CA2047426A1 - Product defect detection using thermal ratio analysis - Google Patents
Product defect detection using thermal ratio analysisInfo
- Publication number
- CA2047426A1 CA2047426A1 CA002047426A CA2047426A CA2047426A1 CA 2047426 A1 CA2047426 A1 CA 2047426A1 CA 002047426 A CA002047426 A CA 002047426A CA 2047426 A CA2047426 A CA 2047426A CA 2047426 A1 CA2047426 A1 CA 2047426A1
- Authority
- CA
- Canada
- Prior art keywords
- record
- sample
- records
- temperature
- making
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 230000007547 defect Effects 0.000 title claims abstract description 90
- 238000004458 analytical method Methods 0.000 title abstract description 10
- 238000001514 detection method Methods 0.000 title description 5
- 238000000034 method Methods 0.000 claims abstract description 70
- 239000000523 sample Substances 0.000 claims description 100
- 239000013074 reference sample Substances 0.000 claims description 71
- 238000012360 testing method Methods 0.000 claims description 65
- 239000002131 composite material Substances 0.000 claims description 20
- 238000010438 heat treatment Methods 0.000 claims description 19
- 230000006641 stabilisation Effects 0.000 claims description 7
- 238000011105 stabilization Methods 0.000 claims description 7
- 238000007781 pre-processing Methods 0.000 claims description 3
- 230000000087 stabilizing effect Effects 0.000 claims 8
- 230000002708 enhancing effect Effects 0.000 claims 2
- 238000007619 statistical method Methods 0.000 abstract description 3
- 230000001629 suppression Effects 0.000 abstract 1
- 150000002500 ions Chemical class 0.000 description 23
- 230000002950 deficient Effects 0.000 description 12
- 230000000694 effects Effects 0.000 description 8
- 238000001931 thermography Methods 0.000 description 8
- 238000010586 diagram Methods 0.000 description 6
- 101100536354 Drosophila melanogaster tant gene Proteins 0.000 description 5
- 238000013459 approach Methods 0.000 description 5
- 238000001914 filtration Methods 0.000 description 4
- 238000005259 measurement Methods 0.000 description 4
- 238000004806 packaging method and process Methods 0.000 description 4
- 239000000700 radioactive tracer Substances 0.000 description 4
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 3
- 238000004364 calculation method Methods 0.000 description 3
- 230000008859 change Effects 0.000 description 3
- 238000003384 imaging method Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 238000001757 thermogravimetry curve Methods 0.000 description 3
- AYFVYJQAPQTCCC-GBXIJSLDSA-N L-threonine Chemical compound C[C@@H](O)[C@H](N)C(O)=O AYFVYJQAPQTCCC-GBXIJSLDSA-N 0.000 description 2
- 229910052804 chromium Inorganic materials 0.000 description 2
- 230000001419 dependent effect Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 229910052721 tungsten Inorganic materials 0.000 description 2
- 238000010792 warming Methods 0.000 description 2
- 230000005457 Black-body radiation Effects 0.000 description 1
- 241000479907 Devia <beetle> Species 0.000 description 1
- 235000008247 Echinochloa frumentacea Nutrition 0.000 description 1
- POSKOXIJDWDKPH-UHFFFAOYSA-N Kelevan Chemical compound ClC1(Cl)C2(Cl)C3(Cl)C4(Cl)C(CC(=O)CCC(=O)OCC)(O)C5(Cl)C3(Cl)C1(Cl)C5(Cl)C42Cl POSKOXIJDWDKPH-UHFFFAOYSA-N 0.000 description 1
- 125000000205 L-threonino group Chemical group [H]OC(=O)[C@@]([H])(N([H])[*])[C@](C([H])([H])[H])([H])O[H] 0.000 description 1
- 101100536883 Legionella pneumophila subsp. pneumophila (strain Philadelphia 1 / ATCC 33152 / DSM 7513) thi5 gene Proteins 0.000 description 1
