CA1120545A - Method and device for testing electrical conductor elements - Google Patents

Method and device for testing electrical conductor elements

Info

Publication number
CA1120545A
CA1120545A CA000315697A CA315697A CA1120545A CA 1120545 A CA1120545 A CA 1120545A CA 000315697 A CA000315697 A CA 000315697A CA 315697 A CA315697 A CA 315697A CA 1120545 A CA1120545 A CA 1120545A
Authority
CA
Canada
Prior art keywords
conductor
current
electrical
voltage
percent
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA000315697A
Other languages
English (en)
French (fr)
Inventor
Alan T. English
Gabriel L. Miller
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
Western Electric Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US05/949,578 external-priority patent/US4213087A/en
Application filed by Western Electric Co Inc filed Critical Western Electric Co Inc
Application granted granted Critical
Publication of CA1120545A publication Critical patent/CA1120545A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
CA000315697A 1977-10-31 1978-10-31 Method and device for testing electrical conductor elements Expired CA1120545A (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US84721377A 1977-10-31 1977-10-31
US847,213 1977-10-31
US05/949,578 US4213087A (en) 1978-10-10 1978-10-10 Method and device for testing electrical conductor elements
US949,578 1978-10-10

Publications (1)

Publication Number Publication Date
CA1120545A true CA1120545A (en) 1982-03-23

Family

ID=27126694

Family Applications (1)

Application Number Title Priority Date Filing Date
CA000315697A Expired CA1120545A (en) 1977-10-31 1978-10-31 Method and device for testing electrical conductor elements

Country Status (12)

Country Link
JP (1) JPS5488777A (sv)
CA (1) CA1120545A (sv)
CH (1) CH635686A5 (sv)
DE (1) DE2847074A1 (sv)
DK (1) DK483278A (sv)
FR (1) FR2407483A1 (sv)
GB (1) GB2007850B (sv)
HK (1) HK25584A (sv)
IT (1) IT1099851B (sv)
NL (1) NL7810608A (sv)
SE (1) SE433782B (sv)
SG (1) SG56382G (sv)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4547724A (en) * 1983-02-07 1985-10-15 Tektronix, Inc. Method and apparatus for detection of non-linear electrical devices
JPH0630444B2 (ja) * 1985-05-02 1994-04-20 株式会社日立製作所 Ａ／ｄ変換器試験方式

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3500188A (en) * 1966-06-02 1970-03-10 Amp Inc Method and means for measuring constriction resistance based on nonlinearity
GB1221704A (en) * 1968-09-16 1971-02-10 Dale Electronics Method for testing the resistance characteristics of self-heated electric resistors
US3692987A (en) * 1970-07-06 1972-09-19 Western Electric Co Methods and apparatus for allocating the measured noise and resistance of a thin-film resistor between the resistor proper and the contact pads therefor
US3746973A (en) * 1972-05-05 1973-07-17 Ibm Testing of metallization networks on insulative substrates supporting semiconductor chips
US3803483A (en) * 1972-05-05 1974-04-09 Ibm Semiconductor structure for testing of metallization networks on insulative substrates supporting semiconductor chips
US3974443A (en) * 1975-01-02 1976-08-10 International Business Machines Corporation Conductive line width and resistivity measuring system

Also Published As

Publication number Publication date
GB2007850A (en) 1979-05-23
DE2847074A1 (de) 1979-05-03
SE433782B (sv) 1984-06-12
CH635686A5 (de) 1983-04-15
IT1099851B (it) 1985-09-28
SE7811012L (sv) 1979-05-01
SG56382G (en) 1983-09-02
IT7829239A0 (it) 1978-10-30
JPS5488777A (en) 1979-07-14
GB2007850B (en) 1982-05-12
HK25584A (en) 1984-03-30
FR2407483A1 (fr) 1979-05-25
NL7810608A (nl) 1979-05-02
FR2407483B1 (sv) 1983-09-16
DK483278A (da) 1979-05-01

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Legal Events

Date Code Title Description
MKEX Expiry