CN101091245B - 半导体器件中不同部件界面间的层及其制造方法、具有该层的半导体器件及其制造方法 - Google Patents
半导体器件中不同部件界面间的层及其制造方法、具有该层的半导体器件及其制造方法 Download PDFInfo
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Abstract
本发明涉及在半导体器件(10)中不同部件(5,6)界面(2)间的层(1)、及其制造方法。为了这个目的,一部件(5)具有电路载体(11)的表面(3)作为界面(2),并且另一部件(6)具有塑料封装模塑料(9)的接触表面(4)作为界面(2)。在这种情况下该粘附促进层(1)是聚合链分子和碳纳米管混合物。
Description
技术领域
本发明涉及半导体器件中不同部件界面间的层及其制造方法。这样的层试图有助于改进半导体器件中塑料封装模塑料与半导体器件中相关的表面和/或界面的先前不充分粘附,尤其是由于这样的不充分粘附情况导致失效增加和故障风险在半导体器件中发生,其可能导致器件失效,特别是就器件技术指标而言。
背景技术
以前有时会尝试利用机械预处理,使与塑料封装模塑料形成界面的电路载体表面的变粗糙,或者利用物理-化学方法来实现不同部件界面的互锁改进,例如等离子体刻蚀。基于无机和金属化合物的具有粘附促进层的电解涂层也不能得到预期的结果。无论如何,以前的粘附促进方法,例如等离子体刻蚀,都非常地昂贵且不能对模塑模塑料粘附产生任何有效的改进并且仍然受限于电学传导表面的制备。
但是,现代电路载体不仅具有金属化布线结构而且还具有由电路载体的载体材料形成的塑料表面。在这些区域也存在塑料封装模塑料和电路载体材料之间的剥离风险。特别的危害是这些界面的湿气渗透,其结果是,当半导体器件焊接在高级电路板上时,所谓的“爆米花(POPCORN)”效应可能发生,涉及半导体器件部件,特别是塑料封装部分,从电路载体表面爆脱。
发明内容
本发明的目的在于提供一种能被应用于半导体器件不同部件界面间的层,其决定性地提高界面间粘附性。
该目的通过以下技术方案来实现。还包括技术所述技术方案的有益的改进。
依照本发明,提供设置在半导体器件中不同部件界面间的层,一个部件包括电路载体的表面作为界面,和另一个部件包括塑料封装模塑料的接触表面作为界面。在这种情况中,该层包括聚合链分子和碳纳米管的混合物。
具有聚合链分子和碳纳米管混合物的这种层的优势在于,该层在原则上能设置在广泛的多种材料的表面上,工艺简单并带来低材料成本。该层又具有如下优势:
1.在覆盖该层的所有表面上的塑料封装模塑料的粘附性明显改善;
2.使应用该层的所有金属表面上的侵蚀缓慢,该层有助于金属表面的稳定;
3.通过方法的适当选择有目标的、选择性的涂覆。这可以例如通过对准目标的掩模,或者通过用溶剂、激光烧蚀或其他机械移除方法选择性剥离的全区域涂覆来实现;
4.通过碳纳米管的百分比例有目的地调整该层的电和热传导率。
这种粘附改善层不但能利用外延生长碳纳米管而且能通过添加或者应用合成物层来制造,该合成物层主要包括聚合物和碳纳米管,优选在涂覆(coating)操作之后。浸没、喷洒、刷涂等等在这里都可以想到作为涂覆操作。尤其最好的涂覆形式是运用打印机的喷墨方法进行涂覆。这甚至允许在应用半导体芯片之后,以极细微的精确度涂覆粘附促进层。丝网印刷也适合涂覆该粘附促进剂层。
在本发明的一个优选实施例中,前述的碳纳米管的比例ΔV是1%的体积≤ΔV≤10%的体积,其余由聚合链分子构成。这具有的优势是一方面这样的低比例不会显著地增加这层的成本,而且另一方面不会引起经由碳纳米管的导电性和/或短路。此外,碳纳米管的这种低比例具有的优势是,该聚合链能在纳米管的内部和外部延伸,并且因此在该层中存在碳纳米管和聚合链分子紧密的互连。这种互联同时实现了这样的效果,即塑料封装模塑料在具有这种层的表面上的锚定增加。因此,通过包含碳纳米管的层防止了两个界面之间机械连接的撕掉或脱层。
