CN101576508A - Device and method for automatically detecting chip appearance defects - Google Patents
Device and method for automatically detecting chip appearance defects Download PDFInfo
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- CN101576508A CN101576508A CNA2009100398484A CN200910039848A CN101576508A CN 101576508 A CN101576508 A CN 101576508A CN A2009100398484 A CNA2009100398484 A CN A2009100398484A CN 200910039848 A CN200910039848 A CN 200910039848A CN 101576508 A CN101576508 A CN 101576508A
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Abstract
The invention discloses a device and a method for automatically detecting appearance defects of chips. The device comprises a control computer and a chip automatic delivering system, wherein the control computer is provided with a defect intelligent recognition system, and the chip automatic delivering system is connected with the defect intelligent recognition system. The method comprises the following steps: (1) adjusting a light source illuminating a tested chip, and delivering the chip to a CCD camera through an optical lens; (2) transmitting images formed by the CCD camera to the control computer through a cable; (3) operating the defect intelligent recognition system to perform image recognition so as to detect and judge the images; and (4) sending corresponding signals to a control circuit by the defect intelligent recognition system so as to control a transport unit and a separation mechanism to separate qualified products and unqualified products. The device and the method can perform automatic detection on the appearance defects of the chips and achieve accurate, reliable and efficient appearance quality detection of the chips.
Description
Technical field
The present invention relates to the detection technique of electronic devices and components open defect, particularly chip appearance defects automatic detection device and detection method.
Background technology
Current electronic package develops to microminiaturization, chip type, high-performance direction rapidly, and the defects detection of component pin is the prerequisite that correctly encapsulates, and it is the quality assurance of potted element that other open defects detect.Operation chip manufacturing and two major parts of back operation encapsulation before critical equipment in the chip manufacturing comprises.Back operation equipment mainly comprises the high-speed, high precision that adapts with closeer, littler, lighter novel encapsulated technology, sealed in unit cheaply, and finally realizes the full-automation of whole encapsulation process.In recent years, adjust and development through large-scale, the production line of China has possessed preceding operation major equipment ability to provide the auxiliary items, but the development aspect of back operation key equipment still is at the initial stage, more and more Xian Jin high speed image analytical technology is applied to various fields such as industry and military field, the for example production of electronic product and manufacture view, one of its core technology is to adopt computer vision technique that the product element is carried out high speed, hi-Fix and detection, thereby can be used as the real time high-speed high precision of operation production run behind the chip and the chip appearance quality detection of high reliability.
Still adopt traditional artificial visually examine to detect at present a lot of production lines, after finding defective, manually reject substandard product, there is following several respects problem in existing like this quality testing situation: (1) is because the chip production amount is big, the operator is operated on the continual production line, cause visual fatigue with eye for a long time, make quality assurance system be subjected to artificial subjective the interference; (2) standard that is formed by people's vision is a non-quantification, non-constant yardstick, thereby causes the quality standard fluctuation, directly causes the production quality control instability; (3) human eye is judged the too late computing machine of speed to the treatment of picture fast operation, makes that detection efficiency is low thereby increases the production cost; (4) for the minimum pasting chip of volume, human eye is difficult to judge.Other has the image processing techniques that uses a computer in the part producing, but only detect by the pin positions and the number of camera to chip, the scope that detects is only limited to pin, is not included in the pin that should examine in the chip appearance quality detection and applies color, chip surface lettering color, chip cut size error, pin gauge point position accuracy etc.Do not reach the system requirements of IC chip defect complete detection.
Summary of the invention
The objective of the invention is to overcome the shortcoming and defect of prior art, a kind of safety simple to operate, easy to use is provided, can detects and carry out the chip appearance defects automatic detection device of machinery shunting to various chips open defect by computer picture defective intelligent identifying system.
The present invention also aims to provide a kind of chip appearance defects automatic testing method of realizing by said apparatus.
Purpose of the present invention realizes by following proposal: a kind of chip appearance defects automatic detection device, comprise controlling computer, chip automatic transmission system, ccd video camera, described controlling computer is provided with the defective intelligent identifying system, described defective intelligent identifying system is connected with ccd video camera, described chip automatic transmission system is connected with controlling computer, and ccd video camera is towards chip under test.
