CN101504920A - 在柔性金属基底上形成电子器件的方法和所得器件 - Google Patents
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Abstract
本发明涉及在柔性金属基底上形成电子器件的方法和所得器件。形成电子器件的方法提供具有保留表面的金属载体,并将金属基底材料的接触表面固定到金属载体的保留表面上。加工该基底以便在其上形成电子器件;并将金属基底材料从金属载体上剥离以产生完成的电子器件。
Description
技术领域
本发明大体上涉及电子器件制造,更特别涉及将金属载体固定到金属基底上,在基底上形成电子器件,然后将基底从载体上移除以获得完成的电子器件的方法。
背景技术
薄膜晶体管(TFT)器件广泛用于电光阵列和显示板的开关或驱动电路。传统上采用沉积、图案化和蚀刻步骤的公知次序在刚性基底(通常为玻璃或硅)上制造TFT器件。例如,非晶硅TFT器件要求将金属,如铝、铬或钼;非晶硅半导体;和绝缘体如SiO2或Si3N4沉积到基底上、图案化和蚀刻。半导体薄膜以典型厚度为几纳米至几百纳米的层形式形成,中间层厚度大约几微米,且半导体薄膜可以在位于刚性基底上的绝缘表面上形成。
对刚性基底的要求主要基于制造方法本身的要求。热特性特别重要,因为TFF器件在相对高温下制造。由此,已成功使用的基底材料的范围略微有限,通常限于玻璃、石英或其它刚性的硅基材料。
可以在某些类型的金属基底上形成TFT器件,从而在其制造中实现一定程度的柔性。但是,如基底与在制造过程中负载该基底的载体材料之间的热膨胀失配之类的问题使金属基底更难以用在许多用途中。
在柔性基底上制造TFT通常要求在层沉积的各阶段过程中将基底固定在一定类型的载体上。此类载体更重要的功能之一是为柔性基底提供尺寸稳定性。因此,例如,传统上提供刚性玻璃载体。但是,金属基底与玻璃表现出显著的热膨胀系数(CTE)差异。加热或冷却周期中的过度应力会损坏玻璃或导致金属基底过早从玻璃载体上脱离,从而损失其尺寸稳定性。
由此可以看出,尽管开发和扩展金属作为柔性基底的应用已经受到极大的关注,但与传统玻璃载体的相容性仍对基底材料类型施加了一些限制。因此,需要可用于在柔性金属基底上制造TFT的替代载体材料和技术。
发明内容
本发明的一个目的在于提供形成电子器件的方法,包括提供具有保留表面(retaining surface)的金属载体;提供具有接触表面的金属基底;将接触表面固定到保留表面上;加工该基底以便在其上生成电子器件;和将金属基底从金属载体上剥离。
本发明的特征在于提供了制造到柔性(flexible)金属基底上的电子器件。本发明能够在例如不锈钢薄片上制造。
本发明的优点在于其提供了适用于在高温下加工柔性基底的载体,其中该载体也可以以调节其CTE特征的方式制造。
结合附图阅读下列详述后,本发明的这些和其它目的、特征和优点是本领域技术人员显而易见的,在附图中显示和描述了本发明的示例性实施方案。
附图说明
尽管本说明书最后附有特别指出并清楚要求保护本发明主题的权利要求书,但我们相信,根据与附图结合的下列说明书,可以更好地理解本发明。
图1是在柔性基底上形成的电子器件的侧视图。
图2是显示装配在载体上的柔性金属基底的透视图。
图3是显示用中间粘合剂材料装配在载体上的柔性金属基底的截面侧视图。
图4是显示部分固定在载体上的柔性基底的透视图。
具体实施方式
要理解的是,下列详述中没有具体显示或描述的元件可以呈现本领域技术人员公知的各种形式。本申请中给出的图是沉积到基底上的层的总体空间关系和排列的代表,并非按比例绘制。
在本发明的实施方案中,借助热、压力和真空或这些条件的一些组合将柔性金属基底如不锈钢箔层压到金属载体上。在基底与载体之间使用可重熔的塑料粘合剂材料。该塑料粘合剂材料可以是在加热至接近或高于用于制造器件的温度时会重熔的Teflon或类似材料。术语“柔性”通常是指比大约1.5毫米更薄的金属片材。
参照图1,显示了根据本发明形成的电子器件10。将薄膜电子元件或器件12如导体、薄膜晶体管、二极管或其它元件形成到柔性金属基底20如金属箔上。可以在器件12与基底20之间施加例如亚硝酸硅层14以提供防止杂质从基底20扩散到器件10中的阻挡层。在器件制造过程中,将基底20提供到、沉积到、层压到或以其它方式粘附(attach)到载体18上,载体18在薄膜器件制造所需的整个加工温度和条件范围内为基底20提供尺寸稳定性。
本发明的装置和方法提供了具有有利于将TFT制造到不锈钢或其它金属的柔性基底上的性质的载体18。通过匹配或基本匹配柔性基底的热膨胀系数(CTE),本发明的装置和方法提供了适合该基底并在制造加工过程中将该基底固定就位而没有由变化的温度范围引起的负面作用的载体。
在本发明的一些实施方案中,载体18可以由不锈钢材料制成。在另一些实施方案中,可以对载体18使用不同的金属,只要其严密匹配基底20的CTE。如果载体与基底的CTB在彼此的大约25%内,更优选在彼此的大约10%内,它们可以被视为基本相等。