在本发明进一步的实施例中,假设碳纳米管具有纳米量级的直径d,优选1.2nm≤d≤300nm。具有这样小直径的这些碳纳米管的一个优势是,有可能实现非常小的层厚度。因此,碳纳米管使得1.5nm≤d≤300nm的层厚度成为可能,如果该层具有多壁碳纳米管,优选10nm≤d≤30nm。
在单壁碳纳米管的情况下,甚至可能达到1.5nm以下的层厚度。因此,用单壁碳纳米管,更薄的层能被实现,特别是由于这些单壁碳纳米管具有0.6nm≤d≤1.8nm的直径。
另外,碳纳米管具有低密度的优势,其在1.33至1.4g/cm2接近于塑料封装模塑料的密度。碳纳米管的抗拉强度在大约1011Pa,比在塑料的情况下多大约几个数量级。因此,塑料模塑料的接触表面和具有碳纳米管的层之间脱层的风险降低。特别由于考虑到材料的不同膨胀系数,在高热负载下,碳纳米管的高抗拉强度与常规结构相比给粘附促进层带来更大的张力负载承载能力和抗剪强度。
而且,设想使用的碳纳米管的长度l在几十纳米至几个微米的数量级。因为,虽然它们的长度在10nm至几个μm之间,但是碳纳米管不具有任何晶界,它们的可形变能力和弹性明显更大,并且在晶界处裂口或形成微裂纹事实上不可能。因此,其中设置有碳纳米管的粘附促进层具有抗完全、可变形和弹性的锚,其不但能够在塑料封装模塑料中而且能在金属表面之上,也可在塑料或环氧树脂表面上,形成锚定。
在本发明进一步的实施例中,该层形成为多于一层并且具有基层,该基层具有镍、铁、钼、钴或其合金之一。该基层具有的优势在于,它包括用作形成碳纳米管的催化剂的金属。因此,在该基层之上的另外一层可以包括从碳纳米管的种子(seeds)形成的碳纳米管。这种包括基层和具有碳纳米管的层的双层的层具有的优势是,其能够与塑料封装模塑料的界面紧密地互锁。
另外,可在基层之上形成具有碳纳米管和聚合链分子混合物的层作为第二层,这在塑料封装模塑料开始与该层界面接触之前进行。具有碳纳米管和有机底料(primer)的聚合链分子的混合物的第二层,可以具有这两个结构的紧密互连,并且因此提供了粘附改善效应。
在本发明进一步的优选实施例中,该层由三层构成,包括基层、具有碳纳米管的层和具有聚合链分子的层。在这种情况下,该聚合链分子可以已经是塑料封装模塑料的链分子。这种三层的形式具有的优势是,可以在没有热应力形成的情况下,实现到塑料封装模塑料的转变。
在这种粘附改善中间层情况下的热传导也是对半导体器件的改善有决定性贡献的因素。对于碳纳米管,已经发现在高达6000W/m°K,热传导率实际上是钻石的两倍。另外,特别是粘附促进中间层的抗断强度能通过多壁碳纳米管而进一步提高。
如以上已经提及,对于作为电路载体上的层中的粘附改善颗粒的应用,这种多壁碳纳米管的直径d是1.5nm≤d≤300nm。优选,提供的碳纳米管的直径d为10nm≤d≤30nm。这样的优点在于碳纳米管层可以用在电路载体之上,其中该碳纳米管层依靠许多碳纳米管来抵抗沿两界面的多层连接的撕裂而产生增强的锚定。为了这个目的,在本发明进一步的优选实施例中,碳纳米管可以柱状方式在界面间排列。
本发明更进一步的一个方面涉及包括具有前述成分的层的部件的半导体器件。这样的半导体器件的特征还在于,该层设置在电路载体之上,该电路载体部分地配备有这种层。这种局部涂层考虑到的事实是,电路载体某些区域希望用于称为“焊盘”的接触端子区域,这些区域进入材料接合金属连接,并且因此必须保持没有包含碳纳米管的层。
