CN101363976A - Test fixture and lighting test station using the test fixture - Google Patents
Test fixture and lighting test station using the test fixture Download PDFInfo
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- CN101363976A CN101363976A CNA2008101612512A CN200810161251A CN101363976A CN 101363976 A CN101363976 A CN 101363976A CN A2008101612512 A CNA2008101612512 A CN A2008101612512A CN 200810161251 A CN200810161251 A CN 200810161251A CN 101363976 A CN101363976 A CN 101363976A
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Abstract
The invention discloses a test fixture and a lighting tester stand applying the test fixture. The test fixture is used for fixing a panel to be tested. The test fixture comprises a base, a plurality of drive units and a plurality of moving blocks. The base comprises a frame, and an accommodating space is encircled by the frame. The drive units are arranged on the frame, and each drive unit can individually move on the frame. The moving blocks are arranged corresponding to the containing space, and used for bearing the panel to be tested. Each moving block which can individually move on the containing space is respectively driven by each corresponding drive unit. When a lighting test is carried out to the panel, any one of the moving blocks can individually move to break away from a detection area, while other moving blocks keep bearing the panel, thereby avoiding the phenomenon that the moving blocks influence the detection work of the panel area contacted therewith.
Description
Technical field
The present invention is relevant with measurement jig, particularly about a kind of measurement jig in order to fixing plate assembly to be tested, and the lighting test station of liquid crystal panel.
Background technology
Whether the optical module (for example liquid crystal panel, glass substrate) of dull and stereotyped kenel must exist defective to understand optical module, and carry out further repairing work through detecting after completing.
With the liquid crystal panel is example, when detecting the liquid crystal panel defective, is first to the liquid crystal panel input test signal, makes its pixel start present color.Whether then with the backlight illumination substrate, it is good to observe each pixel one by one by defect detecting device, and this process is called lighting test (Light-on Test).There is defective and presents the bright spot state if find pixel, then need further in addition mark, move under the laser repairing, and repair, eliminate bright spot with laser.
Consult Figure 1 and Figure 2, for being used for the measurement jig of lighting test in the prior art, in order to carry and to test panel to be tested.This measurement jig comprises pedestal 1 and loading plate 2.Pedestal 1 comprises a framework 3, and framework 3 is around forming an accommodation space 4.Transparent carrier plate 2 is provided with corresponding to accommodation space 4.Possess a plurality of pores 5 on the loading plate 2, it can be air-breathing and absorption is carried on the panel on it, with fixed panel in a precalculated position.Backlight 6 and defect detecting device (figure do not show) are displaced into the top and the below of pedestal 1 respectively, and wherein backlight 6 is by the panel dorsal part projection panel pixels that penetrates backlight, and defect detecting device is then observed the whether correct start of each pixel by panel front.
Because need backlight penetrate panel, so loading plate 2 must make with transparent material, could allow backlight by and penetrate panel.Therefore, the material of loading plate 2 is selected to be restricted, and can't freely select the relatively large material loading plate 2 of rigidity.When carrying during large size panel, loading plate 2 can't bear gravity and to lower recess, and then cause panel to bear folding s tress improperly.
Consult shown in Figure 3ly,, must offer pore 5 on the loading plate 2 for fixed panel.When light during by transparent pore because of penetrance and refractive index influence, can cause panel 7 corresponding to the zone around the pore, form the shadow region 2a of ring-type, be arranged in the pixel of this shadow region 2a, meeting be disturbed by shadow region 2a and be difficult for observing, and influences the result that robotization board or personnel judge pixel.If defective just is positioned at shadow region 2a, then defective also can't be detected and be repaired, and causes through lighting test and the panel after repairing, and defectives such as bright spot or pixel start be undesired still can occur.
Summary of the invention
In view of the above problems, the present invention proposes a kind of measurement jig, uses the test of avoiding measurement jig itself to disturb panel, can improve the support of counter plate simultaneously again, avoids panel to bear improper stress.
