CH617772A5 - - Google Patents

Download PDF

Info

Publication number
CH617772A5
CH617772A5 CH1015677A CH1015677A CH617772A5 CH 617772 A5 CH617772 A5 CH 617772A5 CH 1015677 A CH1015677 A CH 1015677A CH 1015677 A CH1015677 A CH 1015677A CH 617772 A5 CH617772 A5 CH 617772A5
Authority
CH
Switzerland
Prior art keywords
image
imprint
diagonal
detector
plane
Prior art date
Application number
CH1015677A
Other languages
English (en)
French (fr)
Inventor
Junpei Tsujiuchi
Toshio Honda
Hiroshi Okuda
Original Assignee
Seiko Instr & Electronics
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP51099050A external-priority patent/JPS605894B2/ja
Priority claimed from JP9905176A external-priority patent/JPS6034699B2/ja
Application filed by Seiko Instr & Electronics filed Critical Seiko Instr & Electronics
Publication of CH617772A5 publication Critical patent/CH617772A5/fr

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/40Investigating hardness or rebound hardness
    • G01N3/42Investigating hardness or rebound hardness by performing impressions under a steady load by indentors, e.g. sphere, pyramid
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0098Tests specified by its name, e.g. Charpy, Brinnel, Mullen
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02Details not specific for a particular testing method
    • G01N2203/06Indicating or recording means; Sensing means
    • G01N2203/0641Indicating or recording means; Sensing means using optical, X-ray, ultraviolet, infrared or similar detectors
    • G01N2203/0647Image analysis

Landscapes

  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
CH1015677A 1976-08-19 1977-08-18 CH617772A5 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP51099050A JPS605894B2 (ja) 1976-08-19 1976-08-19 ビツカ−ス硬さ試験機
JP9905176A JPS6034699B2 (ja) 1976-08-19 1976-08-19 硬さ試験機

Publications (1)

Publication Number Publication Date
CH617772A5 true CH617772A5 (ja) 1980-06-13

Family

ID=26440176

Family Applications (1)

Application Number Title Priority Date Filing Date
CH1015677A CH617772A5 (ja) 1976-08-19 1977-08-18

Country Status (4)

Country Link
US (1) US4147052A (ja)
CH (1) CH617772A5 (ja)
DE (1) DE2737554A1 (ja)
GB (1) GB1563570A (ja)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4255966A (en) * 1977-11-25 1981-03-17 Vickers Limited Hardness testing apparatus
GB1588248A (en) * 1977-11-25 1981-04-23 Vickers Ltd Hardness testing apparatus
US5048966A (en) * 1978-05-22 1991-09-17 Schram Richard R Apparatus and system for linewidth measurements
US4275966A (en) * 1979-01-18 1981-06-30 Claus Kleesattel Method and apparatus for the measurement of hardness testing indentations
US4312220A (en) * 1979-10-17 1982-01-26 King Tester Corporation Portable hardness tester
IT1128984B (it) * 1980-08-26 1986-06-04 Riv Officine Di Villar Perosa Dispositivo lettore di impronte ottenute durante prove di durezza secondo il metodo vickers
US4361034A (en) * 1981-02-13 1982-11-30 King Tester Corporation Portable hardness tester
GB2109923B (en) * 1981-11-13 1985-05-22 De La Rue Syst Optical scanner
DE3378493D1 (ja) * 1982-09-25 1988-12-22 Matsuzawa Seiki Kk
US4535623A (en) * 1983-02-11 1985-08-20 Paul Gilberto Material hardness testing apparatus
JPS59159004A (ja) * 1983-03-01 1984-09-08 N C Sangyo Kk 孔径測定装置
GB2144216B (en) * 1983-07-28 1986-10-22 Platon Limited Ga Opto-electronic position sensing
JPS6042606A (ja) * 1983-08-04 1985-03-06 ナノメトリツクス・インコ−ポレ−テツド 光学的寸法測定装置
US4621523A (en) * 1983-10-24 1986-11-11 Aluminum Company Of America Rapid determination of metal strength from hardness tests
FR2558594B1 (fr) * 1984-01-23 1986-07-11 Radisa Sa Procede de mesure de la durete d'un materiau et dispositif pour la mise en oeuvre de ce procede
IT1179997B (it) * 1984-02-24 1987-09-23 Consiglio Nazionale Ricerche Procedimento ed apparecchiatura per il rilievo dell impronta lasciata in un provino nella misura della durezza alla penetrazione
DD248035A3 (de) * 1984-10-29 1987-07-29 Thaelmann Schwermaschbau Veb Verfahren zur beruehrungslosen durchmesserbestimmung von messgut
US4820051A (en) * 1986-08-21 1989-04-11 Nec Corporation Apparatus for determining microhardness
US4945490A (en) * 1988-04-11 1990-07-31 Biddle Jr Ernest L Brinell hardness indicator with digital readout
US5392122A (en) * 1990-10-01 1995-02-21 Ulanov; Mark Apparatus and method for the determination of geometrical dimensions and physical characteristics of objects
US5150608A (en) * 1991-02-19 1992-09-29 Giancarlo Mazzoleni Centering device for use with brinell hardness-measuring probe
FR2688320A1 (fr) * 1992-03-06 1993-09-10 Micro 2000 Sa Procede et dispositif d'eclairage d'une empreinte formee a la surface d'un materiau et application a un dispositif de controle de la durete.
JP2013050379A (ja) * 2011-08-31 2013-03-14 Mitsutoyo Corp 硬さ試験機
US8590367B2 (en) 2011-08-31 2013-11-26 King Tester Corporation Portable Brinell hardness tester
US9568406B2 (en) 2011-08-31 2017-02-14 King Tester Corporation Portable brinell hardness tester with stented through bore pumping chamber
JP5977556B2 (ja) * 2012-03-27 2016-08-24 株式会社ミツトヨ 硬さ試験機
US9063048B2 (en) * 2012-07-12 2015-06-23 Mitutoyo Corporation Hardness tester and program
USD729613S1 (en) 2012-08-28 2015-05-19 King Tester Corporation Stroke limiter bracket
CN111226106A (zh) * 2017-10-16 2020-06-02 茵品特有限责任公司 用于自动工件试验的装置和方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2713259A (en) * 1949-12-21 1955-07-19 Grodzinski Paul Apparatus for testing the hardness of materials
US3737856A (en) * 1970-03-06 1973-06-05 Electro Optics Devices Corp Automated optical comparator
BE779743A (fr) * 1971-03-05 1972-06-16 Sopelem Microdurometre a calcul automatique
US3822946A (en) * 1972-12-07 1974-07-09 Schiller Industries Inc Dimensional measuring apparatus using optical scan especially for hardness testing