Described defective intelligent identifying system comprises image input module, parameter module, image pretreatment module, defect location module, defective discrimination module; Described image input module is connected respectively with ccd video camera, parameter module, image pretreatment module, described parameter module comprises parameter acquisition module, parameter input module, described parameter module is connected with the defective discrimination module, and described image pretreatment module is connected successively with defect location module, defective discrimination module.
Described defect location module comprises pin positions detection module, chip surface position detecting module, defects detection module, and described pin positions detection module, chip surface position detecting module are connected with the defects detection module respectively; Described defective discrimination module comprises interconnective comparison module and identification module.
Described defects detection module comprises pin colour deficient detection module, pin positions defects detection module and chip surface defects detection module.
Described chip automatic transmission system comprises conveyer, shunting machinery, control circuit, and described conveyer is connected with shunting machinery, and described conveyer, shunting is mechanical is connected respectively with control circuit.
Described ccd video camera, control circuit are connected with the defective intelligent identifying system of controlling computer by long-range cable respectively.
A kind of chip appearance defects automatic testing method of being realized by said apparatus comprises the steps:
(1) controlling computer is obtained the image of current chip on the chip automatic transmission system by defective intelligent identifying system control ccd video camera;
(2) image that ccd video camera becomes is arrived the defective intelligent identifying system by cable transmission;
(3) the defective intelligent identifying system carries out image recognition, detects and passes judgment on image;
(4) the defective intelligent identifying system sends corresponding signal carries out certified products and non-certified products with control conveyer, shunting machinery to the control circuit of chip automatic transmission system product shunting according to recognition result;
Defective intelligent identifying system work in the described step (3) comprises the steps:
(3-1) image input module of defective intelligent identifying system receives the image that ccd video camera transmits; The image that parameter module is taken according to ccd video camera obtains canonical parameter automatically by the canonical parameter acquisition module, and parameter input module is then accepted the manual parameters input;
(3-2) the image pretreatment module is carried out the denoising pre-treatment step, and carries out image recognition;
Whether qualified (3-3) defect location module by the defective intelligent identifying system and defective discrimination module carry out defect image and detect and pass judgment on, and output chip under test corresponding signal.
The defect location module of described step (3-3) and the detection and the judge of defective discrimination module may further comprise the steps:
(3-3-1) the pin positions detection module of defect location module, chip surface position detecting module be according to the image of the input of image pretreatment module, respectively detection chip pin, the position of chip surface, the position of the chip first pin gauge point;
(3-3-2) length of each pin of defects detection module mensuration chip, the distance between each adjacent pin, the number of pin, the gray-scale value of chip pin, the gray-scale value of chip surface printing information;
(3-3-3) comparison module of defective discrimination module compares each measured value and predefined reference value;
(3-3-4) identification module of defective discrimination module is passed judgment on certified products and unacceptable product, and the output corresponding signal is given control circuit.
Defective intelligent identifying system in the described step (3) detects and comprises automatic mode and two kinds of detecting patterns of semi-automatic pattern;
Described automatic mode operation steps comprises: select chip type; Select automatic mode; Enter program execution state, confirm corresponding chip model parameter; Read in image from ccd video camera, measure and pass judgment on; Show evaluation result in real time, according to the result chip is screened, and carry the detected chip of next piece to detect;
Described semi-automatic pattern operation steps comprises: select chip type; Select semi-automatic pattern; Enter program execution state, confirm corresponding chip model parameter; Read in image from ccd video camera, operating computer carries out dimensional measurement and judge, and does final judge by the operator.
