CA1105998A - Component testing station - Google Patents
Component testing stationInfo
- Publication number
- CA1105998A CA1105998A CA304,379A CA304379A CA1105998A CA 1105998 A CA1105998 A CA 1105998A CA 304379 A CA304379 A CA 304379A CA 1105998 A CA1105998 A CA 1105998A
- Authority
- CA
- Canada
- Prior art keywords
- lead
- component
- contacts
- leads
- components
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Relating To Insulation (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
Abstract of the Disclosure A station for testing electrical components is provided with spaced pairs of cooperative lead-engageable contacts, these pairs being yieldingly openable to arrest a lead arriving therebetween for the test. At least one contact of each pair has an abrading edge which may be shaped to penetrate transversely any wire oxidation of the lead to obtain accurate electrical measurement though requiring only low contact force.
Description
11~5~8 U.S. Patent No. 4,119,206 issued on October 10, 1978 in the names of Daniel W. Woodman, Jr. and Stanley R.
Vancelette, and assigned to the same assignee, relates to a component sequence testing station.
This invention relates to mechanism for testing elec-trical components.
More particularly, the invention is concerned with providing an improved testing station for reliably and auto-matically determining electrical acceptability of each of a series of electronic components which are to be processed one after another at a rapid rate.
While the present invention has application to mech-anism for verifying conformity of components electrically to predetermined standards and/or sequence, it is to be recog-nized that application of the invention is not limited to a sequence verifying arrangement, and utility of this inven-tion is to be appreciated whether testing is associated with intermittently operated equipment or continuously operated mechanism.
As noted in the above-cited patent, some U.S, prior art patents are 3,236,374 issued February 22, 1966, 2,896,314 issued July 28, 1959, 3,073,446 issued January 15, 1963, and 3,366,235 issued January 30, 1968. U.S. Patent No. 4,119,206 discloses, for instance, for use in a continuously operative component sequencing machine, a component test station ar-ranged to a component feeding means. The test station as therein illustrated, comprises, in addition to a means for accelerating successive delivery of each component to the station, pairs of cam-controlled electrical contacts respec-tively closeable on each lead when it has been positioned therebetween. The test station of the invention herein dis-closed, in addition to affording greater simplicity and re-- 1 - ~
~1~5~8 liability includes novel distinguishing features hereinafter to be described, and enables elimination of an auxiliary test station.
It is accordingly a main object of the present inven-tion to provide a test station for electrical components having leads, which station shall comprise effective lead engaging contacts requiring only low contact-operating force.
Another object is to provide an improved electric component test station automatically operable on successive lead-bearing components and including a novel lead contact-ing arrangement whereby increased test cycle time is gained and the stop and test position of each component is deter-mined.
Yet another object of the invention is to provide an automatic device or station for accurately determining elec-trical acceptability of electrical components by spaced en-gagements with their respective wire leads, the device or station having the lead contacts shaped to penetrate, during relative arresting of the leads thereby, any oxidized exterior of the leads prior to and during testing while requiring only low, non-lead bending, contact-operating force.
To these ends, and as herein shown, means is provided for feeding the leads of successive components along a path, and a station for testing the components, respectively, has at least one pair of electrical contacts adjacent to the path which are yieldingly separable on being engaged by a lead arriving therebetween. Preferably both contacts of each of two spaced pairs are formed with at least one abrad-ing or acute edge adapted to penetrate any oxidized exterior of the engaged lead. Each lead engaging blade is disposed transversely of the successive side-by-side component leads, the blades being aligned to insure good electrical contact at ~; ,, 59~
spaced localities during arresting of the lead wire and during the testing interval while the component is stopped.
Provision of each contact with a pair of such parallel blades aids in preventing skewing of the component from its path and avoids tendency, if any, to bend the leads during test.
According to a further broad aspect of the present in-vention, there is provided a machine for processing electronic components of a kind having portions of their leads extending coaxially. The machine comprises means for advancing the components along a path. A pair of electrical contact sets lie in the path and spaced apart from one another so that each set is engaged by one of the component leads. Each set in-cludes at least one lead-engaging member which is yieldably mounted and arranged to be displaced from a closed or sub-stantially closed position by an advancing lead so as to stop or substantially stop it, Means is provided for connecting the contact sets in electrical circuitry for determining acceptability of individual components according to predeter-mined electrical requirements and interrupting operation of the machine if a component is not acceptable. Means is also provided for releasing the component through the machine if it is acceptable.
The foregoing and other features of the invention will now be more particularly described in connection with an il-lustrative embodiment and with reference to the accompanying drawings thereof, in which:
Fig. 1 is a view in side elevation, with portions broken away, of a component sequencing and taping maching having sequence testing or verifying mechanism according to this invention disposed along a component conveyor, Fig. 2 is a view in side elevation, and on a larger scale of portions of the verifying and component transfer mechanism shown in Fig. 1 .~
~1~59~
Fig. 3 is a plan view of the transfer and verifying mechanism, Fig. 4 is a view in end elevation of parts shown in Fig. 3 but with portions broken away to show details of driving means, Fig. 5 is a view similar to Fig. 2 but showing the parts at different positions in a cycle, Fig. 6 is a view similar to Fig. S but indicating one component leaving the test stati on as another is about to be delivered thereto;
Fig. 7 is a perspective view of the component test station and associated transfer mechanism, Fig. 8 is an enlarged section showing a lead in test or contact-engaging position, and Fig. 9 is an enlarged view in vertical section showing the contacts in component testing position, and other com-ponents behind and ahead of that position.
