CN1307425C - Ageing trolley detecting monitoring improving method and apparatus - Google Patents
Ageing trolley detecting monitoring improving method and apparatus Download PDFInfo
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- CN1307425C CN1307425C CNB031139302A CN03113930A CN1307425C CN 1307425 C CN1307425 C CN 1307425C CN B031139302 A CNB031139302 A CN B031139302A CN 03113930 A CN03113930 A CN 03113930A CN 1307425 C CN1307425 C CN 1307425C
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Abstract
The present invention relates to a method for testing, monitoring and improving an aged trolley and a device. The method comprises the steps that samples to be tested are placed on the aged trolley, and the aged trolley is connected with a power cord and an AV cable; the samples to be tested are activated so that an aging experiment is carried out, and then a signal of a control card is connected to an adapter of the aged trolley; a display card and the control card are activated to be automatically scanned, and an aging testing result is observed at the same time; if an NG mark is displayed in a detected picture, any key is pressed to pause and do corresponding recording, and then any key is pressed to restore the scanning till all the samples to be tested are tested. The testing monitoring can be carried out in a manual switching mode; when the testing monitoring can be carried out in the manual switching mode, the samples to be tested can be selected through upper, lower, left and right keys, and the other steps are the same with an automatic test.
Description
[technical field]
The invention relates to a kind of aging chassis test monitoring improved device, refer to a kind of improved device of aging chassis test monitoring of automatic control especially.
[background technology]
The method of the aging of product test that industry is common is planning one flexibility test space, by the artificial push to test instrument plug of operating personnel AV cable aging chassis is tested one by one.In this test process, repeatedly plug the AV cable by the operating personnel aging chassis is tested one by one because be, so cause man-hour long, product is in long-time burn-in test process, and determinand the wrong of non-product functionality occur because of environment temperature, humidity and human factor easily and judges; And the agingtable following distance is too small, easily cause the operating personnel handicapped and collide, the vibration test machine causes the result to judge by accident; And when detecting mistake in the test process, can't in real time defective products in time be done suitably to handle, power consumption is consuming time like this.
[summary of the invention]
The object of the present invention is to provide a kind of aging chassis test monitoring improved device of automatic control.
A kind of aging chassis test monitoring improved device, comprise an aging chassis, desire to inspect machine for many, at least one display device, desire to inspect and moving the burn-in test program in the machine and be placed on the above-mentioned aging chassis for above-mentioned many, the machine of inspecting of desiring of above-mentioned many operation burn-in test programs outputs to above-mentioned display device with vision signal, described aging chassis test monitoring improved device further comprises a control card, above-mentioned aging chassis is provided with a breakout box, desire the end that the machine of inspecting is connecting the breakout box on the above-mentioned aging chassis for above-mentioned many, above-mentioned control card connects into the other end of the breakout box of above-mentioned aging chassis by signal line, above-mentioned control card comprises: a controller, it comprises a microprocessor, one reset unit and a display unit, described reset unit is connecting described microprocessor, is controlling restarting of microprocessor; Described display unit is also connecting described processor, and shows the position of the board of being inspected by above-mentioned display device; A connector, described connector is connecting above-mentioned controller; One selector switch, described selector switch connects the breakout box of aging chassis and then connects the above-mentioned machine of desiring to inspect by signal line, described selector switch comprises a multiplexer, and described multiplexer is connecting above-mentioned connector, and described multiplexer receives the selection signal of self-controller to select to desire to inspect machine by connector.
Compared with prior art, the present invention realizes can selectively monitoring testing result to the autoscan of the test pictures of product to be tested by a control card, thereby a large amount of the saving manually realizes that robotization detects, and raises the efficiency.
[description of drawings]
Fig. 1 is the calcspar of the control card of the aging chassis test monitoring device of the present invention.
Fig. 2 is the circuit diagram of controller of the control card of the aging chassis test monitoring device of the present invention.
Fig. 3 is the circuit diagram of selector switch of the control card of the aging chassis test monitoring device of the present invention.
Fig. 4 is the aging chassis test monitoring device operational flowchart of the present invention.
