CN101477241B - 一种显微光学扫描层析成像装置 - Google Patents
一种显微光学扫描层析成像装置 Download PDFInfo
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- CN101477241B CN101477241B CN2009103004836A CN200910300483A CN101477241B CN 101477241 B CN101477241 B CN 101477241B CN 2009103004836 A CN2009103004836 A CN 2009103004836A CN 200910300483 A CN200910300483 A CN 200910300483A CN 101477241 B CN101477241 B CN 101477241B
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CN2009103004836A CN101477241B (zh) | 2009-02-19 | 2009-02-19 | 一种显微光学扫描层析成像装置 |
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CN2009103004836A CN101477241B (zh) | 2009-02-19 | 2009-02-19 | 一种显微光学扫描层析成像装置 |
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CN101477241A CN101477241A (zh) | 2009-07-08 |
CN101477241B true CN101477241B (zh) | 2012-10-31 |
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Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
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CN101458177B (zh) * | 2008-12-24 | 2011-04-06 | 华中科技大学 | 一种精密扫描式切削系统及切削样本加工方法 |
CN102590155A (zh) * | 2012-01-16 | 2012-07-18 | 华中科技大学 | 组织切片扫描成像装置 |
CN102928970B (zh) * | 2012-10-19 | 2014-10-29 | 华中科技大学 | 一种大样本快速三维显微成像的方法和系统 |
CN103376238B (zh) * | 2013-07-22 | 2016-01-06 | 华中科技大学 | 一种代谢信息获取方法及装置 |
CN104833553A (zh) * | 2014-10-22 | 2015-08-12 | 华中科技大学 | 一种显微成像样品的平面加工装置 |
CN104374756B (zh) * | 2014-10-31 | 2017-05-03 | 华中科技大学 | 无标记快速光学检测老年斑三维分布的方法 |
CN104833659B (zh) * | 2014-12-19 | 2017-05-24 | 武汉沃亿生物有限公司 | 一种生物样品断层显微成像系统 |
CN104655626B (zh) * | 2015-02-15 | 2017-04-12 | 宁波大学 | 一种显微镜下观察立体结构的装置 |
US10839509B2 (en) | 2015-07-10 | 2020-11-17 | 3Scan Inc. | Spatial multiplexing of histological stains |
CN106908420B (zh) * | 2015-12-22 | 2019-09-24 | 北京大学 | 一种可控位置界面的显微成像装置 |
CN105928941B (zh) * | 2016-04-13 | 2019-02-12 | 华中科技大学 | 同时获取全脑神经信息及共定位细胞构筑的方法 |
CN105842000B (zh) * | 2016-05-06 | 2018-06-22 | 华中科技大学 | 适用于振动切片的自动切片收集装置及方法 |
CN106841202B (zh) * | 2017-03-21 | 2019-07-30 | 帝麦克斯(苏州)医疗科技有限公司 | 一种图像获取方法及装置 |
CN108168932A (zh) * | 2017-12-15 | 2018-06-15 | 江苏鲁汶仪器有限公司 | 精确定点切片系统及方法 |
CN109115685B (zh) * | 2018-10-30 | 2021-02-09 | 上海交通大学 | 电镜超薄切片辅助定位系统 |
CN110823815A (zh) * | 2019-12-04 | 2020-02-21 | 中国工程物理研究院材料研究所 | 一种用于多点光谱探测的三维自扫描装置 |
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DE3224375C2 (de) * | 1982-06-30 | 1984-09-20 | C. Reichert Optische Werke Ag, Wien | Vorrichtung zur Überprüfung der Qualität des Messers an einem Mikrotom, insbesondere Ultramikrotom |
JP3801697B2 (ja) * | 1996-09-26 | 2006-07-26 | 財団法人神奈川科学技術アカデミー | 組織観察用薄切片試料作製方法 |
JP2002168736A (ja) * | 2000-12-04 | 2002-06-14 | Konica Corp | サンプリング用マイクロヘラ及びその操作方法、マイクロサンプリングシステム及び装置、並びにマイクロサンプルの分析法 |
JP4666504B2 (ja) * | 2006-02-14 | 2011-04-06 | セイコーインスツル株式会社 | 自動薄切装置、自動薄切片標本作製装置及び自動薄切方法 |
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