采用本发明的各种实施方案,可以获得高结构刚性的载体材料,以及有利的CTE特性,和在成本与性能方面的优点。本发明的载体18可重复使用由所用各种材料和遇到的制造条件决定的任意次数。在一些实施方案中,首先通过沉积到载体18上来形成基底20本身,随后制造TFT器件。
图2的透视图显示在电子器件制造之前固定到载体18的保留表面24上的基底20。在图3的截面图显示的实施方案中,基底20通过使用施加在它们之间的可重熔塑料粘合剂材料30层压到载体18的保留表面24上来固定。粘合剂材料可以基于所需性能选自一系列塑料物质。特别有意义的一些塑料粘合剂材料包括如前所述的聚酰亚胺,以及DuPont,Inc出售的商品名为的聚四氟乙烯(PTFE)或聚(全氟-alboxy)含氟聚合物(PFA)。
可用于层压的另一些示例性粘合剂塑料包括但不限于热稳定的聚对苯二甲酸乙二醇酯(HS-PET)、聚萘二甲酸乙二醇酯(PEN)、聚碳酸酯(PC)、聚丙烯酸酯(PAR)、聚醚酰亚胺(PEI)、聚醚砜(PES)、包括的聚酰亚胺(PI)、聚(全氟-alboxy)含氟聚合物(PFA)、聚(醚醚酮)(PEEK)、聚(醚酮)(PEK)、聚(乙烯四氟乙烯)含氟聚合物(PETFE)和聚(甲基丙烯酸甲酯)和各种丙烯酸酯/甲基丙烯酸酯共聚物(PMMA)。适合用作粘合剂的塑料也包括各种环状聚烯烃、JSR Corporation制造的ARTON、Zeon Chemicals L.P.制造的Zeonor和Celanese AG制造的Topas。也可以使用其它更低温塑料基底,包括:以HALAR为名购自Ausimont U.S.A.,Inc.的乙烯-氯代三氟乙烯(E-CTFE)、Dupont Corporation以商标TEFZEL出售的乙烯-四氟乙烯(E-TFE)、聚四氟乙烯(PTFE)、纤维玻璃增强塑料(FEP)和高密度聚乙烯(HDPE)。因其“自层压”能力,能在高温下熔融并经受重熔的塑料特别有利。
许多沉积方法可用于将粘合剂材料涂施到保留表面24和/或接触表面32上。这些包括各种类型的涂布技术,如喷涂和喷墨印刷应用。在一个实施方案中,可以在基底20和载体18之间放置Teflon材料薄片,且施热导致充分重熔以将基底固定就位。来自剥离层的可重熔材料,如可重熔塑料的层压也可用于粘合剂材料沉积。
热和压力提供一种类型的层压能。其它层压法可以单独使用热、单独使用压力、或与粘合剂材料30一起使用溶剂或其它材料。另一些层压方法可能包括溶剂软化技术。或者,辐射可用于层压和层离。
将接触表面32固定到保留表面24上的层压法的其它替代方案包括使用粘合剂和如扩散粘结的方法。扩散粘结可以单独使用热和压力,或可以与热和压力一起使用其它中间粘合材料,如焊料。
层离(delamination)可以以许多方式进行,例如使用热或化学品。在许多实施方案中,从载体上剥离基底的方法使用与用于将基底固定到载体上的方法相同类型的能量。例如,当使用可重熔塑料时,热可用于层压以及用于随后的层离。在一些实施方案中,可以利用基底或载体的局部冷却用作剥离方法。冷却利用金属载体和基底的热收缩/膨胀特性。
在使用环氧树脂或其它粘合剂时,可以施加热或电磁能以充分弱化粘合剂粘合力以便在元件制造后从载体18上移除基底20。例如,可获自Epoxy Technology,Inc.,Billerica,MA的Epo-Tek 353ND环氧树脂和类似环氧树脂可以在延长的施热期下具有相对较低的玻璃化转变温度,并可以具有使粘合强度显著降低的降解温度。或者,剥离法可用于层离,例如包括使用金属或金属线切片剥离的方法。可以使用辐射凝固或软化载体18与基底20之间的粘合剂材料30。
实施例1
在一个实施方案中,用于载体18的材料是厚度大约50.8毫米的不锈钢片。基底20是厚度大约0.762毫米的不锈钢箔。
采用这些材料,采用柔性基底20的TFT制造加工如下:
1.表面制备。在图4的透视图中所示的此步骤中,将薄Teflon(PTFE)涂层作为粘合剂材料30涂施到柔性基底20的接触表面32上。这可以使用任何合适的沉积技术涂施。对于较小的基底20,大约0.127至1.27毫米的厚度是足够的;该厚度可以随柔性基底20的所需硬度和面积而变。
2.定位。将基底20定位,以使其以载体18上的保留表面24为中心。
3.层压。通过施加热和压力以达到大约300℃的PTFE粘合剂材料30的流动温度(Tg),将基底20层压到载体18上。该PTFE材料软化、重熔、并将接触表面32粘合到保留表面24上。在施加热和压力时,挤出载体18与基底的接触表面32之间的夹留空气。
4.加工。随后加工基底20以形成一种或多种电子器件10(图1)。
5.层离。随后再使用热以使该PTFE材料在大约300℃下重熔。随后可以从载体18表面上剥离基底20。
