CA2174784A1 - Automatic Multi-Probe PWB Tester - Google Patents

Automatic Multi-Probe PWB Tester

Info

Publication number
CA2174784A1
CA2174784A1 CA2174784A CA2174784A CA2174784A1 CA 2174784 A1 CA2174784 A1 CA 2174784A1 CA 2174784 A CA2174784 A CA 2174784A CA 2174784 A CA2174784 A CA 2174784A CA 2174784 A1 CA2174784 A1 CA 2174784A1
Authority
CA
Canada
Prior art keywords
conductors
tester
signals
pwb
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA2174784A
Other languages
French (fr)
Other versions
CA2174784C (en
Inventor
George Guozhen Zhong
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to CA002174784A priority Critical patent/CA2174784C/en
Priority to CN97110787A priority patent/CN1167921A/en
Publication of CA2174784A1 publication Critical patent/CA2174784A1/en
Application granted granted Critical
Publication of CA2174784C publication Critical patent/CA2174784C/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2812—Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

A new structure of a test apparatus (tester) for detecting shorts and opens of a printed wiring board and an associated automatic test method. The tester has means for injecting signals into conductors of a printed wiring board under test (BUT) and a large number of integrated solenoid-actuated probes which are arranged in a two-dimensional array for sampling signals from the conductors of the BUT. The signals are sampled from the conductors by the integrated solenoid-actuated probes in a row by row scanning sequence following a grid pattern of the BUT. Each of the probes needs only to sample signals from the conductors in a small portion of the BUT.
CA002174784A 1996-04-23 1996-04-23 Automatic multi-probe pwb tester Expired - Lifetime CA2174784C (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CA002174784A CA2174784C (en) 1996-04-23 1996-04-23 Automatic multi-probe pwb tester
CN97110787A CN1167921A (en) 1996-04-23 1997-04-22 Automatic multi-probe PWB test apparatus and method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CA002174784A CA2174784C (en) 1996-04-23 1996-04-23 Automatic multi-probe pwb tester

Publications (2)

Publication Number Publication Date
CA2174784A1 true CA2174784A1 (en) 1997-10-24
CA2174784C CA2174784C (en) 1999-07-13

Family

ID=4158042

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002174784A Expired - Lifetime CA2174784C (en) 1996-04-23 1996-04-23 Automatic multi-probe pwb tester

Country Status (2)

Country Link
CN (1) CN1167921A (en)
CA (1) CA2174784C (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005096688A1 (en) * 2004-04-02 2005-10-13 Original Solutions Inc. System and method for defect detection and process improvement for printed circuit board assemblies

