CN100543487C - Proving installation and method of testing - Google Patents
Proving installation and method of testing Download PDFInfo
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- CN100543487C CN100543487C CNB200710097920XA CN200710097920A CN100543487C CN 100543487 C CN100543487 C CN 100543487C CN B200710097920X A CNB200710097920X A CN B200710097920XA CN 200710097920 A CN200710097920 A CN 200710097920A CN 100543487 C CN100543487 C CN 100543487C
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Abstract
A kind of proving installation and method of testing.Proving installation is in order to test an electronic package.Electronic package has a flexible circuit board, and proving installation comprises a test board, a supporting seat and at least one thimble.Test board has at least one connection pad.Supporting seat is in order to bearing test plate and electronic package.Thimble is arranged on the supporting seat, and between test board and flexible circuit board.Thimble has one first end and one second end, and first end is in order to electrically connect connection pad, and second end is in order to electrically connect flexible circuit board.
Description
Technical field
The invention relates to a kind of proving installation and method of testing, and particularly relevant for a kind of proving installation and method of testing of electronic package.
Background technology
Along with development of science and technology, the precision of electronic product improves constantly.In electronic product manufacturing process, must be through a series of test procedure, to guarantee the quality of electronic product.
Generally speaking, electronic product is made up of many electronic packages, for example display panel, master control circuit board or key control circuit plate etc.For the convenience of spatial design, often carry connector (Connector) between the electronic package, with the connection between convenient each electronic package with flexible circuit board (Flexible Printed Circuits Board, FPC Board).
Please refer to Fig. 1, it illustrates the synoptic diagram of a kind of conditional electronic assembly 800 and test board 910.Electronic package 800 has a flexible circuit board 810.Flexible circuit board 810 comprises one first connector 820.Test board 910 comprises one second connector 912.In the test process of electronic package 800, at first first connector 820 is docked with second connector 912.Then, provide appropriate signals by test board 910 again, to test.
Generally speaking, in order to ensure the quality of electronic package 800, repeatedly test through regular meeting.Test event each time may be identical, also may be inequality.Yet the connect-disconnect life of first connector 820 and second connector 912 is about 20～50 times, and after repeatedly plugging, mechanicalnesses take place easily for first connector 820 and second connector 912 damages.
In addition, owing to have certain adhesion between first connector 820 and second connector 912, often improper in the process of separating first connector 820 and second connector 912 because of the application of force, and tear flexible circuit board 810.
Above-mentioned test mode causes the damage of first connector 820, second connector 912 or flexible circuit board 810, not only often causes test result to lose efficacy, and more influences the quality after electronic package 800 dispatches from the factory.Therefore, how to provide a proving installation and method of testing,, become an important directions of present research and development to overcome above-mentioned variety of problems.
Summary of the invention
The invention relates to a kind of proving installation and method of testing, it utilizes thimble to electrically connect test board and connector, makes the spoilage of connector and setting flexible circuit board therebetween significantly to reduce.
A purpose according to the present invention is to provide a kind of proving installation, in order to test an electronic package.Electronic package has a flexible circuit board (Flexible Printed Circuits Board, FPC Board), and proving installation comprises a test board, a supporting seat and at least one thimble.Test board has at least one connection pad.Supporting seat is in order to bearing test plate and electronic package.Thimble is arranged on the supporting seat, and between test board and flexible circuit board.Thimble has one first end and one second end, and first end is in order to electrically connect connection pad, and second end is in order to electrically connect flexible circuit board.
According to another object of the present invention is to provide a kind of method of testing, in order to test an electronic package.Electronic package has a flexible circuit board (Flexible Printed Circuits Board, FPC Board).Method of testing comprises: a test board (a) is provided, and test board has a connection pad; (b) thimble is set between test board and flexible circuit board, thimble has one first end and one second end, and first end is in order to electrically connect connection pad, and second end is in order to electrically connect flexible circuit board; And (c) input one test signal is to test board, and test signal also inputs to electronic package via thimble and flexible circuit board, with the test electronic package.
For foregoing of the present invention can be become apparent, preferred embodiment cited below particularly, and conjunction with figs. are described in detail below.
