IT999366B - Apparecchiatura perfezionata per misurare le proprieta di materiali dielettrici - Google Patents

Apparecchiatura perfezionata per misurare le proprieta di materiali dielettrici

Info

Publication number
IT999366B
IT999366B IT31275/73A IT3127573A IT999366B IT 999366 B IT999366 B IT 999366B IT 31275/73 A IT31275/73 A IT 31275/73A IT 3127573 A IT3127573 A IT 3127573A IT 999366 B IT999366 B IT 999366B
Authority
IT
Italy
Prior art keywords
properties
measuring
dielectric materials
perfected
equipment
Prior art date
Application number
IT31275/73A
Other languages
English (en)
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Application granted granted Critical
Publication of IT999366B publication Critical patent/IT999366B/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2637—Circuits therefor for testing other individual devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
IT31275/73A 1972-12-04 1973-11-14 Apparecchiatura perfezionata per misurare le proprieta di materiali dielettrici IT999366B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US00312249A US3840809A (en) 1972-12-04 1972-12-04 Non-destructive measurement of dielectric properties

Publications (1)

Publication Number Publication Date
IT999366B true IT999366B (it) 1976-02-20

Family

ID=23210564

Family Applications (1)

Application Number Title Priority Date Filing Date
IT31275/73A IT999366B (it) 1972-12-04 1973-11-14 Apparecchiatura perfezionata per misurare le proprieta di materiali dielettrici

Country Status (7)

Country Link
US (1) US3840809A (it)
JP (1) JPS5412235B2 (it)
CA (1) CA994862A (it)
DE (1) DE2359184C3 (it)
FR (1) FR2209109B1 (it)
GB (1) GB1400960A (it)
IT (1) IT999366B (it)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3995216A (en) * 1975-04-28 1976-11-30 International Business Machines Corporation Technique for measuring surface states in metal-insulator-semiconductor structures
US4168432A (en) * 1978-01-16 1979-09-18 Rca Corporation Method of testing radiation hardness of a semiconductor device
US4646009A (en) * 1982-05-18 1987-02-24 Ade Corporation Contacts for conductivity-type sensors
US4509012A (en) * 1982-12-30 1985-04-02 Lin Shi Tron Method for determining the characteristic behavior of a metal-insulator-semiconductor device in a deep depletion mode
US4489477A (en) * 1984-02-23 1984-12-25 Northern Telecom Limited Method for screening laser diodes
US4758786A (en) * 1986-08-06 1988-07-19 Molecular Devices Corporation Method of analyzing semiconductor systems
US4906939A (en) * 1988-12-16 1990-03-06 E. I. Du Pont De Nemours And Company Device for automatically ascertaining capacitor breakdown voltage
US4931721A (en) * 1988-12-22 1990-06-05 E. I. Du Pont De Nemours And Company Device for automatically ascertaining capacitance, dissipation factor and insulation resistance of a plurality of capacitors
KR960026519A (ko) * 1994-12-31 1996-07-22 김주용 유전체에 대한 신뢰성 측정 방법
US6597193B2 (en) * 2001-01-26 2003-07-22 Semiconductor Diagnostics, Inc. Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current
US6680621B2 (en) * 2001-01-26 2004-01-20 Semiconductor Diagnostics, Inc. Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current
WO2004092676A1 (en) * 2003-04-17 2004-10-28 Koninklijke Philips Electronics N.V. Method and apparatus for determining the thickness of a dielectric layer
US7872465B2 (en) * 2005-06-30 2011-01-18 The Boeing Company Apparatus and methods for evaluating material volatility
US7965559B2 (en) * 2008-05-27 2011-06-21 Georgia Tech Research Corporation Systems and methods for improved floating-gate transistor programming
US8686744B2 (en) * 2010-07-20 2014-04-01 Texas Instruments Incorporated Precision measurement of capacitor mismatch

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE337430B (it) * 1969-11-17 1971-08-09 Inst Halvledarforskning Ab

Also Published As

Publication number Publication date
CA994862A (en) 1976-08-10
DE2359184B2 (de) 1981-04-09
JPS4990176A (it) 1974-08-28
DE2359184A1 (de) 1974-06-06
GB1400960A (en) 1975-07-16
FR2209109B1 (it) 1978-04-21
US3840809A (en) 1974-10-08
FR2209109A1 (it) 1974-06-28
JPS5412235B2 (it) 1979-05-21
DE2359184C3 (de) 1982-02-04

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