CA1210622A - Development of light-sensitive quinone diazide compositions - Google Patents

Development of light-sensitive quinone diazide compositions

Info

Publication number
CA1210622A
CA1210622A CA000455440A CA455440A CA1210622A CA 1210622 A CA1210622 A CA 1210622A CA 000455440 A CA000455440 A CA 000455440A CA 455440 A CA455440 A CA 455440A CA 1210622 A CA1210622 A CA 1210622A
Authority
CA
Canada
Prior art keywords
carbon atoms
composition
developing
radical
semicarbazide
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA000455440A
Other languages
English (en)
French (fr)
Inventor
John R. Guild
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kodak Graphics Holding Inc
Original Assignee
Eastman Kodak Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Eastman Kodak Co filed Critical Eastman Kodak Co
Application granted granted Critical
Publication of CA1210622A publication Critical patent/CA1210622A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26Processing photosensitive materials; Apparatus therefor
    • G03F7/30Imagewise removal using liquid means
    • G03F7/32Liquid compositions therefor, e.g. developers
    • G03F7/322Aqueous alkaline compositions

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Non-Silver Salt Photosensitive Materials And Non-Silver Salt Photography (AREA)
CA000455440A 1983-07-22 1984-05-30 Development of light-sensitive quinone diazide compositions Expired CA1210622A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US516,227 1983-07-22
US06/516,227 US4464461A (en) 1983-07-22 1983-07-22 Development of light-sensitive quinone diazide compositions

Publications (1)

Publication Number Publication Date
CA1210622A true CA1210622A (en) 1986-09-02

Family

ID=24054661

Family Applications (1)

Application Number Title Priority Date Filing Date
CA000455440A Expired CA1210622A (en) 1983-07-22 1984-05-30 Development of light-sensitive quinone diazide compositions

Country Status (5)

Country Link
US (1) US4464461A (enExample)
EP (1) EP0132354B1 (enExample)
JP (1) JPS6042754A (enExample)
CA (1) CA1210622A (enExample)
DE (1) DE3481348D1 (enExample)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3230171A1 (de) * 1982-08-13 1984-02-16 Hoechst Ag, 6230 Frankfurt Waessrig-alkalische loesung und verfahren zum entwickeln von positiv-arbeitenden reproduktionsschichten
JPS59182444A (ja) * 1983-04-01 1984-10-17 Sumitomo Chem Co Ltd ポジ型フオトレジストの改良現像液
US4606999A (en) * 1983-12-21 1986-08-19 Thiokol Corporation Development of positive photoresists using cyclic quaternary ammonium hydroxides
US4556629A (en) * 1983-12-21 1985-12-03 Morton Thiokol, Inc. Developer composition for positive photoresists using solution with cyclic quaternary ammonium hydroxides
FR2562421B1 (fr) * 1984-04-09 1989-02-17 Sandoz Sa Perfectionnements a la therapie par l'interleukine
US5143814A (en) * 1984-06-11 1992-09-01 Hoechst Celanese Corporation Positive photoresist compositions with o-quinone diazide, novolak and propylene glycol alkyl ether acetate
US5066561A (en) * 1984-06-11 1991-11-19 Hoechst Celanese Corporation Method for producing and using a positive photoresist with o-quinone diazide, novolak, and propylene glycol alkyl ether acetate
EP0177905B1 (de) * 1984-10-09 1990-12-05 Hoechst Japan Kabushiki Kaisha Verfahren zum Entwickeln und zum Entschichten von Photoresistschichten mit quaternären Ammomiumverbindungen
US4686002A (en) * 1986-07-18 1987-08-11 Syntex (U.S.A.) Inc. Stabilized choline base solutions
JPH0745443B2 (ja) * 1986-09-04 1995-05-17 多摩化学工業株式会社 安定な第四級アルキルヒドロキシアルキルアンモニウムハイドロキサイド水溶液
JPS63267397A (ja) * 1986-09-16 1988-11-04 森本 栄次 センタク器
US4808513A (en) * 1987-04-06 1989-02-28 Morton Thiokol, Inc. Method of developing a high contrast, positive photoresist using a developer containing alkanolamine
US5094934A (en) * 1987-04-06 1992-03-10 Morton International, Inc. Method of developing a high contrast, positive photoresist using a developer containing alkanolamine
US5126230A (en) * 1987-04-06 1992-06-30 Morton International, Inc. High contrast, positive photoresist developer containing alkanolamine
US4931103A (en) * 1988-08-11 1990-06-05 E. I. Du Pont De Nemours And Company Tricholine phosphate surface treating agent
US5175078A (en) * 1988-10-20 1992-12-29 Mitsubishi Gas Chemical Company, Inc. Positive type photoresist developer
DE68923844T2 (de) * 1988-10-20 1995-12-21 Mitsubishi Gas Chemical Co Entwickler für Positiv-Photolacke.
US5164286A (en) * 1991-02-01 1992-11-17 Ocg Microelectronic Materials, Inc. Photoresist developer containing fluorinated amphoteric surfactant
CA2081220A1 (en) * 1991-10-29 1993-04-30 Llandro Castillo Santos Single-phase developers for lithographic printing elements
JP2751849B2 (ja) * 1995-01-30 1998-05-18 日立プラント建設株式会社 現像原液の希釈装置
US7135445B2 (en) * 2001-12-04 2006-11-14 Ekc Technology, Inc. Process for the use of bis-choline and tris-choline in the cleaning of quartz-coated polysilicon and other materials
US7547669B2 (en) * 1998-07-06 2009-06-16 Ekc Technology, Inc. Remover compositions for dual damascene system
US6340559B1 (en) * 2001-02-21 2002-01-22 Huntsman Petrochemical Corporation Semiconductor developing agent
US20060094612A1 (en) * 2004-11-04 2006-05-04 Mayumi Kimura Post etch cleaning composition for use with substrates having aluminum
CA2855935A1 (en) * 2011-11-22 2013-05-30 Taminco N.V. Stabilized choline solutions and methods for preparing the same
CA2851406C (en) 2012-04-13 2019-12-17 Huntsman Petrochemical Llc Using novel amines to stabilize quaternary trialkylalkanolamines
CN105228979B (zh) 2013-04-11 2018-04-27 塔明克公司 氢氧化胆碱的改进方法
JP6296974B2 (ja) * 2014-12-25 2018-03-20 四日市合成株式会社 安定化四級アンモニウム水酸化物水溶液及びその製造方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4141733A (en) * 1977-10-25 1979-02-27 Eastman Kodak Company Development of light-sensitive quinone diazide compositions
US4294911A (en) * 1979-06-18 1981-10-13 Eastman Kodak Company Development of light-sensitive quinone diazide compositions using sulfite stabilizer

Also Published As

Publication number Publication date
JPS6042754A (ja) 1985-03-07
JPH048788B2 (enExample) 1992-02-18
EP0132354B1 (en) 1990-02-07
EP0132354A3 (en) 1986-07-16
DE3481348D1 (de) 1990-03-15
US4464461A (en) 1984-08-07
EP0132354A2 (en) 1985-01-30

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Legal Events

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