Description of drawings
Fig. 1 illustrates the synoptic diagram of a kind of conditional electronic assembly and test board;
Fig. 2 A illustrates the synoptic diagram according to the proving installation of first embodiment of the invention;
Fig. 2 B illustrates the partial enlarged drawing of the dashed region 2B of Fig. 2 A;
Fig. 3 illustrates the side view of connector, thimble and the test board of Fig. 2 A;
The electronic package that Fig. 4 illustrates Fig. 2 A is placed in the stereographic map of proving installation;
The electronic package that Fig. 5 illustrates Fig. 2 A is placed in the side view of proving installation;
The synoptic diagram of the state that the proving installation that Fig. 6 illustrates Fig. 4 closes at cover plate;
Fig. 7 A～Fig. 7 B illustrates the action synoptic diagram of connector, thimble and the test board of Fig. 2 A;
Fig. 8 illustrates the process flow diagram of the method for testing of the first embodiment of the present invention; And
Fig. 9 illustrates the synoptic diagram according to the proving installation of second embodiment of the invention.
Wherein, Reference numeral is:
100,200: proving installation
110,910: test board
111: connection pad
120,220: supporting seat
121: locating slot
122: draw-in groove
123: pickup groove
124: the upper support seat
125: the lower support seat
127: storage tank
127a: right angle
127b: arc-shaped notch
130: thimble
131: the first ends
132: the second ends
140,240: cover plate
142: trip
150: holder
229: the second magnet assemblies
249: the first magnet assemblies
700,800: electronic package
710,810: flexible circuit board
712: connector
713: electrical contact point
820: the first connectors
912: the second connectors
D1: first distance
D2: second distance
D3: the 3rd distance
D4: the 4th distance
B2: dashed region
Embodiment
First embodiment
Please refer to Fig. 2 A, it illustrates the synoptic diagram according to the proving installation 100 of first embodiment of the invention.Proving installation 100 is in order to test an electronic package 700.Electronic package 700 has a flexible circuit board (Flexible Printed Circuits Board, FPC Board) 710.Proving installation 100 comprises a test board 110, a supporting seat 120 and at least one thimble 130.In the present embodiment, supporting seat 120 by a upper support seat 124 and once supporting seat 125 formed.Test board 110 has at least one connection pad 111.Supporting seat 120 is in order to bearing test plate 110 and electronic package 700.Thimble 130 is arranged on the upper support seat 124, and between test board 110 and flexible circuit board 710.Thimble 130 has one first end 131 and one second end, 132, the first ends 131 in order to electrically connect connection pad 111, the second ends 132 in order to electrically connect flexible circuit board 710.
In the present embodiment, electronic package 700 is that example is done explanation with a display panel.The test event of proving installation 100 comprises color correctness, response time, character display effect, has or not the degree of bad point or video noise etc.In test process, can select different test board 110 for use according to different test events, perhaps by the different test signal of same test board 110 inputs.
Shown in Fig. 2 A, lower support seat 125 has a pickup groove 123, in order to fixing test plate 110 in a precalculated position, and the restriction test board 110 can't move in X-direction and Y direction.Preferably, test board 110 is fixed in the pickup groove 123 in sealed mode, moves to avoid test board 110.Same test board 110 can be reused corresponding to a plurality of electronic packages 700.That is to say that test board 110 can be set up in pickup groove 123, and does not need often to dismantle test board 110.
In addition, please be simultaneously with reference to Fig. 2 A and Fig. 3, Fig. 3 illustrates the side view of connector 712, thimble 130 and the test board 110 of Fig. 2 A.Shown in Fig. 2 A, flexible circuit board 710 has a connector (Connector) 712.As shown in Figure 3, connector 712 has at least one electrical contact point 713, in order to electrically connect second end 132.
In the present embodiment, proving installation 100 comprises a plurality of thimbles 130, and connector 712 has a plurality of electrical contact points 713, and test board 110 has a plurality of connection pads 111.These thimbles 130 are held on the holder 150, and first end 131 of each thimble 130 is corresponding to each connection pad 111, and second end 132 of each thimble 130 is corresponding to each electrical contact point 713.
Wherein, electrically contact point 713 can be the interior metal contact of connector 712 or the metallic circuit that connector 712 peripheries are exposed.The deviser can select suitable electrical contact point 713 for use according to the structure of connector 712.That is to say that electronic package 700 does not need extra change design, can test.
And test board 110 only need remove connector (as second connector 912 of Fig. 1) originally can expose connection pad 111, does not need the design of extra changed test plate 110.
