CH638048A5 - Radiographic method of scanning diamonds - Google Patents
Radiographic method of scanning diamonds Download PDFInfo
- Publication number
- CH638048A5 CH638048A5 CH139679A CH139679A CH638048A5 CH 638048 A5 CH638048 A5 CH 638048A5 CH 139679 A CH139679 A CH 139679A CH 139679 A CH139679 A CH 139679A CH 638048 A5 CH638048 A5 CH 638048A5
- Authority
- CH
- Switzerland
- Prior art keywords
- diamond
- ray
- medium
- rays
- liquid
- Prior art date
Links
- 239000010432 diamond Substances 0.000 title claims description 53
- 238000000034 method Methods 0.000 title claims description 36
- 229910003460 diamond Inorganic materials 0.000 claims description 39
- 238000010521 absorption reaction Methods 0.000 claims description 27
- 230000005855 radiation Effects 0.000 claims description 19
- 239000007788 liquid Substances 0.000 claims description 15
- 239000000839 emulsion Substances 0.000 claims description 12
- 239000007787 solid Substances 0.000 claims description 10
- VZGDMQKNWNREIO-UHFFFAOYSA-N tetrachloromethane Chemical compound ClC(Cl)(Cl)Cl VZGDMQKNWNREIO-UHFFFAOYSA-N 0.000 claims description 6
- 239000007864 aqueous solution Substances 0.000 claims description 4
- WDIHJSXYQDMJHN-UHFFFAOYSA-L barium chloride Chemical group [Cl-].[Cl-].[Ba+2] WDIHJSXYQDMJHN-UHFFFAOYSA-L 0.000 claims description 4
- 229910001626 barium chloride Inorganic materials 0.000 claims description 4
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 3
- RLJMLMKIBZAXJO-UHFFFAOYSA-N lead nitrate Chemical compound [O-][N+](=O)O[Pb]O[N+]([O-])=O RLJMLMKIBZAXJO-UHFFFAOYSA-N 0.000 claims description 3
- 150000003839 salts Chemical class 0.000 claims description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 2
- 238000002441 X-ray diffraction Methods 0.000 claims description 2
- 229910052802 copper Inorganic materials 0.000 claims description 2
- 239000010949 copper Substances 0.000 claims description 2
- 229910001385 heavy metal Inorganic materials 0.000 claims description 2
- 239000012188 paraffin wax Substances 0.000 claims description 2
- 150000004945 aromatic hydrocarbons Chemical class 0.000 claims 1
- 238000012360 testing method Methods 0.000 description 32
- 230000009102 absorption Effects 0.000 description 26
- 238000002601 radiography Methods 0.000 description 16
- 239000000463 material Substances 0.000 description 12
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 9
- 230000007547 defect Effects 0.000 description 7
- 239000000203 mixture Substances 0.000 description 7
- 239000000243 solution Substances 0.000 description 6
- 229910016523 CuKa Inorganic materials 0.000 description 5
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 229910052840 fayalite Inorganic materials 0.000 description 4
- 229910052839 forsterite Inorganic materials 0.000 description 4
- 238000007654 immersion Methods 0.000 description 4
- 229910052742 iron Inorganic materials 0.000 description 4
- HCWCAKKEBCNQJP-UHFFFAOYSA-N magnesium orthosilicate Chemical compound [Mg+2].[Mg+2].[O-][Si]([O-])([O-])[O-] HCWCAKKEBCNQJP-UHFFFAOYSA-N 0.000 description 4
- 239000004575 stone Substances 0.000 description 4
- 238000003963 x-ray microscopy Methods 0.000 description 4
- 229910052799 carbon Inorganic materials 0.000 description 3
- 239000011888 foil Substances 0.000 description 3
- 230000005469 synchrotron radiation Effects 0.000 description 3
- -1 Fayalite Fe2Si04 Chemical compound 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 230000002745 absorbent Effects 0.000 description 2
- 239000002250 absorbent Substances 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 238000003491 array Methods 0.000 description 2
- 230000002238 attenuated effect Effects 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 230000002349 favourable effect Effects 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 238000000386 microscopy Methods 0.000 description 2
- 229910052609 olivine Inorganic materials 0.000 description 2
- 239000010450 olivine Substances 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 239000011343 solid material Substances 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- ZCYVEMRRCGMTRW-UHFFFAOYSA-N 7553-56-2 Chemical compound [I] ZCYVEMRRCGMTRW-UHFFFAOYSA-N 0.000 description 1
