CN101154054B - 基板曝光装置及照明装置 - Google Patents
基板曝光装置及照明装置 Download PDFInfo
- Publication number
- CN101154054B CN101154054B CN2007101360837A CN200710136083A CN101154054B CN 101154054 B CN101154054 B CN 101154054B CN 2007101360837 A CN2007101360837 A CN 2007101360837A CN 200710136083 A CN200710136083 A CN 200710136083A CN 101154054 B CN101154054 B CN 101154054B
- Authority
- CN
- China
- Prior art keywords
- light
- mentioned
- integrator
- optical system
- exposure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Links
- 238000005286 illumination Methods 0.000 title claims description 10
- 239000000758 substrate Substances 0.000 title abstract description 10
- 230000003287 optical effect Effects 0.000 claims abstract description 91
- 230000005540 biological transmission Effects 0.000 claims description 4
- 238000003384 imaging method Methods 0.000 description 12
- 230000014509 gene expression Effects 0.000 description 9
- 239000004065 semiconductor Substances 0.000 description 7
- 230000015572 biosynthetic process Effects 0.000 description 4
- 230000002093 peripheral effect Effects 0.000 description 4
- 238000000926 separation method Methods 0.000 description 3
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000012467 final product Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70283—Mask effects on the imaging process
- G03F7/70291—Addressable masks, e.g. spatial light modulators [SLMs], digital micro-mirror devices [DMDs] or liquid crystal display [LCD] patterning devices
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70066—Size and form of the illuminated area in the mask plane, e.g. reticle masking blades or blinds
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70075—Homogenization of illumination intensity in the mask plane by using an integrator, e.g. fly's eye lens, facet mirror or glass rod, by using a diffusing optical element or by beam deflection
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Abstract
Description
Claims (8)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006-270173 | 2006-09-30 | ||
JP2006270173A JP4511502B2 (ja) | 2006-09-30 | 2006-09-30 | 基板露光装置 |
JP2006270173 | 2006-09-30 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101154054A CN101154054A (zh) | 2008-04-02 |
CN101154054B true CN101154054B (zh) | 2011-04-20 |
Family
ID=39134625
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2007101360837A Active CN101154054B (zh) | 2006-09-30 | 2007-07-17 | 基板曝光装置及照明装置 |
Country Status (5)
Country | Link |
---|---|
US (1) | US7755741B2 (zh) |
JP (1) | JP4511502B2 (zh) |
CN (1) | CN101154054B (zh) |
DE (1) | DE102007038704B4 (zh) |
HK (1) | HK1121536A1 (zh) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8215776B2 (en) * | 2009-01-07 | 2012-07-10 | Eastman Kodak Company | Line illumination apparatus using laser arrays |
CN103293863B (zh) * | 2012-02-24 | 2015-11-18 | 上海微电子装备有限公司 | 一种光刻照明系统 |
CN111025605B (zh) * | 2019-12-25 | 2021-09-28 | 辽宁中蓝光电科技有限公司 | 一种自由曲面广角摄像镜头 |
CN113189780B (zh) * | 2021-04-21 | 2023-03-24 | 吉林省长光瑞思激光技术有限公司 | 一种可实现激光圆方光斑变化的光路整形系统 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5335044A (en) * | 1992-02-26 | 1994-08-02 | Nikon Corporation | Projection type exposure apparatus and method of exposure |
US6583937B1 (en) * | 1998-11-30 | 2003-06-24 | Carl-Zeiss Stiftung | Illuminating system of a microlithographic projection exposure arrangement |
