CN101196842A - Electric power loop test method - Google Patents
Electric power loop test method Download PDFInfo
- Publication number
- CN101196842A CN101196842A CN 200610157375 CN200610157375A CN101196842A CN 101196842 A CN101196842 A CN 101196842A CN 200610157375 CN200610157375 CN 200610157375 CN 200610157375 A CN200610157375 A CN 200610157375A CN 101196842 A CN101196842 A CN 101196842A
- Authority
- CN
- China
- Prior art keywords
- measured
- board
- main control
- control computer
- tested
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Landscapes
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
A power circuit test method is provided, which comprises the following steps: setting test times; controlling closure of a relay; recording current test times; judging whether a machine station to be tested is in a working state under electrifying; if judging yes, a power switch of the machine station to be tested is controlled to be disconnected; judging whether a machine station to be tested is not in a working state under electrifying; if judging yes, the power switch of the machine station to be tested is controlled to be closed; judging whether a machine station to be tested is in a working state under electrifying; if judging yes, a warm start switch of the machine station to be tested is controlled; judging whether the warm start of the machine station to be tested is normal; if judging yes, the relay is controlled to be disconnected; judging whether the recorded test times reach to the set test times; if judging yes, the machine station to be tested is tested qualified and the process is finished. By adopting the power circuit test method, the invention can conduct power circuit test on the machine station to be tested, namely conduct the tests of alternating current and direct current as well as warm start to upgrade the test efficiency of the test of consumer electronic products before leaving the factory.
Description
Technical field
The present invention relates to a kind of loop test method, relate in particular to the relevant electric power loop test method of a kind of computing machine.
Background technology
In consumption electronic products tests, the electric power loop test is the project of must surveying of electronic product test such as computing machine, and it is related to reliability of products and stability, is the precondition of electronic product reliability and stability.At present, most of consumption electronic products all are to use AC (Alternating Current, alternating current) power supply, therefore, general test jobs just comprises AC test, DC (Direct Current, direct current) test and warm start (Warm Boot or Reboot) test.Three kinds of tests all need to carry out, thereby to testing in stability, quality and serviceable life that consumption electronic products use.
Yet above three kinds of tests at present are to carry out respectively, and basic need relies on and manually finish, in case and the test duration longer, testing time is more, the manual error that occurs is just bigger.Such as, when carrying out the AC test, need artificial closure/disconnection AC power supplies, and need to observe product when closure/disconnection AC power supplies, whether be in the test case of duty of energising work/not, if reach the test jobs of a few hours, artificial efficient just generally reduces, and fault rate just improves greatly, can't guarantee the efficient of test jobs.
Summary of the invention
In view of above content, be necessary to provide electric power loop test method, can carry out the automatic test of AC, DC and warm start to different consumption electronic products, promote testing efficiency.
A kind of electric power loop test method, this method is utilized a main control computer, connects the single-chip microcomputer of this main control computer, is reached the relay that connects this single-chip microcomputer, the board to be measured that is connected to power supply by described relay is carried out the electric power loop test jobs, and this method may further comprise the steps: A. sets the testing time that board to be measured is tested by main control computer; B. main control computer sends a control signal to single-chip microcomputer, the pilot relay closure; C. main control computer is noted the number of times when Pretesting; D. whether main control computer is in the energising duty after judging board energized to be measured; E. if be in the energising duty after the board energized to be measured, then main control computer sends a control signal to single-chip microcomputer, and the power switch of controlling board to be measured disconnects; F. main control computer judges after the power switch of board to be measured disconnects whether be in the not duty of switching on; G. if the power switch of board to be measured is in the not duty of switching on after disconnecting, then main control computer sends a control signal to single-chip microcomputer, controls the power switch closure of board to be measured; H. whether main control computer is in the energising duty after judging the power switch closure of board to be measured; I. if be in the energising duty after the power switch closure of board to be measured, then main control computer sends a control signal to single-chip microcomputer, controls the thermally-actuated switch of board to be measured; J. main control computer judges whether board warm start to be measured is normal; K. if board warm start to be measured is normal, then main control computer sends a control signal to single-chip microcomputer, and pilot relay disconnects; L. main control computer judges whether the testing time of record reaches the testing time of setting; Reach M. if the testing time of record reaches the testing time of setting, board test passes then to be measured finishes whole flow process.
