CN219392216U - Magnetic attraction test fixture - Google Patents
Magnetic attraction test fixture Download PDFInfo
- Publication number
- CN219392216U CN219392216U CN202320521831.8U CN202320521831U CN219392216U CN 219392216 U CN219392216 U CN 219392216U CN 202320521831 U CN202320521831 U CN 202320521831U CN 219392216 U CN219392216 U CN 219392216U
- Authority
- CN
- China
- Prior art keywords
- limiting block
- chip
- magnet
- tested
- accommodating groove
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
The utility model discloses a magnetic attraction test fixture, and relates to the technical field of chip testing. The magnetic attraction test fixture comprises a base, a conductive adhesive structure and a limiting block; the base is provided with an accommodating groove, and a first magnet is arranged in the accommodating groove; the conductive adhesive structure is arranged in the accommodating groove and is used for being electrically connected with the test pins of the chip to be tested; the limiting block is detachably arranged in the accommodating groove, a through hole matched with the chip to be tested is formed in the limiting block, and the limiting block is used for limiting the chip to be tested; be provided with the second magnet that corresponds first magnet on the stopper, first magnet and second magnet can adsorb each other. According to the magnetic attraction test fixture, the chip to be tested is limited and fixed through the limiting block, and the second magnet of the limiting block is attracted through the first magnet of the accommodating groove, so that the chip to be tested and the limiting block are placed and fixed more conveniently.
Description
Technical Field
The utility model relates to the technical field of chip testing, in particular to a magnetic attraction testing jig.
Background
In the manufacturing process of the chip, functional test is required to be carried out on the chip, so that qualified products and defective products are screened out; during testing, a tester puts the chip to be tested into the testing equipment provided with the testing probes, and the testing probes are in one-to-one correspondence with the testing pins of the chip. This approach has the following problems: 1. the alignment of the chip pins and the probes is troublesome, so that the chip is not easy to place; 2. in the test process, the situation that the pins of the chip deviate from the probes possibly occurs, so that poor contact is caused, and the test result is influenced; 3. when the chip pins are contacted with the probes, the chip pins are easy to damage; and the probe has long signal transmission distance due to slender structure, signal interference exists, and the signal transmission is not stable enough.
Disclosure of Invention
The present utility model aims to solve at least one of the technical problems existing in the prior art. Therefore, the utility model provides the magnetic test fixture which can conveniently mount and limit the chip and improve the test efficiency.
According to an embodiment of the utility model, a magnetic test fixture comprises:
the base is provided with an accommodating groove, and a first magnet is arranged in the accommodating groove;
the conductive adhesive structure is arranged in the accommodating groove and is used for being electrically connected with a test pin of the chip to be tested;
the limiting block is detachably arranged in the accommodating groove, a through hole matched with the chip to be tested is formed in the limiting block, and the limiting block is used for limiting the chip to be tested; the limiting block is provided with a second magnet corresponding to the first magnet, and the first magnet and the second magnet can be mutually adsorbed.
According to some embodiments of the utility model, the first magnets and the second magnets are respectively four, the four first magnets are arranged at four corners of the accommodating groove, the four second magnets are arranged at four corners of the limiting block, and the arrangement positions of the four first magnets are in one-to-one correspondence with the arrangement positions of the four second magnets.
According to some embodiments of the utility model, a positioning column is arranged in the accommodating groove, and the limiting block is provided with a positioning hole matched with the positioning column.
According to some embodiments of the utility model, an anti-static block and a conductive column are arranged in the accommodating groove, the conductive column is arranged on the anti-static block, and the limiting block is provided with an electrostatic hole matched with the conductive column.
According to some embodiments of the utility model, the limiting block is provided with at least one notch groove on the periphery of the through hole.
According to some embodiments of the present utility model, the conductive adhesive structure includes an elastic insulating layer and a plurality of conductive adhesive columns, the plurality of conductive adhesive columns are disposed in the elastic insulating layer at intervals and penetrate through the elastic insulating layer, the plurality of conductive adhesive columns are distributed in one-to-one correspondence with a plurality of test pins of the chip to be tested, and the conductive adhesive columns are used for electrically connecting with the test pins corresponding to the chip to be tested.
