CA2849330C - Slide scanner with a tilted image - Google Patents

Slide scanner with a tilted image Download PDF

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Publication number
CA2849330C
CA2849330C CA2849330A CA2849330A CA2849330C CA 2849330 C CA2849330 C CA 2849330C CA 2849330 A CA2849330 A CA 2849330A CA 2849330 A CA2849330 A CA 2849330A CA 2849330 C CA2849330 C CA 2849330C
Authority
CA
Canada
Prior art keywords
specimen
scan
detector array
instrument
scanning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CA2849330A
Other languages
English (en)
French (fr)
Other versions
CA2849330A1 (en
Inventor
Savvas Damaskinos (Nmi)
Arthur Edward Dixon
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Huron Technologies International Inc
Original Assignee
Huron Technologies International Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Huron Technologies International Inc filed Critical Huron Technologies International Inc
Publication of CA2849330A1 publication Critical patent/CA2849330A1/en
Application granted granted Critical
Publication of CA2849330C publication Critical patent/CA2849330C/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/06Means for illuminating specimens
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00Methods or apparatus for measurement or analysis of nanostructures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/645Specially adapted constructive features of fluorimeters
    • G01N21/6456Spatial resolved fluorescence measurements; Imaging
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/16Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/34Microscope slides, e.g. mounting specimens on microscope slides
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/36Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365Control or image processing arrangements for digital or video microscopes
    • G02B21/367Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Health & Medical Sciences (AREA)
  • Multimedia (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Microscoopes, Condenser (AREA)
  • Automatic Focus Adjustment (AREA)
CA2849330A 2011-09-21 2012-09-21 Slide scanner with a tilted image Active CA2849330C (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201161537460P 2011-09-21 2011-09-21
US61/537,460 2011-09-21
PCT/CA2012/000868 WO2013040686A1 (en) 2011-09-21 2012-09-21 Slide scanner with a tilted image plane

Publications (2)

Publication Number Publication Date
CA2849330A1 CA2849330A1 (en) 2013-03-28
CA2849330C true CA2849330C (en) 2020-11-03

Family

ID=47913706

Family Applications (1)

Application Number Title Priority Date Filing Date
CA2849330A Active CA2849330C (en) 2011-09-21 2012-09-21 Slide scanner with a tilted image

Country Status (5)

Country Link
US (1) US9632301B2 (OSRAM)
EP (1) EP2758825B1 (OSRAM)
CA (1) CA2849330C (OSRAM)
IN (1) IN2014DN03134A (OSRAM)
WO (1) WO2013040686A1 (OSRAM)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2868263C (en) * 2012-03-23 2021-04-13 Huron Technologies International Inc. Slide scanner with dynamic focus and specimen tilt and method of operation
JP6211063B2 (ja) 2012-05-02 2017-10-11 ライカ バイオシステムズ イメージング インコーポレイテッド ライン走査イメージングにおけるリアルタイムフォーカシング
JP6027875B2 (ja) * 2012-12-07 2016-11-16 オリンパス株式会社 撮像装置及び顕微鏡システム
WO2014179269A2 (en) * 2013-04-30 2014-11-06 Molecular Devices, Llc Apparatus and method for generating in-focus images using parallel imaging in a microscopy system
CN105814883B (zh) * 2013-12-16 2019-06-18 皇家飞利浦有限公司 具有带有用于电子电路的间隙的新型成像传感器的扫描成像系统
CA2981348C (en) * 2015-04-02 2023-05-23 Huron Technologies International Inc. High resolution pathology scanner with improved signal to noise ratio
US10244149B2 (en) 2015-06-09 2019-03-26 Lockheed Martin Corporation Imaging system with scan line titled off focal plane
US10634894B2 (en) 2015-09-24 2020-04-28 Leica Biosystems Imaging, Inc. Real-time focusing in line scan imaging
CA3002319C (en) * 2015-12-09 2022-06-14 Ventana Medical Systems, Inc. An image scanning apparatus and methods of operating an image scanning apparatus
EP3420393B1 (en) 2016-02-22 2024-04-10 Koninklijke Philips N.V. System for generating a synthetic 2d image with an enhanced depth of field of a biological sample
WO2018089839A1 (en) 2016-11-10 2018-05-17 The Trustees Of Columbia University In The City Of New York Rapid high-resolution imaging methods for large samples
DE102017107348B4 (de) * 2017-04-05 2019-03-14 Olympus Soft Imaging Solutions Gmbh Verfahren zur zytometrischen Analyse von Zellproben
US11106026B2 (en) * 2017-04-24 2021-08-31 Huron Technologies International Inc. Scanning microscope for 3D imaging using MSIA
US10823952B2 (en) * 2017-06-22 2020-11-03 Huron Technologies International Inc. MSIA scanning instrument with increased dynamic range
ES2928577T3 (es) * 2017-09-29 2022-11-21 Leica Biosystems Imaging Inc Barrido en Z fijo bidimensional y tridimensional
EP3798711A1 (en) * 2019-09-27 2021-03-31 Leica Microsystems CMS GmbH Imaging device and method for imaging an object using a microscope
US12099178B2 (en) * 2020-12-16 2024-09-24 Singular Genomics Systems, Inc. Kinematic imaging system
WO2025072582A1 (en) * 2023-09-27 2025-04-03 Leica Biosystems Imaging, Inc. Automatic tilt compensation in a digital scanning system
US12452530B2 (en) 2023-12-20 2025-10-21 Illumina, Inc. Intelligent sample tilt adjustment with zones having variable size

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0843059A (ja) * 1994-07-27 1996-02-16 Nikon Corp 近接場走査型顕微鏡
US7095032B2 (en) * 1998-03-20 2006-08-22 Montagu Jean I Focusing of microscopes and reading of microarrays
US7518652B2 (en) * 2000-05-03 2009-04-14 Aperio Technologies, Inc. Method and apparatus for pre-focus in a linear array based slide scanner
US6583865B2 (en) * 2000-08-25 2003-06-24 Amnis Corporation Alternative detector configuration and mode of operation of a time delay integration particle analyzer
DE10234756B3 (de) * 2002-07-30 2004-02-12 Leica Microsystems Semiconductor Gmbh Autofokusmodul für mikroskopbasierte Systeme
WO2005010495A2 (en) * 2003-07-22 2005-02-03 Trestle Corporation System and method for generating digital images of a microscope slide
JP4759277B2 (ja) * 2005-01-21 2011-08-31 オリンパス株式会社 観察方法および観察補助具
US8059336B2 (en) * 2007-05-04 2011-11-15 Aperio Technologies, Inc. Rapid microscope scanner for volume image acquisition
US10353190B2 (en) * 2009-12-30 2019-07-16 Koninklijke Philips N.V. Sensor for microscopy

Also Published As

Publication number Publication date
EP2758825A4 (en) 2015-04-15
EP2758825A1 (en) 2014-07-30
WO2013040686A1 (en) 2013-03-28
US9632301B2 (en) 2017-04-25
EP2758825B1 (en) 2016-05-18
US20140231638A1 (en) 2014-08-21
IN2014DN03134A (OSRAM) 2015-05-22
CA2849330A1 (en) 2013-03-28

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Effective date: 20170921