CA1203283A - Methode et dispositif pour evaluer l'etalonnage de sondes a attenuation de tension - Google Patents
Methode et dispositif pour evaluer l'etalonnage de sondes a attenuation de tensionInfo
- Publication number
- CA1203283A CA1203283A CA000415607A CA415607A CA1203283A CA 1203283 A CA1203283 A CA 1203283A CA 000415607 A CA000415607 A CA 000415607A CA 415607 A CA415607 A CA 415607A CA 1203283 A CA1203283 A CA 1203283A
- Authority
- CA
- Canada
- Prior art keywords
- probe
- output signal
- reference level
- square
- level
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
- G01R29/027—Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Current Or Voltage (AREA)
- Tests Of Electronic Circuits (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Measurement And Recording Of Electrical Phenomena And Electrical Characteristics Of The Living Body (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56184095A JPS5885182A (ja) | 1981-11-17 | 1981-11-17 | プローブ校正表示方法 |
JP180495/81 | 1981-11-17 |
Publications (1)
Publication Number | Publication Date |
---|---|
CA1203283A true CA1203283A (fr) | 1986-04-15 |
Family
ID=16147300
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CA000415607A Expired CA1203283A (fr) | 1981-11-17 | 1982-11-15 | Methode et dispositif pour evaluer l'etalonnage de sondes a attenuation de tension |
Country Status (6)
Country | Link |
---|---|
US (1) | US4608657A (fr) |
JP (1) | JPS5885182A (fr) |
CA (1) | CA1203283A (fr) |
DE (1) | DE3242441A1 (fr) |
FR (1) | FR2516661B1 (fr) |
GB (1) | GB2109945B (fr) |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4663586A (en) * | 1985-05-02 | 1987-05-05 | Hewlett-Packard Company | Device with automatic compensation of an ac attenuator |
JPH0785096B2 (ja) * | 1986-10-08 | 1995-09-13 | 横河・ヒユ−レツト・パツカ−ド株式会社 | セトリング特性測定方法 |
US4859936A (en) * | 1987-01-29 | 1989-08-22 | John Fluke Mfg. Co., Inc. | Method of and apparatus for determining AC calibration errors and apparatus using device with AC calibration errors |
US4783307A (en) * | 1987-03-05 | 1988-11-08 | Commonwealth Edison Company | Reactor control system verification |
JPS6421305U (fr) * | 1987-07-30 | 1989-02-02 | ||
JPS6421306U (fr) * | 1987-07-30 | 1989-02-02 | ||
US5033015A (en) * | 1988-08-12 | 1991-07-16 | Hughes Aircraft Company | Automated system for testing an imaging sensor |
US5038305A (en) * | 1989-02-27 | 1991-08-06 | Microfast Controls Corp. | Programmable controller linear transducer input modules |
US5121632A (en) * | 1991-01-03 | 1992-06-16 | Magnetrol International, Incorporated | Point level switch |
US5351009A (en) * | 1993-03-08 | 1994-09-27 | Honeywell, Inc. | Method for calibrating components permitting the use of low cost components |
DE19647897C2 (de) * | 1996-11-20 | 1998-10-01 | A B Elektronik Gmbh | Vorrichtung zum Einjustieren von Ausgangswerten oder -kurven von Drehwinkel- und Drehzahlsensoren |
US6556003B2 (en) * | 2001-03-20 | 2003-04-29 | Sang Joon Choi | Computer multimeter |
US6801042B2 (en) | 2001-12-18 | 2004-10-05 | Tektronix, Inc. | Calibration method and apparatus for signal analysis device |
US7205773B1 (en) * | 2004-09-29 | 2007-04-17 | Keithley Instruments, Inc. | Method for calibrating a pulsed measurement system |
US7299144B2 (en) * | 2005-12-15 | 2007-11-20 | International Business Machines Corporation | Method and apparatus for implementing automatic-calibration of TDR probing system |
CN102298130A (zh) * | 2010-06-24 | 2011-12-28 | 鸿富锦精密工业(深圳)有限公司 | 示波器探头校验装置 |
TWI447419B (zh) * | 2010-06-30 | 2014-08-01 | Hon Hai Prec Ind Co Ltd | 示波器探頭校驗裝置 |
US20150316411A1 (en) * | 2014-05-02 | 2015-11-05 | Kla-Tencor Corporation | Method and System for Intrinsic LED Heating for Measurement |
US9660647B2 (en) * | 2014-10-27 | 2017-05-23 | Sk Hynix Memory Solutions Inc. | Calibration device and memory system having the same |
CN107247246A (zh) * | 2017-05-18 | 2017-10-13 | 郑州云海信息技术有限公司 | 一种示波器测量数据的校准方法和装置 |
CA3144282A1 (fr) * | 2019-07-09 | 2021-01-14 | Gentiam Llc | Outil de test d'electronique et de diagnostic |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2205793C3 (de) * | 1972-02-08 | 1974-09-12 | Bodenseewerk Perkin-Elmer & Co Gmbh, 7770 Ueberlingen | Schaltungsanordnung zum Abgleich der Nullinie |
FR2297426A1 (fr) * | 1975-01-10 | 1976-08-06 | Russin Leonid | Dispositif pour mesurer les parametres d'un objet a l'etat dynamique |
US4070615A (en) * | 1976-05-12 | 1978-01-24 | Tektronix, Inc. | Compensation indicator for attenuation probe |
US4161029A (en) * | 1977-09-19 | 1979-07-10 | Frye George J | Automatic transient response analyzer system |
US4229703A (en) * | 1979-02-12 | 1980-10-21 | Varian Associates, Inc. | Zero reference and offset compensation circuit |
US4253057A (en) * | 1979-04-26 | 1981-02-24 | Tektronix, Inc. | Compensation indicator for attenuation probe |
US4458196A (en) * | 1981-08-05 | 1984-07-03 | John Fluke Mfg. Co., Inc. | Method and apparatus for high speed resistance, inductance and capacitance measurement |
-
1981
- 1981-11-17 JP JP56184095A patent/JPS5885182A/ja active Granted
-
1982
- 1982-11-01 US US06/438,101 patent/US4608657A/en not_active Expired - Fee Related
- 1982-11-09 GB GB08231895A patent/GB2109945B/en not_active Expired
- 1982-11-15 CA CA000415607A patent/CA1203283A/fr not_active Expired
- 1982-11-16 FR FR8219469A patent/FR2516661B1/fr not_active Expired
- 1982-11-16 DE DE19823242441 patent/DE3242441A1/de active Granted
Also Published As
Publication number | Publication date |
---|---|
FR2516661B1 (fr) | 1986-12-19 |
GB2109945B (en) | 1986-05-29 |
JPH0149903B2 (fr) | 1989-10-26 |
FR2516661A1 (fr) | 1983-05-20 |
GB2109945A (en) | 1983-06-08 |
DE3242441C2 (fr) | 1991-11-14 |
DE3242441A1 (de) | 1983-06-30 |
JPS5885182A (ja) | 1983-05-21 |
US4608657A (en) | 1986-08-26 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MKEX | Expiry |