Compare prior art, utilize electric power loop test method provided by the present invention, can carry out the electric power loop test jobs to a plurality of different consumption electronic products simultaneously, promptly carry out the automatic test of AC, DC and warm start simultaneously, promoted the dispatch from the factory testing efficiency of Pretesting of consumption electronic products.
Description of drawings
Fig. 1 is the applied environment figure of electric power loop test method better embodiment of the present invention.
Fig. 2 is the method flow diagram of electric power loop test method better embodiment of the present invention.
Embodiment
As shown in Figure 1, be the applied environment figure of electric power loop test method better embodiment of the present invention.It comprises: main control computer 10, connect the single-chip microcomputer 20 of this main control computer 10, connect the board 30 a plurality of to be measured of main control computer 10, connect the relay 40 of single-chip microcomputers 20 by multichannel output module 2 by multichannel load module 1.And described a plurality of board 30 to be measured connects power supply 50 by described relay 40.
Described main control computer 10 be can installation and operation software PC, notebook computer or server, be used for whole hardware structure is carried out the master control operation, realize electric power loop test jobs, i.e. AC, DC and warm start test jobs to board 30 to be measured.
Described single-chip microcomputer 20 is a MCU (Micro-programmed Control Unit, microprogram control unit), be used to receive the control signal that main control computer 10 sends, thereby the closure/disconnection of pilot relay 40, control board 30 to be measured power switch 301 closure/disconnection and control thermally-actuated switch 302.
Described board to be measured 30 can be PC, notebook computer, server, household appliances consumption electronic products such as (as televisor, refrigerators).
Described relay 40 is the gate-controlled switches that are used to control board 30 to be measured and power supply 50 disconnection/connections.
Described power supply 50 is 30 workable power supplys of board to be measured, generally speaking, provides the AC power supplies of 220 or 110 volts of voltages.And before the test beginning, board 30 to be measured and power supply 50 are "on" positions not, and promptly relay 40 is off-states, and the power switch 301 of board to be measured 30 is closure states, therefore when board 30 to be measured just often, energized 50 can be in the energising duty.
As shown in Figure 2, be the method flow diagram of electric power loop test method better embodiment of the present invention.This method may further comprise the steps:
Set the testing time that board 30 to be measured is tested by main control computer 10.This testing time is generally set as required, if PC, then can set testing time is 500 times (step S21) such as, board 30 to be measured.
During the test beginning, main control computer 10 sends AC and controls signal to single-chip microcomputer 20, pilot relay 40 closures.50 pairs of board 30 power supplies to be measured of relay 40 closed back power supplys, if board to be measured 30 is normal, then this board 30 to be measured can be in the energising duty.(step S22).
At this moment, main control computer 10 is noted the number of times when Pretesting.Promptly be recorded as this moment the 1st time (step S23).
If multichannel load module 1 receives the information that board 30 to be measured is in the energising duty, then main control computer 10 sends DC and controls signal to single-chip microcomputer 20, and the power switch 301 of controlling board 30 to be measured disconnects.Such as, for PC, power switch 301 promptly is that PC goes up Power Button button, this button is connected on the PC working power, press to be in PC energising and when being in open state and close PC energising duty button, open PC energising duty button and press to be in the PC energising and when being in not open state.The control signal that main control computer 10 sends is an analogue-key signal, makes single-chip microcomputer 20 disconnect by multichannel output module 2 controls board 30 power switches 301 to be measured, thereby makes board 30 to be measured be in to switch on not duty (step S25).
Be in energising but the information of duty not if multichannel load module 1 receives board 30 to be measured, then main control computer 10 sends DC and controls signal to single-chip microcomputer 20, controls power switch 301 closures (step S27) of board 30 to be measured.