而且,存在这样的半导体器件,其所具有的电路载体具有用于应用半导体芯片背面的区域。于是,电路载体的这些区域也保持没有该绝缘粘附促进层,特别是如果想得到欧姆接触的情况下。因此,该层优选用作半导体器件中电路载体与塑料封装模塑料间的粘附促进剂。为了这个目的,该层设置在作为电路载体的布线衬底上,该布线衬底具有塑料载体材料和/或陶瓷载体材料的表面和布线线路的结构化金属表面。依照本发明的改善粘附的层能容易地选择性地应用于这些不同的材料,而前述区域没有所述粘附改善层。
在本发明进一步优选的应用中,该层设置在作为电路载体的引线框架之上,该引线框架包括具有金属表面的内部引线,该层设置在其上。确切地说,为了在进一步的工艺中内部引线不从塑料封装模塑料中被扯掉,这种内部引线集要强连接到塑料封装模塑料。也希望能使湿气进入并最终导致半导体器件失效的微裂纹,一定不出现在塑料封装模塑料和内部引线之间的界面处。
而且,包括陶瓷衬底的电路载体可以配备有粘附促进层,其优势在于它们可以特别应用于高频器件和用于千兆和百亿赫兹范围之内的高频的集成电路。
而且,该电路载体可以包括塑料绝缘底板并代表半成品,该塑料优选为纤维增强的环氧树脂,许多半导体芯片设置在其上并且借助于碳纳米管层连接到塑料封装模塑料。在这种情况下,有利的是,具有碳纳米管的粘附促进层不仅设置于绝缘底板之上和互连之上,而且覆盖半导体芯片并且甚至在连接元件之上提供涂层。
制造半导体器件中的不同部件界面间的层的方法具有以下方法步骤。首先,制造半导体器件的电路载体,其表面承载半导体芯片且其界面用塑料模塑料密封。随后,将一个层选择性地应用于电路载体的界面,该界面至少涂覆有碳纳米管和聚合链分子。这种方法具有的优势在于,该具有碳纳米管的层只应用于电路载体的与塑料封装模塑料接触的位置,所以一方面这涉及非常低的材料消耗,并且另一方面必须容纳电连接线和/或半导体芯片的该电路载体区域保持自由。
优选地,为了选择性的应用该层于电路载体界面,电路载体表面区域被提供了一保护层。该保护层应用于要保护使其不被涂覆粘附促进层的区域,由此随后,在应用了保护层之后,电路载体可以浸入包含碳纳米管的悬浮液。在这种浸入方法的情况下,已经安装到电路载体之上并且没有被保护层保护的一切都被涂覆了相应的碳纳米管粘附层。该保护层本身在应用粘附促进层之后被移除。
在另一优选的制造层的方法中,通过将种子(seed)的悬浮液用来形成碳纳米管,借助于液相使用碳纳米管。这种液相应用于先前选择性地应用的催化剂材料涂层,确切地说催化剂材料涂层是包括金属镍、铁、钼、钴或其合金之一的层。为了这个目的,该溶液优选具有碳富勒烯(carbonfullerene)用作形成碳纳米管的种子,碳富勒烯已知是小石墨球的形式,且形成单壁六边形结构的球形石墨图案。
在被应用作为基层的催化材料的影响下,这些富勒烯产生碳纳米管作为悬浮液中的固体物质。在该工艺中,所述种子可以与合成树脂低聚物混合并且,随着溶液的热处理,随后形成相互啮合的碳纳米管和合成树脂链状分子,它们紧密互连。
另外,这样的具有碳纳米管的层可以通过使用印刷技术而形成:将碳纳米管的适当前体应用于电路载体,其之后转化成碳纳米管。在这种情况下也可能例如将具有碳纳米管前体的悬浮溶液与溶剂中的适当的催化金属颗粒混合,其之后作为悬浮液或溶液依靠印刷技术选择性地被应用到电路载体表面。
碳纳米管前体到碳纳米管网状物的转变最终是通过低温处理得到的。制作含碳纳米管的粘附促进层之后,所述溶剂和包含在溶剂中的催化元素可以通过清洗步骤从电路载体移除。
一种制造在不同部件界面间具有层的半导体器件的方法,一个部件包括电路载体的表面作为界面,另一部件包括塑料封装模塑料的接触表面作为界面,该方法具有以下方法步骤。首先,粘附促进层通过例如之前描述的方法被选择性地应用到电路载体上,该电路载体上有许多半导体器件的位置。随后,在不具有这样的粘附促进层的区域中将半导体芯片固定电路载体上。在这之后,在半导体芯片和在半导体器件位置处的电路载体上没有涂层的接触端子区域之间建立电连接。最后,半导体芯片和电连接被置入塑料模塑料,同时,该塑料封装模塑料同时应用于电路载体的有涂层界面。
