CN100446174C - 制造包括被磁材料环绕的电导体的元件的方法 - Google Patents
制造包括被磁材料环绕的电导体的元件的方法 Download PDFInfo
- Publication number
- CN100446174C CN100446174C CNB2004800368709A CN200480036870A CN100446174C CN 100446174 C CN100446174 C CN 100446174C CN B2004800368709 A CNB2004800368709 A CN B2004800368709A CN 200480036870 A CN200480036870 A CN 200480036870A CN 100446174 C CN100446174 C CN 100446174C
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- China
- Prior art keywords
- conductor
- layer
- electronic circuit
- circuit component
- magnetic material
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000004020 conductor Substances 0.000 title claims abstract description 74
- 239000000696 magnetic material Substances 0.000 title claims abstract description 41
- 238000000034 method Methods 0.000 title claims abstract description 33
- 239000002270 dispersing agent Substances 0.000 claims abstract description 13
- 239000007788 liquid Substances 0.000 claims abstract description 7
- 239000012530 fluid Substances 0.000 claims abstract 4
- 239000010410 layer Substances 0.000 claims description 61
- 238000004519 manufacturing process Methods 0.000 claims description 24
- 230000005291 magnetic effect Effects 0.000 claims description 21
- 229920002120 photoresistant polymer Polymers 0.000 claims description 18
- 239000000463 material Substances 0.000 claims description 13
- 230000001939 inductive effect Effects 0.000 claims description 11
- 239000002904 solvent Substances 0.000 claims description 5
- 238000001704 evaporation Methods 0.000 claims description 4
- 230000008020 evaporation Effects 0.000 claims description 3
- 230000005294 ferromagnetic effect Effects 0.000 claims description 2
- 239000011241 protective layer Substances 0.000 claims description 2
- 239000002245 particle Substances 0.000 claims 5
- 230000015572 biosynthetic process Effects 0.000 claims 4
- 239000012774 insulation material Substances 0.000 claims 3
- 239000011810 insulating material Substances 0.000 claims 1
- 239000011368 organic material Substances 0.000 claims 1
- 239000002122 magnetic nanoparticle Substances 0.000 abstract 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 34
- 235000012239 silicon dioxide Nutrition 0.000 description 17
- 239000000377 silicon dioxide Substances 0.000 description 17
- 238000005516 engineering process Methods 0.000 description 7
- 238000005530 etching Methods 0.000 description 7
- 229910052751 metal Inorganic materials 0.000 description 7
- 239000002105 nanoparticle Substances 0.000 description 7
- 239000002184 metal Substances 0.000 description 6
- 230000005350 ferromagnetic resonance Effects 0.000 description 5
- 239000000758 substrate Substances 0.000 description 5
- 229920000642 polymer Polymers 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- 239000000725 suspension Substances 0.000 description 4
- 150000001875 compounds Chemical class 0.000 description 3
- 239000003302 ferromagnetic material Substances 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 2
- 238000005452 bending Methods 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 230000004907 flux Effects 0.000 description 2
- 230000035699 permeability Effects 0.000 description 2
- 238000001556 precipitation Methods 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 2
- GJCOSYZMQJWQCA-UHFFFAOYSA-N 9H-xanthene Chemical compound C1=CC=C2CC3=CC=CC=C3OC2=C1 GJCOSYZMQJWQCA-UHFFFAOYSA-N 0.000 description 1
- CWYNVVGOOAEACU-UHFFFAOYSA-N Fe2+ Chemical compound [Fe+2] CWYNVVGOOAEACU-UHFFFAOYSA-N 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000013500 data storage Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005672 electromagnetic field Effects 0.000 description 1
- 238000009713 electroplating Methods 0.000 description 1
- 239000012634 fragment Substances 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 229910001004 magnetic alloy Inorganic materials 0.000 description 1
- 230000005415 magnetization Effects 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
- 238000001259 photo etching Methods 0.000 description 1
- 238000001020 plasma etching Methods 0.000 description 1
- 239000013047 polymeric layer Substances 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 229920001285 xanthan gum Polymers 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F1/00—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties
- H01F1/0036—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties showing low dimensional magnetism, i.e. spin rearrangements due to a restriction of dimensions, e.g. showing giant magnetoresistivity
- H01F1/0045—Zero dimensional, e.g. nanoparticles, soft nanoparticles for medical/biological use
- H01F1/0063—Zero dimensional, e.g. nanoparticles, soft nanoparticles for medical/biological use in a non-magnetic matrix, e.g. granular solids
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F17/00—Fixed inductances of the signal type
- H01F17/0006—Printed inductances
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F41/00—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties
- H01F41/02—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for manufacturing cores, coils, or magnets
- H01F41/04—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for manufacturing cores, coils, or magnets for manufacturing coils
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F41/00—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties
- H01F41/02—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for manufacturing cores, coils, or magnets
- H01F41/04—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for manufacturing cores, coils, or magnets for manufacturing coils
- H01F41/041—Printed circuit coils
- H01F41/046—Printed circuit coils structurally combined with ferromagnetic material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
- H01L23/5227—Inductive arrangements or effects of, or between, wiring layers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F17/00—Fixed inductances of the signal type
- H01F17/04—Fixed inductances of the signal type with magnetic core
- H01F17/06—Fixed inductances of the signal type with magnetic core with core substantially closed in itself, e.g. toroid
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Biomedical Technology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Molecular Biology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Coils Or Transformers For Communication (AREA)
- Manufacturing Cores, Coils, And Magnets (AREA)
- Parts Printed On Printed Circuit Boards (AREA)
Abstract
Description
Claims (16)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP03293095A EP1542261B1 (en) | 2003-12-10 | 2003-12-10 | Method of producing an element comprising an electrical conductor encircled by magnetic material |
EP03293095.0 | 2003-12-10 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1898770A CN1898770A (zh) | 2007-01-17 |
CN100446174C true CN100446174C (zh) | 2008-12-24 |
Family
ID=34486452
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2004800368709A Expired - Fee Related CN100446174C (zh) | 2003-12-10 | 2004-12-10 | 制造包括被磁材料环绕的电导体的元件的方法 |
Country Status (9)
Country | Link |
---|---|
US (1) | US20070298520A1 (zh) |
EP (1) | EP1542261B1 (zh) |
JP (1) | JP2007514308A (zh) |
KR (1) | KR20070011244A (zh) |
CN (1) | CN100446174C (zh) |
AT (1) | ATE358330T1 (zh) |
DE (1) | DE60312872T2 (zh) |
TW (1) | TW200535912A (zh) |
WO (1) | WO2005093789A1 (zh) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6958572B2 (en) * | 2002-02-06 | 2005-10-25 | Ut-Battelle Llc | Controlled non-normal alignment of catalytically grown nanostructures in a large-scale synthesis process |
US20100315191A1 (en) * | 2005-10-13 | 2010-12-16 | Xiao T Danny | Patterned magnetic inductors |
US8436707B2 (en) * | 2010-01-12 | 2013-05-07 | Infineon Technologies Ag | System and method for integrated inductor |
US9461355B2 (en) * | 2013-03-29 | 2016-10-04 | Intel Corporation | Method apparatus and material for radio frequency passives and antennas |
US11728090B2 (en) * | 2020-02-10 | 2023-08-15 | Analog Devices International Unlimited Company | Micro-scale device with floating conductive layer |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07211865A (ja) * | 1994-01-19 | 1995-08-11 | Fujitsu Ltd | インダクタ |
CN1182964A (zh) * | 1996-11-15 | 1998-05-27 | 凌沛清(音译) | 半导体芯片上的电感的结构及其制造方法 |
US5834825A (en) * | 1995-12-27 | 1998-11-10 | Nec Corporation | Semiconductor device having spiral wiring directly covered with an insulating layer containing ferromagnetic particles |
US6396122B1 (en) * | 2000-09-08 | 2002-05-28 | Newport Fab, Llc | Method for fabricating on-chip inductors and related structure |
JP2003347123A (ja) * | 2002-05-29 | 2003-12-05 | Taiyo Yuden Co Ltd | 薄膜インダクタ及びそれを利用した電子機器 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5869148A (en) * | 1991-04-23 | 1999-02-09 | Webcraft Technologies Inc. | Process for the in-line, high speed manufacturing of magnetic products |
US5276338A (en) * | 1992-05-15 | 1994-01-04 | International Business Machines Corporation | Bonded wafer structure having a buried insulation layer |
DE19533050A1 (de) * | 1995-09-07 | 1997-03-13 | Vacuumschmelze Gmbh | Verfahren zur Herstellung eines induktiven Bauelementes mit abgleichbarer Induktivität |
US5882985A (en) * | 1995-10-10 | 1999-03-16 | Advanced Micro Devices, Inc. | Reduction of field oxide step height during semiconductor fabrication |
TW308719B (zh) * | 1995-10-23 | 1997-06-21 | Dow Corning | |
US6492705B1 (en) * | 1996-06-04 | 2002-12-10 | Intersil Corporation | Integrated circuit air bridge structures and methods of fabricating same |
US6004830A (en) * | 1998-02-09 | 1999-12-21 | Advanced Vision Technologies, Inc. | Fabrication process for confined electron field emission device |
JPH11345887A (ja) * | 1998-03-31 | 1999-12-14 | Seiko Epson Corp | 半導体装置およびその製造方法 |
US6254662B1 (en) * | 1999-07-26 | 2001-07-03 | International Business Machines Corporation | Chemical synthesis of monodisperse and magnetic alloy nanocrystal containing thin films |
WO2006058034A2 (en) * | 2004-11-22 | 2006-06-01 | Intermolecular, Inc. | Molecular self-assembly in substrate processing |
-
2003
- 2003-12-10 EP EP03293095A patent/EP1542261B1/en not_active Expired - Lifetime
- 2003-12-10 DE DE60312872T patent/DE60312872T2/de not_active Expired - Lifetime
- 2003-12-10 AT AT03293095T patent/ATE358330T1/de not_active IP Right Cessation
-
2004
- 2004-12-10 JP JP2006543509A patent/JP2007514308A/ja active Pending
- 2004-12-10 CN CNB2004800368709A patent/CN100446174C/zh not_active Expired - Fee Related
- 2004-12-10 US US10/596,370 patent/US20070298520A1/en not_active Abandoned
- 2004-12-10 TW TW093138484A patent/TW200535912A/zh unknown
- 2004-12-10 WO PCT/EP2004/014167 patent/WO2005093789A1/en active Application Filing
- 2004-12-10 KR KR1020067011445A patent/KR20070011244A/ko not_active Application Discontinuation
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07211865A (ja) * | 1994-01-19 | 1995-08-11 | Fujitsu Ltd | インダクタ |
US5834825A (en) * | 1995-12-27 | 1998-11-10 | Nec Corporation | Semiconductor device having spiral wiring directly covered with an insulating layer containing ferromagnetic particles |
CN1182964A (zh) * | 1996-11-15 | 1998-05-27 | 凌沛清(音译) | 半导体芯片上的电感的结构及其制造方法 |
US6396122B1 (en) * | 2000-09-08 | 2002-05-28 | Newport Fab, Llc | Method for fabricating on-chip inductors and related structure |
JP2003347123A (ja) * | 2002-05-29 | 2003-12-05 | Taiyo Yuden Co Ltd | 薄膜インダクタ及びそれを利用した電子機器 |
Also Published As
Publication number | Publication date |
---|---|
JP2007514308A (ja) | 2007-05-31 |
ATE358330T1 (de) | 2007-04-15 |
EP1542261A1 (en) | 2005-06-15 |
CN1898770A (zh) | 2007-01-17 |
US20070298520A1 (en) | 2007-12-27 |
WO2005093789A1 (en) | 2005-10-06 |
DE60312872D1 (de) | 2007-05-10 |
KR20070011244A (ko) | 2007-01-24 |
DE60312872T2 (de) | 2007-07-12 |
TW200535912A (en) | 2005-11-01 |
EP1542261B1 (en) | 2007-03-28 |
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C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
ASS | Succession or assignment of patent right |
Owner name: FREESCALE SEMICONDUCTOR INC.; APPLICANT Free format text: FORMER OWNER: FREESCALE SEMICONDUCTOR INC. Effective date: 20070323 |
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C41 | Transfer of patent application or patent right or utility model | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20070323 Address after: Texas in the United States Applicant after: Fisical Semiconductor Inc. Co-applicant after: Centre National De La Recherche Scientifique Address before: Texas in the United States Applicant before: Fisical Semiconductor Inc. |
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C14 | Grant of patent or utility model | ||
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