According to some embodiments of the utility model, the conductive adhesive structure further comprises a support frame, and the elastic insulating layer is disposed on the support frame.
According to some embodiments of the utility model, the magnetic test fixture further comprises a cover plate, the cover plate is movably connected with the base, and the cover plate can cover the base.
According to some embodiments of the utility model, one side of the cover plate is hinged with one side of the base, the other side of the cover plate is provided with a clip, and the other side of the base is provided with a clip rod matched with the clip.
According to some embodiments of the utility model, the cover plate is provided with a handle.
The magnetic test fixture provided by the embodiment of the utility model has at least the following beneficial effects: the chip to be tested is limited through the limiting block, and the second magnet of the limiting block is adsorbed through the first magnet of the accommodating groove, so that the chip to be tested and the limiting block are placed more conveniently, and the testing efficiency is improved.
Additional aspects and advantages of the utility model will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the utility model.
Drawings
The foregoing and/or additional aspects and advantages of the utility model will become apparent and may be better understood from the following description of embodiments taken in conjunction with the accompanying drawings in which:
FIG. 1 is a schematic diagram of a magnetic test fixture according to an embodiment of the present utility model;
FIG. 2 is a schematic diagram of a magnetic test fixture according to an embodiment of the present utility model after a stopper is removed;
FIG. 3 is a schematic diagram illustrating a top view of a stopper according to an embodiment of the present utility model;
FIG. 4 is a schematic diagram illustrating a bottom view of a stopper according to an embodiment of the present utility model;
fig. 5 is a schematic structural diagram of a conductive adhesive structure according to an embodiment of the present utility model;
reference numerals:
the base 100, the accommodating groove 110, the first magnet 120, the positioning column 130, the conductive adhesive structure 200, the elastic insulating layer 210, the conductive adhesive column 220, the supporting frame 230, the limiting block 300, the through hole 310, the second magnet 320, the positioning hole 330, the notch groove 340, the electrostatic hole 350, the cover plate 400, the clip 410, the handle 420, the clip rod 500, the damping structure 600, the conductive column 700 and the antistatic block 800.
Detailed Description
Reference will now be made in detail to the present embodiments of the present utility model, examples of which are illustrated in the accompanying drawings, wherein the accompanying drawings are used to supplement the description of the written description so that one can intuitively and intuitively understand each technical feature and overall technical scheme of the present utility model, but not to limit the scope of the present utility model.
In the description of the present utility model, a number means one or more, a number means two or more, and greater than, less than, exceeding, etc. are understood to not include the present number, and above, below, within, etc. are understood to include the present number. The description of the first and second is for the purpose of distinguishing between technical features only and should not be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated or implicitly indicating the precedence of the technical features indicated.
In the description of the present utility model, unless explicitly defined otherwise, terms such as arrangement, installation, connection, etc. should be construed broadly and the specific meaning of the terms in the present utility model can be reasonably determined by a person skilled in the art in combination with the specific contents of the technical scheme.
Referring to fig. 1 to 4, a magnetic attraction test fixture according to an embodiment of the present utility model includes a base 100, a conductive adhesive structure 200, and a stopper 300; the base 100 is provided with a receiving groove 110, and a first magnet 120 is arranged in the receiving groove 110; the conductive adhesive structure 200 is disposed in the accommodating groove 110, and the conductive adhesive structure 200 is used for electrically connecting with a test pin of a chip to be tested; the limiting block 300 is detachably arranged in the accommodating groove 110, a through hole 310 matched with the chip to be tested is formed in the limiting block 300, and the limiting block 300 is used for limiting the chip to be tested; the stopper 300 is provided with a second magnet 320 corresponding to the first magnet 120, and the first magnet 120 and the second magnet 320 can be attracted to each other.