对该实施例给出的步骤允许作出许多变动。例如,可以针对基底20和载体18的条件适当地调节所用粘合剂材料30的厚度以及组成。可以使用相对纯净的Teflon材料;但是也可以使用包括Teflon以及微粒状、纤维状或其它填料的组合物,其中该微粒状添加剂提供改进的性能、温度范围或其它条件。
在保留表面24外,该可重熔塑料充当阻挡层以防止基底20与载体18的交界表面之间的空气或其它气体的夹留。再加热Teflon粘合剂中间材料随后允许从载体18上剥离基底20。在一些实施方案中,粘合剂材料30在基底20从载体18表面上移除后仍沉积在基底20上,充当例如介电层。
实施例2
在另一实施方案中,粘合剂将基底20临时固定到载体18上。随之,TFT制造步骤如下:
1.将基底20固定到载体18上。将柔性基底20粘结到载体18上。这通过将具有合适厚度或剥离强度的粘合剂涂布到基底20和/或载体18上来进行。可以使用压力或热与压力的结合以便将基底20粘结就位。从载体和基底之间挤出夹留空气。
2.平面化。在一些用途中,用于TFT沉积的所需表面粗糙度可以为大约低于0.2至0.3微米峰间值或更好。可以将平面化材料添加到暴露的基底表面上以实现这种平滑度水平。
4.形成电绝缘层。作为用于修整基底表面的最后表面制备步骤(其可以是任选的),在该平面化层上沉积电绝缘层。合适的绝缘层材料可以是SiO2、SiNx、SiON或这些材料的某些组合。其厚度通常为大约0.5至1.5微米。
5.形成TFT元件。在制备柔性基底20表面后,可以开始铺设TFT元件。这通常要求将薄膜半导体材料层沉积到基底上,随后通过选择性除去部分半导体材料来形成图案。该程序采用元件制造领域中公知的方法铺设栅极、源极和漏极元件及其它负载层。
6.从载体18上剥离。热、冷却、辐射或溶剂可用于使基底20不再粘结到载体18的表面上,以便从基底20上剥离载体18。或者,在一些用途中,可以例如通过激光切割法围绕生成的TFT元件切穿基底20以利于移除具有TFT元件的一部分基底20。该基底的其余部分保持粘结到载体上。一旦通过任何方法分离,基底20可以层压或施加到一些其它表面上或使其冷却。
本发明的方法和装置能够使用许多柔性材料作为电子器件的基底,例如包括金属,如不锈钢和镍。
在基底20与载体18的匹配方面,观察两种材料之间的热膨胀系数是有用的。采用本发明的装置和方法,可以设计和制造相同金属或具有相容CTE特性的金属的载体18和基底20。当CTE值严密匹配时,仅需少量粘合剂材料或粘合剂就能将基底固定到载体上。这简化了将基底固定到载体上的步骤和剥离基底的步骤。
可以使用各种金属和合金作为基底20或作为载体18。这包括例如不锈钢、铝、铜和其它金属。通常非磁性的300系列不锈钢特别有利。
已经特别参照其某些优选实施方案详细描述了本发明,但要理解的是,本领域普通技术人员可以在不背离本发明范围的情况下在如上所述并如所附权利要求中所示的本发明范围内进行变动和修改。例如,当最好施加压力(没有热)以将基底20装配到载体18上时,沉积法特别有利。
在基底20上形成的电子器件可用于提供传给或来自多种不同类型元件的信号,并具有用于图像显示像素或图像传感像素的特定用途。例如,在基底20表面上形成的电子器件可以与例如用于显示器的相应液晶像素、发光二极管像素或有机发光二极管像素耦合。对于图像传感,在基底20表面上生成的电子器件可以与可激发磷光体像素耦合,或与另一类型的传感器像素,包括生物检测器耦合。
由此,提供了将基底装配到载体上以便在柔性基底上形成电子器件的方法。
部件单
10 电子器件
12 薄膜电子元件或器件
14 阻挡层
18 金属载体
20 柔性金属基底
24 载体18上的保留表面
30 粘合剂材料
32 基底20上的接触表面
Claims (10)
1.形成电子器件的方法,包括:
提供具有保留表面的金属载体;
提供具有接触表面的金属基底;
将接触表面固定到保留表面上;
加工该基底以便在其上形成电子器件;和
将金属基底材料从金属载体上剥离。
2.权利要求1的方法,其中将接触表面固定到保留表面上包括
将塑料粘合剂材料涂施到载体的保留表面或基底的接触表面或两者上;和
通过层压将基底粘附到载体上。
3.权利要求1的方法,其中将金属基底从载体上剥离包括加热载体表面、加热基底,或加热二者。
4.权利要求1的方法,其中固定接触表面包括在一定波长频段内辐射基底和载体。
5.权利要求1的方法,其中固定接触表面包括使用扩散粘结。
6.权利要求1的方法,其中剥离包括冷却载体表面、冷却基底、或冷却二者。
7.权利要求1的方法,其中剥离包括冷却载体表面、冷却基底、或冷却二者。
8.形成电子器件的方法,包括:
提供具有保留表面的金属载体;
提供具有接触表面的金属基底;
将粘合剂涂施到保留表面上、或涂施到接触表面上、或涂施到这两个表面上;
将金属基底粘附到金属载体上;
加工该金属基底以便在其上形成电子器件;和
将金属基底从金属载体上剥离。
9.权利要求8的方法,其中将金属基底从金属载体上剥离包括加热基底、加热载体、或加热二者。