Action principle of the present invention is: the core content of defective intelligent identifying system of the present invention is defect location module and defective discrimination module.Defect location module and defective discrimination module comprise following algorithm: chip edge extracts, positioning chip pin zone, the positioning chip surf zone, the positioning chip first pin gauge point position, calculate length, area, the gray scale of each pin, calculate adjacent lead pin pitch, the computing chip surface printing font total area.After chip image is sent to controlling computer, the position of defective intelligent identifying system detection chip pin, chip surface and the chip first pin gauge point, measure length, area and the gray scale of pin, measure adjacent lead pin pitch, measure the chip surface printing type face total area.Compare with this measured value and the predefined reference value of operating personnel, automatically carrying out certified products and unacceptable product passes judgment on, the evaluation result of each chip is shown on display, to control circuit, the control transfer system is delivered to the unacceptable product place with defective chip for the unacceptable product output signal.Defective intelligent identifying system of the present invention comprises two kinds of detecting patterns: automatic mode and semi-automatic pattern.Automatic mode is the auto judge result according to the Computer Automatic Recognition system, and detection system is carried out the differentiation of certified products and unacceptable product automatically; Semi-automatic pattern is to increase the manual intervention function on the basis of automatic mode, make it at any time breakpoint to be set and be in halted state, can manually stop the operation of automatic identification procedure at any time, and carrying out artificial defect identification and judge, the chip connecting gear can normally move also and can suspend at some detected states this moment.
The present invention has following advantage and effect with respect to prior art:
(1) the present invention can detect automatically to chip appearance defects, and safety, accurate, reliable, the detection efficiency height.
(2) the present invention has two kinds of detecting patterns, can select the mode detection that detects according to actual needs.
(3) the present invention can detect the small chip that human eye is difficult to detect by the Computer Automatic Recognition system, makes it detection efficiency and accuracy.
Description of drawings
Fig. 1 is the structural representation of chip appearance defects automatic detection device.
Fig. 2 is that each module communication of defective intelligent identifying system concerns synoptic diagram.
Fig. 3 is the process flow diagram that chip pin and chip are cut apart in the front.
Fig. 4 is the process flow diagram that obtains the chip standard parameter.
Fig. 5 is the process flow diagram that detects the pin color.
Fig. 6 is the process flow diagram of the skew of detection chip pin, warpage, scarce pin.
Fig. 7 is detection chip surface lettering sharpness testing process figure.
Fig. 8 is the chip first pin gauge point testing process figure.
Fig. 9 is the bad testing process figure of chip cutting.
Embodiment
Below in conjunction with embodiment and accompanying drawing the present invention is described in further detail, but embodiments of the present invention are not limited thereto.
Embodiment
Fig. 1 shows chip appearance defects automatic detection device of the present invention, and it comprises controlling computer 1, ccd video camera 2, light source 3, support 4, chip automatic transmission system 5.Described controlling computer 1 is provided with the defective intelligent identifying system, and described defective intelligent identifying system is electrically connected with ccd video camera, is used to receive the picture signal that ccd video camera is gathered.Described controlling computer 1 also is electrically connected with chip automatic transmission system 5, controls the transmission of described chip automatic transmission system 5 execution and the action that stops, and described ccd video camera is towards chip under test.Support 4 is rigidly connected with described ccd video camera 2, light source 3, chip automatic transmission system 5 and the hardware system of collection of composition diagram image signal and chip quality control.
Described chip automatic transmission system comprises conveyer, shunting machinery, control circuit, and described conveyer is connected with shunting machinery, and described conveyer, shunting is mechanical is connected respectively with control circuit.Chip under test is positioned on the described conveyer.
Fig. 2 is that each module communication of defective intelligent identifying system concerns synoptic diagram.Described defective intelligent identifying system comprises ccd video camera, image input module, parameter module, image pretreatment module, defect location module, defective discrimination module; Described image input module is connected respectively with ccd video camera, parameter module, image pretreatment module, described parameter module comprises parameter acquisition module, parameter input module, parameter in the parameter module is as the canonical parameter of the chip of model to be detected, described parameter module links to each other with the defective discrimination module, and described image pretreatment module is connected successively with defect location module, defective discrimination module; Described defect location module comprises pin positions detection module, chip surface position detecting module, defects detection module, and described pin positions detection module, chip surface position detecting module are connected with the defects detection module respectively; Described defective discrimination module comprises interconnective comparison module and identification module, described defects detection module comprises pin colour deficient detection module, pin positions defects detection module and chip surface defects detection module, and described ccd video camera, control circuit are connected with the defective intelligent identifying system of controlling computer by long-range cable respectively.
