CH505461A - Ionenquelle - Google Patents

Ionenquelle

Info

Publication number
CH505461A
CH505461A CH620170A CH620170A CH505461A CH 505461 A CH505461 A CH 505461A CH 620170 A CH620170 A CH 620170A CH 620170 A CH620170 A CH 620170A CH 505461 A CH505461 A CH 505461A
Authority
CH
Switzerland
Prior art keywords
ion source
ion
source
Prior art date
Application number
CH620170A
Other languages
English (en)
Inventor
Andrew Derek
Graham Pittaway Lawrence
Chisholm Thomas
Original Assignee
Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Nv filed Critical Philips Nv
Publication of CH505461A publication Critical patent/CH505461A/de

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
CH620170A 1969-04-28 1970-04-24 Ionenquelle CH505461A (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB21453/69A GB1237028A (en) 1969-04-28 1969-04-28 Ion source

Publications (1)

Publication Number Publication Date
CH505461A true CH505461A (de) 1971-03-31

Family

ID=10163206

Family Applications (1)

Application Number Title Priority Date Filing Date
CH620170A CH505461A (de) 1969-04-28 1970-04-24 Ionenquelle

Country Status (4)

Country Link
US (1) US3619684A (de)
CH (1) CH505461A (de)
FR (1) FR2040328A1 (de)
GB (1) GB1237028A (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1437174A (en) * 1972-05-26 1976-05-26 Mullard Ltd Ion gauges
US3760225A (en) * 1972-06-06 1973-09-18 Atomic Energy Commission High current plasma source
US3930163A (en) * 1974-03-22 1975-12-30 Varian Associates Ion beam apparatus with separately replaceable elements
US4579144A (en) * 1983-03-04 1986-04-01 Uti Instrument Company Electron impact ion source for trace analysis
US4689574A (en) * 1983-03-04 1987-08-25 Uti Instrument Co. Electron impact ion source for trace analysis
JPS60202649A (ja) * 1984-03-26 1985-10-14 Seiko Instr & Electronics Ltd 二重格子陽極電子衝撃型イオン源
US4755722A (en) * 1984-04-02 1988-07-05 Rpc Industries Ion plasma electron gun
US4742232A (en) * 1987-03-03 1988-05-03 United States Of America As Represented By The Adminstrator, National Aeronautics And Space Administration Ion generator and ion application system
GB8820359D0 (en) * 1988-08-26 1988-09-28 Atomic Energy Authority Uk Charged particle grid
US5302827A (en) * 1993-05-11 1994-04-12 Mks Instruments, Inc. Quadrupole mass spectrometer
GB9409953D0 (en) * 1994-05-17 1994-07-06 Fisons Plc Mass spectrometer and electron impact ion source therefor
US6300637B1 (en) * 1998-10-16 2001-10-09 Siemens Energy & Automation, Inc. Increased ionization efficiency in a mass spectrometer using electron beam trajectory modification
DE19949978A1 (de) * 1999-10-08 2001-05-10 Univ Dresden Tech Elektronenstoßionenquelle
US8674321B2 (en) * 2012-02-28 2014-03-18 Tiza Lab, L.L.C. Microplasma ion source for focused ion beam applications
US8822912B2 (en) 2012-12-19 2014-09-02 Schlumberger Technology Corporation Ion source having increased electron path length
US8779351B2 (en) * 2012-12-19 2014-07-15 Schlumberger Technology Corporation Ion source employing secondary electron generation
US9799504B2 (en) * 2015-12-11 2017-10-24 Horiba Stec, Co., Ltd. Ion source, quadrupole mass spectrometer and residual gas analyzing method
CN109406689B (zh) * 2018-10-22 2023-05-12 南京国科精准医学科技有限公司 一种离子渗透气体分子分离方法及装置
CN112516797B (zh) * 2020-12-01 2022-09-16 中国科学院近代物理研究所 一种用于同位素分离系统的静电聚焦和加速系统及方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB976664A (en) * 1962-02-20 1964-12-02 Atomic Energy Authority Uk Improvements in or relating to ion sources

Also Published As

Publication number Publication date
DE2018507A1 (de) 1970-12-10
FR2040328A1 (de) 1971-01-22
US3619684A (en) 1971-11-09
DE2018507B2 (de) 1976-11-04
GB1237028A (en) 1971-06-30

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Legal Events

Date Code Title Description
PL Patent ceased