CH332309A - Object arrangement in electron microscopes - Google Patents

Object arrangement in electron microscopes

Info

Publication number
CH332309A
CH332309A CH332309DA CH332309A CH 332309 A CH332309 A CH 332309A CH 332309D A CH332309D A CH 332309DA CH 332309 A CH332309 A CH 332309A
Authority
CH
Switzerland
Prior art keywords
electron microscopes
object arrangement
arrangement
microscopes
electron
Prior art date
Application number
Other languages
German (de)
Inventor
Nat Leisegang Siegfried Dr Rer
Original Assignee
Siemens Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag filed Critical Siemens Ag
Publication of CH332309A publication Critical patent/CH332309A/en

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09BORGANIC DYES OR CLOSELY-RELATED COMPOUNDS FOR PRODUCING DYES, e.g. PIGMENTS; MORDANTS; LAKES
    • C09B33/00Disazo and polyazo dyes of the types A->K<-B, A->B->K<-C, or the like, prepared by diazotising and coupling
    • C09B33/02Disazo dyes
    • C09B33/08Disazo dyes in which the coupling component is a hydroxy-amino compound
    • C09B33/10Disazo dyes in which the coupling component is a hydroxy-amino compound in which the coupling component is an amino naphthol
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/20Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support

Landscapes

  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Electron Sources, Ion Sources (AREA)
CH332309D 1954-07-14 1955-07-09 Object arrangement in electron microscopes CH332309A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DES40018A DE1106439B (en) 1954-07-14 1954-07-14 Object holder for electron microscopes equipped with a cooling device

Publications (1)

Publication Number Publication Date
CH332309A true CH332309A (en) 1958-08-31

Family

ID=7483497

Family Applications (1)

Application Number Title Priority Date Filing Date
CH332309D CH332309A (en) 1954-07-14 1955-07-09 Object arrangement in electron microscopes

Country Status (5)

Country Link
US (1) US2858444A (en)
CH (1) CH332309A (en)
DE (1) DE1106439B (en)
GB (1) GB794356A (en)
NL (2) NL198831A (en)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2927209A (en) * 1957-07-05 1960-03-01 Jones Richard Norman Spectrometric cell structure and charging method therefor
NL108507C (en) * 1958-09-13
US3112398A (en) * 1960-02-15 1963-11-26 Shimula Yoshihiro Device for cooling the specimen in X-ray diffraction apparatus
US3008044A (en) * 1960-02-25 1961-11-07 Gen Electric Application of superconductivity in guiding charged particles
DE1160121B (en) * 1961-02-07 1963-12-27 Siemens Ag Heatable slide for electron beam devices, especially electron microscopes
DE1165780B (en) * 1961-02-28 1964-03-19 Siemens Ag Electron microscope with a preparation adjustment table that is in particular not supported symmetrically to the beam axis
AT227797B (en) * 1961-04-13 1963-06-10 Hans Dipl Ing Dr Techn List Device for setting and changing the spatial position of objects to be treated in a treatment chamber
US3171956A (en) * 1962-03-30 1965-03-02 Rca Corp Variant temperature environment for specimen stage of scientific instrument
US3171957A (en) * 1962-03-30 1965-03-02 Rca Corp Specimen holder for an electron microscope with means to support a specimen across a thermocouple junction
DE1215832B (en) 1963-04-19 1966-05-05 Max Planck Gesellschaft Corpuscular beam apparatus working on the pump, in particular an electron microscope, with an object cartridge which receives the object carrier and consists of two mutually heat-insulated cartridge parts
DE1202915B (en) * 1963-09-09 1965-10-14 Siemens Ag Corpuscular beam apparatus working on the pump, in particular an electron microscope, with an object cartridge which receives the object carrier and which is connected to a deep-freezing device
US3548189A (en) * 1965-06-16 1970-12-15 Aden B Meinel Method employing ion beams for polishing and figuring refractory dielectrics
US3973125A (en) * 1965-09-16 1976-08-03 Siemens Aktiengesellschaft Corpuscular-ray apparatus with a cryogenically cooled specimen space
FR1553218A (en) * 1967-02-03 1969-01-10
US3525228A (en) * 1969-02-04 1970-08-25 Atomic Energy Commission Nonboiling liquid target for a high-energy particle beam
US4071766A (en) * 1974-03-28 1978-01-31 Mta Kozponti Kemiai Kutato Intezet Micro-chamber for electron optical examinations particularly for the electron microscopic examination of biological objects
FR2466097A1 (en) 1979-09-20 1981-03-27 Georges Adrien VARIABLE TEMPERATURE OBJECT HOLDER FOR ELECTRONIC MICROSCOPE
US4262194A (en) * 1979-12-18 1981-04-14 The United States Of America As Represented By The Department Of Health, Education & Welfare High resolution electron microscope cold stage
US5168004A (en) * 1988-08-25 1992-12-01 Basf Aktiengesellschaft Melt-spun acrylic fibers possessing a highly uniform internal structure which are particularly suited for thermal conversion to quality carbon fibers
CN119024903B (en) * 2024-08-21 2025-04-08 崂山国家实验室 Sub-millisecond time resolution freezing electron microscope sample temperature control system

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE659092C (en) * 1934-12-12 1938-04-25 Ernst Ruska Dr Ing Infeed device for corpuscular jet devices operated on the pump
DE708778C (en) * 1937-11-20 1942-01-26 Gewerkschaft Mathias Stinnes Device for introducing objects into the electron microscope
US2220973A (en) * 1939-03-31 1940-11-12 Rca Corp Electron microscope
DE902535C (en) * 1941-12-11 1954-01-25 Manfred Von Ardenne Object holder for electron beam devices
CH236120A (en) * 1942-04-29 1945-01-15 Fides Gmbh Method for examining an object in a corpuscular beam apparatus.

Also Published As

Publication number Publication date
NL101213C (en)
DE1106439B (en) 1961-05-10
NL198831A (en)
GB794356A (en) 1958-04-30
US2858444A (en) 1958-10-28

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