If multichannel load module 1 receives the information that board 30 to be measured is in the energising duty, then main control computer 10 sends warm start and controls signal to single-chip microcomputer 20, controls the thermally-actuated switch 302 of board 30 to be measured.This control signal is an analogue-key signal equally, for PC, the duty that is equivalent to switch on is pressed reset key or Ctrl, Alt, Delete Macintosh, for other type board 30 to be measured, is equivalent to press and restarts button (step S29).
Whether normally main control computer 10 is surveyed the detecting information of board 30 to be measured, by the warm start detecting information of multichannel load module 1 reception board 30 to be measured, when board 30 promptly to be measured is in the energising duty, judge its warm start (step S210).
If receiving board 30 to be measured, multichannel load module 1 is in the normal information of warm start when switching on duty, then main control computer 10 sends AC and controls signal to single-chip microcomputer 20, pilot relay 40 disconnects, and promptly disconnects be connected (the step S211) of board 30 to be measured and power supply 50.
Further, in step S24, step S26, step S28 and step S210, if multichannel load module 1 can't receive AC, DC, the warm start detecting information of board 30 correspondences to be measured, then main control computer 10 shows the testing time and the test-types of current test crash.For example, when testing the 120th time, during execution in step S28, multichannel load module 1 can't receive the DC detecting information, promptly can't receive board 30 to be measured be in the energising duty information, illustrate that then board to be measured is defective, at this moment, main control computer 10 demonstrates the DC test failure (step S213) that board 30 to be measured carries out the 120th when test.
Claims (4)
1. electric power loop test method, it is characterized in that, this method is utilized a main control computer, connects the single-chip microcomputer of this main control computer, is reached the relay that connects this single-chip microcomputer, the board to be measured that is connected to power supply by described relay is carried out the electric power loop test jobs, and this method may further comprise the steps:
A. set the testing time that board to be measured is tested by main control computer;
B. main control computer sends a control signal to single-chip microcomputer, the pilot relay closure;
C. main control computer is noted the number of times when Pretesting;
D. whether main control computer is in the energising duty after judging board energized to be measured;
E. if be in the energising duty after the board energized to be measured, then main control computer sends a control signal to single-chip microcomputer, and the power switch of controlling board to be measured disconnects;
F. main control computer judges after the power switch of board to be measured disconnects whether be in the not duty of switching on;
G. if the power switch of board to be measured is in the not duty of switching on after disconnecting, then main control computer sends a control signal to single-chip microcomputer, controls the power switch closure of board to be measured;
H. whether main control computer is in the energising duty after judging the power switch closure of board to be measured;
I. if be in the energising duty after the power switch closure of board to be measured, then main control computer sends a control signal to single-chip microcomputer, controls the thermally-actuated switch of board to be measured;
J. main control computer judges whether board warm start to be measured is normal;
K. if board warm start to be measured is normal, then main control computer sends a control signal to single-chip microcomputer, and pilot relay disconnects;
L. main control computer judges whether the testing time of record reaches the testing time of setting; And
M. if the testing time of record reaches the testing time of setting, board test passes then to be measured finishes whole flow process.
2. electric power loop test method as claimed in claim 1 is characterized in that, if the judged result of described step D, F, H and J is that then main control computer does not show the testing time and the test-types of current test crash.
3. electric power loop test method as claimed in claim 2 is characterized in that, if the judged result of described step L is then returned step B for not.