[embodiment]
See also Fig. 1, the present invention uses a control card to monitor aging chassis test.This control card comprises a controller 400 and a selector switch 200, and this controller 400 is connected with selector switch 200 by the connector on the pcb board 300, and it comprises microprocessor 410, reset unit 450, display unit 420 and selected cell 460.Wherein reset unit 450 and selected cell 460 all link to each other with the input end of microprocessor 410, and the output terminal of microprocessor 410 is connected to display unit 420 and connector 300.
This selector switch 200 comprises multiplexer 240 and image amplifier 220.This multiplexer 240 is connecting 80 and is desiring to inspect machine 250, and this image amplifier 220 is connecting video display 230.After amplifying via image amplifier 220 by multiplexer 240 again, the vision signal that 240,80 of the multiplexers that this controller 400 is input to this selector switch 200 by connector 300 with control signal are desired the machine of inspecting outputs to video display 230.
Seeing also Fig. 2, is the circuit diagram of the controller 400 of this control card.Microprocessor 410 among Fig. 1 adopts 8051 series microprocessors of Intel Company, i.e. U7 shown in Fig. 2 in the present embodiment.The pulse input circuit of U7 comprises a ceramic crystal oscillator Y1, capacitor C 2 and C3, the two ends of this crystal oscillator Y1 are connecting the X1 end and X2 end of U7 respectively, capacitor C 2 is connected back with C3 and ceramic crystal oscillator Y1 is connected in parallel between X1 end and the X2 end, and the node ground connection between capacitor C 2 and the C3.
Reset unit 450 shown in Figure 1 comprises reset key SW1 shown in Figure 2, and the two ends of SW1 are connecting the RST end and VCC end of U7 respectively, and capacitor C 1 is in parallel with this reset key SW1.Also be connected to the direct voltage source of a 5V between the VCC end of this reset key SW1 and U7.P0.0/AD0 to the P0.6/AD6 end of U7 is connecting the 9-3 end input of connector J1, the 1 end ground connection of J1,2 terminations-5V voltage, 10 terminations+5V voltage, 11 end ground connection.
Selected cell 460 shown in Figure 1 comprises resistance R 1, R2, R 3, the R4 of options button SW2, SW3, SW4, SW5 and SW2 shown in Figure 2, SW3, SW4, the corresponding connection of SW5, and options button SW2, SW3, SW4, SW5 are connecting P2.0/A8, P2.1/A9, P2.2/A10, the P2.3/A11 end of U1 respectively by resistance R 1, R2, R3, R4.Options button SW2, SW3, SW4, SW5 are controlling respectively under the artificial mode being inspected the selection operation of board upper and lower, left and right, options button SW2 and SW3 be respectively by selecting to be inspected the machine number of plies upwards, downwards, options button SW4 and SW5 respectively by left, to the right select with layer in inspect the board number.
Display unit 420 shown in Figure 1 is in the present embodiment for four seven segment digital tubes shown in Figure 2 and be connected impact damper U8 and U9 between these four seven segment digital tubes and the microprocessor U7.Impact damper U8 and U9 all adopt DM7407IC in the present embodiment.The P2.4/A12 of processor U7, P2.5/A13, P2.6/A14, P2.7/A15 end are connecting A8, A7, A6, the A5 end of impact damper U8 respectively.The Y8 of U8, Y7, Y6, Y5 are connecting the sheet choosing end of four seven segment digital tubes respectively.The P1.0 of U7, P1.1, P1.2, P1.3, P1.4, P1.5, P1.6, the P1.7 end is connecting the A8 of impact damper U9 respectively, A7, A6, A5, A4, A3, A2, the A1 end, the Y8 of impact damper U9, Y7, Y6, Y5, Y4, Y3, Y2, the Y1 end is connecting other eight ends (the other eight end parallel connections of these four seven segment digital tubes) of four seven segment digital tubes, wherein two seven segment digital tubes in left side combine the number of plies of the equipment that demonstration inspecting, in addition two seven segment digital tubes combine the platform number that equipment that demonstration inspecting is arranged in one deck (this example desire to inspect 80 boards be divided into 5 layers, 16 every layer).The selection result of selected cell options button SW2, SW3, SW4, SW5 can be expressed by these four seven segment digital tubes under the artificial mode.