- VEXZGXHMUGYJMC-UHFFFAOYSA-M Chloride anion Chemical compound [Cl-] VEXZGXHMUGYJMC-UHFFFAOYSA-M 0.000 description 1
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- 241000196324 Embryophyta Species 0.000 description 1
- 206010073306 Exposure to radiation Diseases 0.000 description 1
- 241001465754 Metazoa Species 0.000 description 1
- 229910002651 NO3 Inorganic materials 0.000 description 1
- NHNBFGGVMKEFGY-UHFFFAOYSA-N Nitrate Chemical compound [O-][N+]([O-])=O NHNBFGGVMKEFGY-UHFFFAOYSA-N 0.000 description 1
- 239000004698 Polyethylene Substances 0.000 description 1
- ZGOFOSYUUXVFEO-UHFFFAOYSA-N [Fe+4].[O-][Si]([O-])([O-])[O-] Chemical compound [Fe+4].[O-][Si]([O-])([O-])[O-] ZGOFOSYUUXVFEO-UHFFFAOYSA-N 0.000 description 1
- 230000002159 abnormal effect Effects 0.000 description 1
- 239000010405 anode material Substances 0.000 description 1
- 229910052788 barium Inorganic materials 0.000 description 1
- DSAJWYNOEDNPEQ-UHFFFAOYSA-N barium atom Chemical compound [Ba] DSAJWYNOEDNPEQ-UHFFFAOYSA-N 0.000 description 1
- 229910052790 beryllium Inorganic materials 0.000 description 1
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N beryllium atom Chemical compound [Be] ATBAMAFKBVZNFJ-UHFFFAOYSA-N 0.000 description 1
- 210000000988 bone and bone Anatomy 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000011651 chromium Substances 0.000 description 1
- 230000003749 cleanliness Effects 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000000326 densiometry Methods 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 239000010437 gem Substances 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- QYFRTHZXAGSYGT-UHFFFAOYSA-L hexaaluminum dipotassium dioxosilane oxygen(2-) difluoride hydrate Chemical compound O.[O--].[O--].[O--].[O--].[O--].[O--].[O--].[O--].[O--].[F-].[F-].[Al+3].[Al+3].[Al+3].[Al+3].[Al+3].[Al+3].[K+].[K+].O=[Si]=O.O=[Si]=O.O=[Si]=O.O=[Si]=O.O=[Si]=O.O=[Si]=O QYFRTHZXAGSYGT-UHFFFAOYSA-L 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 239000011147 inorganic material Substances 0.000 description 1
- 229910052500 inorganic mineral Inorganic materials 0.000 description 1
- 239000011630 iodine Substances 0.000 description 1
- PNDPGZBMCMUPRI-UHFFFAOYSA-N iodine Chemical compound II PNDPGZBMCMUPRI-UHFFFAOYSA-N 0.000 description 1
- 229910052740 iodine Inorganic materials 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000015654 memory Effects 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 150000002736 metal compounds Chemical class 0.000 description 1
- 239000011707 mineral Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 238000000879 optical micrograph Methods 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 125000002524 organometallic group Chemical group 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 238000005375 photometry Methods 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 229920006254 polymer film Polymers 0.000 description 1
- 208000014733 refractive error Diseases 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000011435 rock Substances 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- 239000006104 solid solution Substances 0.000 description 1
- 238000012800 visualization Methods 0.000 description 1
- 239000001993 wax Substances 0.000 description 1
- 238000002424 x-ray crystallography Methods 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/389—Precious stones; Pearls
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/87—Investigating jewels
Landscapes
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB589878 | 1978-02-14 | ||
| GB2355178 | 1978-05-26 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CH638048A5 true CH638048A5 (en) | 1983-08-31 |
Family
ID=26240242
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CH139679A CH638048A5 (en) | 1978-02-14 | 1979-02-13 | Radiographic method of scanning diamonds |
Country Status (5)
| Country | Link |
|---|---|
| CH (1) | CH638048A5 (enrdf_load_stackoverflow) |