CN1639845A (zh) * | 2002-07-03 | 2005-07-13 | 日立比亚机械股份有限公司 | 照明方法和曝光方法及其装置 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60232552A (ja) * | 1984-05-02 | 1985-11-19 | Canon Inc | 照明光学系 |
JPH05217855A (ja) * | 1992-02-01 | 1993-08-27 | Nikon Corp | 露光用照明装置 |
JP3701694B2 (ja) * | 1994-03-08 | 2005-10-05 | 株式会社トプコン | 照明光学系 |
JP2001500628A (ja) * | 1996-02-28 | 2001-01-16 | ケニス シー ジョンソン | マイクロリトグラフィ用マイクロレンズスキャナ及び広フィールド共焦顕微鏡 |
JPH09325275A (ja) * | 1996-06-04 | 1997-12-16 | Canon Inc | 照明装置及びそれを用いた投影露光装置 |
US6563567B1 (en) * | 1998-12-17 | 2003-05-13 | Nikon Corporation | Method and apparatus for illuminating a surface using a projection imaging apparatus |
DE60035710T2 (de) | 2000-02-16 | 2007-12-06 | Asml Holding, N.V. | Zoom-beleuchtungssystem zur verwendung in der photolithographie |
JP2001255665A (ja) * | 2000-03-14 | 2001-09-21 | Fuji Photo Film Co Ltd | 画像露光装置 |
US6960035B2 (en) * | 2002-04-10 | 2005-11-01 | Fuji Photo Film Co., Ltd. | Laser apparatus, exposure head, exposure apparatus, and optical fiber connection method |
US6876494B2 (en) * | 2002-09-30 | 2005-04-05 | Fuji Photo Film Co., Ltd. | Imaging forming apparatus |
JP4450689B2 (ja) * | 2003-07-31 | 2010-04-14 | 富士フイルム株式会社 | 露光ヘッド |
JP4401802B2 (ja) | 2004-02-04 | 2010-01-20 | キヤノン株式会社 | カメラ |
WO2005109098A1 (en) * | 2004-05-12 | 2005-11-17 | Fuji Photo Film Co., Ltd. | Pattern forming material, pattern forming apparatus, and pattern forming process |
US7251020B2 (en) * | 2004-07-30 | 2007-07-31 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7085066B2 (en) * | 2004-08-20 | 2006-08-01 | Panavision International, L.P. | Anamorphic imaging system |
-
2006
- 2006-09-30 JP JP2006270173A patent/JP4511502B2/ja active Active
-
2007
- 2007-07-17 CN CN2007101360837A patent/CN101154054B/zh active Active
- 2007-08-16 US US11/839,863 patent/US7755741B2/en active Active
- 2007-08-16 DE DE102007038704.2A patent/DE102007038704B4/de active Active
-
2008
- 2008-09-23 HK HK08110555.8A patent/HK1121536A1/xx not_active IP Right Cessation
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5335044A (en) * | 1992-02-26 | 1994-08-02 | Nikon Corporation | Projection type exposure apparatus and method of exposure |
US6583937B1 (en) * | 1998-11-30 | 2003-06-24 | Carl-Zeiss Stiftung | Illuminating system of a microlithographic projection exposure arrangement |
CN1639845A (zh) * | 2002-07-03 | 2005-07-13 | 日立比亚机械股份有限公司 | 照明方法和曝光方法及其装置 |
Also Published As
Publication number | Publication date |
---|---|
US7755741B2 (en) | 2010-07-13 |
US20080079921A1 (en) | 2008-04-03 |
DE102007038704A1 (de) | 2008-04-03 |
HK1121536A1 (en) | 2009-04-24 |
DE102007038704B4 (de) | 2020-07-02 |
JP2008089935A (ja) | 2008-04-17 |
CN101154054A (zh) | 2008-04-02 |
JP4511502B2 (ja) | 2010-07-28 |
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Address after: Kanagawa Patentee after: Via Mechanics Ltd. Address before: Kanagawa Patentee before: Hitachi Bia Macine Co., Ltd. |
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Effective date of registration: 20180508 Address after: Tokyo, Japan, Japan Patentee after: Adrian Engineering Technology Co. Ltd. Address before: Kanagawa Patentee before: Via Mechanics Ltd. |
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