In order to reach above-mentioned purpose, the present invention proposes a kind of measurement jig, is applied to a lighting test board, is applied to a lighting test board, with fixing substrate to be tested, for example: liquid crystal panel or glass substrate.Measurement jig comprises pedestal, a plurality of driver element and a plurality of movable block.Pedestal comprises a framework, and framework is around forming an accommodation space.Driver element is disposed on the framework, and each driver element can be displaced on the framework individually.Movable block is corresponding to the accommodation space setting, in order to carry panel to be tested.Each movable block is driven by each corresponding driver element respectively, and can be displaced on the accommodation space individually.When panel carried out lighting test, the arbitrary of movable block can move individually, and with the zone of disengaging detection, and other movable block still continues this panel of carrying, avoids movable block to influence the detection operation of its panel zone that contacts.
According to aforesaid measurement jig, the present invention proposes a kind of lighting test station, in order to a liquid crystal panel is carried out lighting test, comprises mobile platform, backlight, measurement jig and defect detecting device.Backlight, measurement jig and defect detecting device all are disposed on the mobile platform, and can relatively move.Measurement jig is in order to carrying and fixing panel to be tested, and backlight is observed penetration region backlight for defect detecting device and whether had defective in order to throw the panel that penetrates backlight.By relatively moving of backlight, measurement jig and defect detecting device, finish the detection of panel.Tester table of the present invention comprises a laser repairing device, is electrically connected at defect detecting device, and moves jointly with defect detecting device, uses when detecting defective correction of the defect at once.
The present invention more proposes a kind of lighting test method of panel defect, and being provides a pedestal earlier, and this pedestal possesses framework and accommodation space, and wherein frame loops is around accommodation space.A plurality of movable blocks then are provided,, and movable block can be displaced in the accommodation space individually corresponding to the accommodation space setting.Panel is placed on the movable block, provide backlight to provide the backlight illumination panel from the dorsal part of panel, observe by defect detecting device whether the backlight irradiation area exists defective on the panel simultaneously, and progressively adjust the relative position of defect detecting device and substrate, make defect detecting device detect the panel All Ranges.When defect detecting device moved to above the faceplate part of movable block carrying, moved on the surface that this movable block is parallel to this panel, away from the part to be detected of panel, so that the light penetration panel of backlight detects for defect detecting device.
According to embodiments of the invention, movable block is to avoid influencing backlight with direct move mode, and by moving of movable block, substrate/panel can be intactly detected, can be observed and be repaired to guarantee all defectives.Therefore simultaneously, movable block need not made with transparent material, can select the work of the material of high rigidity, deforms when avoiding bearing substrate/panel, makes substrate/panel can not bear folding s tress improperly.
Description of drawings
Fig. 1 is the schematic perspective view of prior art measurement jig;
Fig. 2 is the schematic top plan view of prior art measurement jig;
Fig. 3 is in the prior art measurement jig, the local enlarged diagram of panel;
Fig. 4 is the schematic perspective view of an embodiment of measurement jig of the present invention;
Fig. 5 is the amplification schematic perspective view of Fig. 4 driven unit;
Fig. 6 is the side schematic view of Fig. 4 movable block;
Fig. 7, Fig. 8 and Fig. 9 are the schematic top plan view of measurement jig of the present invention;
Figure 10 is the schematic top plan view of another embodiment of measurement jig of the present invention;
Figure 11 is the schematic perspective view of an embodiment of lighting test station of the present invention;
Figure 12 and Figure 13 are the flow chart of steps of lighting test method of the present invention.