Controlling computer is obtained the image of current chip on the chip automatic transmission system by defective intelligent identifying system control ccd video camera; The captured image of ccd video camera is arrived the defective intelligent identifying system by cable transmission; The defective intelligent identifying system carries out image recognition, detection and judge; The defective intelligent identifying system sends corresponding signal carries out certified products and non-certified products with control conveyer, shunting machinery to the control circuit of chip automatic transmission system product shunting according to recognition result.
The work of described defective intelligent identifying system comprises the steps: that the image input module of defective intelligent identifying system receives the image that ccd video camera transmits, the image that parameter module is taken according to ccd video camera, automatically obtain canonical parameter by the canonical parameter acquisition module, parameter input module is then accepted the manual parameters input; The image pretreatment module is carried out the denoising pre-treatment step, and carries out image recognition; Whether qualified defect location module by the defective intelligent identifying system and defective discrimination module carry out defect image to be detected and passes judgment on, and output chip under test corresponding signal.The detection and the judge of described defect location module and defective discrimination module may further comprise the steps: the pin positions detection module of defect location module, chip surface position detecting module be according to the image of the input of image pretreatment module, respectively detection chip pin, the position of chip surface, the position of the chip first pin gauge point; The length of each pin of defects detection module mensuration chip, the distance between each adjacent pin, the number of pin are measured the gray-scale value of chip pin, the gray-scale value of chip surface printing information; The comparison module of defective discrimination module is each measured value and predefined reference value relatively; The identification module of defective discrimination module is passed judgment on certified products and unacceptable product, and the output corresponding signal is given control circuit.
Described defective intelligent identifying system detects and comprises automatic mode and two kinds of detecting patterns of semi-automatic pattern.
Described automatic mode operation steps comprises: select chip type; Select automatic mode; Enter program execution state, confirm corresponding chip model parameter; Read in image from ccd video camera, measure and pass judgment on; Show evaluation result in real time, according to the result chip is screened, and carry the detected chip of next piece to detect;
Described semi-automatic pattern operation steps comprises: select chip type; Select semi-automatic pattern; Enter program execution state, confirm corresponding chip model parameter; Read in image from ccd video camera, operating computer carries out dimensional measurement and judge, and does final judge by the operator.
Fig. 3 is the defect location module, cuts apart the process flow diagram of chip pin and chip surface.Be used for being implemented in the zone that image extracts chip, divide the pin part of chip and the surface portion of chip.Use Canny operator detected image to obtain the chip pin edge when cutting apart, scanning obtains the coordinate range of chip pin on the basis of this pin edge image.The coordinate that utilization obtains is partitioned into the zone that only contains chip, stores the area image that only contains chip according to this zone.Simultaneously, in edge image, be partitioned into the pin edge image in the chip area, store the pin edge image.In the chip area image, mark off chip surface area, and the storage chip surface image.
Fig. 4 is the process flow diagram that the canonical parameter acquisition module obtains the chip standard parameter.Be used to obtain the average gradient value in pin area, number of pins, chip surface printing type face area and the font zone of standard chips, and whether the coordinate up and down of left and right sides pin is positioned at the relative position parameter of chip surface.This flow process carries out earlier to the chip standard image that adaptive threshold is cut apart and morphological operation, and first pin subregion from obtaining judges whether it is given up according to its region area, and so circulation is to obtain all pin partitioned area and areas.Maximal value and minimum value in all chip pin subregion areas that statistics is obtained.Preserve the maximal value and minimum value and the process ends that obtain.The maximal value that obtains can be set the upper limit canonical parameter into the pin area, and the minimum value of acquisition can be set the lower limit standard parameter into the pin area.
Fig. 5 is a pin colour deficient detection module, detects the process flow diagram of pin color.Whether qualified, oxidation, blackout, scratch occur as pin and expose situations such as copper body if detecting the pin color, then show underproof result.Flow process to pin carry out that adaptive threshold is cut apart, morphological operation removes noise spot.From first pin subregion, obtain each pin zone, judge whether the pin zone successfully obtains, successfully obtain and then judge the pin area value; Do not exceed normal pin area then number of pins add one, enter that next pin subregion obtains and the judgement of area; Exceed normal pin subregion area as the subregion area, then this subregion of mark does not increase the number of pins that has detected, continues to obtain next subregion; If successfully do not obtain next pin zone, judge then whether number of pins is consistent with the number of pins of setting, obtain each pin color average gray again, whether detection chip pin color is qualified, EOP (end of program) after the output judged result.
