CA994862A - Non-destructive measurement of dielectric properties - Google Patents

Non-destructive measurement of dielectric properties

Info

Publication number
CA994862A
CA994862A CA186,058A CA186058A CA994862A CA 994862 A CA994862 A CA 994862A CA 186058 A CA186058 A CA 186058A CA 994862 A CA994862 A CA 994862A
Authority
CA
Canada
Prior art keywords
dielectric properties
destructive measurement
destructive
measurement
dielectric
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA186,058A
Other languages
English (en)
Other versions
CA186058S (en
Inventor
Bob H. Yun
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Application granted granted Critical
Publication of CA994862A publication Critical patent/CA994862A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2637—Circuits therefor for testing other individual devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
CA186,058A 1972-12-04 1973-11-16 Non-destructive measurement of dielectric properties Expired CA994862A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US00312249A US3840809A (en) 1972-12-04 1972-12-04 Non-destructive measurement of dielectric properties

Publications (1)

Publication Number Publication Date
CA994862A true CA994862A (en) 1976-08-10

Family

ID=23210564

Family Applications (1)

Application Number Title Priority Date Filing Date
CA186,058A Expired CA994862A (en) 1972-12-04 1973-11-16 Non-destructive measurement of dielectric properties

Country Status (7)

Country Link
US (1) US3840809A (cs)
JP (1) JPS5412235B2 (cs)
CA (1) CA994862A (cs)
DE (1) DE2359184C3 (cs)
FR (1) FR2209109B1 (cs)
GB (1) GB1400960A (cs)
IT (1) IT999366B (cs)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3995216A (en) * 1975-04-28 1976-11-30 International Business Machines Corporation Technique for measuring surface states in metal-insulator-semiconductor structures
US4168432A (en) * 1978-01-16 1979-09-18 Rca Corporation Method of testing radiation hardness of a semiconductor device
US4646009A (en) * 1982-05-18 1987-02-24 Ade Corporation Contacts for conductivity-type sensors
US4509012A (en) * 1982-12-30 1985-04-02 Lin Shi Tron Method for determining the characteristic behavior of a metal-insulator-semiconductor device in a deep depletion mode
US4489477A (en) * 1984-02-23 1984-12-25 Northern Telecom Limited Method for screening laser diodes
US4758786A (en) * 1986-08-06 1988-07-19 Molecular Devices Corporation Method of analyzing semiconductor systems
US4906939A (en) * 1988-12-16 1990-03-06 E. I. Du Pont De Nemours And Company Device for automatically ascertaining capacitor breakdown voltage
US4931721A (en) * 1988-12-22 1990-06-05 E. I. Du Pont De Nemours And Company Device for automatically ascertaining capacitance, dissipation factor and insulation resistance of a plurality of capacitors
KR960026519A (ko) * 1994-12-31 1996-07-22 김주용 유전체에 대한 신뢰성 측정 방법
US6680621B2 (en) * 2001-01-26 2004-01-20 Semiconductor Diagnostics, Inc. Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current
US6597193B2 (en) * 2001-01-26 2003-07-22 Semiconductor Diagnostics, Inc. Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current
KR20060007020A (ko) * 2003-04-17 2006-01-23 코닌클리즈케 필립스 일렉트로닉스 엔.브이. 유전체 두께 결정 방법 및 장치와 전기 소자 제조 방법
US7872465B2 (en) * 2005-06-30 2011-01-18 The Boeing Company Apparatus and methods for evaluating material volatility
US7965559B2 (en) * 2008-05-27 2011-06-21 Georgia Tech Research Corporation Systems and methods for improved floating-gate transistor programming
US8686744B2 (en) * 2010-07-20 2014-04-01 Texas Instruments Incorporated Precision measurement of capacitor mismatch

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE337430B (cs) * 1969-11-17 1971-08-09 Inst Halvledarforskning Ab

Also Published As

Publication number Publication date
US3840809A (en) 1974-10-08
GB1400960A (en) 1975-07-16
DE2359184B2 (de) 1981-04-09
DE2359184A1 (de) 1974-06-06
JPS4990176A (cs) 1974-08-28
DE2359184C3 (de) 1982-02-04
IT999366B (it) 1976-02-20
FR2209109B1 (cs) 1978-04-21
JPS5412235B2 (cs) 1979-05-21
FR2209109A1 (cs) 1974-06-28

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