[primary clustering symbol description]
1 pedestal, 2 loading plates
3 frameworks, 4 accommodation spaces
5 pore 2a shadow regions
6 backlights, 7 panels
10 pedestals, 11 frameworks
12 accommodation spaces, 13 guide rails
14 tooth bars, 20 driver elements
21 motor seats, 22 motors
23 gears, 30 movable blocks
31 pores, 32 tracheaes
33 diverting valves, 40 gas pump pump apparatus
The 42 air blowing pumpings of 41 vacuum pump
50 positioning components, 51 blocks
52 transmission components, 53 test fingers
60 driver elements, 100 measurement jigs
200 substrates, 300 lighting test stations
310 mobile platforms, 311 first mobile devices
312 second mobile devices 313 the 3rd mobile device
314 portal frames, 320 backlights
330 defect detecting devices, 340 laser repairing devices
400 panel X1 first axle directions
The X2 second axis direction X3 the 3rd axis direction
Embodiment
Fig. 4 is an embodiment of measurement jig of the present invention, and wherein measurement jig 100 is in order to fix a substrate 200 to be detected, for example liquid crystal panel.Measurement jig 100 comprises pedestal 10, a plurality of driver element 20 and a plurality of movable block 30.
Consult Fig. 4 and shown in Figure 5, pedestal 10 comprises a framework 11, and framework 11 is around forming an accommodation space 12.Pedestal 10 comprises two guide rails 13, is arranged at the relative dual side-edge of framework 11 respectively, and framework 11 dual side-edges one of them be provided with tooth bar 14.Each driver element 20 comprises motor seat 21, motor 22 and gear 23.Motor 22 is arranged in the motor seat 21, and gear 23 is connected in the output shaft of motor 22.Gear 23 is driven by motor 22, and meshes with tooth bar 14.Turn gear 23 by motor 22, gear 23 can roll on tooth bar 14, is displaced on the framework 11 along tooth bar 14 and drive driver element 20.The motor 22 of each driver element 20 can individually rotate, so each driver element 20 can individually be displaced on the framework 11.
Consult Fig. 4, Fig. 5 and shown in Figure 6, movable block 30 is long square type block, and its two end is overlapping with two guide rails 13 respectively, and can be displaced into respectively on two guide rails 13, and movable block 30 is provided with corresponding to accommodation space 12.The motor seat 21 of driver element 20 is provided with an end of movable block 30, makes each movable block 30 be subjected to corresponding driver element 20 respectively and drives, and can individually be displaced on the accommodation space 12.In addition, an end of movable block 30 also can be overlapping with one of guide rail 13, and drived unit 20 supports.
Consult Fig. 4, Fig. 5 and shown in Figure 6 again, movable block 30 is in order to carrying substrate to be detected 200 thereon, and moves back and forth in the accommodation space 12 of pedestal 10, to leave the below, zone to be detected of substrate 200.Because driver element 20 can activate individually, therefore when a movable block 30 was moved the adjustment position, other movable block 30 still can be kept motionless with bearing substrate 200.
Consult Fig. 4, Fig. 5 and shown in Figure 6 again, gas pump pump apparatus 40 can comprise vacuum pump 41 and air blowing pumping 42, and wherein vacuum pump 41 is in order to the generation negative pressure of vacuum of bleeding, and air blowing pumping 42 is then in order to provide air-flow to produce malleation.Be provided with one or several pores 31 on each movable block 30, and be provided with one or several tracheaes 32 in the movable block 30, connect each corresponding pore 31 respectively.One end of movable block 30 is provided with diverting valve 33, and a side of diverting valve 33 connects each pore 31 by tracheae 32, and the opposite side of diverting valve 33 then is connected in vacuum pump 41 and air blowing pumping 42, uses so that each pore 31 ejection air-flow or air-breathing.Whether diverting valve 33 can open or cut out each tracheae 32 individually, be unlocked to determine each pore 31.Possess at movable block 30 under the state of a plurality of pores 31, pore 31 can be arranged along the long axis direction of movable block 30, but therefore keying optic placode 200 sizes of each pore 31 and deciding, that is have only the pore 31 that is covered by substrate 200 just to need to open and close its pairing tracheae 32, do not need not special control by pore 31 32 of the pairing tracheaes that substrate 200 covers.By the negative pressure that vacuum pump 31 provides, each pore 31 air-breathing generation negative pressure of vacuum attract substrates 200, with fixing base 200 on movable block 30.When specific movable block 30 moves away the below, zone to be detected of substrate 200, air blowing pumping 32 provides malleation, make the pore 31 ejection air-flows of this movable block 30, and between substrate 200 and movable block 30, form air cushion, or make between substrate 200 and this movable block 30 and form the gap, even also substrate 200 is suspended on this movable block 300, do not make this movable block 30 contact substrates 200 in moving, use and avoid movable block 30 rubbed substrates 200 and cause substrate 200 breakages.In addition, when placement substrate 200 was on measurement jig 100, the pore 31 of each movable block 30 also can spray air-flow earlier to be pre-formed air cushion, substrate 200 is suspended on the movable block 30, after then substrate 200 moved to the precalculated position again, pore 31 just changed into air-breathing, with negative pressure of vacuum fixing base 200.