Fig. 6 is the process flow diagram of the skew of pin positions defects detection module detection chip pin, warpage and scarce pin, is used to detect skew, warpage, the scarce pin defective of pin, and whether the detection chip pin positions is normal, and whether the chip pin number meets the requirements.At first from the pin edge image that Fig. 4 obtains, use scanning algorithm, obtain the number of the right and left pin.Number of pins and standard pin number of parameters are compared, judge whether this chip pin number is qualified,, promptly lack pin, then process ends if defective.Enter the pin positions test section, obtain the end points coordinate at two ends, the pin left and right sides, calculate the length of pin and the spacing distance between the pin, with income value and standard value relatively, judge whether pin length and pin interval is qualified respectively by scanning.If the pin warpage occurs, then pin length is defective; If the pin skew occurs, then the result is defective at interval for pin.Each defective all terminator is exported defective result, and chip is sent into the substandard products district.
Fig. 7 is chip surface defects detection module detection chip surface lettering sharpness testing process figure.But whether the information of this flow process detection chip surface printing is clear, if the font of printing above is worn, in addition decolouring, use the chip person to be difficult to obtain the information of chip, this part testing result is defective.Flow process begins, and three channel separation of RGB with the chip surface image obtain three gray level images on the passage.Gray level image to above-mentioned three passages carries out the adaptive threshold processing respectively, obtains its corresponding bianry image.On each width of cloth bianry image, corrode expansion, remove the noise spot on the image.The ratio that accounts for according to noise spot is if detect by the gray scale method less than 10%, if detect by gradient method greater than 10%.The gray scale method detects by adding up the area of font in the above-mentioned bianry image that obtains, and judges whether this area is qualified, thereby judges whether the lettering sharpness is qualified.Gradient method detects by calculating the average gradient value of above-mentioned gray level image in the lettering zone, judges whether this Grad is qualified, thereby judges whether the lettering sharpness is qualified.
Fig. 8 is the testing process figure of the chip surface defects detection module detection chip first pin gauge point position.This gauge point comes down to a small sircle hole, and chip this mark circular hole of may biting during manufacturing causes the direction confusion of chip.Earlier the chip surface image is asked gradient, by obtaining the chip surface gradient map after the greyscale transformation; The lettering area image is carried out expansion process, the lettering area image after obtaining expanding.In above-mentioned gradient image, after removing the lettering area image after the expansion, obtain the pin gauge point and may have the zone, behind the screening zone, use Hough circle detection algorithm, detect the center of circle and the radius that obtain and screen by zone, Hough circle the pin gauge point, judging whether to have only a circle, is then qualified, less than circle or more than a circle, then export defective result, process ends.
Fig. 9 is the bad process flow diagram of chip surface defects detection module detection chip cutting.Make pin with respect to the whole generation skew of chip surface when chip cutting is bad.Flow process begins, and obtains chip pin zone and surf zone coordinate, obtains the right and left pin upper limit coordinate and lower limit coordinate, obtains chip area bound coordinate.Judge pin up and down coordinate with respect to chip surface coordinate conformance with standard value whether.If coordinate is greater than coordinate certain limit on the chip (10% chip length) on the pin, perhaps under the pin coordinate less than coordinate certain limit under the chip (10% chip length), then belong to the situation that does not meet standard value, result of flow is defective, thereby judges that chip is bad for cutting.
The foregoing description can be realized the present invention preferably.The foregoing description is preferred embodiment of the present invention only, is not in order to limiting practical range of the present invention, and promptly all variation and modifications of doing according to content of the present invention are all within claim of the present invention scope required for protection.
Claims (10)
1, a kind of chip appearance defects automatic detection device, it is characterized in that: comprise controlling computer, chip automatic transmission system, ccd video camera, described controlling computer is provided with the defective intelligent identifying system, described defective intelligent identifying system is connected with ccd video camera, described chip automatic transmission system is connected with controlling computer, and ccd video camera is towards chip under test.