塑料模塑料的应用可以依靠注模技术实行,其也称为“模塑”或“模塑技术”。这种方法具有的优势是塑料封装模塑料应用于电路载体,通过应用碳纳米管粘附促进层,在塑料层和电路载体间有可能产生改善的粘附性,所以在界面中的脱层和微裂纹被避免。塑料封装模塑料的应用可以依靠常规的注模技术实行。
特别有利的是改变该方法以达到如下程度:具有碳纳米管的粘附促进层只在电路载体、半导体芯片和连接元件已经连接之后应用,所以半导体芯片的表面和连接的表面也通过浸入方法、喷洒方法和/或喷墨印刷方法涂覆这样的粘附促进层。
因此有可能在半导体芯片和电路载体间的电连接建立之前或之后,来涂覆具有半导体芯片的电路载体,该涂覆利用聚合物有机物质和功能性有机分子或其他载体材料的溶液进行,其在涂覆聚合物层之后反应并交联,按照需要质量百分比从0.1到5%的碳纳米管可混合到该聚合物层中。除了浸入技术之外,涂覆方法也可以包括喷洒、滴涂(drip coating)或丝网印刷。
在随后应用塑料封装模塑料固化涂层之后,该层导致与塑料封装模塑料的粘附得到明显的改进,利用两个效应:第一,通过有机层和塑料封装模塑料相互作用的化学和物理效果;第二,环氧低聚物流入碳纳米管孔洞的机械锚定。而且,聚合物层的粘附促进表面区域通过引入碳纳米管而得到增加。
结果,具有碳纳米管的层和塑料封装模塑料之间的结合强度可能比以前的没有引入纳米管的有机粘附促进涂层更大。
而且,有目的的热导率调节可以依靠所包含的碳纳米管的百分比例实现,或者如果需要,如果需要在粘附促进层上电化学沉积金属结构,也能产生导电性。然而,导电性只能在超过纳米管的渗透阈值(percolationthreshold)的时候获得。
总起来说,使用了纳米管的如下优势:第一,增加涂层的机械强度,第二,减少湿气吸收,第三,减小热膨胀系数,并因此减小热应力,且第四,有可能得到具有小于5nm的纳米管的超薄涂层,来更好以及更均匀地结合(integration)塑料封装模塑料的聚合物基质。
附图说明
本发明现在根据随附的附图详细解释。
附图1示出具有依照本发明第一实施例的层的半导体器件的截面示意图;
附图2到10示出具有依照本发明第一实施例的层的半导体器件的制造略图;
附图2示出浸入涂覆之前的具有保护层的电路载体的截面示意图;
附图3示出依照附图2的电路载体的浸入涂覆的原理图;
附图4示出单壁碳纳米管的透视示意图;
附图5示出包括碳纳米管的悬浮覆盖层的电路载体的截面示意图;
附图6示出附图5的电路载体在从覆盖层蒸发溶剂后的截面示意图;
附图7示出应用了塑料模塑料的依照附图6的电路载体的截面示意图;
附图8示出依照附图2的电路载体应用了依据本发明的层之后和移除保护层之后的截面示意图;
附图9示出依照附图8的电路载体在应用接触端子区域之后、在固定半导体芯片之后以及在半导体芯片接触表面连接到电路载体接触端子区域之后的截面示意图;
附图10示出电路载体应用了塑料封装模塑料之后的半导体器件的截面示意图;
附图11示出具有不同粘附促进层的界面的抗剪强度的对照;
具体实施方式
附图1示出的是具有依照本发明第一实施例的层1的半导体器件10的截面示意图。在本发明第一实施例中,半导体器件10建立在电路载体11上,其从引线框12穿孔输出(punch out)。该引线框12具有外部引线18用作外部接触19以及与半导体芯片14连接的内部引线13。在这种情况下,内部引线13由塑料封装模塑料9支持,该模塑料9具有相对于粘附促进层1的界面2的接触表面4。内部引线13具有表面3,其部分地涂覆有粘附促进层1。