Consult shown in Figure 4 again, in order to reach correct and to locate substrate 200 apace, measurement jig 100 can comprise a plurality of positioning components 50, and be arranged at movably on the framework 11 of pedestal 10 individually, wherein at least two positioning components 50 are corresponding to the adjacent dual side-edge of substrate 200, use this dual side-edge position, location, and reach this substrate 200 of quick location in the precalculated position.Each positioning component 50 has block 51 and transmission component 52, and transmission component 52 movably is arranged on the framework 11 of pedestal 10, and transmission component 52 can be the manual transmission assembly, or the transmission component of motor, gear and the combination of tooth bar institute.Block 51 is made by nonrigid plastic, is arranged on the transmission component 52, in order to the side of buffering with contact substrate 200.Measurement jig 100 can comprise a plurality of test fingers 53 in addition, be arranged on framework 11 or the positioning component 50, the position of test fingers 53 and quantity cooperate the demand of substrate 200 controls, use when substrate 200 is fixed in the precalculated position, but be electrically connected substrate 200 with the signal contact of test fingers 53 contact substrates 200, present test base 200 needed test signals.
Consult shown in Figure 7ly, when the back side with backlight 320 irradiated substrates 200, and when detecting defectives by substrate 200 is positive, movable block 30 can block its substrate that contacts 200 subregions.
Consult Fig. 8 and shown in Figure 9, when detecting these zones, each movable block 30 is movable to other parts, make travel path backlight can not be subjected to movable block 30 and block, so those regional defects detection operations can be carried out smoothly.Because movable block 30 directly moves to outside the surveyed area, therefore do not block the problem of travel path backlight, or hole causes refraction backlight and forms the problem in shadow region.Therefore, movable block 30 can adopt light tight and possess the material of high rigidity, and does not need with light-permeable but the material of rigidity or undercapacity.
Consult shown in Figure 10ly, be another embodiment of measurement jig of the present invention.Measurement jig 100 is roughly identical with first embodiment, and it comprises pedestal 10, a plurality of driver element 60, a plurality of movable block 30 and gas pump pump apparatus (figure does not show).Each driver element 60 is respectively a pneumatic cylinder, and its two end is connected to an end of pedestal 10 and each movable block 30, and the other end of movable block 30 is hubbed on the guide rail (figure does not show) of pedestal 10.Driver element 60 can move back and forth between two positions by linear activated each movable block 30.When defects detection need be carried out in the zone that movable block 30 is carried, driver element 60 can change the position of movable block 30.
Second embodiment is not limited to motor in order to the power of explanation driver element 30 and 60, also can be pneumatic cylinder, or the linear activated actuated piece of any generation, for example linear lead screw, solenoid valve (solenoid), belt group etc.
Consult shown in Figure 11, embodiment for lighting test station of the present invention, lighting test station 300 carries out lighting test in order to counter plate 400, and it can comprise the disclosed measurement jig 100 of previous embodiment, mobile platform 310, backlight 320, reach defect detecting device 330.
