Integrated circuit chip temperature test device and method
Technical field
The present invention relates to a kind of proving installation, especially a kind of integrated circuit chip temperature test device.The invention still further relates to a kind of method of testing of integrated circuit (IC) chip.
Background technology
Current, if integrated circuit (IC) chip is carried out temperature test, must after to Chip Packaging, can carry out.General temperature test need be realized the evaluation of total temperature (40~170 ℃), has the shortcoming that the cycle is long, expense is high.Nowadays, probe station can be realized the evaluation of total temperature, but existing probe station has only four probes, and wherein two probes must connect power supply and ground, in addition Sheng Xia two probes can only one as input end, another is as output terminal.Yet present most solid-state circuit all needs multichannel input signal ability operate as normal, the regulating networks with multichannel selection that have.So proving installations such as existing probe station can't satisfy the requirement of integrated circuit chip temperature test.
Summary of the invention
Technical matters to be solved by this invention provides a kind of integrated circuit chip temperature test device, and a kind of integrated circuit chip temperature method of testing, it is with low cost, and the test job cycle is short, can be good at satisfying the requirement of existing integrated circuits chip temperature test.
For solving the problems of the technologies described above, the technical scheme of integrated circuit chip temperature test device of the present invention is, comprise four probes, wherein first probe and second probe are connected respectively to power end and earth terminal, the 3rd probe is connected to the input end of analog signal of an analog to digital converter, the digital signal of described analog to digital converter output sends to tested circuit, and four point probe connects externally measured instrument, gathers the detecting information in the tested circuit.
This people also provide a kind of integrated circuit chip temperature method of testing that adopts said apparatus to realize, its technical scheme is, described first probe and described second probe are tested circuit supply, described the 3rd probe is exported control signal in the mode that sends simulating signal, described analog to digital converter becomes digital signal with described analog signal conversion, and sending to described tested circuit, described four point probe is gathered the detecting information in the described tested circuit, and exports to externally measured instrument.
The present invention utilizes the 3rd probe output simulating signal, by analog to digital converter simulating signal is changed into digital signal then, has solved the problem that existing circuit needs the multiple signals input, and with low cost, and the test job cycle is short.
Description of drawings
The present invention is further detailed explanation below in conjunction with drawings and Examples:
Accompanying drawing is the structural representation of integrated circuit chip temperature test device of the present invention.
Embodiment
Integrated circuit chip temperature test device of the present invention, its structure as shown in drawings, comprise four probes, wherein first probe and second probe are connected respectively to power end and earth terminal, the 3rd probe is connected to the input end of analog signal of an analog to digital converter, the digital signal of described analog to digital converter output sends to tested circuit, and four point probe connects externally measured instrument, gathers the detecting information in the tested circuit.
The digital signal output end of described analog to digital converter is connected with a scrambler, after the encoding digital signals of described scrambler with described analog to digital converter, exports to described tested circuit.
The present invention also comprises a kind of integrated circuit chip temperature method of testing of utilizing said apparatus to realize, described first probe and described second probe are tested circuit supply, described the 3rd probe is exported control signal in the mode that sends simulating signal, described analog to digital converter becomes digital signal with described analog signal conversion, and send to described tested circuit, described four point probe is gathered the detecting information in the described tested circuit, and exports to externally measured instrument.
Described analog to digital converter becomes analog signal conversion after the digital signal, and through described scrambler recompile, the digital signal after will encoding then sends to described tested circuit.
For example, a circuit is carried out temperature test, and the output voltage of definite optimum temperature characteristic.Power supply is made voltage scanning at test input after powering on ground, makes analog to digital converter export 4 coding, has 2
4=16 kinds of conditioning signals, these conditioning signals are adjusted the internal resistance network of voltage reference, change output voltage, do above-mentioned test in the total temperature scope, can get 16 temperature curves, determine that at last suitable resistance value obtains the curve of output of optimum temperature characteristic.Realize 7 functions that probe could be realized by 4 probes like this.
In sum, the present invention utilizes the 3rd probe output simulating signal, by analog to digital converter simulating signal is changed into digital signal then, has solved the problem that existing circuit needs the multiple signals input, and with low cost, and the test job cycle is short.