Specifically, when testing a chip to be tested, selecting a limiting block 300 matched with the chip to be tested, placing the limiting block 300 in the accommodating groove 110, wherein the limiting block 300 is provided with a second magnet 320, and the accommodating groove 110 is internally provided with a first magnet 120, and the first magnet 120 and the second magnet 320 can be mutually adsorbed, so that when the limiting block 300 is placed in the accommodating groove 110, the first magnet 120 can adsorb the second magnet 320, and the installation and the fixation of the limiting block 300 are realized; and then the chip to be tested is placed according to the limiting block 300, the chip to be tested is limited through the limiting block 300, and the alignment accuracy of the test pins of the chip to be tested and the conductive adhesive columns 220 is ensured.
According to the magnetic attraction test fixture provided by the embodiment of the utility model, the chip to be tested is limited and fixed through the limiting block 300, and the second magnet 320 of the limiting block 300 is attracted through the first magnet 120 of the accommodating groove 110, so that the chip to be tested and the limiting block 300 are more convenient to place and fix, the situation that the test pins of the chip to be tested deviate from the conductive adhesive structure 200 can be avoided, and the test efficiency and the test effect are improved.
As shown in fig. 2 and fig. 4, in some embodiments of the present utility model, four first magnets 120 and four second magnets 320 are respectively disposed at four corners of the accommodating groove 110, four second magnets 320 are disposed at four corners of the limiting block 300, and the disposition positions of the four first magnets 120 are in one-to-one correspondence with the disposition positions of the four second magnets 320. The adoption of the four-dot matrix type magnetic attraction mode can ensure the connection stability of the limiting block 300 in the vertical direction and avoid the shifting of the limiting block 300.
As shown in fig. 2 and 4, in some embodiments of the present utility model, the accommodating groove 110 is provided with a positioning post 130, and the stopper 300 is provided with a positioning hole 330 adapted to the positioning post 130. Specifically, as shown in fig. 2, a positioning post 130 is respectively disposed on the front and rear sides of the accommodating groove 110, as shown in fig. 4, a positioning hole 330 is disposed at a corresponding position of the accommodating groove 110, and positioning of the stopper 300 can be achieved through cooperation of the positioning hole 330 and the positioning post 130, so that installation of the stopper 300 is facilitated. Further, a foolproof structure may be disposed on the positioning post 130, so as to avoid opposite installation directions of the limiting block 300, and ensure accurate installation positions of the limiting block 300.
As shown in fig. 2 and fig. 4, in some embodiments of the present utility model, an anti-static block 800 and a conductive post 700 are disposed in the accommodating groove, the conductive post 700 is disposed on the anti-static block 800, and the stopper 300 is provided with an electrostatic hole 350 adapted to the conductive post 700. The conductive post 700 plays a role of conducting static electricity, and the static electricity is conducted to the anti-static block 800, so that static electricity possibly generated when the limiting block 300 is installed is eliminated, and damage to the chip to be tested is avoided.
As shown in fig. 3, in some embodiments of the present utility model, the stopper 300 is provided with at least one notch groove 340 at a circumferential side of the through hole 310. By providing a plurality of notch grooves 340 on the stopper 300, a user can conveniently take out the stopper 300 from the accommodating groove 110 through the notch grooves 340.
As shown in fig. 5, in some embodiments of the present utility model, the conductive adhesive structure 200 includes an elastic insulating layer 210 and a plurality of conductive adhesive columns 220, wherein the plurality of conductive adhesive columns 220 are disposed in the elastic insulating layer 210 at intervals and penetrate through the elastic insulating layer 210, the plurality of conductive adhesive columns 220 are distributed in one-to-one correspondence with a plurality of test pins of the chip to be tested, and the conductive adhesive columns 220 are used for electrically connecting with the test pins corresponding to the chip to be tested. Since the conductive adhesive column 220 is disposed on the elastic insulating layer 210, when the test pin of the chip to be tested is in contact with the conductive adhesive column 220, the elastic insulating layer 210 can play a role in buffering to a certain extent, and protect the test pin of the chip to be tested from damage; meanwhile, compared with the traditional probe, the conductive adhesive column 220 has lower cost, shorter signal transmission distance, smaller signal interference and relatively more stable signal transmission, and is beneficial to improving the test accuracy and reducing the cost.