半导体芯片14在没有涂层的表面区域15上被内部引线13之一承载,且同样嵌入塑料封装模塑料9中。在本发明的该实施例中,半导体芯片14的表面不具有粘附促进层。但是,作为第一部件5的内部引线13的剩余表面3,完全涂覆有粘附促进层1。为了这个目的,层1包含碳纳米管,其一方面促进与第二部件6(也即塑料封装模塑料9)的链型分子的互锁,并且使在电路载体11上的塑料封装模塑料9的机械锚定成为可能。
附图2到10示出具有依照本发明第一实施例的层的半导体器件的制造略图。与附图1功能相同的部件在附图2到10中具有相同的标号且不分别说明。
附图2示出浸没涂覆之前的具有保护层24的电路载体11的截面示意图。电路载体11也是引线框12的一部分且具有内部引线13,内部引线13的表面3在局部没有保护层24,以便在其上沉积依据本发明的粘附促进层。没有保护层24的内部引线13的所有表面3,可以通过附图3中示出的浸没方法涂覆有悬浮液。
附图3示出附图2的电路载体11的浸没涂覆的原理图。为了这个目的,提供容器20,其在顶部纵向开口且充满碳纳米管8和聚合链分子7的悬浮液21。当在箭头A的方向上将选择性涂覆了保护层的引线框12浸入容器20时,在保护层的上侧上和引线框12未保护的表面上,形成几个纳米厚到几个微米厚的碳纳米管8和聚合链分子7,它们互连并且在引线框12拔出时形成包括溶剂、碳纳米管8和聚合链分子7的悬浮夜的初始涂层。
附图4示出的是具有六边形排列的碳原子C的单壁碳纳米管8的三维略图。该六个碳原子C的六边形排列对应于已知的苯环,其代表碳原子C的优选结构,为了稳定环的目的,每个环中双电子键旋转,这样促进了碳纳米管8的导电性。长度l可以从几十纳米延伸到几十微米。附图4示出的单壁碳纳米管8的直径d的范围是0.6到1.8nm。在多层碳纳米管的情况下,同轴排列的圆柱形壁一个套入另一个,所以多层碳纳米管8可以达到从1.5nm到300nm的直径。在本发明的该实施例中,该碳纳米管8的优选直径范围是10nm≤d≤30nm。
附图5示出具有悬浮液涂层21的电路载体11的截面示意图,该涂层21包括碳纳米管8。该悬浮液涂层21使不具有保护层的电路载体11的表面3变湿,并具有随粘合剂一起的挥发性溶剂,其在浸没涂覆之后加热电路载体11时蒸发。
附图6示出电路载体11在从悬浮液涂层21蒸发溶剂后的截面示意图,如附图5中所示。包括粘合剂和碳纳米管8的剩余涂层22,由于碳纳米管8的结构而具有相对不规则裂开的表面23,如附图4中所示。包括聚合链分子7的塑料封装模塑料9,在箭头E的方向上以粘性状态应用到表面23。在该工艺中,可发生聚合链分子7与涂层22的碳纳米管8的紧密互连。
附图7示出应用了塑料封装模塑料9的依照附图6的电路载体11的截面示意图。在这种情形下,该塑料封装模塑料9的聚合链分子7已经与涂层22的碳纳米管8紧密地互连,所以产生塑料封装模塑料9在电路载体11的表面3上的强锚定。
附图8示出依照附图2的电路载体11在应用了依据本发明的层1之后和在去除保护层24之后的截面示意图,象附图2所示的那样。在这种情况下,外部引线1 8保持没有粘附促进层1,在内部引线13上受保护的接触端子区域17同样地保持没有粘附促进层1。在该方法的情况下,内部引线13的表面区域15也保持没有粘附促进层且能接收半导体芯片。
附图9示出在应用金属涂层到接触端子区域17之后,在内部引线13之上固定半导体芯片14之后,并且在半导体芯片14的接触区域25与金属化接触端子区域17之间建立电连接16之后,依照附图8的电路载体11的截面示意图。在本发明该实施例中不需要把嵌入塑料模塑料中的所有部件都浸入涂覆,在下一步骤中,塑料封装模塑料是通过注模(injectionmolding)技术涂覆。另一方面,在部件安装时只进行所有部件的浸没涂覆,以便半导体芯片和半导体芯片与电路载体之间的电连接也能可靠地锚定于塑料封装模塑料中。