Please refer to Fig. 2 B, it illustrates the partial enlarged drawing of the dashed region 2B of Fig. 2 A.Upper support seat 124 has a locating slot 121, in order to alignment connector 712.Locating slot 121 restriction connectors 712 can't move in X-direction and Y direction.In addition, thimble 130 also is fixed in the locating slot 121.
As Fig. 2 A and shown in Figure 3, pickup groove 123 assignment test plates 110 by lower support seat 125, after upper support seat 124 and lower support seat 125 make up, locating slot 121 positions of upper support seat 124 can make each connection pad 111 accurately corresponding to each thimble 130 just corresponding to the connection pad 111 of test board 110.In addition, by locating slot 121 alignment connectors 712, can make each electrical contact point 713 more accurately corresponding to each thimble 130.And no longer need via artificial adjustment, considerably convenient.
Please be simultaneously with reference to Fig. 4 and Fig. 5.The electronic package 700 that Fig. 4 illustrates Fig. 2 A is placed in the stereographic map of proving installation 100, and the electronic package 700 that Fig. 5 illustrates Fig. 2 A is placed in the side view of proving installation 100.Proving installation 100 also comprises a cover plate 140.Cover plate 140 is coupled to upper support seat 124 with pivoting.When cover plate 140 is opened, then can insert electronic package 700 in proving installation 100, and connector 712 can be inserted in the locating slot 121.Please refer to Fig. 6, the synoptic diagram of the state that its proving installation 100 that illustrates Fig. 4 closes at cover plate 140.Cover plate 140 can't be displaced into Z-direction in order to against flexible circuit board 710 and connector 712 thereof with restriction flexible circuit board 710 and connector 712 thereof.And make that the contact of flexible circuit board 710, thimble 130 and test board 110 is good.
Please refer to Fig. 4, cover plate 140 comprises a trip 142, and upper support seat 124 has a draw-in groove 122.When cover plate 140 closed, trip 142 engaging draw-in grooves 122 made cover plate 140 can not get loose and influence test result.
Please refer to Fig. 7 A～Fig. 7 B, it illustrates the action synoptic diagram of connector 712, thimble 130 and the test board 110 of Fig. 2 A.At least one end of each thimble 130 has telescopic resilience.In the present embodiment, each thimble 130 comprises an elastic parts, is arranged at holder 150 inside, and is provided with between first end 131 and second end 132.Make first end 131 and second end 132 of thimble 130 all have elasticity.Shown in Fig. 7 A, when connector 712 and test board 110 did not contact thimble 130 as yet, first end 131 of thimble 130 protruded from holder 150 outer first distance D 1, and second end 132 of thimble 130 protrudes from holder 150 outer second distance D2.
Shown in Fig. 7 B, when cover plate 140 (being illustrated among Fig. 4) closes and connector 712 and test board 110 closely during contact thimble 130, first end 131 of thimble 130 protrudes from the holder 150 first outer distance D 1 and shortens to the 3rd distance D 3, and second end 132 of thimble 130 protrudes from holder 150 outer second distance D2 and shortens to the 4th distance D 4.At this moment, elastic parts is squeezed, and produces a back stretch.This back stretch puts on first end 131 and second end 132, makes end 131 and second end 132 of winning closely be resisted against the connection pad 111 of test board 110 and the electrical contact point 713 of connector 712 respectively.And,, have first end 131 of telescopic resilience or second end 132 and can guarantee that each thimble 130 all can be against connection pad 111 or electrical contact point 713 if when each thimble 130 distance of protruding from holder 150 is inconsistent.
Moreover the sectional area of thimble 130 is less than or equal to the area of connection pad 111 and electrical contact point 713, to avoid other circuit of thimble 130 false touches.
Please be simultaneously with reference to Fig. 8 and Fig. 2 A, Fig. 8 illustrates the process flow diagram of the method for testing of the first embodiment of the present invention.At first, in step S01, provide test board 110, test board 110 is fixed in the pickup groove 123 of lower support seat 125.Test board 110 is selected for use according to the electronic package 700 and the test event thereof of desire test.