Consult shown in Figure 11ly again, lighting test station 300 can comprise laser repairing device 340 in addition, and it is electrically connected at defect detecting device 330, and moves jointly with defect detecting device 330.When defect detecting device 330 found that there is defective such as bright spot in panels 40, laser repairing device 340 can be launched laser and eliminate this bright spot.Lighting test station 300 application testing tools, 100 carryings panel 400 to be tested, because of can moving separately, movable block 30 changes the position, therefore the interference that can not be subjected to movable block 30 backlight of backlight 320, the particularly interference of pore 31, therefore can find out all defect on the panel 400 effectively, do not hidden file or refraction causes the subregion to detect because of backlight.In addition, laser repairing device 340 is integrated in the lighting test station, more can repair defective immediately, does not need defective is carried out mark or movable panel 400 to the laser preparing board again, simultaneously, repair efficiency also can be confirmed by defect detecting device 330 immediately.
Based on aforesaid lighting test station, the present invention proposes a kind of lighting test method of panel defect, in order to the defective of detection panel, and further with the laser preparing defective.
Consult Figure 12 and shown in Figure 13, this method is that a pedestal 10 (S110) is provided earlier, and pedestal 10 has framework 11 and accommodation space 12, and its middle frame 11 is around accommodation space 12.A plurality of movable blocks 30 then are provided, (S120) are set corresponding to accommodation space 12.Movable block 30 at least one ends are overlapped in the guide rail 13 of framework 11, use that movable block 30 individually is displaced in the accommodation space 12.According to panel 400 length, adjust each movable block 30 relative position, but make movable block 30 support panels 30 (S130).In addition, movable block has at least one pore, in order to air-breathing or ejection air-flow.
Consult shown in Figure 7ly again, panel 400 is placed in (S140) on the movable block 30, to the precalculated position, and make the signal contact (S141) of test fingers touch panel by the positioning component movable panel.Then the pore 31 of movable block 30 carry out air-breathing, produce negative pressure of vacuum attract panel 400 on movable block 30 with fixed panel 400 (S150).The backside illuminated panel 400 (S160) of backlight 320 from panel 400 is provided, and, observes whether backlight 320 irradiation areas exist defective (S170) on the panel 400 by a defect detecting device 330.Progressively adjust the relative position of defect detecting device 330 and panel 400, make defect detecting device 330 detect panel 400 All Rangeses (S180).During the relative position of mobile defect detecting device 330 and panel 400, judge whether defect detecting device 330 moves to the panel 400 parts top of movable block 30 carryings, that is judge whether backlight 320 is moved piece 30 and blocks (S190).If yes, defect detecting device 330 can't detect the shadow region that is blocked and produces because of backlight 320.At this moment, the pore of movable block 30 31 ejection air-flows, air-flow forms air cushion between the surface of the surface of panel 400 and movable block 30, make and produce gap (S191) between movable block 30 and the panel 400.Then (S192) moved on the surface that this movable block 30 is parallel to this panel 400, away from the part to be detected of panel 400, so that the light penetration panel of backlight detects (S170) for defect detecting device.After movable block 30 left zone to be detected, pore 31 stopped to spray air-flow, eliminated the gap (S193) between movable block 30 and the panel 400, and air-breathing again with the absorption fixed panel.When finding that there is defective such as bright spot in panel 400, with laser repairing device 340 correction of the defect places (S200).
Consult shown in Figure 8ly, produce the process in gap, also movable block 30 vertically can be moved apart surface one preset distance of panel 400, and form this gap except forming the air cushions with pore 31 ejection air-flows.
Though the present invention discloses as above with preferred embodiment; right its is not in order to limit the present invention; under the situation that does not deviate from spirit of the present invention and essence thereof; those of ordinary skill in the art work as can make various corresponding changes and distortion according to the present invention, but these corresponding changes and distortion all should belong to the protection domain of the appended claim of the present invention.
