CA2050316A1 - Procede et appareillage d'essai areal et spatial d'eprouvettes - Google Patents

Procede et appareillage d'essai areal et spatial d'eprouvettes

Info

Publication number
CA2050316A1
CA2050316A1 CA002050316A CA2050316A CA2050316A1 CA 2050316 A1 CA2050316 A1 CA 2050316A1 CA 002050316 A CA002050316 A CA 002050316A CA 2050316 A CA2050316 A CA 2050316A CA 2050316 A1 CA2050316 A1 CA 2050316A1
Authority
CA
Canada
Prior art keywords
light
accordance
test piece
opto
intensity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
CA002050316A
Other languages
English (en)
Inventor
Wilfried Schoeps
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
OPTOCONTROL AG
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of CA2050316A1 publication Critical patent/CA2050316A1/fr
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Textile Engineering (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
CA002050316A 1990-01-06 1991-01-07 Procede et appareillage d'essai areal et spatial d'eprouvettes Abandoned CA2050316A1 (fr)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
CH31/90A CH681112A5 (fr) 1990-01-06 1990-01-06
CH91/90-7 1990-01-06
PCT/CH1991/000004 WO1991010891A1 (fr) 1990-01-06 1991-01-07 Procede et dispositif pour l'examen sans contact de materiaux d'essai en surface ou en volume

Publications (1)

Publication Number Publication Date
CA2050316A1 true CA2050316A1 (fr) 1991-07-07

Family

ID=4177789

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002050316A Abandoned CA2050316A1 (fr) 1990-01-06 1991-01-07 Procede et appareillage d'essai areal et spatial d'eprouvettes

Country Status (9)

Country Link
EP (1) EP0462240A1 (fr)
JP (1) JPH04506411A (fr)
KR (1) KR920701784A (fr)
AU (1) AU6911891A (fr)
BR (1) BR9103915A (fr)
CA (1) CA2050316A1 (fr)
CH (1) CH681112A5 (fr)
RU (1) RU2058546C1 (fr)
WO (1) WO1991010891A1 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7640073B2 (en) 2005-04-14 2009-12-29 Jeld-Wen, Inc. Systems and methods of identifying and manipulating objects

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH683293A5 (de) * 1991-12-20 1994-02-15 Peyer Ag Siegfried Fremdfasererkennung in Garnen.
AT1797U1 (de) * 1996-07-23 1997-11-25 Mte Messgeraete Entwicklungs U Optoelektronisches messsystem zur vermessung und identifikation von flachglasprodukten
US6100537A (en) * 1997-07-22 2000-08-08 "MTE" Messgerate, Entwicklungs- und Vertriebsgesellschaft mbH Measuring system for recognition of surface features
DE19801140A1 (de) * 1998-01-14 1999-07-15 Voith Sulzer Papiertech Patent Vorrichtung zum direkten oder indirekten Auftrag eines flüssigen bis pastösen Auftragsmediums auf eine laufende Materialbahn sowie Betriebsverfahren für eine solche Vorrichtung
US6420287B1 (en) 1998-11-24 2002-07-16 Nippon Electric Glass Co., Ltd. Ceramic article
JP2007039335A (ja) * 1998-11-24 2007-02-15 Nippon Electric Glass Co Ltd セラミックス物品の製造方法
FR2817964B1 (fr) * 2000-12-11 2003-03-14 Usinor Dispositif d'inspection automatique de surface d'une bande en defilement
EP1498723A1 (fr) * 2003-07-17 2005-01-19 Hauni Maschinbau AG Méthode pour reconnaítre des corps étrangers dans une ligne continue de produits et appareil pour la mise en oevre de ce méthode
JP4698140B2 (ja) * 2003-11-12 2011-06-08 ザ・ボーイング・カンパニー 複合構造内の欠陥を識別するためのシステム
RU2540939C2 (ru) * 2013-05-24 2015-02-10 Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Сибирская государственная геодезическая академия" (ФГБОУ ВПО "СГГА") Способ определения координат контрольной точки объекта с применением наземного лазерного сканера
DE102013221334A1 (de) * 2013-10-21 2015-04-23 Volkswagen Aktiengesellschaft Verfahren und Messvorrichtung zum Bewerten von Strukturunterschieden einer reflektierenden Oberfläche
EP3279716B1 (fr) 2015-03-31 2020-10-14 Hamamatsu Photonics K.K. Dispositif d'affichage par projection
RU178901U1 (ru) * 2017-10-30 2018-04-23 Олег Александрович Продоус Устройство для бесконтактного измерения шероховатости поверхности

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL240616A (fr) * 1958-06-30
US3019346A (en) * 1960-03-28 1962-01-30 Jones & Laughlin Steel Corp Electronic surface inspection system
US3693021A (en) * 1970-06-29 1972-09-19 Eastman Kodak Co Web inspection system using interlaced photocells
US4594001A (en) * 1981-07-07 1986-06-10 Robotic Vision Systems, Inc. Detection of three-dimensional information with a projected plane of light
US4650333A (en) * 1984-04-12 1987-03-17 International Business Machines Corporation System for measuring and detecting printed circuit wiring defects
GB2159271B (en) * 1984-04-27 1988-05-18 Nissan Motor Surface flaw detecting method and apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7640073B2 (en) 2005-04-14 2009-12-29 Jeld-Wen, Inc. Systems and methods of identifying and manipulating objects
US7801638B2 (en) 2005-04-14 2010-09-21 Jeld-Wen, Inc. Systems and methods of identifying and manipulating objects

Also Published As

Publication number Publication date
RU2058546C1 (ru) 1996-04-20
JPH04506411A (ja) 1992-11-05
BR9103915A (pt) 1992-03-03
EP0462240A1 (fr) 1991-12-27
AU6911891A (en) 1991-08-05
CH681112A5 (fr) 1993-01-15
WO1991010891A1 (fr) 1991-07-25
KR920701784A (ko) 1992-08-12

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Legal Events

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