Then, in step S02, thimble 130 is set between test board 110 and electronic package 700.In the present embodiment, with upper support seat 124 and 125 combinations of lower support seat, wherein upper support seat 124 is arranged in the pickup groove 123 of lower support seat 125, makes the thimble 130 accurate connection pads 111 in alignment with test board 110 that are arranged at upper support seat 124.Then, electronic package 700 to be tested is placed a storage tank 127 on the supporting seat 120, storage tank 127 has four right angle 127a and two arc-shaped notch 127b, and four right angle 127a are in order to the position of localized electron device 700 at X-Y plane, and two arc-shaped notch 127b then conveniently pick and place.And the connector 712 of electronic package 700 is fixed in the locating slot 121 of upper support seat 124, cover plate 140 is closed.By holder 150 clamping thimbles, and by pickup groove 123 and locating slot 121 assignment test plates 110 and connector 712.Make thimble 130 contact well with test board 110 and connector 712.
Then, in step S03, after connector 712 and test board 110 electrically connect by thimble 130, import a test signal again to test board 110.Test signal also inputs to electronic package 700 via thimble 130 and flexible circuit board 710, with test electronic package 700.
Though above-mentioned method of testing is that example is done explanation with the proving installation 100 of first embodiment, yet method of testing of the present invention is not limited thereto.So long as a thimble is set between test board 110 and flexible circuit board 710, to reach the effect that test board 110 and flexible circuit board 710 electrically connect, technical scope under neither disengaging the present invention.
Second embodiment
Proving installation 100 differences of the proving installation 200 of present embodiment and first embodiment are the combination of cover plate 240 and supporting seat 220, and all the other something in common also no longer repeat.Please refer to Fig. 9, it illustrates the synoptic diagram according to the proving installation 200 of second embodiment of the invention.In the present embodiment, cover plate 240 comprises one first magnet assembly 249, and supporting seat 220 comprises one second magnet assembly 229.First magnet assembly 249 and second magnet assembly, 229 magnetic are inhaled mutually, and for example first magnet assembly 249 and second magnet assembly 229 are the combination of N utmost point magnet and S utmost point magnet, perhaps are the combination of arbitrary type magnet and metal.By the mode that magnetic is inhaled mutually, cover plate 240 and supporting seat 220 are combined closely.
Proving installation of the above embodiment of the present invention and method of testing are to utilize thimble to electrically connect test board and connector, make proving installation and method of testing have following advantage:
The first, reduce the damage probability of connector: no longer need the repetition plug-in connector, only need connector is placed on the thimble and can test, make the damage probability of connector significantly reduce.
The second, reduce the damage probability of flexible circuit board: after connector no longer needed to repeat plug, flexible circuit board can not be subjected to external force and pull, and makes the damage probability of flexible circuit board significantly reduce.
Three, easy to operate: as to save after the action of plug-in connector, only need electronic package and flexible circuit board thereof and connector are placed in the proving installation and can test.It is quite simple and easy to make that test procedure becomes, and handled easily.
Four, the reuse height of test board: in test procedure each time, test board can't wreck, and therefore same test board can be reused corresponding to a plurality of electronic packages.That is to say that test board can be set up in pickup groove, and does not need often to dismantle test board.
Five, each thimble all can be against connection pad or electrical contact point: if each thimble protrudes from the distance of holder when inconsistent, have first end of telescopic resilience or second end and can guarantee that each thimble all can be against connection pad or electrical contact point.
Six, thimble can other circuit of false touch: 8 sectional areas of thimble are less than or equal to the area of connection pad and electrical contact point, to avoid other circuit of thimble false touch.
Seven, do not need to change the design of electronic package or test board: electrically contact point can be the interior metal contact of connector or the metallic circuit that the connector periphery is exposed.Test board only need remove connector originally can expose connection pad.That is to say, do not need additionally to change the design of electronic package and test board.
In sum, though the present invention discloses as above with preferred embodiment, so it is not in order to limit the present invention.The general technical staff of the technical field of the invention without departing from the spirit and scope of the present invention, can do various changes and retouching.Therefore, protection scope of the present invention is as the criterion when looking the accompanying Claim book person of defining.
Claims (17)
1. proving installation, in order to test an electronic package, this electronic package has a flexible circuit board, and this proving installation comprises:
One test board has at least one connection pad;
One supporting seat is in order to carry this test board and this electronic package; And
At least one thimble is arranged on this supporting seat, and between this test board and this flexible circuit board, this thimble has one first end and one second end, and this first end is in order to electrically connect this connection pad, and this second end is in order to electrically connect this flexible circuit board.