Claims (13)
1. a measurement jig is characterized in that, comprises:
One pedestal comprises a framework, and this framework is around forming an accommodation space;
A plurality of driver elements are disposed on this framework, and can be displaced on this framework individually; And
A plurality of movable blocks are provided with corresponding to this accommodation space, and respectively this movable block is driven by corresponding respectively this driver element respectively, and can be displaced into individually on this accommodation space.
2. measurement jig as claimed in claim 1 is characterized in that this pedestal comprises a tooth bar in addition, and this tooth bar is arranged on this framework, and respectively this driver element comprises a motor and a gear in addition, and this gear is driven by this motor, and meshes with this tooth bar.
3. measurement jig as claimed in claim 1 is characterized in that, comprises a guide rail on this pedestal in addition, and this guide rail is arranged on this framework, and respectively an end and this guide rail of this movable block is overlapping, and can be displaced into individually on this guide rail.
4. measurement jig as claimed in claim 1 is characterized in that, also comprises a gas pump pump apparatus and a tracheae, and respectively this movable block then comprises a pore in addition, and this gas pump pump apparatus is connected with this pore by this tracheae.
5. measurement jig as claimed in claim 1 is characterized in that, also comprises a plurality of positioning components, can be displaced into individually to be arranged on this framework, and respectively this positioning component comprises a block in addition.
6. lighting test station is characterized in that it comprises:
One mobile platform;
One backlight is disposed on this mobile platform;
Just like each described measurement jig in the claim 1～5, be disposed on this mobile platform; And
One defect detecting device is disposed on this mobile platform.
7. lighting test station as claimed in claim 6 is characterized in that, this mobile platform comprises:
One first mobile device is arranged on this platform, in order to move this pedestal in a first axle direction;
One portal frame and one second mobile device, this portal frame is arranged on this platform, this second mobile device is arranged on this portal frame, and this second mobile device setting is in order to moving this defect detecting device in one second axis direction, and this first axle direction system crisscrosses this second axis direction; And
One the 3rd mobile device is arranged on this platform, and in order to move this one the 3rd axis direction that comes from backlight, the 3rd axis direction is parallel to this second axis direction.
8. lighting test station as claimed in claim 6 is characterized in that, also comprises a laser repairing device, is electrically connected at this defect detecting device, and moves jointly with this defect detecting device.
9. the lighting test method of a panel defect is characterized in that, comprises:
One pedestal is provided, comprises a framework, and this framework is around forming an accommodation space;
A plurality of movable blocks are provided, are provided with corresponding to this accommodation space;
One panel is placed on these a plurality of movable blocks;
Provide a backlight to shine this panel;
Between a movable block of those movable blocks and this panel, produce a gap; And
Move on the surface that this movable block is parallel to this panel.
10. the lighting test method of panel defect as claimed in claim 9 is characterized in that, also comprises:
Eliminate this gap;
Observe a defective of this panel; And
Repair this defective.
11. the lighting test method of panel defect as claimed in claim 9 is characterized in that this movable block comprises a pore in addition, corresponding to this panel.
12. the lighting test method of panel defect as claimed in claim 11 is characterized in that, the generation step in this gap comprises from this pore and sprays an air-flow, to form an air cushion between the surface of the surface of this panel and this movable block.