- 240000004072 Panicum sumatrense Species 0.000 description 1
- 101100313003 Rattus norvegicus Tanc1 gene Proteins 0.000 description 1
- 101100240664 Schizosaccharomyces pombe (strain 972 / ATCC 24843) nmt1 gene Proteins 0.000 description 1
- 241000897276 Termes Species 0.000 description 1
- 241000613130 Tima Species 0.000 description 1
- 230000005856 abnormality Effects 0.000 description 1
- 238000004378 air conditioning Methods 0.000 description 1
- 230000002547 anomalous effect Effects 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 238000010420 art technique Methods 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 238000007664 blowing Methods 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- HPNSNYBUADCFDR-UHFFFAOYSA-N chromafenozide Chemical compound CC1=CC(C)=CC(C(=O)N(NC(=O)C=2C(=C3CCCOC3=CC=2)C)C(C)(C)C)=C1 HPNSNYBUADCFDR-UHFFFAOYSA-N 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 230000001186 cumulative effect Effects 0.000 description 1
- 238000009795 derivation Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000005315 distribution function Methods 0.000 description 1
- 230000003028 elevating effect Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000007849 functional defect Effects 0.000 description 1
- 125000000524 functional group Chemical group 0.000 description 1
- 238000009499 grossing Methods 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 230000000873 masking effect Effects 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- MHWLWQUZZRMNGJ-UHFFFAOYSA-N nalidixic acid Chemical compound C1=C(C)N=C2N(CC)C=C(C(O)=O)C(=O)C2=C1 MHWLWQUZZRMNGJ-UHFFFAOYSA-N 0.000 description 1
- 238000013139 quantization Methods 0.000 description 1
- 230000003252 repetitive effect Effects 0.000 description 1
- 238000012163 sequencing technique Methods 0.000 description 1
- 230000002226 simultaneous effect Effects 0.000 description 1
- 230000000638 stimulation Effects 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 238000002076 thermal analysis method Methods 0.000 description 1
- 238000002849 thermal shift Methods 0.000 description 1
- KUAZQDVKQLNFPE-UHFFFAOYSA-N thiram Chemical compound CN(C)C(=S)SSC(=S)N(C)C KUAZQDVKQLNFPE-UHFFFAOYSA-N 0.000 description 1
- SYOKIDBDQMKNDQ-XWTIBIIYSA-N vildagliptin Chemical compound C1C(O)(C2)CC(C3)CC1CC32NCC(=O)N1CCC[C@H]1C#N SYOKIDBDQMKNDQ-XWTIBIIYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/72—Investigating presence of flaws
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US07/582,102 US5032727A (en) | 1990-09-14 | 1990-09-14 | Product defect detection using thermal ratio analysis |
| US07/582,102 | 1990-09-14 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA2047426A1 true CA2047426A1 (en) | 1992-03-15 |
Family
ID=24327854
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA002047426A Abandoned CA2047426A1 (en) | 1990-09-14 | 1991-07-19 | Product defect detection using thermal ratio analysis |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US5032727A (show.php) |
| EP (1) | EP0475570A2 (show.php) |
| JP (1) | JPH04282445A (show.php) |
| AU (1) | AU626146B2 (show.php) |
| CA (1) | CA2047426A1 (show.php) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6715915B1 (en) | 1999-08-13 | 2004-04-06 | Morinaga Milk Industry Co., Ltd. | Fluidity determination method of a packed fluid and device used in the same |
Families Citing this family (56)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03182185A (ja) * | 1989-12-11 | 1991-08-08 | Fujitsu Ltd | 赤外線監視システム |
