CA2503342A1 - Procede de traitement de donnees pour analyseur logique - Google Patents

Procede de traitement de donnees pour analyseur logique Download PDF

Info

Publication number
CA2503342A1
CA2503342A1 CA002503342A CA2503342A CA2503342A1 CA 2503342 A1 CA2503342 A1 CA 2503342A1 CA 002503342 A CA002503342 A CA 002503342A CA 2503342 A CA2503342 A CA 2503342A CA 2503342 A1 CA2503342 A1 CA 2503342A1
Authority
CA
Canada
Prior art keywords
memory
test data
test
control circuit
test sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
CA002503342A
Other languages
English (en)
Inventor
Chiu-Hao Cheng
Ming-Gwo Cheng
Tsung-Chih Huang
Chun-Feng Tzu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Zeroplus Technology Co Ltd
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of CA2503342A1 publication Critical patent/CA2503342A1/fr
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/25—Testing of logic operation, e.g. by logic analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

La présente invention concerne un procédé de traitement de données pour analyseur logique, qui est utilisé dans un analyseur logique (10) comprenant: un circuit de commande (17) apte à introduire en mémoire des données d'essai en provenance d'un échantillon d'essai (13); une mémoire (18) commandée par le circuit de commande (17), qui stocke les données d'essai reçues de l'échantillon d'essai (13); et un écran d'affichage (161) apte à afficher les données d'essai récupérées par le circuit de commande (17) dans la mémoire (18), lequel procédé est caractérisé en ce que le circuit de commande (17) commande à un logiciel de compression (19) de comprimer les données d'essai reçues en provenance de l'échantillon d'essai (13) avant de les stocker dans la mémoire (18), et de décomprimer les données d'essai comprimées avant leur transmission de la mémoire (18) à l'écran (161).
CA002503342A 2002-10-21 2002-10-21 Procede de traitement de donnees pour analyseur logique Abandoned CA2503342A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2002/031587 WO2004038589A1 (fr) 2002-10-21 2002-10-21 Procede de traitement de donnees pour analyseur logique

Publications (1)

Publication Number Publication Date
CA2503342A1 true CA2503342A1 (fr) 2004-05-06

Family

ID=32173958

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002503342A Abandoned CA2503342A1 (fr) 2002-10-21 2002-10-21 Procede de traitement de donnees pour analyseur logique

Country Status (7)

Country Link
JP (1) JP2006504183A (fr)
CN (1) CN1723442A (fr)
AU (1) AU2002347801A1 (fr)
CA (1) CA2503342A1 (fr)
DE (1) DE10297807T5 (fr)
GB (1) GB2411482B (fr)
WO (1) WO2004038589A1 (fr)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006090727A (ja) * 2004-09-21 2006-04-06 Nec Engineering Ltd オンチップ・ロジックアナライザ
US7528617B2 (en) * 2006-03-07 2009-05-05 Testmetrix, Inc. Apparatus having a member to receive a tray(s) that holds semiconductor devices for testing
US7734976B2 (en) * 2006-11-30 2010-06-08 Electro Scientific Industries, Inc. Synchronizing control of test instruments
CN103294602B (zh) * 2012-02-28 2016-04-13 孕龙科技股份有限公司 逻辑分析仪的数据读取及写入其存储器的方法
TWI553323B (zh) * 2014-07-15 2016-10-11 Zeroplus Technology Co Ltd Data Processing and Display Method of Logical Analysis System
CN106291335A (zh) * 2015-05-14 2017-01-04 孕龙科技股份有限公司 逻辑分析仪及其探棒

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3552175B2 (ja) * 1995-05-17 2004-08-11 株式会社アドバンテスト フェイルメモリ装置
GB9623215D0 (en) * 1996-11-07 1997-01-08 Process Insight Limited Solid state memory test system with defect compression
US6360340B1 (en) * 1996-11-19 2002-03-19 Teradyne, Inc. Memory tester with data compression
US6467053B1 (en) * 1999-06-28 2002-10-15 International Business Machines Corporation Captured synchronous DRAM fails in a working environment

Also Published As

Publication number Publication date
JP2006504183A (ja) 2006-02-02
GB2411482B (en) 2006-03-01
DE10297807T5 (de) 2005-08-25
AU2002347801A1 (en) 2004-05-13
AU2002347801A8 (en) 2004-05-13
GB0510267D0 (en) 2005-06-29
WO2004038589A1 (fr) 2004-05-06
CN1723442A (zh) 2006-01-18
GB2411482A (en) 2005-08-31

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Legal Events

Date Code Title Description
EEER Examination request
FZDE Discontinued