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6441629B1 (en) * 2000-05-31 2002-08-27 Advantest Corp Probe contact system having planarity adjustment mechanism
CN100340864C (en) * 2001-08-10 2007-10-03 马尼亚发展有限公司 Apparatus and method for testing circuit board
US6717432B2 (en) * 2002-04-16 2004-04-06 Teradyne, Inc. Single axis manipulator with controlled compliance
CN1307425C (en) * 2003-03-13 2007-03-28 鸿富锦精密工业（深圳）有限公司 Ageing trolley detecting monitoring improving method and apparatus
DE10320925B4 (en) * 2003-05-09 2007-07-05 Atg Test Systems Gmbh & Co.Kg Method for testing unpopulated printed circuit boards
CN100357752C (en) * 2004-03-26 2007-12-26 广辉电子股份有限公司 Line defect detection maintenance equipment and method
WO2005093441A1 (en) * 2004-03-26 2005-10-06 Quanta Display Inc. Line defect testing-repairing device and method
KR100657947B1 (en) * 2005-02-02 2006-12-14 삼성전자주식회사 Electrical Read HeadProbe having high sensitivity and resolution power and method of operating the same
US7728608B2 (en) * 2005-10-24 2010-06-01 Kabushiki Naisha Nihon Micronics Method for assembling electrical connecting apparatus
US7557594B2 (en) * 2007-08-14 2009-07-07 Electro Scientific Industries, Inc. Automated contact alignment tool
CN102166747A (en) * 2010-02-26 2011-08-31 鸿富锦精密工业（深圳）有限公司 System for testing object by mechanical arm and method thereof
CN102288822A (en) * 2010-06-17 2011-12-21 竞陆电子(昆山)有限公司 Device for testing resistance of carbon ink of printed circuit board
CN102411098A (en) * 2010-09-21 2012-04-11 上海广联电子有限公司 Substrate testing system and method
CN102410822B (en) * 2010-09-21 2013-07-24 捷毅系统股份有限公司 Device and method for measuring thickness
KR101305380B1 (en) * 2012-05-30 2013-09-17 삼성전기주식회사 Printed circuit board inspection apparatus and position correcting method thereof
KR101598271B1 (en) * 2013-07-26 2016-02-26 삼성전기주식회사 Board for probe card, manufacturing method of the same and probe card
CN103675583A (en) * 2013-09-10 2014-03-26 镇江华印电路板有限公司 A single-side printed circuit board open circuit and short circuit testing apparatus
CN103499711B (en) * 2013-09-23 2017-03-29 无锡市汇博普纳电子有限公司 The high-frequency integrated circuit of Ultra fine pitch exchanges automatic test probe
CN104095631B (en) * 2014-07-24 2023-05-26 思澜科技（成都）有限公司 Biological impedance measuring probe based on four-electrode model
JP2016035957A (en) * 2014-08-01 2016-03-17 東京エレクトロン株式会社 Device inspecting method, probe card, interposer, and inspecting device
TWI620940B (en) * 2016-11-14 2018-04-11 旺矽科技股份有限公司 Probe card and multi-signal transmission board
CN107728041B (en) * 2017-10-11 2021-12-03 惠州市金普升电子科技有限公司 Electronic circuit board electric property detection device
CN108020770A (en) * 2017-10-31 2018-05-11 东莞华贝电子科技有限公司 The test system and method for circuit board assemblies
CN109683081A (en) * 2018-12-24 2019-04-26 安徽省大富光电科技有限公司 A kind of tracking mode flexible circuit board conductive pattern on-Line Monitor Device
CN110308352A (en) * 2019-07-16 2019-10-08 珠海达明科技有限公司 A kind of intelligence probe test platform and its test method
CN114966143B (en) * 2022-06-13 2023-01-31 法特迪精密科技（苏州）有限公司 Electromagnetic drive rotary probe and fixed socket structure
CN114966142B (en) * 2022-06-13 2023-01-31 法特迪精密科技（苏州）有限公司 Matching method of electromagnetic drive rotary probe and fixed socket
US20240241191A1 (en) * 2022-07-22 2024-07-18 Nvidia Corporation High-bandwidth coaxial interface test fixture

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005096688A1 (en) * 2004-04-02 2005-10-13 Original Solutions Inc. System and method for defect detection and process improvement for printed circuit board assemblies

Also Published As

Publication number Publication date
CA2174784C (en) 1999-07-13
CN1167921A (en) 1997-12-17

Similar Documents

Publication Publication Date Title
CA2174784A1 (en) Automatic Multi-Probe PWB Tester
TW522240B (en) Test fixture for testing backplanes or populated circuit boards
EP0864872A3 (en) Dual-laser voltage probing of IC's
DE60001254D1 (en) Test device for integrated circuits with multi-port test functionality
EP1173008A3 (en) Apparatus and method for detecting defects in a multi-channel scan driver
MY125058A (en) Horizontal transfer test handler
EP0367710A3 (en) Diagnostics of a board containing a plurality of hybrid electronic components
DE3467623D1 (en) Sample stand
EP0840130A3 (en) Standard- and limited-access hybrid test fixture
US6727712B2 (en) Apparatus and methods for testing circuit boards
WO2004042787A3 (en) Method and apparatus for testing asynchronous set/reset faults in a scan-based integrated circuit
MY113351A (en) Testing fixture and method for circuit traces on a flexible substrate
ATE224061T1 (en) METHOD AND DEVICE FOR TESTING PRINTED CIRCUIT BOARDS
JPH10227826A (en) Apparatus and method for test of printed-circuit board
EP0918227A3 (en) Automatic circuit tester having a waveform acquisition mode of operation
EP1031839A2 (en) Test fixture for matched impedance testing
US4229693A (en) Method and apparatus for capacitance testing printed circuit boards
HK58894A (en) Probe for an adapter for a device for testing printed circuit boards
KR100526744B1 (en) Machine for the electric test of printed circuits
CA2324135A1 (en) Apparatus for testing bare-chip lsi mounting board
JP2000097985A (en) Scanning tester for test location with tight space
DE60107881D1 (en) DEVICE AND METHOD FOR TESTING UNPROCESSED PRINTED CIRCUITS
DE19707485A1 (en) Converter device with a force-applying blind pins
JPS5427755A (en) Circuit testing equipment
US20010033180A1 (en) Test pin with removable head

Legal Events

Date Code Title Description
EEER Examination request
MKEX Expiry

Effective date: 20160425