim 5, it is characterized in that described mirror support (5) has 4, be folding shape support, wherein: their folding shape base plate is provided with mounting hole, and this folding shape base plate is connected by the vertical plate of this mounting hole with big flap (1) with screw; On their the folding shape riser eyeglass is installed, wherein 1 folding shape riser is installed concave mirror (3), and other 3 folding shape risers are installed 1 plane mirror respectively.
8. horizontal sample frame of Fourier infrared spectrograph according to claim 5, the fixed form that it is characterized in that described concave reflection mirror support is identical with mirror support (5), the top has two adjustable screws to fix eyeglass, and the bottom is connected by the vertical plate of screw (8) with big flap.
9. according to claim 1 or 4 described horizontal sample frame of Fourier infrared spectrograph, it is characterized in that described big flap (1), its leveling board is of a size of length * wide=180mm * 85mm; Its vertical plate is of a size of length * height=180mm * 105mm.
10. horizontal sample frame of Fourier infrared spectrograph according to claim 9 is characterized in that described big flap (1), and its material is steel or aluminum metal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009102723358A CN101694455B (en) | 2009-09-29 | 2009-09-29 | Horizontal sample frame of Fourier infrared spectrograph |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009102723358A CN101694455B (en) | 2009-09-29 | 2009-09-29 | Horizontal sample frame of Fourier infrared spectrograph |
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| Publication Number | Publication Date |
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| CN101694455A true CN101694455A (en) | 2010-04-14 |
| CN101694455B CN101694455B (en) | 2012-01-11 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN2009102723358A Expired - Fee Related CN101694455B (en) | 2009-09-29 | 2009-09-29 | Horizontal sample frame of Fourier infrared spectrograph |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104330356A (en) * | 2014-11-24 | 2015-02-04 | 中国航空工业集团公司洛阳电光设备研究所 | Detection device for testing transmittance of optical cowling film |
| CN105445247A (en) * | 2015-12-14 | 2016-03-30 | 天津港东科技发展股份有限公司 | High-sensitivity sample rack |
| CN106596403A (en) * | 2016-11-25 | 2017-04-26 | 中国科学院长春光学精密机械与物理研究所 | Clamping device for measuring reflectivity of curved mirror |
| CN113008790A (en) * | 2021-02-05 | 2021-06-22 | 天津港东科技股份有限公司 | Sample fixing frame for Fourier transform infrared spectrometer |
| CN116242799A (en) * | 2023-03-14 | 2023-06-09 | 合肥工业大学 | Base oil detection device and detection method based on deep learning infrared multidimensional fusion algorithm |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5714758A (en) * | 1996-10-10 | 1998-02-03 | Surface Optics Corp. | Portable infrared surface inspection system |
| CN100465617C (en) * | 2006-01-18 | 2009-03-04 | 中国科学院上海技术物理研究所 | Photo-modulated reflectance spectrum measuring method and apparatus based on step scan |
| CN100491975C (en) * | 2006-03-22 | 2009-05-27 | 武汉大学 | Portable infrared spectrograph |
| CN101694454B (en) * | 2009-09-29 | 2011-08-03 | 武汉理工大学 | Optical path steering device of Fourier infrared spectrograph sample bin |
-
2009
- 2009-09-29 CN CN2009102723358A patent/CN101694455B/en not_active Expired - Fee Related
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104330356A (en) * | 2014-11-24 | 2015-02-04 | 中国航空工业集团公司洛阳电光设备研究所 | Detection device for testing transmittance of optical cowling film |
| CN105445247A (en) * | 2015-12-14 | 2016-03-30 | 天津港东科技发展股份有限公司 | High-sensitivity sample rack |
| CN106596403A (en) * | 2016-11-25 | 2017-04-26 | 中国科学院长春光学精密机械与物理研究所 | Clamping device for measuring reflectivity of curved mirror |
| CN113008790A (en) * | 2021-02-05 | 2021-06-22 | 天津港东科技股份有限公司 | Sample fixing frame for Fourier transform infrared spectrometer |
| CN116242799A (en) * | 2023-03-14 | 2023-06-09 | 合肥工业大学 | Base oil detection device and detection method based on deep learning infrared multidimensional fusion algorithm |
| CN116242799B (en) * | 2023-03-14 | 2023-08-18 | 合肥工业大学 | Base oil detection device and detection method based on deep learning infrared multidimensional fusion algorithm |
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| CN101694455B (en) | 2012-01-11 |
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Granted publication date: 20120111 Termination date: 20120929 |