10.权利要求8的方法,其中涂施粘合剂包括涂施环氧树脂。
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US12/028,174 US20090202857A1 (en) | 2008-02-08 | 2008-02-08 | Method for forming an electronic device on a flexible metallic substrate and resultant device |
US12/028174 | 2008-02-08 |
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US9991311B2 (en) | 2008-12-02 | 2018-06-05 | Arizona Board Of Regents On Behalf Of Arizona State University | Dual active layer semiconductor device and method of manufacturing the same |
US9721825B2 (en) | 2008-12-02 | 2017-08-01 | Arizona Board Of Regents, A Body Corporate Of The State Of Arizona, Acting For And On Behalf Of Arizona State University | Method of providing a flexible semiconductor device and flexible semiconductor device thereof |
US9601530B2 (en) | 2008-12-02 | 2017-03-21 | Arizona Board Of Regents, A Body Corporated Of The State Of Arizona, Acting For And On Behalf Of Arizona State University | Dual active layer semiconductor device and method of manufacturing the same |
JP5521034B2 (ja) * | 2009-05-29 | 2014-06-11 | アリゾナ・ボード・オブ・リージェンツ,フォー・アンド・オン・ビハーフ・オブ・アリゾナ・ステート・ユニバーシティ | フレキシブル半導体デバイスを高温で提供する方法およびそのフレキシブル半導体デバイス |
WO2012021196A2 (en) | 2010-05-21 | 2012-02-16 | Arizona Board Of Regents, For And On Behalf Of Arizona State University | Method for manufacturing electronic devices and electronic devices thereof |
WO2012021197A2 (en) | 2010-05-21 | 2012-02-16 | Arizona Board Of Regents, For And On Behalf Of Arizona State University | Method of manufacturing electronic devices on both sides of a carrier substrate and electronic devices thereof |
JP5931067B2 (ja) | 2010-09-06 | 2016-06-08 | コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. | 基板シート |
WO2017034644A2 (en) | 2015-06-09 | 2017-03-02 | ARIZONA BOARD OF REGENTS a body corporate for THE STATE OF ARIZONA for and on behalf of ARIZONA STATE UNIVERSITY | Method of providing an electronic device and electronic device thereof |
WO2015156891A2 (en) | 2014-01-23 | 2015-10-15 | Arizona Board Of Regents, Acting For And On Behalf Of Arizona State University | Method of providing a flexible semiconductor device and flexible semiconductor device thereof |