| US5032727A (en) * | 1990-09-14 | 1991-07-16 | Digital Equipment Corporation | Product defect detection using thermal ratio analysis |
| US5294198A (en) * | 1991-10-01 | 1994-03-15 | Cincinnati Electronics Corporation | Infrared inspection system and method employing emissivity indications |
| US5504431A (en) * | 1991-12-09 | 1996-04-02 | Matsushita Electric Industrial Co., Ltd. | Device for and method of evaluating semiconductor integrated circuit |
| GB2264779B (en) * | 1992-02-20 | 1996-05-01 | Thermoteknix Systems Ltd | Monitoring changes in image characteristics |
| US5417494A (en) * | 1992-05-01 | 1995-05-23 | Exid, Inc. | Contactless testing of electronic materials and devices using microwaves |
| US5240329A (en) * | 1992-08-14 | 1993-08-31 | Ford Motor Company | Non-destructive method for detecting defects in a workpiece |
| US5292195A (en) * | 1992-09-09 | 1994-03-08 | Martin Marietta Corporation | Thermographic evaluation technique |
| NL9301568A (nl) * | 1993-09-09 | 1995-04-03 | Tce Consultancy & Eng | Analyse-systeem voor het analyseren, bewaken, diagnostiseren en/of sturen van een produktieproces waarin produkten worden gevormd die een temperatuurbehandeling ondergaan, produktieproces met een analysesysteem en een werkwijze daarvoor. |
| JPH07128151A (ja) * | 1993-10-29 | 1995-05-19 | Mitsubishi Electric Corp | 熱画像解析装置 |
| GB9421493D0 (en) * | 1994-10-24 | 1994-12-07 | Marconi Gec Ltd | Imaging method and system |
| GB9503274D0 (en) * | 1995-02-21 | 1995-04-12 | Sun Electric Uk Ltd | Method and apparatus for machine diagnosis |
| US5709469A (en) * | 1995-03-13 | 1998-01-20 | The United States Of America As Represented By The Secretary Of The Air Force | Process for testing integrity of bonds between epoxy patches and aircraft structural materials |
| US5833365A (en) * | 1995-03-24 | 1998-11-10 | Interuniversitair Micro-Electronika Centrum Vzw | Method for local temperature sensing for use in performing high resolution in-situ parameter measurements |
| US5631465A (en) * | 1996-02-29 | 1997-05-20 | Shepard; Steven M. | Method of interpreting thermographic data for non-destructive evaluation |
| US5775806A (en) * | 1996-09-12 | 1998-07-07 | The United States Of America As Represented By The Secretary Of The Air Force | Infrared assessment system |
| US6536944B1 (en) * | 1996-10-09 | 2003-03-25 | Symyx Technologies, Inc. | Parallel screen for rapid thermal characterization of materials |
| US5711603A (en) * | 1996-10-30 | 1998-01-27 | United Technologies Corporation | Nondestructive testing: transient depth thermography |
| US6033107A (en) * | 1997-07-15 | 2000-03-07 | Temptronic Corporation | Temperature mapping system |
| US6013915A (en) | 1998-02-10 | 2000-01-11 | Philip Morris Incorporated | Process control by transient thermography |
| US6172512B1 (en) * | 1998-02-19 | 2001-01-09 | International Business Machines Corporation | Image processing methods for the optical detection of dynamic errors in integrated circuits |
| US7083327B1 (en) * | 1999-04-06 | 2006-08-01 | Thermal Wave Imaging, Inc. | Method and apparatus for detecting kissing unbond defects |
| US6394646B1 (en) | 1999-04-16 | 2002-05-28 | General Electric Company | Method and apparatus for quantitative nondestructive evaluation of metal airfoils using high resolution transient thermography |
| US6367968B1 (en) | 1999-07-21 | 2002-04-09 | General Electric Company | Thermal resonance imaging method |
| US6367969B1 (en) | 1999-07-21 | 2002-04-09 | General Electric Company | Synthetic reference thermal imaging method |
