CA2001583A1 - Sonde de mesure du bruit - Google Patents

Sonde de mesure du bruit

Info

Publication number
CA2001583A1
CA2001583A1 CA2001583A CA2001583A CA2001583A1 CA 2001583 A1 CA2001583 A1 CA 2001583A1 CA 2001583 A CA2001583 A CA 2001583A CA 2001583 A CA2001583 A CA 2001583A CA 2001583 A1 CA2001583 A1 CA 2001583A1
Authority
CA
Canada
Prior art keywords
loop
conductors
probe
electrical circuit
measurement probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA2001583A
Other languages
English (en)
Other versions
CA2001583C (fr
Inventor
Douglas Charles Smith
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
American Telephone and Telegraph Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by American Telephone and Telegraph Co Inc filed Critical American Telephone and Telegraph Co Inc
Publication of CA2001583A1 publication Critical patent/CA2001583A1/fr
Application granted granted Critical
Publication of CA2001583C publication Critical patent/CA2001583C/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Measuring Magnetic Variables (AREA)
CA002001583A 1988-12-23 1989-10-26 Sonde de mesure du bruit Expired - Lifetime CA2001583C (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/289,288 US4879507A (en) 1988-12-23 1988-12-23 Noise measurement probe
US289,288 1988-12-23

Publications (2)

Publication Number Publication Date
CA2001583A1 true CA2001583A1 (fr) 1990-06-23
CA2001583C CA2001583C (fr) 1994-04-19

Family

ID=23110879

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002001583A Expired - Lifetime CA2001583C (fr) 1988-12-23 1989-10-26 Sonde de mesure du bruit

Country Status (3)

Country Link
US (1) US4879507A (fr)
JP (1) JPH0664106B2 (fr)
CA (1) CA2001583C (fr)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2877609B2 (ja) * 1992-03-30 1999-03-31 株式会社東芝 原子力発電設備用起動領域モニタシステム
US6791026B2 (en) * 2002-10-25 2004-09-14 Fukuda Denshi Co., Ltd. Biomedical signal cable and biomedical signal processor
US10067165B2 (en) 2015-09-04 2018-09-04 Ford Global Technologies, Llc Isolated differential voltage probe for EMI noise source
JP6580011B2 (ja) * 2016-09-12 2019-09-25 株式会社日立製作所 信号線ノイズ耐性評価方法及びその装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB744116A (en) * 1953-12-04 1956-02-01 Francis Richard Pettit Improvements in wireless aerials and feeders
US3534371A (en) * 1968-07-10 1970-10-13 Adams Russel Co Inc Plural dipole vertical antenna with isolation chokes
JPS56143960A (en) * 1980-04-10 1981-11-10 Hajime Sangyo Kk Noise detector
JPS6216683Y2 (fr) * 1981-03-20 1987-04-27
US4593247A (en) * 1983-11-25 1986-06-03 General Electric Company Method of NMR imaging with off-center zoom scan
US4539709A (en) * 1984-03-05 1985-09-03 Rockwell International Corporation Measurement of oscillator spillover noise in a single sideband system
US4611214A (en) * 1984-06-27 1986-09-09 The United States Of America As Represented By The Secretary Of The Army Tactical high frequency array antennas

Also Published As

Publication number Publication date
CA2001583C (fr) 1994-04-19
US4879507A (en) 1989-11-07
JPH02201174A (ja) 1990-08-09
JPH0664106B2 (ja) 1994-08-22

Similar Documents

Publication Publication Date Title
JPH04219945A (ja) プローブ接続方法
KR950006472A (ko) 프로브카드, 프로브카드용 동축 프로브빔 및 그 제조방법
DE3872735D1 (de) Elektrische verbindungsvorrichtung zwischen zwei buendeln von leitenden draehten und mit dieser vorrichtung ausgestattetes kraftfahrzeug.
DE3777193D1 (de) Akzelerometer.
US4914307A (en) Optoelectronic device for contactless measurement of the dimensions of objects
EP0299768A3 (fr) Bande de support pour puces semi-conductrices
US5808475A (en) Semiconductor probe card for low current measurements
CA2001583A1 (fr) Sonde de mesure du bruit
US6140823A (en) Method and apparatus for measuring a transfer impedance of shielded devices and common mode currents in shieldings
WO2003007002A3 (fr) Appareil d'interface pour essai de circuits integres
DE3362798D1 (en) Transmission system for soil examination
EP0312975A3 (fr) Empaquetage pour puce semi-conductrice
JPS57207865A (en) Measuring terminal
EP0355378A3 (fr) Clip pour tester des circuits SMD et sa méthode de fabrication.
AU2398800A (en) Dual-pin probe for testing circuit boards
SU1629738A1 (ru) Щуп измерительного прибора
SU801158A1 (ru) Контактное устройство
JPS6257222B2 (fr)
JPS5486269A (en) Semiconductor device
JPH0533972Y2 (fr)
JPH0533973Y2 (fr)
JPH0620308Y2 (ja) Ｉｃソケツト
JPS5828360Y2 (ja) Ｉｃクリツプ
JPS63279179A (ja) 集積回路装置の測定用ソケット
JPH0443821Y2 (fr)

Legal Events

Date Code Title Description
EEER Examination request
MKEX Expiry