See also Fig. 3, the multiplexer 240 of this selector switch 200 is made up of U1, U2, U3, U4, U5, U6, and U1, U2, U 3, U4, U5 all adopt 250362/FPIC to realize in the present embodiment, and U6 system adopts 10164IC to realize.Input end A, the B of U6, C end is connecting 5,6,7 ends of connector J1 opposite side, receives the output of self-controller 400.The X0-X4 of U6 is connecting the Z end of U5, U1, U2, U3, U4 respectively, and 80 desire checkout equipments in the present embodiment are divided into 5 layers, 16 every layer, imports from the I0-I15 end of U5, U1, U2, U3, U4 respectively.The S0-S3 end of U5, U1, U2, U3, U4 is connecting the 1-4 end of connector J1 opposite side, receives the choice of location signal of self-controller 400.The selected picture of inspecting exports image amplifier U10 to from the Z end of U6, again by video display output (Fig. 3 does not indicate).
See also Fig. 4, be the operational scheme of the present invention's detection.To desire checkout equipments be example to detect 80 in the present embodiment.Testing process is from step 10, in step 10, product to be tested is taken put in regular turn and plug on the aging chassis line and AV cable from pipeline lower floor, activate product to be tested by power key and carry out burn-in test, enter into step 14 by step 10 then, the signal line connection of control card is inserted the breakout box of the aging chassis of operation test procedure.Then enter step 16, power-on selects whether to need to employ manual switching in step 16, if do not need then flow process changes step 20 over to, the beginning autoscan, autoscan is by position 1 beginning of ground floor,, carried out successively from the ground floor to the layer 5 to the position 16 by every layer of position 1, the operator can observe aging result simultaneously again.Then, flow process enters into 30 by 20, see that whether running into picture the NG situation of (NO GOING represents that picture stops) occurring, if NG then flow process be transferred to step 40, press any key and suspend scanning, at this moment, flow process enters into step 50 by step 40, bad phenomenon such as the operator can make mistakes demonstration in step 50, no display result, picture stop and error code and time are inserted defective products management ticket, hang on the defective products, deliver to the maintenance area.Then, flow process enters into step 60, presses any key, recovers to continue scanning.Judge that in step 70 80 quilts inspect equipment and whether all detect and finish, flow process then changes the flow process of step 30 repeating step 30 to step 70 over to.If all inspected, then flow process enters step 80, and whole flow process finishes.If do not inspect the NG signal in the step 30 all the time, then flow process directly is transferred to step 80 detection of end by step 30.
If what select in step 16 is the manual switching pattern, then flow process is transferred to step 22 by step 16, in step 22, be that SW2, SW3, SW4, SW5 in the present embodiment moves to switch between the number of plies and position and directly select indivedual boards of desiring to inspect by the upper and lower, left and right options button, flow process enters step 32 then, step 32 is as the step 30 under the autosensing mode, can observe the detection picture, see whether picture NG occurs, if do not appear at the NG signal then direct execution in step 22, select other picture of being inspected board to watch; If NG then step enter into step 52 by 32, step 52 is equivalent to the step 50 under the autosensing mode, and defective products is made respective record.Then change flow process 72 over to, be equivalent to detect automatically the step 70 in the step, detect if also need continue manual switching, then flow process is transferred to 22, the flow process between repeating step 22-72; If need not to watch the test pictures of product to be tested, then flow process enters step 80 end again.
Claims (6)
1. aging chassis test monitoring improved device, comprise an aging chassis, desire to inspect machine for many, at least one display device, desire to inspect and moving the burn-in test program in the machine and be placed on the above-mentioned aging chassis for above-mentioned many, the machine of inspecting of desiring of above-mentioned many operation burn-in test programs outputs to above-mentioned display device with vision signal, it is characterized in that: described aging chassis test monitoring improved device further comprises a control card, above-mentioned aging chassis is provided with a breakout box, desire the end that the machine of inspecting is connecting the breakout box on the above-mentioned aging chassis for above-mentioned many, above-mentioned control card connects into the other end of the breakout box of above-mentioned aging chassis by signal line, above-mentioned control card comprises: a controller, it comprises a microprocessor, one reset unit and a display unit, described reset unit is connecting described microprocessor, is controlling restarting of microprocessor; Described display unit is also connecting described processor, and shows the position of the board of being inspected by above-mentioned display device; A connector, described connector is connecting above-mentioned controller; One selector switch, described selector switch connects the breakout box of aging chassis and then connects the above-mentioned machine of desiring to inspect by signal line, described selector switch comprises a multiplexer, and described multiplexer is connecting above-mentioned connector, and described multiplexer receives the selection signal of self-controller to select to desire to inspect machine by connector.