附图10示出电路载体11应用了塑料封装模塑料9之后的半导体器件10的截面示意图。在这种情况下,内部引线13完全嵌入塑料封装模塑料9中,达到它们不承载半导体芯片14的程度,并且因此同时机械连接到塑料封装模塑料9。在该过程中,附图5、6和7描述的机制发生在电路载体11和塑料封装模塑料9之间的界面2。
附图11示出具有不同粘附促进层的界面2的抗剪强度的比较的图表。为了这个目的,以N/mm2为单位的抗剪强度绘制在图表的y轴上,并且没有碳纳米管的粘附促进层以柱30、31和32描绘在x轴上。作为对比,以柱40、41和42表示具有碳纳米管的涂层。
在没有纳米管涂层的柱30、31和32的情况下,抗剪强度从最初的稍大于8N/mm2,随着机械负载(柱31)和热负载(32)的增加而减小了大约20%,对应于柱40、41和42的提供了碳纳米管的涂层增加了它自身的抗剪强度,在机械负载(柱41)和热负载(42)下,从最初的大于8N/mm2(柱40)到大于10N/mm2。因此,依照本发明的层证明了优于常规粘附促进措施,所述层具有比例在1%体积≤ΔV≤10%体积的碳纳米管,其余部分包括聚合链分子。
施加热循环时抗剪强度的增长又展示了用于该层的这种新颖材料的粘附性相对于常规粘附促进层的改善。这种令本领域技术人员惊讶的热负载变化下的增长,如附图11中的柱42所示,可归因于依照本发明的该层中,随着热负载和粘附促进效应从聚合链分子移动到碳纳米管,聚合链分子和碳纳米管之间的互连增加。
Claims (24)
1.一种在半导体器件(10)中不同部件(5,6)的界面(2)之间的层,一个部件(5)包括电路载体(11)的表面(3)作为界面(2)且另一部件(6)包括塑料封装模塑料(9)接触表面(4)作为界面(2),并且该层(1)包括聚合物和碳纳米管(8)的混合物。
2.如权利要求1的层,特征在于该层(1)中碳纳米管(8)的比例ΔV是1%体积≤ΔV≤10%体积,其余为聚合链分子(7)。
3.如权利要求1或权利要求2的层,特征在于碳纳米管(8)具有纳米数量级的直径(d)。
4.如权利要求1或权利要求2要求的层,特征在于该碳纳米管(8)的直径d为1.2nm≤d≤300nm。
5.如权利要求1要求的层,特征在于碳纳米管(8)具有几十纳米到几个微米数量级的长度(1)。
6.如权利要求1要求的层,特征在于该层(1)形成为多于一层且具有基层,该基层具有金属镍、铁、钼、钴或所述各金属的合金之一。
7.如权利要求6的层,特征在于该层(1)具有在基层之上的具有碳纳米管(8)的层。
8.如权利要求6或权利要求7的层,特征在于该层(1)具有在基层之上的具有混合物的层,该混合物包括碳纳米管(8)和聚合链分子(7)。
9.如权利要求6或权利要求7要求的层,特征在于该层(1)具有在基层之上的具有碳纳米管(8)的层和具有聚合链分子(7)的层。
10.如权利要求1要求的层,特征在于由塑料封装模塑混合物(9)的链分子组成该层的聚合物。
11.如权利要求1要求的层,特征在于该层(1)的碳纳米管(8)具有垂直于所述界面(2)排列的柱状结构。
12.一种包括具有前述权利要求之一的层(1)的部件的半导体器件。
13.如权利要求12的半导体器件,特征在于该半导体器件(10)具有电路载体(11),在该电路载体上部分地提供该层(1)。
14.如权利要求1到11之一的层作为电路载体(11)与塑料封装模塑料(9)之间的半导体器件(10)中的粘附促进剂的用途。
15.如权利要求14的用途,特征在于该层(1)设置在作为电路载体(11)的布线衬底之上,该布线衬底具有塑料载体材料和/或陶瓷载体材料的表面(3)以及布线线路的结构化金属表面(3)。
16.如权利要求14的用途,特征在于该层(1)设置在作为电路载体(11)的引线框(12)之上,该引线框(12)包括具有金属表面(3)的内部引线(13),该内部引线上设置该层(1)。