2. proving installation according to claim 1 is characterized in that, at least one end of this thimble has telescopic resilience.
3. proving installation according to claim 1 is characterized in that, the sectional area of this thimble is less than or equal to the area of this connection pad.
4. proving installation according to claim 1 is characterized in that this flexible circuit board has a connector, and this connector has at least one electrical contact point, in order to electrically connect this second end.
5. proving installation according to claim 4 is characterized in that this supporting seat has a locating slot, in order to locate this connector.
6. proving installation according to claim 4 is characterized in that, the sectional area of this thimble is less than or equal to the area of this electrical contact point.
7. proving installation according to claim 1 is characterized in that, more comprises:
One cover plate is coupled to this supporting seat with pivoting, and this cover plate makes that in order to against this flexible circuit board the contact of this flexible circuit board, this thimble and this test board is good.
8. proving installation according to claim 7 is characterized in that this cover plate comprises a trip, and this supporting seat has a draw-in groove, and this trip is in order to engage this draw-in groove.
9. proving installation according to claim 7 is characterized in that, this cover plate comprises one first magnet assembly, and this supporting seat comprises one second magnet assembly, and this first magnet assembly is in order to inhale mutually with this second magnet assembly magnetic.
10. proving installation according to claim 1 is characterized in that, this electronic package is a display panel.
11. proving installation according to claim 1 is characterized in that, this supporting seat has a pickup groove, in order to fix this test board.
12. a method of testing, in order to test an electronic package, this electronic package has a flexible circuit board, and this method of testing comprises:
(a) provide a test board, this test board has a connection pad; And
(b) provide a supporting seat, in order to carry this test board and this electronic package; One thimble is set on this supporting seat, and this thimble places between this test board and this flexible circuit board, this thimble has one first end and one second end, and this first end is in order to electrically connect this connection pad, and this second end is in order to electrically connect this flexible circuit board; And
(c) input one test signal is to this test board, and this test signal also inputs to this electronic package via this thimble, to test this electronic package.
13. method of testing according to claim 12 is characterized in that, in this step (b), at least one end of this thimble has telescopic resilience.
14. method of testing according to claim 12 is characterized in that, in this step (b), the sectional area of this thimble is less than or equal to the area of this connection pad.
15. method of testing according to claim 12 is characterized in that, this flexible circuit board has a connector, and this connector has at least one electrical contact point, and in this step (b), this electrical contact point is in order to electrically connect this second end.
16. method of testing according to claim 15 is characterized in that, in this step (b), the sectional area of this thimble is less than or equal to the area of this electrical contact point.
17. method of testing according to claim 12 is characterized in that, this electronic package is a display panel.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB200710097920XA CN100543487C (en) | 2007-04-18 | 2007-04-18 | Proving installation and method of testing |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB200710097920XA CN100543487C (en) | 2007-04-18 | 2007-04-18 | Proving installation and method of testing |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101038322A CN101038322A (en) | 2007-09-19 |
| CN100543487C true CN100543487C (en) | 2009-09-23 |
Family
ID=38889355
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB200710097920XA Expired - Fee Related CN100543487C (en) | 2007-04-18 | 2007-04-18 | Proving installation and method of testing |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN100543487C (en) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2010088695A1 (en) | 2009-02-02 | 2010-08-05 | Apex Technologies, Inc. | Flexible magnetic interconnects |
| CN101944701A (en) * | 2010-08-31 | 2011-01-12 | 友达光电(厦门)有限公司 | Connector connection method and connector connection device |
| CN103869106A (en) * | 2012-12-12 | 2014-06-18 | 鸿富锦精密工业（深圳）有限公司 | Connector used for test |
| CN103630787B (en) * | 2013-12-10 | 2016-01-27 | 索尔思光电（成都）有限公司 | A kind of optical module proving installation |
| CN104319505B (en) | 2014-11-17 | 2018-01-19 | 合肥京东方光电科技有限公司 | Flexible printed circuit board grafting tool |
| CN110375961B (en) * | 2019-07-29 | 2021-06-04 | 武汉电信器件有限公司 | Automatic test method and system for optical module |
-
2007
- 2007-04-18 CN CNB200710097920XA patent/CN100543487C/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| CN101038322A (en) | 2007-09-19 |
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Granted publication date: 20090923 Termination date: 20210418 |