| TW501290B (en) * | 1999-07-23 | 2002-09-01 | Telcordia Tech Inc | Infrared thermographic method for process monitoring and control of multilayer conductive compositions |
| US6595684B1 (en) | 1999-11-03 | 2003-07-22 | Northrop Grumman Corporation | System and method for evaluating a structure |
| US7724925B2 (en) * | 1999-12-02 | 2010-05-25 | Thermal Wave Imaging, Inc. | System for generating thermographic images using thermographic signal reconstruction |
| DE60041661D1 (de) * | 1999-12-02 | 2009-04-09 | Thermal Wave Imaging Inc | Verfahren und system zur bezugsfreien thermographischen erkennung von suboberflächendefekten unter verwendung komprimierter bilddaten |
| US6751342B2 (en) | 1999-12-02 | 2004-06-15 | Thermal Wave Imaging, Inc. | System for generating thermographic images using thermographic signal reconstruction |
| US6260998B1 (en) * | 2000-01-19 | 2001-07-17 | Visteon Global Technologies, Inc. | Method for specifying accelerated thermal cycling tests for electronic solder joint durability |
| US7401976B1 (en) * | 2000-08-25 | 2008-07-22 | Art Advanced Research Technologies Inc. | Detection of defects by thermographic analysis |
| WO2002089042A1 (en) * | 2001-04-13 | 2002-11-07 | Thermal Wave Imaging, Inc. | System for generating thermographic images using thermographic signal reconstruction |
| CA2449508A1 (en) | 2001-05-21 | 2002-11-28 | Pressco Technology, Inc. | An apparatus and method for providing snapshot action thermal infrared imaging within automated process control article inspection applications |
| US6840666B2 (en) * | 2002-01-23 | 2005-01-11 | Marena Systems Corporation | Methods and systems employing infrared thermography for defect detection and analysis |
| JP2003215081A (ja) * | 2002-01-24 | 2003-07-30 | Central Glass Co Ltd | 板ガラスに形成された導電線の断線検査方法およびその装置 |
| US7425093B2 (en) * | 2003-07-16 | 2008-09-16 | Cabot Corporation | Thermography test method and apparatus for bonding evaluation in sputtering targets |
| US7129492B2 (en) * | 2003-07-29 | 2006-10-31 | Toyota Motor Manufacturing North America, Inc. | Systems and methods for inspecting coatings |
| ITRM20030524A1 (it) * | 2003-11-12 | 2005-05-13 | Ct Sviluppo Materiali Spa | Apparato e metodo per il controllo della qualita' |
| US7474115B1 (en) | 2004-12-28 | 2009-01-06 | Dupont Displays, Inc. | Organic electronic device display defect detection |
| US7409313B2 (en) * | 2005-12-16 | 2008-08-05 | General Electric Company | Method and apparatus for nondestructive evaluation of insulative coating |
| JP4908995B2 (ja) | 2006-09-27 | 2012-04-04 | 株式会社日立ハイテクノロジーズ | 欠陥分類方法及びその装置並びに欠陥検査装置 |
| WO2010106639A1 (ja) * | 2009-03-17 | 2010-09-23 | 西日本高速道路エンジニアリング四国株式会社 | 構造物の損傷深さ判定方法とその装置及び構造物の損傷処置判定方法とその装置 |
| US8204294B2 (en) * | 2009-11-25 | 2012-06-19 | Toyota Motor Engineering & Manufacturing North America, Inc. | Systems and methods for detecting defects in coatings utilizing color-based thermal mismatch |
| ES2446546T3 (es) * | 2009-12-10 | 2014-03-10 | Emhart Glass S.A. | Método y sistema para la monitorización de un proceso de formación de recipientes de vidrio |
| US9671357B2 (en) * | 2009-12-10 | 2017-06-06 | Emhardt Glass S.A. | System and method for monitoring hot glass containers to enhance their quality and control the forming process |
| DE102010027072A1 (de) * | 2010-07-13 | 2012-01-19 | Prüftechnik Dieter Busch AG | Verfahren und System zur Vorhersage von Fehlern an Komponenten rotierender Maschinen mit Thermographie |