US10381224B2 (en) | 2014-01-23 | 2019-08-13 | Arizona Board Of Regents On Behalf Of Arizona State University | Method of providing an electronic device and electronic device thereof |
EP3143641A4 (en) | 2014-05-13 | 2018-01-17 | Arizona Board of Regents, a Body Corporate of the State of Arizona acting for and on behalf of Arizona State University | Method of providing an electronic device and electronic device thereof |
US10446582B2 (en) | 2014-12-22 | 2019-10-15 | Arizona Board Of Regents On Behalf Of Arizona State University | Method of providing an imaging system and imaging system thereof |
US9741742B2 (en) | 2014-12-22 | 2017-08-22 | Arizona Board Of Regents, A Body Corporate Of The State Of Arizona, Acting For And On Behalf Of Arizona State University | Deformable electronic device and methods of providing and using deformable electronic device |
CN111497378A (zh) * | 2020-04-20 | 2020-08-07 | 宁波瑞凌新能源科技有限公司 | 辐射制冷金属板、其制备方法及应用 |
AU2020220086B2 (en) | 2020-04-20 | 2022-02-24 | Ningbo Radi-Cool Advanced Energy Technologies Co., Ltd. | Radiative cooling metal plate, preparation method and application thereof |
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US7223672B2 (en) * | 2002-04-24 | 2007-05-29 | E Ink Corporation | Processes for forming backplanes for electro-optic displays |
US20060207967A1 (en) * | 2003-07-03 | 2006-09-21 | Bocko Peter L | Porous processing carrier for flexible substrates |
WO2005026742A1 (ja) * | 2003-09-12 | 2005-03-24 | Nec Corporation | チップとそのチップを用いた装置およびその使用方法 |
US7658470B1 (en) * | 2005-04-28 | 2010-02-09 | Hewlett-Packard Development Company, L.P. | Method of using a flexible circuit |
KR100820170B1 (ko) * | 2006-08-30 | 2008-04-10 | 한국전자통신연구원 | 플렉시블 기판의 적층 방법 |
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CN105765645A (zh) * | 2013-11-18 | 2016-07-13 | 康宁精密素材株式会社 | 柔性基底接合方法 |
CN105765645B (zh) * | 2013-11-18 | 2018-10-19 | 康宁精密素材株式会社 | 柔性基底接合方法 |
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