As shown in fig. 5, in some embodiments of the present utility model, the conductive adhesive structure 200 further includes a support frame 230, and the elastic insulating layer 210 is disposed on the support frame 230. As shown in fig. 5, since the elastic insulating layer 210 has a plurality, the elastic insulating layer 210 is supported by the support frame 230, and the support frame 230 may have a hardness slightly greater than that of the elastic insulating layer 210.
As shown in fig. 1, in some embodiments of the present utility model, the magnetic test fixture further includes a cover plate 400, where the cover plate 400 is movably connected to the base 100, and the cover plate 400 can cover the base 100. When the chip to be tested is tested, the base 100 is covered by the cover plate 400, so that the test pins of the chip to be tested are ensured to be in close contact with the conductive adhesive columns 220, and poor contact between the test pins and the conductive adhesive columns is avoided, and the test process is prevented from being influenced.
As shown in fig. 1, in some embodiments of the present utility model, one side of the cover 400 is hinged to one side of the base 100, the other side of the cover 400 is provided with a clip 410, and the other side of the base 100 is provided with a clip lever 500 adapted to the clip 410. When the cover plate 400 covers the base 100, the clip 410 can clip the clip lever 500, so as to ensure that the limiting block 300 and the chip to be tested can be pressed; meanwhile, the hinge structure between the cover plate 400 and the base 100 is provided with a damping structure 600, thereby avoiding the case where the cover plate 400 is automatically covered in an opened state. It should be noted that, the cover 400 may be hinged to the base 100, or may be connected to the base 100 by a snap-fit connection, or other common movable connection methods.
As shown in fig. 1, in some embodiments of the present utility model, the cover 400 is further provided with a handle 410, and by providing the handle 410, it is convenient for a user to open or close the cover 400 through the handle 410.
In the description of the present specification, a description referring to the terms "one embodiment," "further embodiment," "some specific embodiments," or "some examples," etc., means that a particular feature, structure, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present utility model. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiments or examples. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
While embodiments of the present utility model have been shown and described, it will be understood by those of ordinary skill in the art that: many changes, modifications, substitutions and variations may be made to the embodiments without departing from the spirit and principles of the utility model, the scope of which is defined by the claims and their equivalents.
Claims (10)
1. A magnetic attraction test fixture is characterized by comprising:
the base is provided with an accommodating groove, and a first magnet is arranged in the accommodating groove;
the conductive adhesive structure is arranged in the accommodating groove and is used for being electrically connected with a test pin of the chip to be tested;
the limiting block is detachably arranged in the accommodating groove, a through hole matched with the chip to be tested is formed in the limiting block, and the limiting block is used for limiting the chip to be tested; the limiting block is provided with a second magnet corresponding to the first magnet, and the first magnet and the second magnet can be mutually adsorbed.
2. The magnetic attraction test fixture of claim 1, wherein the first magnets and the second magnets are respectively four, the four first magnets are arranged at four corners of the accommodating groove, the four second magnets are arranged at four corners of the limiting block, and the arrangement positions of the four first magnets are in one-to-one correspondence with the arrangement positions of the four second magnets.
3. The magnetic attraction test fixture of claim 1, wherein a positioning column is arranged in the accommodating groove, and the limiting block is provided with a positioning hole matched with the positioning column.
4. The magnetic attraction test fixture of claim 1, wherein an anti-static block and a conductive column are arranged in the accommodating groove, the conductive column is arranged on the anti-static block, and the limiting block is provided with an electrostatic hole matched with the conductive column.
5. The magnetic attraction test fixture of claim 1, wherein the limiting block is provided with at least one notch groove on the periphery of the through hole.