17.一种制造在半导体器件(10)中不同部件(5,6)的界面(2)之间的层(1)的方法,该方法具有以下方法步骤:
制造半导体器件(10)的电路载体(11),其具有承载半导体芯片(14)的表面(3)和用塑料封装模塑料(9)密封的界面(2);
选择性地将该层(1)应用于该电路载体(11)的界面(2),所述界面(2)至少用碳纳米管(8)和聚合链分子(7)涂覆。
18.如权利要求17的方法,特征在于,为了选择性地将所述层(1)应用于该电路载体(11)的界面(2),为要被保护而不被应用所述层(1)的该电路载体(11)的表面区域(15)提供保护层(24),且其特征在于该电路载体(11)随后浸入包括碳纳米管(8)的悬浮液(21)。
19.如权利要求18的方法,特征在于该保护层(24)在应用所述层(1)之后除去。
20.如权利要求17到19之一的方法,特征在于,为了选择性地将所述层(1)应用于该电路载体(11)的界面(2),应用催化材料层。
21.如权利要求20要求的方法,特征在于,该催化材料层为包括金属镍、铁、钼、钴或所述各金属的合金之一的层。
22.如权利要求20的方法,特征在于将具有碳纳米管(8)的种子并具有合成树脂低聚物的溶液应用到具有催化金属的该催化材料层(1),并且随后,热处理该溶液,形成相互啮合的碳纳米管(8)和合成树脂的聚合链分子(7)。
23.一种制造在不同部件(5,6)的界面(2)之间具有层(1)的半导体器件(10)的方法,一个部件(5)包括电路载体(11)的表面(3)作为界面(2),且另一部件(6)包括塑料封装模塑料(9)的接触表面(4)作为界面(2),并且该层(1)包括聚合链分子(7)和碳纳米管(8)的混合物,该方法具有如下方法步骤:
制造半导体器件(10)的电路载体(11),其具有承载半导体芯片(14)的表面(3)和用塑料封装模塑料(9)密封的界面(2);
以权利要求17到22之一所述的方法,选择性地将层(1)应用于该电路载体(11)的界面(2),
将半导体芯片(14)应用于该电路载体(11),
在该半导体芯片(14)和该电路载体(11)的没有涂层的接触端子区域(17)间建立电连接(16),
将该半导体芯片(14)和所述电连接(16)嵌入塑料封装模塑料(9)中,同时将该塑料封装模塑料(9)应用于该电路载体(11)的被涂覆的界面(2)。
24.如权利要求23的方法,特征在于通过注模技术,将该半导体芯片(14)和所述电连接(16)嵌入塑料封装模塑料(9)中,以及将该塑料封装模塑料(9)应用于被涂覆的界面(2)。
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PCT/DE2005/001722 WO2006034696A2 (de) | 2004-09-30 | 2005-09-28 | Schicht zwischen grenzflächen unterschiedlicher komponenten in halbleiterbauteilen, sowie verfahren zu deren herstellung |
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DE102010001711A1 (de) * | 2010-02-09 | 2011-08-11 | Robert Bosch GmbH, 70469 | Halbleiter-Bauelement und entsprechendes Herstellungsverfahren |
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