2. aging chassis test monitoring improved device as claimed in claim 1, it is characterized in that: the controller of described control card further comprises a selected cell, described selected cell comprises four options buttons in upper and lower, left and right, can specifically desire the board inspected by the direct selection of these options buttons.
3. aging chassis test monitoring improved device as claimed in claim 1 is characterized in that: the processor of the controller of described control card is to adopt 8051 processors.
4. aging chassis test monitoring improved device as claimed in claim 1 is characterized in that: the display unit of the controller of described control card comprises two data impact dampers and four seven segment digital tubes.
5. aging chassis test monitoring improved device as claimed in claim 1, it is characterized in that: the selector switch of described control card further comprises an image amplifier, described image amplifier two ends are connecting this multiplexer and display device respectively.
6. as claim 1,2,3,4 or 5 described aging chassis test monitoring improved devices, it is characterized in that: described control card can suspend scanning by any key in operational process, can recover scanning by any key again.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB031139302A CN1307425C (en) | 2003-03-13 | 2003-03-13 | Ageing trolley detecting monitoring improving method and apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB031139302A CN1307425C (en) | 2003-03-13 | 2003-03-13 | Ageing trolley detecting monitoring improving method and apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1530782A CN1530782A (en) | 2004-09-22 |
| CN1307425C true CN1307425C (en) | 2007-03-28 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB031139302A Expired - Fee Related CN1307425C (en) | 2003-03-13 | 2003-03-13 | Ageing trolley detecting monitoring improving method and apparatus |
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| Country | Link |
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| CN (1) | CN1307425C (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109613726B (en) * | 2018-12-27 | 2023-08-29 | 宁波图锐自动化设备有限公司 | Control method and control system for automatically plugging liquid crystal display |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN86201156U (en) * | 1985-06-07 | 1987-02-18 | 海曼股份公司 | X-ray scanner |
| CN2212208Y (en) * | 1994-06-24 | 1995-11-08 | 郑本荣 | Computer controlled relay protective detector |
| CN1167921A (en) * | 1996-04-23 | 1997-12-17 | 钟国桢 | Automatic multi-probe PWB test apparatus and method |
| CN1177187A (en) * | 1996-05-11 | 1998-03-25 | 三星电子株式会社 | System for testing hard disk drives |
| CN1221112A (en) * | 1997-12-26 | 1999-06-30 | 三星电子株式会社 | Test and burn-in apparatus in-line system using apparatus, and test method using the system |
| US6125663A (en) * | 1995-12-08 | 2000-10-03 | Memminger-Iro Gmbh | Method and apparatus for monitoring scanning conditions during control of a yarn feeding device |
| CN1299974A (en) * | 1999-12-15 | 2001-06-20 | 曹骥 | Comprehensive aging screening device for electronic components |
-
2003
- 2003-03-13 CN CNB031139302A patent/CN1307425C/en not_active Expired - Fee Related
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN86201156U (en) * | 1985-06-07 | 1987-02-18 | 海曼股份公司 | X-ray scanner |
| CN2212208Y (en) * | 1994-06-24 | 1995-11-08 | 郑本荣 | Computer controlled relay protective detector |
| US6125663A (en) * | 1995-12-08 | 2000-10-03 | Memminger-Iro Gmbh | Method and apparatus for monitoring scanning conditions during control of a yarn feeding device |
| CN1167921A (en) * | 1996-04-23 | 1997-12-17 | 钟国桢 | Automatic multi-probe PWB test apparatus and method |
| CN1177187A (en) * | 1996-05-11 | 1998-03-25 | 三星电子株式会社 | System for testing hard disk drives |
| CN1221112A (en) * | 1997-12-26 | 1999-06-30 | 三星电子株式会社 | Test and burn-in apparatus in-line system using apparatus, and test method using the system |
| CN1299974A (en) * | 1999-12-15 | 2001-06-20 | 曹骥 | Comprehensive aging screening device for electronic components |
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| Publication number | Publication date |
|---|---|
| CN1530782A (en) | 2004-09-22 |
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Granted publication date: 20070328 |