CH325279A - electron microscope - Google Patents

electron microscope

Info

Publication number
CH325279A
CH325279A CH325279DA CH325279A CH 325279 A CH325279 A CH 325279A CH 325279D A CH325279D A CH 325279DA CH 325279 A CH325279 A CH 325279A
Authority
CH
Switzerland
Prior art keywords
electron microscope
microscope
electron
Prior art date
Application number
Other languages
German (de)
Inventor
Kazato Kenji
Ito Kazuo
Original Assignee
Kabushikikaisha Nihondenshi Ko
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kabushikikaisha Nihondenshi Ko filed Critical Kabushikikaisha Nihondenshi Ko
Publication of CH325279A publication Critical patent/CH325279A/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/10—Lenses
    • H01J37/12—Lenses electrostatic
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S164/00—Metal founding
    • Y10S164/04—Dental
CH325279D 1954-04-12 1954-09-04 electron microscope CH325279A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP325279X 1954-04-12

Publications (1)

Publication Number Publication Date
CH325279A true CH325279A (en) 1957-10-31

Family

ID=12361421

Family Applications (1)

Application Number Title Priority Date Filing Date
CH325279D CH325279A (en) 1954-04-12 1954-09-04 electron microscope

Country Status (5)

Country Link
US (1) US2753458A (en)
CH (1) CH325279A (en)
DE (1) DE1039153B (en)
FR (1) FR1113365A (en)
GB (1) GB772621A (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3290119A (en) * 1959-05-14 1966-12-06 Nuclear Technical Services Cor Inspection unit
US3051834A (en) * 1959-09-16 1962-08-28 Shimula Yoshihiro Automatic recording system of x-ray diffraction patterns
US3313936A (en) * 1964-01-06 1967-04-11 Varian Associates Low energy electron diffraction apparatus having three concentric tubular focusing elctrodes
US3171958A (en) * 1962-03-30 1965-03-02 Rca Corp Heated specimen holder for the electron microscope
GB973051A (en) * 1962-08-28 1964-10-21 Ass Elect Ind Improvements relating to electron microscope specimen holders
US3327114A (en) * 1964-06-23 1967-06-20 Alfred F Diorio Low-angle x-ray diffraction camera comprising releasably connected sections and adjustable beam apertures and stops
US3896314A (en) * 1972-12-14 1975-07-22 Jeol Ltd Specimen heating and positioning device for an electron microscope
US4142088A (en) * 1973-08-17 1979-02-27 The United States Of America As Represented By The United States Department Of Energy Method of mounting a fuel pellet in a laser-excited fusion reactor
US4071766A (en) * 1974-03-28 1978-01-31 Mta Kozponti Kemiai Kutato Intezet Micro-chamber for electron optical examinations particularly for the electron microscopic examination of biological objects
US5296669A (en) * 1992-05-29 1994-03-22 Hitachi, Ltd. Specimen heating device for use with an electron microscope

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE659092C (en) * 1934-12-12 1938-04-25 Ernst Ruska Dr Ing Infeed device for corpuscular jet devices operated on the pump
BE434135A (en) * 1938-05-02
CH240304A (en) * 1941-12-03 1945-12-15 Ardenne Manfred Von Heatable slide on an electron beam device.
CH233969A (en) * 1942-04-29 1944-08-31 Fides Gmbh Corpuscular beam apparatus.
DE888896C (en) * 1943-08-03 1953-09-07 Siemens Ag Electrically heatable slide for electron beam devices
US2417213A (en) * 1944-12-28 1947-03-11 Rca Corp Device for indirect heating of materials
US2467224A (en) * 1948-02-21 1949-04-12 Rca Corp Neutralization of electrostatic charges in electron-optical instruments
US2467225A (en) * 1948-05-22 1949-04-12 Rca Corp Reducing specimen contamination in electron optical instruments

Also Published As

Publication number Publication date
DE1039153B (en) 1958-09-18
US2753458A (en) 1956-07-03
FR1113365A (en) 1956-03-28
GB772621A (en) 1957-04-17

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