4. electric power loop test method as claimed in claim 1 is characterized in that, described board to be measured is a kind of of personal computer, notebook computer, server, televisor, refrigerator.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN 200610157375 CN101196842A (en) | 2006-12-08 | 2006-12-08 | Electric power loop test method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN 200610157375 CN101196842A (en) | 2006-12-08 | 2006-12-08 | Electric power loop test method |
Publications (1)
Publication Number | Publication Date |
---|---|
CN101196842A true CN101196842A (en) | 2008-06-11 |
Family
ID=39547273
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN 200610157375 Pending CN101196842A (en) | 2006-12-08 | 2006-12-08 | Electric power loop test method |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN101196842A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102540105A (en) * | 2011-12-31 | 2012-07-04 | 曙光信息产业股份有限公司 | Method for testing AC and DC on/off machines |
CN102736012A (en) * | 2011-04-02 | 2012-10-17 | 鸿富锦精密工业(深圳)有限公司 | System and method for testing direct current circuit |
CN104486162A (en) * | 2014-12-22 | 2015-04-01 | 上海斐讯数据通信技术有限公司 | Automatic on-off test system and test method thereof |
CN106685753A (en) * | 2016-12-02 | 2017-05-17 | 曙光信息产业(北京)有限公司 | Automated test method and device for simulating server cluster startup |
CN110162434A (en) * | 2019-04-11 | 2019-08-23 | 深圳市同泰怡信息技术有限公司 | A kind of test fixture and its test method of server A C on-off |
CN110632500A (en) * | 2019-09-24 | 2019-12-31 | 闻泰科技(无锡)有限公司 | Method and system for judging electronic equipment condition through detection device |
-
2006
- 2006-12-08 CN CN 200610157375 patent/CN101196842A/en active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102736012A (en) * | 2011-04-02 | 2012-10-17 | 鸿富锦精密工业(深圳)有限公司 | System and method for testing direct current circuit |
CN102540105A (en) * | 2011-12-31 | 2012-07-04 | 曙光信息产业股份有限公司 | Method for testing AC and DC on/off machines |
CN104486162A (en) * | 2014-12-22 | 2015-04-01 | 上海斐讯数据通信技术有限公司 | Automatic on-off test system and test method thereof |
CN106685753A (en) * | 2016-12-02 | 2017-05-17 | 曙光信息产业(北京)有限公司 | Automated test method and device for simulating server cluster startup |
CN110162434A (en) * | 2019-04-11 | 2019-08-23 | 深圳市同泰怡信息技术有限公司 | A kind of test fixture and its test method of server A C on-off |
CN110632500A (en) * | 2019-09-24 | 2019-12-31 | 闻泰科技(无锡)有限公司 | Method and system for judging electronic equipment condition through detection device |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI386672B (en) | Method for power cycle testing | |
CN101615104B (en) | System for switching hard disks and switching method | |
US7231553B2 (en) | System and method for testing computing devices | |
CN101196842A (en) | Electric power loop test method | |
US20070021848A1 (en) | Testing system and related method for testing an electronic device by determining a power on/off signal | |
CN101436154B (en) | Startup and closedown test system and method of computer mainboard | |
US7831860B2 (en) | System and method for testing redundancy and hot-swapping capability of a redundant power supply | |
CN101551770B (en) | Hot plug testing device and method | |
US8093755B2 (en) | Uninterruptible power supply with wireless communication of detected data | |
CN102419719A (en) | Computer system and method for starting same | |
CN102577021B (en) | Mobile terminal device, power supply system, and power supply method and power supply program for mobile terminal device | |
KR101739501B1 (en) | A power saving method of a computer system | |
CN209543136U (en) | The test device and test equipment of the controller of vehicle | |
CN109490763B (en) | Universal testing device and testing method for single board of relay | |
CN100377132C (en) | Communication device and control method thereof | |
CN105510755A (en) | Testing device | |
CN103135728B (en) | Power supply start-up control method and system thereof | |
CN112948186B (en) | Detection device and detection method of interface signal | |
CN103257867B (en) | Control method, electronic equipment and electronic installation | |
US9281713B2 (en) | System and method for electricity management | |
US20040189341A1 (en) | Power-on self test for a computer system | |
CN211148837U (en) | Outer quick-witted testing arrangement of air conditioner | |
CN114123457A (en) | Power supply method, device and equipment | |
CN102209333A (en) | Power supply control method and equipment | |
CN101946382A (en) | Switching device and method for operating same |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C12 | Rejection of a patent application after its publication | ||
RJ01 | Rejection of invention patent application after publication |
Open date: 20080611 |