13. the lighting test method of panel defect as claimed in claim 9 is characterized in that, the generation step in this gap comprises surface one preset distance that this movable block is vertically moved apart this panel.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200810161251A CN100578301C (en) | 2008-09-24 | 2008-09-24 | Test fixture and lighting test station using the test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200810161251A CN100578301C (en) | 2008-09-24 | 2008-09-24 | Test fixture and lighting test station using the test fixture |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101363976A true CN101363976A (en) | 2009-02-11 |
| CN100578301C CN100578301C (en) | 2010-01-06 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN200810161251A Expired - Fee Related CN100578301C (en) | 2008-09-24 | 2008-09-24 | Test fixture and lighting test station using the test fixture |
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| CN (1) | CN100578301C (en) |
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| CN102436082A (en) * | 2010-08-24 | 2012-05-02 | 日本麦可罗尼克斯股份有限公司 | Checking apparatus for flat plate-like device under test |
| CN102789075A (en) * | 2012-07-26 | 2012-11-21 | 北京京东方光电科技有限公司 | Lighting jig for detecting liquid crystal panels |
| CN103698913A (en) * | 2013-12-18 | 2014-04-02 | 京东方科技集团股份有限公司 | Backlight source lighting-on jig |
| CN105259685A (en) * | 2015-11-27 | 2016-01-20 | 武汉华星光电技术有限公司 | Test fixture applied to liquid crystal display module |
| WO2016173030A1 (en) * | 2015-04-30 | 2016-11-03 | 深圳市华星光电技术有限公司 | Detecting installation device for liquid crystal display panel |
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| CN102436082A (en) * | 2010-08-24 | 2012-05-02 | 日本麦可罗尼克斯股份有限公司 | Checking apparatus for flat plate-like device under test |
| CN102789075A (en) * | 2012-07-26 | 2012-11-21 | 北京京东方光电科技有限公司 | Lighting jig for detecting liquid crystal panels |
| CN102789075B (en) * | 2012-07-26 | 2015-03-11 | 北京京东方光电科技有限公司 | Lighting jig for detecting liquid crystal panels |
| CN103698913A (en) * | 2013-12-18 | 2014-04-02 | 京东方科技集团股份有限公司 | Backlight source lighting-on jig |
| CN103698913B (en) * | 2013-12-18 | 2016-05-04 | 京东方科技集团股份有限公司 | A kind of backlight lighting jig |
| WO2016173030A1 (en) * | 2015-04-30 | 2016-11-03 | 深圳市华星光电技术有限公司 | Detecting installation device for liquid crystal display panel |
| WO2017016010A1 (en) * | 2015-07-29 | 2017-02-02 | 深圳市华星光电技术有限公司 | Auxiliary device for liquid crystal panel detection |
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| CN108550337B (en) * | 2018-06-13 | 2023-12-29 | 深圳市深科达智能装备股份有限公司 | Automatic module lighting jig carrier |
| CN108550337A (en) * | 2018-06-13 | 2018-09-18 | 深圳市深科达智能装备股份有限公司 | The automatic lighting jig microscope carrier of module |
| CN108983454A (en) * | 2018-08-01 | 2018-12-11 | 惠科股份有限公司 | A kind of test device and test equipment |
| CN109799629A (en) * | 2019-03-07 | 2019-05-24 | 昆山龙腾光电有限公司 | Testing device of display panel and test method |
| CN110530616A (en) * | 2019-09-02 | 2019-12-03 | 武汉鑫联兴精密机电有限公司 | A kind of optical platform accurately measuring correction mechanism with levelness |
| CN110557496B (en) * | 2019-10-22 | 2020-12-22 | 国网福建省电力有限公司福州供电公司 | Communication equipment testing device |
| CN110557496A (en) * | 2019-10-22 | 2019-12-10 | 唐伟 | Communication equipment testing device |
| CN112693896A (en) * | 2020-12-22 | 2021-04-23 | 苏州科韵激光科技有限公司 | Glass carrying platform of display panel |
| CN113820877A (en) * | 2021-11-22 | 2021-12-21 | 深圳市伟盛丰科技有限公司 | Lighting test jig with quick replacement function |
| CN114815339A (en) * | 2022-05-17 | 2022-07-29 | 厦门特仪科技有限公司 | Off-line lighting equipment suitable for LCD screens of different sizes |
| CN114815339B (en) * | 2022-05-17 | 2023-09-26 | 厦门特仪科技有限公司 | Offline lighting device applicable to LCD screens of different sizes |
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