6. The magnetic attraction test fixture as claimed in claim 1, wherein the conductive adhesive structure comprises an elastic insulating layer and a plurality of conductive adhesive columns, the plurality of conductive adhesive columns are arranged in the elastic insulating layer at intervals and penetrate through the elastic insulating layer, the plurality of conductive adhesive columns are distributed in one-to-one correspondence with a plurality of test pins of the chip to be tested, and the conductive adhesive columns are used for being electrically connected with the test pins corresponding to the chip to be tested.
7. The fixture of claim 6, wherein the conductive adhesive structure further comprises a support frame, and the elastic insulating layer is disposed on the support frame.
8. The magnetic testing jig of claim 1, further comprising a cover plate movably connected to the base, the cover plate being capable of covering the base.
9. The magnetic attraction test fixture of claim 8, wherein one side of the cover plate is hinged to one side of the base, a clip is arranged on the other side of the cover plate, and a clip rod matched with the clip is arranged on the other side of the base.
10. The magnetic attraction test fixture of claim 8, wherein the cover plate is provided with a handle.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320521831.8U CN219392216U (en) | 2023-03-10 | 2023-03-10 | Magnetic attraction test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320521831.8U CN219392216U (en) | 2023-03-10 | 2023-03-10 | Magnetic attraction test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN219392216U true CN219392216U (en) | 2023-07-21 |
Family
ID=87169017
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202320521831.8U Active CN219392216U (en) | 2023-03-10 | 2023-03-10 | Magnetic attraction test fixture |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN219392216U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116973605A (en) * | 2023-08-25 | 2023-10-31 | 苏州微飞半导体有限公司 | ACS high-precision test seat for vertical conductive adhesive of metal wire |
-
2023
- 2023-03-10 CN CN202320521831.8U patent/CN219392216U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116973605A (en) * | 2023-08-25 | 2023-10-31 | 苏州微飞半导体有限公司 | ACS high-precision test seat for vertical conductive adhesive of metal wire |
| CN116973605B (en) * | 2023-08-25 | 2024-04-30 | 苏州微飞半导体有限公司 | ACS high-precision test seat for vertical conductive adhesive of metal wire |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN219392216U (en) | Magnetic attraction test fixture | |
| WO2010034185A1 (en) | A general transferring device for testing a special testing apparatus of a circuitry board and a general jig thereof | |
| US7378860B2 (en) | Wafer test head architecture and method of use | |
| US20030016039A1 (en) | Wireless test fixture for printed circuit board test systems | |
| CN109686287A (en) | A kind of the display panel test structure and jig of analog producing line multiple conversions signal | |
| CN100543487C (en) | Proving installation and method of testing | |
| CN100474577C (en) | Base board and electric test method therefor | |
| CN107064760A (en) | A kind of accurate device for quick testing of high integration conducting ring assemblies conducting insulation | |
| CN109387767B (en) | Be applied to positioning jig of PCB board | |
| CN103901381A (en) | Triaxial magnetic force test seat and triaxial magnetic force test system | |
| CN215449355U (en) | Tester capable of testing multiple packaging types | |
| CN212060337U (en) | PCB performance testing device | |
| US5698990A (en) | Counterforce spring assembly for printed circuit board test fixtures | |
| CN212459896U (en) | High-low temperature four-parameter testing device of electrolytic capacitor | |
| CN113358935B (en) | Capacitance testing device | |
| CN206515440U (en) | A kind of pellet type IC chip test device | |
| CN209182370U (en) | Through silicon via channel measuring apparatus | |
| CN205193190U (en) | Key module test fixture | |
| CN209372909U (en) | A kind of circuit board testing device | |
| CN219842513U (en) | Chip test fixture and device | |
| CN208459552U (en) | A kind of detection jig for touch screen chip | |
| CN103592471B (en) | A kind of capacity measurement fixture | |
| CN206074706U (en) | Electronic component ageing tester | |
| CN219417661U (en) | Chip test protection device | |
| CN205484693U (en) | A smelting tool for circuit board detects |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |