CN100360943C - Detector capable of preventing overpressure - Google Patents
Detector capable of preventing overpressure Download PDFInfo
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- CN100360943C CN100360943C CNB2004100955502A CN200410095550A CN100360943C CN 100360943 C CN100360943 C CN 100360943C CN B2004100955502 A CNB2004100955502 A CN B2004100955502A CN 200410095550 A CN200410095550 A CN 200410095550A CN 100360943 C CN100360943 C CN 100360943C
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- pressure
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Abstract
The present invention relates to a testing device capable of preventing overpressure, which is used for testing whether a current conducting die set is exactly connected to a circuit board. The present invention comprises a first test board, at least one first guide post, a second test board, at least one elastic element, and a third test board, wherein the first test board is provided with a first surface, a second surface and a through hole, and the through hole penetrates through the first surface and the second surface; the first guide post is arranged on the first surface, the second test board is arranged on the first surface, and the first guide post penetrates through the second test board; one end of the elastic element is arranged on the second test board, and the other end of the elastic element is arranged on the third test board which is arranged in the through hole.
Description
Technical field
The present invention relates to a kind of proving installation, particularly relate to a kind of have prevent the excessive proving installation of pressure (OVER-PRESSURE PROTECTION TESTING APPARATUS).
Background technology
All kinds of circuit boards such as motherboard or display card etc. in process of production must be through a series of tests, and whether normal with each function of verification circuit board, whether the decision circuitry plate can sell or continue processing.
Shown in Figure 1A and 1B, the equipment of existing known testing circuit board is mainly to comprise a circuit board testing board 1 and one of be used in this circuit board testing board 1 circuit board testing jig 2.Circuit board testing jig 2 is mainly to comprise one first test cell 21, one second test cell 22 and a support plate 23, and wherein first test cell 21 also is referred to as down dials, and second test cell 22 also is referred to as plate.
On the other hand, when circuit board is a motherboard, for the CPU socket on the Test Host plate, must before beginning test, the CPU wafer be inserted in socket, and after finishing test, the CPU wafer is pulled away socket, if Plug Action accidentally, tends to cause stitch on the CPU wafer by bending or fracture.Therefore, when testing, produce the situation of a large amount of losses, normally substitute the CPU wafer, to test with a wafer card extender in order to reduce the CPU wafer.Card extender then has electrically conduct a little identical with the CPU wafer, and then the switching pin of wafer card extender is inserted on the CPU socket.Thus, in test procedure, being plugged repeatedly just becomes card extender but not the CPU wafer in CPU socket.
Because the CPU socket on the existing known techniques Test Host plate need be put CPU or adapter with manual type, such process expends time in and manpower, if will be with this test process automation, the machine that detects must design suitable mechanism, avoid in the test process because of the misoperation of board or allow component under test be subjected to improperly external force causes component under test to damage.On the other hand, in recent years along with the change of CPU wafer process and the increase of outer pin number, make the structure of CPU socket change, for example the CPU socket module that uses at present more includes one as limiting the lid that CPU uses thereupon.Therefore when reality is tested the CPU socket module of this type,, will cause the damage of measurement jig, CPU socket module and tested circuit board if the lid that restriction CPU uses does not open or lid is not held successfully.
Therefore, how a kind of proving installation that prevents that pressure is excessive that has is provided, avoid with suitable mechanism that component under test is subjected to improper damage in the test process, and suitably the test module also can be arranged in pairs or groups to reach the effect of automatic test, one of current just important topic by mechanism.
This shows that above-mentioned existing Test Host plate obviously still has inconvenience and defective, and demands urgently further being improved in structure and use.In order to solve the problem that the Test Host plate exists, relevant manufacturer there's no one who doesn't or isn't seeks solution painstakingly, but do not see always that for a long time suitable design finished by development, and common product does not have appropriate structure to address the above problem, this obviously is the problem that the anxious desire of relevant dealer solves.
Because the defective that above-mentioned existing Test Host plate exists, the inventor is based on being engaged in this type of product design manufacturing abundant for many years practical experience and professional knowledge, and the utilization of cooperation scientific principle, actively studied innovation, in the hope of founding the proving installation that having of a kind of new structure prevents that pressure is excessive, can improve general existing Test Host plate, make it have more practicality.Through constantly research, design, and after studying sample and improvement repeatedly, create the present invention who has practical value finally.
Summary of the invention
The objective of the invention is to, overcome the defective that existing Test Host plate exists, and a kind of new proving installation that prevents that pressure is excessive that has is provided, technical matters to be solved is to make it have flexible member to avoid in the test process conduction module and be subjected to improper external force and to damage, and has the 3rd test board for the installing of test module, conduction module on can the automatic testing circuit plate, thus be suitable for practicality more.
The object of the invention to solve the technical problems realizes by the following technical solutions.
The present invention proposes a kind ofly has a proving installation that prevents that pressure is excessive, it is whether test one conduction module accurately is linked to a circuit board, it comprises: one first test board, it is to have a first surface, a second surface and a through hole, and wherein this through hole is to run through this first surface and this second surface; At least one first guide pillar, it is to be arranged at this first surface; One second test board, it is to be arranged at this first surface, and this first guide pillar is to be arranged in this second test board, first test board and second test board can produce mutual displacement along first guide pillar; At least one flexible member, one end are to be arranged at this second test board; And one the 3rd test board, it is to be arranged in this through hole, and the other end of this flexible member is to be arranged at the 3rd test board.
The object of the invention to solve the technical problems also can be applied to the following technical measures to achieve further.
Aforesaid have a proving installation that prevents that pressure is excessive, and it also comprises: a location-plate; A plurality of pillars, wherein first end of these pillars is to be mounted on this first surface, and second end of these pillars is that group is established this location-plate; One elasticity module, it is to be arranged between this location-plate and this first surface, and is mounted on this location-plate.
Aforesaid have a proving installation that prevents that pressure is excessive, and wherein said elasticity module comprises: a telescoping column, and wherein first end of this telescoping column is to be mounted on this location-plate;
One sleeve, it is second end that is sheathed on this telescoping column; And one first spring, it is to be located on this telescoping column, and first end of this first spring is to be mounted on this telescoping column, second end of this first spring is the nozzle end that is mounted on this sleeve.
Aforesaid have a proving installation that prevents that pressure is excessive, and it also comprises: at least one second guide pillar, and it is to be arranged in this second test board and to be mounted on the 3rd test board, and this second guide pillar and this telescoping column axial line altogether; This second guide pillar is a bolt, and wherein this bolt is to be arranged in this second test board with no threaded portion.
Aforesaid have a proving installation that prevents that pressure is excessive, it also comprises: a test module, it is to be arranged at the 3rd test board, and have one the test pedestal, a framework and at least one testing element, wherein this test pedestal is to be arranged at the 3rd test board, this framework is to be arranged at the 3rd test board along this test pedestal outer rim, and this testing element is to be arranged at this test pedestal.
Aforesaid have a proving installation that prevents that pressure is excessive, and wherein said testing element is a metal cylinder.
Aforesaid have a proving installation that prevents that pressure is excessive, and wherein said framework is constituted by elastic material or by plastic cement material.
Aforesaid have a proving installation that prevents that pressure is excessive, and it also comprises: a probe, and it is a distance of detecting the 3rd test board and this circuit board, and produces a detecting result; And
One switch, it is to stop this according to this detecting result to have the proving installation start that prevents that pressure is excessive.
Aforesaid have a proving installation that prevents that pressure is excessive, and wherein said conduction module is a socket module, and this socket module comprises: a pedestal, and it is to be arranged at this circuit board; And
One fixed bar, it is to be arranged at this pedestal.
Aforesaid have a proving installation that prevents that pressure is excessive, and it also comprises: a conduction module through hole, wherein this fixed bar is to pass through this conduction module through hole.
Aforesaid have a proving installation that prevents that pressure is excessive, and wherein said second test board and the 3rd test board are made of the bakelite material.
The present invention compared with prior art has tangible advantage and beneficial effect.By above technical scheme as can be known, in order to reach aforementioned goal of the invention, major technique of the present invention thes contents are as follows:
Of the present invention have a proving installation that prevents that pressure is excessive, and it is whether test one conduction module accurately is linked to a circuit board, comprises one first test board, at least one first guide pillar, one second test board, at least one flexible member and one the 3rd test board.Wherein first test board is to have a first surface, a second surface and a through hole, and through hole is to run through first surface and second surface, first guide pillar is to be arranged at first surface, second test board is to be arranged at first surface, and first guide pillar is to be arranged in second test board, one end of flexible member is that the other end that is arranged at second test board and flexible member is to be arranged at the 3rd test board, and the 3rd test board is to be arranged in the through hole.
By technique scheme, the present invention has and prevents that the excessive proving installation of pressure has following advantage at least: have flexible member to avoid in the test process conduction module and be subjected to improper external force and to damage, and have the 3rd test board, so the conduction module on can the automatic testing circuit plate for test module installing.
In sum, special construction of the present invention have a proving installation that prevents that pressure is excessive, it has above-mentioned many advantages and practical value, and in like product, do not see have similar structural design to publish or use and really genus innovation, no matter it all has bigger improvement on product structure or function, have large improvement technically, and produced handy and practical effect, and more existing have prevent that the excessive proving installation of pressure has the multinomial effect of enhancement, thereby be suitable for practicality more, and have the extensive value of industry, really be a novelty, progressive, practical new design.
Above-mentioned explanation only is the general introduction of technical solution of the present invention, for can clearer understanding technological means of the present invention, and can be implemented according to the content of instructions, and for above-mentioned and other purposes, feature and advantage of the present invention can be become apparent, below especially exemplified by preferred embodiment, and conjunction with figs., be described in detail as follows.
Description of drawings
Figure 1A is the synoptic diagram of the existing known proving installation of a demonstration;
Figure 1B is the decomposing schematic representation of the existing known proving installation of a demonstration; And
Fig. 2 is the synoptic diagram with the proving installation that prevents that pressure is excessive of preferred embodiment of the present invention;
Fig. 3 A is that having of a preferred embodiment of the present invention prevents the proving installation that pressure is excessive, wherein has to prevent that the excessive proving installation of pressure from comprising the synoptic diagram of location-plate;
Fig. 3 B is that having of a preferred embodiment of the present invention prevents the proving installation that pressure is excessive, and wherein testing module is the partial schematic diagram that is installed on the 3rd test board;
Fig. 3 C is that having of a preferred embodiment of the present invention prevents the proving installation that pressure is excessive, wherein has to prevent that the excessive proving installation of pressure from comprising the side view of location-plate;
Fig. 4 A is that having of a preferred embodiment of the present invention prevents the proving installation that pressure is excessive, wherein has to prevent that the excessive proving installation of pressure is used for the circuit board testing jig synoptic diagram; And
Fig. 4 B is that having of a preferred embodiment of the present invention prevents the proving installation that pressure is excessive, wherein has to prevent that the excessive proving installation of pressure is used for the decomposing schematic representation of circuit board testing jig.
1: circuit board testing board 11: press
12: following balcony 2: circuit board testing jig
22: the second test cells of 21: the first test cells
23: support plate 24: proving installation
3: circuit board 31: electronic component
32: conduction module 321: pedestal
322: fixed bar 323: lid
4: have and prevent 41: the first test boards of the excessive proving installation of pressure
411: first surface 412: second surface
413: through hole 414: conduction module through hole
43: the three test boards of 42: the second test boards
Guide pillar 45 in 44: the first: flexible member
51: location-plate 52: pillar
53: elasticity module 531: telescoping column
532: 533: the first springs of sleeve
Guide pillar 55 in 54: the second: the test module
551: test pedestal 552: framework
553: testing element 56: probe
57: switch
Embodiment
Reach technological means and the effect that predetermined goal of the invention is taked for further setting forth the present invention, below in conjunction with accompanying drawing and preferred embodiment, having of proposing of foundation the present invention prevented its embodiment of the excessive proving installation of pressure, structure, feature and effect thereof, describe in detail as after.
As shown in Figure 2, preferred embodiment of the present invention have a proving installation that prevents that pressure is excessive, it is whether test one conduction module accurately is linked to a circuit board, comprises one first test board 41, at least one first guide pillar 44, one second test board 42, at least one flexible member 45 and one the 3rd test board 43.
Shown in Fig. 3 A, Fig. 3 B and Fig. 3 C, wherein Fig. 3 B is and a partial schematic diagram of Fig. 3 A different visual angles, and Fig. 3 C is the side view of Fig. 3 A from X-direction.With shown in Figure 2 different be that having of present embodiment prevents that the excessive proving installation of pressure from more can comprise a location-plate 51, a plurality of pillar 52, an elasticity module 53 and at least one second guide pillar 54.First end of its B-C post 52 is to be mounted on first surface 411, and second end of pillar 52 is to be mounted on location-plate 51.Elasticity module 53 is to be arranged between location-plate 51 and the first surface 411, and be mounted on location-plate 51, and elasticity module 53 is to comprise a telescoping column 531, a sleeve 532 and one first spring 533, wherein first end of telescoping column 531 is to be mounted on location-plate 51, sleeve 532 is second ends that are sheathed on telescoping column 531, first spring 533 is to be located on telescoping column 531, and first end of first spring 533 is that second end that is mounted on telescoping column 531, the first springs 533 is the nozzle end that is mounted on sleeve 532.Second guide pillar 54 is to be arranged in second test board 42 and to be mounted on the 3rd test board 43, and second guide pillar 54 is total to axial line with telescoping column 531.In the present embodiment, second guide pillar 54 can be a bolt, and bolt is to be arranged in second test board 42 with no threaded portion.
On the other hand, second test board 42 and the 3rd test board 43 are to produce mutual displacement and to make flexible member 45 be compressed along second guide pillar 54, first test board 41 and second test board 42 can produce mutual displacement along first guide pillar 44, and after making that second guide pillar 54 joins with elasticity module 53, second guide pillar 54 upwards forces in sleeve 532 is compressed the spring 533 of winning.
Having of present embodiment prevents that the excessive proving installation of pressure from more can comprise a test module 55, and wherein testing module 55 is to be arranged at the 3rd test board 43, and has a test pedestal 551, a framework 552 and at least one testing element 553.Test pedestal 551 is to be arranged at the 3rd test board 43, and framework 552 is to be arranged at the 3rd test board 43 along test pedestal 551 outer rims, and testing element 553 is to be arranged at test pedestal 551.In the present embodiment, at least a portion of testing element 55 3 is to protrude from test module 55, and at least a portion of testing element 553 is to insert conducting element.On the other hand, testing element 553 is can be a metal cylinder, and framework 552 can be made of elastic material or plastic cement material.
Having of present embodiment prevents that the excessive proving installation of pressure from more can comprise a probe 56 and a switch 57, its middle probe 56 is distances of detecting the 3rd test board 43 and circuit board, and producing a detecting result, switch 57 is to stop to have the proving installation start that prevents that pressure is excessive according to the detecting result.
Shown in Fig. 4 A and Fig. 4 B, having of present embodiment prevents that the excessive proving installation of pressure 4 more can specifically be implemented on circuit board testing board 1 and circuit board testing jig 2.Wherein circuit board testing jig 2 comprises a proving installation 24, has and prevent an excessive proving installation of pressure 4 and a support plate 23.Have and prevent that the excessive proving installation of pressure 4 from being to be electrically connected on press 11, proving installation 24 is to be fixed in down above the balcony 12, support plate 23 is to be arranged between first test cell 21 and second test cell 22, the one side of support plate 23 is bearer circuit plates 3, circuit board 3 is to can be a motherboard, conduction module 32 is to can be a socket module and comprise a pedestal 321 and a fixed bar 322 and a lid 323, and wherein pedestal 321 is to be arranged at circuit board 3, and fixed bar 322 is to be arranged at pedestal 321.Have when preventing the excessive proving installation of pressure 4 testing circuit boards 3, the testing element 553 of test module 55 is to be electrically connected with conduction module 32, and fixed bar 322 and lid 323 be pass through conduction module through hole 414 and with 41 conflicts of first test board.
Have and prevent that the excessive proving installation of pressure 4 from being the press 11 that is linked to circuit board testing board 1, and proving installation 24 is to be fixed in above the following balcony 12 of circuit board testing board 1, when the press 11 of circuit board testing board 1 is exerted pressure downwards, have and prevent that the excessive proving installation of pressure 4 from being to move towards direction of exerting pressure, prevent the excessive proving installation of pressure 4, support plate 23 and proving installation 24 mutual butts so that have, measure the circuit board 3 that support plate 23 is carried according to this.After testing element 553 was that module 32 is electrically connected with conduction, if press 11 is still exerted pressure downwards, second test board 42 and the 3rd test board 43 were along the 54 mutual displacements of generation of second guide pillar and make flexible member 45 be compressed.Afterwards if press 11 does not still stop to exert pressure downwards, first test board 41 and second test board 42 are to produce mutual displacement along first guide pillar 44, and make second guide pillar 54 and elasticity module 53 join, and second guide pillar 54 upwards forces in sleeve 532 spring 533 of winning is compressed.
The above, it only is preferred embodiment of the present invention, be not that the present invention is done any pro forma restriction, though the present invention discloses as above with preferred embodiment, yet be not in order to limit the present invention, any those skilled in the art, in not breaking away from the technical solution of the present invention scope, when the technology contents that can utilize above-mentioned announcement is made a little change or is modified to the equivalent embodiment of equivalent variations, in every case be the content that does not break away from technical solution of the present invention, according to technical spirit of the present invention to any simple modification that above embodiment did, equivalent variations and modification all still belong in the scope of technical solution of the present invention.
Claims (11)
1, a kind of have a proving installation that prevents that pressure is excessive, and it is whether test one conduction module accurately is linked to a circuit board, it is characterized in that it comprises:
One first test board, it is to have a first surface, a second surface and a through hole, wherein this through hole is to run through this first surface and this second surface;
At least one first guide pillar, it is to be arranged at this first surface;
One second test board, it is to be arranged at this first surface, and this first guide pillar is to be arranged in this second test board, first test board and second test board can produce mutual displacement along first guide pillar;
At least one flexible member, one end are to be arranged at this second test board; And
One the 3rd test board, it is to be arranged in this through hole, and the other end of this flexible member is to be arranged at the 3rd test board.
2, according to claim 1 have a proving installation that prevents that pressure is excessive, it is characterized in that it also comprises:
One location-plate;
A plurality of pillars, wherein first end of these pillars is to be mounted on this first surface, and second end of these pillars is that group is established this location-plate;
One elasticity module, it is to be arranged between this location-plate and this first surface, and is mounted on this location-plate.
3, according to claim 2 have a proving installation that prevents that pressure is excessive, it is characterized in that wherein said elasticity module comprises:
One telescoping column, wherein first end of this telescoping column is to be mounted on this location-plate;
One sleeve, it is second end that is sheathed on this telescoping column; And
One first spring, it is to be located on this telescoping column, and first end of this first spring is to be mounted on this telescoping column, second end of this first spring is the nozzle end that is mounted on this sleeve.
4, according to claim 3 have a proving installation that prevents that pressure is excessive, it is characterized in that it also comprises:
At least one second guide pillar, it is to be arranged in this second test board and to be mounted on the 3rd test board, and this second guide pillar and the common axial line of this telescoping column; This second guide pillar is a bolt, and wherein this bolt is to be arranged in this second test board with no threaded portion.
5, according to claim 1 have a proving installation that prevents that pressure is excessive, it is characterized in that it also comprises:
One test module, it is to be arranged at the 3rd test board, and have one the test pedestal, a framework and at least one testing element, wherein this test pedestal is to be arranged at the 3rd test board, this framework is to be arranged at the 3rd test board along this test pedestal outer rim, and this testing element is to be arranged at this test pedestal.
6, according to claim 5 have a proving installation that prevents that pressure is excessive, it is characterized in that wherein said testing element is a metal cylinder.
7, according to claim 5 have a proving installation that prevents that pressure is excessive, it is characterized in that wherein said framework is constituted by elastic material or by plastic cement material.
8, according to claim 1 have a proving installation that prevents that pressure is excessive, it is characterized in that it also comprises:
One probe, it is a distance of detecting the 3rd test board and this circuit board, and produces a detecting result; And
One switch, it is to stop this according to this detecting result to have the proving installation start that prevents that pressure is excessive.
9, according to claim 1 have a proving installation that prevents that pressure is excessive, it is characterized in that wherein said conduction module is a socket module, and this socket module comprises:
One pedestal, it is to be arranged at this circuit board; And
One fixed bar, it is to be arranged at this pedestal.
10, according to claim 9 have a proving installation that prevents that pressure is excessive, it is characterized in that it also comprises:
One conduction module through hole, wherein this fixed bar is to pass through this conduction module through hole.
11, according to claim 1 have a proving installation that prevents that pressure is excessive, it is characterized in that wherein said second test board and the 3rd test board are made of the bakelite material.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2004100955502A CN100360943C (en) | 2004-11-29 | 2004-11-29 | Detector capable of preventing overpressure |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2004100955502A CN100360943C (en) | 2004-11-29 | 2004-11-29 | Detector capable of preventing overpressure |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1782715A CN1782715A (en) | 2006-06-07 |
| CN100360943C true CN100360943C (en) | 2008-01-09 |
Family
ID=36773143
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB2004100955502A Expired - Fee Related CN100360943C (en) | 2004-11-29 | 2004-11-29 | Detector capable of preventing overpressure |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN100360943C (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101303385B (en) * | 2007-05-09 | 2010-05-26 | 和硕联合科技股份有限公司 | Tester machine platform |
| CN101498762B (en) * | 2008-01-29 | 2013-06-12 | 富葵精密组件(深圳)有限公司 | Electrical measurement tool |
| CN107478980A (en) * | 2017-08-04 | 2017-12-15 | 深圳市新国都支付技术有限公司 | A kind of POS mainboard automated testing method and circuit |
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| CN2314383Y (en) * | 1998-02-13 | 1999-04-14 | 春升电子股份有限公司 | Switching board for testing instruments of printed board circuits |
| US5974662A (en) * | 1993-11-16 | 1999-11-02 | Formfactor, Inc. | Method of planarizing tips of probe elements of a probe card assembly |
| CN1328644A (en) * | 1998-12-02 | 2001-12-26 | 佛姆法克特股份有限公司 | Probe card for probing wafers with raised contact elements |
| CN1421911A (en) * | 2001-11-23 | 2003-06-04 | 蔡炳根 | Improved structure of integrated circuit test bench |
| CN1129797C (en) * | 1996-02-13 | 2003-12-03 | 日本电子材料株式会社 | Probe, manufacture of same, and vertically operative type probe card assembly employing same |
| JP2004071909A (en) * | 2002-08-07 | 2004-03-04 | Tokyo Electron Ltd | Driving-gear and probe device of mounting stand |
| CN2648453Y (en) * | 2003-07-30 | 2004-10-13 | 铃德电子科技（深圳）有限公司 | Switching model of needle bed and switch for printed circuit board tester |
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2004
- 2004-11-29 CN CNB2004100955502A patent/CN100360943C/en not_active Expired - Fee Related
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5313157A (en) * | 1990-10-31 | 1994-05-17 | Hughes Aircraft Company | Probe for jesting an electrical circuit chip |
| US5974662A (en) * | 1993-11-16 | 1999-11-02 | Formfactor, Inc. | Method of planarizing tips of probe elements of a probe card assembly |
| CN1129797C (en) * | 1996-02-13 | 2003-12-03 | 日本电子材料株式会社 | Probe, manufacture of same, and vertically operative type probe card assembly employing same |
| CN2314383Y (en) * | 1998-02-13 | 1999-04-14 | 春升电子股份有限公司 | Switching board for testing instruments of printed board circuits |
| CN1328644A (en) * | 1998-12-02 | 2001-12-26 | 佛姆法克特股份有限公司 | Probe card for probing wafers with raised contact elements |
| CN1421911A (en) * | 2001-11-23 | 2003-06-04 | 蔡炳根 | Improved structure of integrated circuit test bench |
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Also Published As
| Publication number | Publication date |
|---|---|
| CN1782715A (en) | 2006-06-07 |
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Granted publication date: 20080109 Termination date: 20091229 |