CN101137165B - 测量宽带码分多址系统下行链路功控信干比的方法和装置 - Google Patents
测量宽带码分多址系统下行链路功控信干比的方法和装置 Download PDFInfo
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Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
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CN1234713A (zh) * | 1998-03-26 | 1999-11-10 | 朗迅科技公司 | 用于无线通信系统中频率间越区切换的方法和装置 |
CN1264969A (zh) * | 2000-03-11 | 2000-08-30 | 深圳市中兴通讯股份有限公司 | 通信系统中基于插入导频符号的信干比估测方法和装置 |
CN1349319A (zh) * | 2000-10-13 | 2002-05-15 | 深圳市中兴通讯股份有限公司 | 一种wcdma系统中信干比估测方法和装置 |
CN1756413A (zh) * | 2004-09-30 | 2006-04-05 | 中兴通讯股份有限公司 | 一种宽带码分多址系统上行链路的sir测量方法 |
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Publication number | Priority date | Publication date | Assignee | Title |
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CN1234713A (zh) * | 1998-03-26 | 1999-11-10 | 朗迅科技公司 | 用于无线通信系统中频率间越区切换的方法和装置 |
CN1264969A (zh) * | 2000-03-11 | 2000-08-30 | 深圳市中兴通讯股份有限公司 | 通信系统中基于插入导频符号的信干比估测方法和装置 |
CN1349319A (zh) * | 2000-10-13 | 2002-05-15 | 深圳市中兴通讯股份有限公司 | 一种wcdma系统中信干比估测方法和装置 |
CN1756413A (zh) * | 2004-09-30 | 2006-04-05 | 中兴通讯股份有限公司 | 一种宽带码分多址系统上行链路的sir测量方法 |
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Effective date of registration: 20151111 Address after: Dameisha Yantian District of Shenzhen City, Guangdong province 518085 Building No. 1 Patentee after: SHENZHEN ZTE MICROELECTRONICS TECHNOLOGY CO., LTD. Address before: 518057 Nanshan District high tech Industrial Park, Guangdong, South Road, science and technology, ZTE building, legal department Patentee before: ZTE Corporation |
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Application publication date: 20080305 Assignee: Xi'an Chris Semiconductor Technology Co. Ltd. Assignor: SHENZHEN ZTE MICROELECTRONICS TECHNOLOGY CO., LTD. Contract record no.: 2019440020036 Denomination of invention: Method and device for measuring WCDMA system downlink power controlled signal-interference ratio Granted publication date: 20100616 License type: Common License Record date: 20190619 |