| DE102010063149A1 (de) * | 2010-12-15 | 2012-06-21 | Siemens Aktiengesellschaft | Testen von Baugruppen |
| US9052351B2 (en) * | 2012-09-19 | 2015-06-09 | Sensus Usa Inc. | Method and apparatus for preventing electricity meter failure |
| CN103776542B (zh) * | 2012-09-21 | 2021-04-20 | 杭州美盛红外光电技术有限公司 | 热像诊断装置和热像诊断方法 |
| JP5764592B2 (ja) * | 2013-02-22 | 2015-08-19 | 東京エレクトロン株式会社 | 基板処理装置、基板処理装置の監視装置及び基板処理装置の監視方法 |
| WO2015035445A1 (en) * | 2013-09-10 | 2015-03-19 | Metso Minerals (Australia) Limited | Infrared detection of conveyor belt faults |
| US20160212360A1 (en) * | 2015-01-21 | 2016-07-21 | Siemens Energy, Inc. | In-situ inspection of power generating machinery |
| KR101840837B1 (ko) * | 2017-12-06 | 2018-03-21 | 엘아이지넥스원 주식회사 | 적외선 검출기의 온도에 따른 불량화소 검출장치 및 방법 |
| KR102670136B1 (ko) * | 2019-04-08 | 2024-05-29 | 한국전력공사 | 변압기 소음 제거 장치 및 방법 |
| CN111862019B (zh) * | 2020-07-11 | 2023-04-11 | 北京唯实兴邦科技有限公司 | 一种热电光软多维信息融合电路智能检测与故障诊断方法 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4061578A (en) * | 1976-04-05 | 1977-12-06 | Marcos Kleinerman | Infrared detection and imaging, method and apparatus |
| DE2704871C3 (de) * | 1977-02-05 | 1981-03-26 | Bodenseewerk Perkin-Elmer & Co GmbH, 88662 Überlingen | Verfahren zu Differenzthermoanalyse |
| SE8300166L (sv) * | 1982-01-18 | 1983-07-19 | Uti Instruments Co | Digital bildbehandling |
| US4558222A (en) * | 1982-11-06 | 1985-12-10 | Barr & Stroud Limited | Infrared radiation detecting systems |
| US4513441A (en) * | 1983-08-02 | 1985-04-23 | Sparta, Inc. | Image comparison system |
| CA1229392A (en) * | 1984-02-28 | 1987-11-17 | Hirosato Yamane | Method and apparatus for detection of surface defects of hot metal body |
| US4816681A (en) * | 1984-10-02 | 1989-03-28 | Fuji Photo Film Co., Ltd. | Method and apparatus for improving quality of energy subtraction image |
| US4759073A (en) * | 1985-11-15 | 1988-07-19 | Kulicke & Soffa Industries, Inc. | Bonding apparatus with means and method for automatic calibration using pattern recognition |
| US4872052A (en) * | 1986-12-03 | 1989-10-03 | View Engineering, Inc. | Semiconductor device inspection system |
| US4755874A (en) * | 1987-08-31 | 1988-07-05 | Kla Instruments Corporation | Emission microscopy system |
| FR2641870B1 (fr) * | 1989-01-19 | 1991-07-12 | Bull Sa | Procede pour le controle d'une carte de circuit imprime equipee, notamment le controle des soudures de la carte, et appareillage pour la mise en oeuvre de ce procede |
| US5032727A (en) * | 1990-09-14 | 1991-07-16 | Digital Equipment Corporation | Product defect detection using thermal ratio analysis |
-
1990
- 1990-09-14 US US07/582,102 patent/US5032727A/en not_active Expired - Lifetime
-
1991
- 1991-06-05 AU AU78189/91A patent/AU626146B2/en not_active Ceased
- 1991-07-19 CA CA002047426A patent/CA2047426A1/en not_active Abandoned
- 1991-07-30 EP EP91306974A patent/EP0475570A2/en not_active Withdrawn
- 1991-08-01 JP JP3192930A patent/JPH04282445A/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6715915B1 (en) | 1999-08-13 | 2004-04-06 | Morinaga Milk Industry Co., Ltd. | Fluidity determination method of a packed fluid and device used in the same |
Also Published As
| Publication number | Publication date |
|---|---|
| US5032727A (en) | 1991-07-16 |
| AU7818991A (en) | 1992-03-19 |
| EP0475570A3 (show.php) | 1994-02-09 |
| EP0475570A2 (en) | 1992-03-18 |
| JPH04282445A (ja) | 1992-10-07 |
| AU626146B2 (en) | 1992-07-23 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EEER | Examination request | ||
| FZDE | Discontinued |