CN101413990B - 一种现场可编程门阵列的测试方法及系统 - Google Patents
一种现场可编程门阵列的测试方法及系统 Download PDFInfo
- Publication number
- CN101413990B CN101413990B CN2008102279790A CN200810227979A CN101413990B CN 101413990 B CN101413990 B CN 101413990B CN 2008102279790 A CN2008102279790 A CN 2008102279790A CN 200810227979 A CN200810227979 A CN 200810227979A CN 101413990 B CN101413990 B CN 101413990B
- Authority
- CN
- China
- Prior art keywords
- test
- node
- test vector
- configuration
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
Description
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2008102279790A CN101413990B (zh) | 2008-12-03 | 2008-12-03 | 一种现场可编程门阵列的测试方法及系统 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2008102279790A CN101413990B (zh) | 2008-12-03 | 2008-12-03 | 一种现场可编程门阵列的测试方法及系统 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101413990A CN101413990A (zh) | 2009-04-22 |
CN101413990B true CN101413990B (zh) | 2010-09-08 |
Family
ID=40594622
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2008102279790A Expired - Fee Related CN101413990B (zh) | 2008-12-03 | 2008-12-03 | 一种现场可编程门阵列的测试方法及系统 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN101413990B (zh) |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101581762B (zh) * | 2009-05-07 | 2011-06-08 | 北京大学 | 面向应用的fpga的延迟故障测试方法及系统 |
CN102116840B (zh) * | 2009-12-30 | 2012-12-05 | 中国科学院沈阳自动化研究所 | 一种基于贪心策略的fpga局部互联测试方法 |
CN102466776B (zh) * | 2010-11-19 | 2013-07-10 | 北京自动测试技术研究所 | 面向复杂可编程逻辑器件的批量测试方法 |
CN102353892A (zh) * | 2011-06-08 | 2012-02-15 | 北京航空航天大学 | 一种基于sram的fpga的lut测试结构及方法 |
CN103163450A (zh) * | 2011-12-16 | 2013-06-19 | 中国科学院微电子研究所 | 一种应用于对特定结构fpga进行测试的导航映射方法 |
US9235460B2 (en) * | 2012-02-27 | 2016-01-12 | Altera Corporation | Methods and apparatus for automatic fault detection |
CN103076559B (zh) * | 2012-12-29 | 2015-02-04 | 东南大学 | 一种针对扫描测试中移位功耗的优化方法 |
CN104020409A (zh) * | 2013-02-28 | 2014-09-03 | 中兴通讯股份有限公司 | 一种自适应配置芯片的方法及装置 |
CN103645435B (zh) * | 2013-12-13 | 2016-03-23 | 电子科技大学 | 多信号模型可编程逻辑器件的软件模块可测性设计方法 |
CN108733552B (zh) * | 2017-04-18 | 2020-12-22 | 北京大学 | 一种fpga远程调试系统及远程调试方法 |
CN107942240B (zh) * | 2017-11-15 | 2020-03-31 | 深圳市紫光同创电子有限公司 | Fpga芯片中dsp模块的功能测试方法及装置 |
CN108107352A (zh) * | 2017-12-06 | 2018-06-01 | 中国电子产品可靠性与环境试验研究所 | Fpga器件测试系统及方法 |
CN109143045B (zh) * | 2018-10-24 | 2024-02-13 | 武汉精鸿电子技术有限公司 | 一种时序及波形生成装置及方法 |
CN111722097B (zh) * | 2020-07-01 | 2022-02-18 | 无锡中微亿芯有限公司 | 一种具有互连测试功能的多裸片fpga |
CN112540766A (zh) * | 2020-12-24 | 2021-03-23 | 山东高云半导体科技有限公司 | 现场可编程门阵列编码方法、装置和系统 |
CN113435149B (zh) * | 2021-06-25 | 2023-08-18 | 无锡中微亿芯有限公司 | 一种优化fpga综合效果的测试例自动生成方法 |
CN114398848B (zh) * | 2022-02-23 | 2024-06-18 | 无锡玖熠半导体科技有限公司 | 一种测试向量生成方法、装置及存储介质 |
CN114859218B (zh) * | 2022-03-16 | 2023-06-23 | 厦门智多晶科技有限公司 | 一种fpga芯片中查找表的检测电路及检测方法 |
CN115684894B (zh) * | 2022-12-29 | 2023-04-07 | 摩尔线程智能科技(北京)有限责任公司 | 芯片可测性设计的测试方法及测试平台 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6470485B1 (en) * | 2000-10-18 | 2002-10-22 | Lattice Semiconductor Corporation | Scalable and parallel processing methods and structures for testing configurable interconnect network in FPGA device |
US6594610B1 (en) * | 2001-02-21 | 2003-07-15 | Xilinx, Inc. | Fault emulation testing of programmable logic devices |
CN101038323A (zh) * | 2007-02-14 | 2007-09-19 | 北京时代民芯科技有限公司 | 五次配置完成fpga可配置逻辑块的测试方法 |
CN101153892A (zh) * | 2007-10-12 | 2008-04-02 | 成都华微电子系统有限公司 | 现场可编程门阵列输入输出模块验证方法 |
-
2008
- 2008-12-03 CN CN2008102279790A patent/CN101413990B/zh not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6470485B1 (en) * | 2000-10-18 | 2002-10-22 | Lattice Semiconductor Corporation | Scalable and parallel processing methods and structures for testing configurable interconnect network in FPGA device |
US6594610B1 (en) * | 2001-02-21 | 2003-07-15 | Xilinx, Inc. | Fault emulation testing of programmable logic devices |
CN101038323A (zh) * | 2007-02-14 | 2007-09-19 | 北京时代民芯科技有限公司 | 五次配置完成fpga可配置逻辑块的测试方法 |
CN101153892A (zh) * | 2007-10-12 | 2008-04-02 | 成都华微电子系统有限公司 | 现场可编程门阵列输入输出模块验证方法 |