| DE (1) | DE2905367A1 (enrdf_load_stackoverflow) |
| FR (1) | FR2417100A1 (enrdf_load_stackoverflow) |
| NL (1) | NL7901179A (enrdf_load_stackoverflow) |
| ZA (1) | ZA79531B (enrdf_load_stackoverflow) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1126477A3 (de) * | 2000-02-14 | 2003-06-18 | Leica Microsystems Lithography GmbH | Verfahren zur Untersuchung von Strukturen auf einem Halbleiter-Substrat |
| DE102010033761A1 (de) * | 2010-08-09 | 2012-02-09 | Rolls-Royce Deutschland Ltd & Co Kg | Verfahren zur Durchstrahlungsprüfung von Bauteilen |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2128365C3 (de) * | 1971-06-08 | 1974-05-22 | Optische Werke G. Rodenstock, 8000 Muenchen | Einrichtung zur vergrößerten Darstellung des Querschnittes von unzerstörten Contactlinsen oder dgl |
| DE2444644A1 (de) * | 1974-09-18 | 1976-04-08 | Dihaco Diamanten Handels Co | Verfahren und vorrichtung zur ermittlung und groessenbestimmung von einschluessen in edelsteinen |
| DE2604410A1 (de) * | 1974-09-18 | 1977-08-11 | Dihaco Diamanten Handels Co | Verfahren und vorrichtung zur ermittlung und groessenbestimmung von einschluessen in edelsteinen |
-
1979
- 1979-02-07 ZA ZA79531A patent/ZA79531B/xx unknown
- 1979-02-13 DE DE19792905367 patent/DE2905367A1/de active Granted
- 1979-02-13 CH CH139679A patent/CH638048A5/de not_active IP Right Cessation
- 1979-02-14 FR FR7903747A patent/FR2417100A1/fr active Granted
- 1979-02-14 NL NL7901179A patent/NL7901179A/xx not_active Application Discontinuation
Also Published As
| Publication number | Publication date |
|---|---|
| NL7901179A (nl) | 1979-08-16 |
| ZA79531B (en) | 1980-02-27 |
| FR2417100A1 (fr) | 1979-09-07 |
| DE2905367A1 (de) | 1979-08-23 |
| FR2417100B1 (enrdf_load_stackoverflow) | 1985-02-22 |
| DE2905367C2 (enrdf_load_stackoverflow) | 1988-07-28 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| DE69633618T2 (de) | Vereinfachte bedingungen und konfigurationen für phasenkontrast-bilderzeugung mit harten röntgenstrahlen | |
| DE3840736C2 (enrdf_load_stackoverflow) | ||
| DE3734300C2 (enrdf_load_stackoverflow) | ||
| DE2105259A1 (de) | Gerat fur die Röntgenstrahlenfotografie | |
| DE2740284A1 (de) | Kamera mit einer holographischen anzeige | |
| DE2166526A1 (de) | Einrichtung zur abbildung eines objektes mittels elektromagnetischer strahlung oder korpuskelstrahlung hoher energei | |
| DE69515845T2 (de) | Untersuchung eines diamanten | |
| DE2514942A1 (de) | Fluoroskopischer schirm | |
| DE2360197A1 (de) | Verfahren zur erhoehung der schaerfentiefe und/oder des aufloesungsvermoegens von lichtmikroskopen | |
| DE1497614A1 (de) | Fotografische Speicher-Aufzeichnung von Informationen und Verfahren zur Herstellung solcher Aufzeichnungen | |
| DE68916168T2 (de) | Verfahren und Vorrichtung zur Analyse einer Oberfläche. | |
| DE10050349C2 (de) | Verfahren zur Bestimmung der Strahlenbeständigkeit von Kristallen und deren Verwendung | |
| DE60021972T2 (de) | Vorrichtung und Verfahren zur Bildgebung mittels Röntgenstrahlen | |
| DE2747856C2 (enrdf_load_stackoverflow) | ||
| EP0456897A1 (de) | Messanordnung für die Röntgenfluoreszenzanalyse | |
| DE3789813T2 (de) | Pulverdiffraktionsverfahren und -vorrichtung. | |
| DE2306764A1 (de) | Mikroschwaerzungsmessverfahren und mikroschwaerzungsmesser bzw. mikrodensitometer | |
| DE2000116A1 (de) | Eingangsschirm fuer Bildvorrichtungen | |
| CH638048A5 (en) | Radiographic method of scanning diamonds | |
| DE2016753C3 (de) | Vorrichtung zur Justierung des Objektfeldes in Elektronenmikroskopen | |
| DE69002229T2 (de) | Telezentrisches abtasten für transparente speicherphosphore. | |
| DE60036161T3 (de) | Verfahren zur Aufnahme von Röntgenstrahlen-Bildern | |
| DE1256531B (de) | Hilfsbelichtungseinrichtung fuer Reproduktions- und Vergroesserungsgeraete | |
| DE3504534A1 (de) | Verfahren und geraet zum messen eines gammastrahlenfluss-einfalls | |
| DE19955848A1 (de) | Verfahren zur röntgenologischen Abbildung von Untersuchungsobjekten mit geringen Dichteunterschieden sowie röntgenoptische Systeme |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PL | Patent ceased |