Also Published As

Publication number Publication date
DE2737554A1 (de) 1978-03-09
US4147052A (en) 1979-04-03
GB1563570A (en) 1980-03-26

Similar Documents

Publication Publication Date Title
CH617772A5 (ja)
EP0028774B1 (en) Apparatus for detecting defects in a periodic pattern
US6366690B1 (en) Pixel based machine for patterned wafers
US7916281B2 (en) Apparatus for producing optical signatures from coinage
EP0063980B1 (fr) Appareil de projection à dispositif de mise au point
US3957376A (en) Measuring method and system using a diffraction pattern
FR2682473A1 (fr) Procede et dispositif de relevement optique de la topographie d'objets.
US5255069A (en) Electro-optical interferometric microdensitometer system
FR2707018A1 (ja)
EP0402191B1 (fr) Procédé et dispositif de mesure de largeur de traits à balayage optique
JP2533514B2 (ja) 凹部深さ・膜厚測定装置
FR2499718A1 (fr) Procede et dispositif pour la detection des defauts de surface des pieces mecaniques, en particulier des pieces a surface courbe
FR2606522A1 (fr) Dispositif et procede optique de mise au point photoelectrique, notamment pour microscopes d'operations chirurgicales
FR2632728A1 (fr) Procede et appareil pour la determination automatique du comportement d'une goutte d'un liquide par rapport a une surface d'un materiau
EP0717291B1 (fr) Procédé de mesure des dimensions du foyer optique d'un tube radiogène
JP3276577B2 (ja) 光学式表面粗さ計測装置
JPS6034699B2 (ja) 硬さ試験機
JP3365881B2 (ja) レンズの屈折率検査装置
KR20080023183A (ko) 기판 표면 에러를 광학적으로 검출하기 위한 장치
EP0053992A1 (fr) Procédé et dispositif de contrôle optique des états de surface de produits métallurgiques
JPS605894B2 (ja) ビツカ−ス硬さ試験機
SU932223A1 (ru) Способ определени напр жений в издели х из диэлектрических материалов
JPS57113342A (en) Eccentricity measurement
JPS60500270A (ja) 検査装置及び方法
JPH02145943A (ja) 限られた微小点部分の反射測定法

Legal Events

Date Code Title Description
PL Patent ceased