Also Published As
Publication number | Publication date |
---|---|
CN101413990A (zh) | 2009-04-22 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN101413990B (zh) | 一种现场可编程门阵列的测试方法及系统 | |
US6996758B1 (en) | Apparatus for testing an interconnecting logic fabric | |
JP4406648B2 (ja) | SoCのための再設定可能なファブリック | |
Stroud et al. | Built-in self-test of logic blocks in FPGAs (Finally, a free lunch: BIST without overhead!) | |
US20170074932A1 (en) | Integrated circuit verification using parameterized configuration | |
Stroud et al. | Evaluation of FPGA resources for built-in self-test of programmable logic blocks | |
CN104865518B (zh) | 一种sram型fpga的clb动态老炼配置方法 | |
CN108319526B (zh) | 基于片上嵌入式微系统及其内部fpga资源内建自测试方法 | |
CN102841306B (zh) | 一种fpga可编程逻辑单元的测试与定位方法 | |
US6983405B1 (en) | Method and apparatus for testing circuitry embedded within a field programmable gate array | |
US8566068B2 (en) | Trace routing network | |
CN100380807C (zh) | 扫描路径电路和包括该扫描路径电路的半导体集成电路 | |
US7779322B1 (en) | Compacting test responses using X-driven compactor | |
CN101464494A (zh) | 一种现场可编程门阵列器件中使用的互连线测试电路 | |
CN104903736A (zh) | 用于动态分配扫描测试资源的电路和方法 | |
CN101581762A (zh) | 面向应用的fpga的延迟故障测试方法及系统 | |
CN116029236B (zh) | 可综合的参数化自测试模型结构及测试方法 | |
CN101398451A (zh) | 一种用于测试背板的快速检测方法 | |
US20050066232A1 (en) | Debug circuit | |
Fernandes et al. | Application of built in self-test for interconnect testing of FPGAs | |
Yang et al. | A new automatic method for testing interconnect resources in FPGAs based on general routing matrix | |
US11688482B2 (en) | Digital circuit testing and analysis module, system and method thereof | |
CN114781304A (zh) | 一种芯片的引脚状态控制方法、系统、芯片以及上位机 | |
US7305636B2 (en) | Method and system for formal unidirectional bus verification using synthesizing constrained drivers | |
Sun et al. | Design and implementation of a parity-based BIST scheme for FPGA global interconnects |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: WUXI INSPEED COMMUNICATIONS CO.,LTD. Free format text: FORMER OWNER: BEIJING UNIV. Effective date: 20140416 |
|
C41 | Transfer of patent application or patent right or utility model | ||
COR | Change of bibliographic data |
Free format text: CORRECT: ADDRESS; FROM: 100871 HAIDIAN, BEIJING TO: 214043 WUXI, JIANGSU PROVINCE |
|
TR01 | Transfer of patent right |
Effective date of registration: 20140416 Address after: Tong Hui Road Beitang District 214043 Jiangsu city of Wuxi Province, No. 436 building 45 Patentee after: Wuxi Inspeed Communications Co.,Ltd. Address before: 100871 Beijing the Summer Palace Road, Haidian District, No. 5 Patentee before: Peking University |
|
ASS | Succession or assignment of patent right |
Owner name: JIANGSU MINLEHUI COMMERCE TECHNOLOGY CO., LTD. Free format text: FORMER OWNER: WUXI INSPEED COMMUNICATIONS CO.,LTD. Effective date: 20141028 |
|
C41 | Transfer of patent application or patent right or utility model | ||
COR | Change of bibliographic data |
Free format text: CORRECT: ADDRESS; FROM: 214043 WUXI, JIANGSU PROVINCE TO: 214045 WUXI, JIANGSU PROVINCE |
|
TR01 | Transfer of patent right |
Effective date of registration: 20141028 Address after: Beitang District Road 214045 Jiangsu Minfeng 198-404 city of Wuxi Province Patentee after: Jiangsu Minle Business Technology Co., Ltd. Address before: Tong Hui Road Beitang District 214043 Jiangsu city of Wuxi Province, No. 436 building 45 Patentee before: Wuxi Inspeed Communications Co.,Ltd. |
|
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20151208 Address after: Tong Hui Road Beitang District 214043 Jiangsu city of Wuxi Province, No. 436 building 45 Patentee after: Wuxi lead Speed Technology Co., Ltd. Address before: Beitang District Road 214045 Jiangsu Minfeng 198-404 city of Wuxi Province Patentee before: Jiangsu Minle Business Technology Co., Ltd. |
|
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20100908 Termination date: 20151203 |
|
EXPY | Termination of patent right or utility model |