2, chip appearance defects automatic detection device according to claim 1 is characterized in that: described defective intelligent identifying system comprises image input module, parameter module, image pretreatment module, defect location module, defective discrimination module; Described image input module is connected respectively with ccd video camera, parameter module, image pretreatment module, described parameter module comprises parameter acquisition module and parameter input module, described parameter module is connected with the defective discrimination module, and described image pretreatment module is connected successively with defect location module, defective discrimination module.
3, chip appearance defects automatic detection device according to claim 2, it is characterized in that: described defect location module comprises pin positions detection module, chip surface position detecting module, defects detection module, and described pin positions detection module, chip surface position detecting module are connected with the defects detection module respectively; Described defective discrimination module comprises interconnective comparison module and identification module.
4, chip appearance defects automatic detection device according to claim 3 is characterized in that: described defects detection module comprises pin colour deficient detection module, Pin locations defects detection module and chip surface defects detection module.
5, according to each described chip appearance defects automatic detection device of claim 1～4, it is characterized in that: described chip automatic transmission system comprises conveyer, shunting machinery, control circuit, described conveyer is connected with shunting machinery, and described conveyer, shunting machinery are connected respectively with control circuit.
6, chip appearance defects automatic detection device according to claim 5 is characterized in that: described ccd video camera, control circuit are connected with the defective intelligent identifying system of controlling computer by long-range cable respectively.
7, a kind of chip appearance defects automatic testing method of being realized by the described device of claim 6 is characterized in that comprising the steps:
(1) controlling computer is obtained the image of current chip on the IC chip automatic transmission system by defective intelligent identifying system control ccd video camera;
(2) image that ccd video camera becomes is arrived the defective intelligent identifying system by cable transmission;
(3) the defective intelligent identifying system carries out image recognition, detects and passes judgment on;
(4) the defective intelligent identifying system sends corresponding signal carries out certified products and non-certified products with control conveyer, shunting machinery to the control circuit of chip automatic transmission system product shunting according to recognition result;
8, chip appearance defects automatic testing method according to claim 7 is characterized in that: the defective intelligent identifying system work in the described step (3) comprises the steps:
(3-1) image input module of defective intelligent identifying system receives the image that ccd video camera transmits;
(3-2) the image pretreatment module is carried out the denoising pre-treatment step, and carries out image recognition;
Whether qualified (3-3) defect location module by the defective intelligent identifying system and defective discrimination module carry out defect image and detect and pass judgment on, and output chip under test corresponding signal.
9, chip appearance defects automatic testing method according to claim 8 is characterized in that: the defect location module of described step (3-3) and the detection and the judge of defective discrimination module may further comprise the steps:
(3-3-1) the pin positions detection module of defect location module, chip surface position detecting module be according to the image of the input of image pretreatment module, respectively detection chip pin, the position of chip surface, the position of the chip first pin gauge point;
(3-3-2) length of each pin of defects detection module mensuration chip, the distance between each adjacent pin, the number of pin are measured the gray-scale value of chip pin, the gray-scale value of chip surface printing information;
(3-3-3) comparison module of defective discrimination module compares each measured value and predefined reference value;
(3-3-4) identification module of defective discrimination module is passed judgment on certified products and unacceptable product, and the output corresponding signal is given control circuit.
10, chip appearance defects automatic testing method according to claim 7 is characterized in that: the defective intelligent identifying system in the described step (3) detects and comprises automatic mode and two kinds of detecting patterns of semi-automatic pattern;
Described automatic mode operation steps comprises: select chip type; Select automatic mode; Enter program execution state, confirm corresponding chip model parameter; Read in image from ccd video camera, measure and pass judgment on; Show evaluation result in real time, according to the result chip is screened, and carry the detected chip of next piece to detect;
Described semi-automatic pattern operation steps comprises: select chip type; Select semi-automatic pattern; Enter program execution state, confirm corresponding chip model parameter; Read in image from ccd video camera, operating computer carries out dimensional measurement and judge, and does final judge by the operator.
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Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2771190B2 (en) * | 1988-10-07 | 1998-07-02 | 株式会社日立製作所 | Method and apparatus for inspecting filling state of through hole |
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-
2009
- 2009-05-27 CN CN2009100398484A patent/CN101576508B/en not_active Expired - Fee Related
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