Although the embodiment selected for purposes of il-lustration pertains to a machine programmed to produce elec-trically tested reels of sequenced components with lead-taped spacing to match requirements of component insertion machines, the invention is not thus limited in use. The drawings laregly correspond to those of the cited Patent No.
4,119,206 for ease of comparison.
For the sake of convenience, and not by way of limita-tion, the invention will hereinafter be described as embodied in machines of the general type disclosed in U.S. Patents 3,669,309 issued June 13, 1972 and 3,971,193 issued July 27, 1976. These employ a continuously operative endless con-veyor of chain-type generally designated 10 (Figs. 1,2,6 and 7) for carrying in uniformly spaced side-by-side relation a succession of components C (not necessarily alike physically .
~i .i 9~
or electrically) having at least partly coaxial leads L to be re-taped and then reeled at a station 12 (Fig. 1). It will be understood that the components C, initially fed by tape T from their respective dispensers 14 arranged along the conveyor, are successively indexed and individually re-leased to the conveyor according to programming means not herein shown.
In addition to the conveyor 10, the dispensers 14, and the station 12 being assumed essentially to correspond with the patented structure referred to, it is also herein assumed for purposes of convenience that component accelerative or transfer mechanism 16 (substantially corresponding to that generally designated 30 in the cited Patent No. 4,119,206)is employed to shift successive components in the direction of conveyor feed toward a novel component testing station gener-ally designated 18. The conveyor 10 and/or the transfer mechanism 16 thus clearly are incidental to supplying suc-cessive components C cyclically to the station 1~, but are not~essential to practice of the present invention, other component presenting means of various types and structure also being clearly useful therewith as different circumstances or testing conditions may require or make desirable.
The conveyor 10 comprises uniformly spaced, lead-engaging carriers 20 including, respectively, a pair of leading side plates 22 and a pair of trailing side plates 24. Pivotal relation of upstanding pick-off fingers 26 of the plates 24 to the leading plates 22 is controlled by cam means which, along the upper conveyor reach, constitutes a fixed, hori-zontal pair of parallel cam tracks 28 secured to the conveyor frame~ It will thus be understood that upon passing from beneath delivery ends of the series of dispensers 14, each pair of fingers 26 is rapidly advancing a component C (left-ward as seen in Fig. 1) toward the station 12, and it is important to ascertain prior to its arrival thereat if the component is acceptable for its intended use as determined by the test station 18.
~1~P59~
The transfer mechanism 16 (Figs. 2-5 and 7) is up-stream of the conveyor from the test station 18 which is itself upstream from the subsequent processing station, for instance that at the station 12. Though not herein fully shown, the conveyor 10 may be driven by power means including a drive chain 30 (Fig. 1) having operative connection to a timing belt 32 (Figs. 1-4) provided for actuating the trans-fer mechanism 16 and the test station 18 in synchronism as will next be described. For this purpose the belt 32 drives a gear 34 journalled B
thereof and each stud carries a locknut 98.
Each of the contact supports 80 is secured to a shiftable operating assembly comprising a bar 100 projecting transversely of the conveyor path from a lever 102. This lever at one end carries a follower roll 104 having a peripheral engagement with the cam 40, and at the other end is fulcrumed to the housing 38. A spring 106 (Figs. 2,7) normally maintains engagement of the roll 104 with the cam 40 cyclically to control rise and descent of the upper contacts 72 for engagement and transverse penetration of the successive leads. ~Towever, as indicated in Figs. 1 and 2, upon occasion such as the need to replace a faulty component found disqualified by electrical test at the station 18, an operator may simply turn the lever 102 clockwise to its dash-line position shown in Fig. 1. The spring 106 in cooperation with a stop pin 108 in the housing will then hold the lever 102 and the raised supports 80 in an out-of-the way positionwhile a fresh component C is manually substituted across the lower contacts 70,70 to be tested when the contacts 72 are again lowered into lead engaging ,position. It will be understood that failure of a component to quality as acceptable at the station 18 will at once deenergize the conveyor drive system, and that it will be automatically re-energized upon meeting predetermined electrical requirement. Appropriate test current and voltage for the respective components successively lead-engaged by the contacts 70,72 is administered by circuitry not herein shown, control and timing of the tests preferably being derived from computer-dictated pulsing. For convenience a compartmented receptacle (not shown) for supplying the different replacement components C is customarily provided adjacent to the test station.
Certain components, such as disc caps, which have bodies and lead portions which are non-aligned, i.e. have lead portions non-coaxial adjacent to their bodies, may require means for controlling the orientation of such bodies relative to their coaxial lead portions. Thus an elongated stationary thin strip 110 (Figs . 3, 7) anchored at one end to the conveyor frame, and extending parallel to and supported by its drive chain from a point upstream of the dispensers ~ 59~8 14 to the station 12, is arranged to prevent the bodies from rotating excessively (due to gravity) about their coaxial lead portions and becoming fouled in the chain. At the point of entry into the transfer mechanism 16, an extension 118 (Figs, 7,9) of the strip 110 engages non-aligned bodies such as those of disc caps to support them. On reaching the station 18 the coaxial lead portions L
being urged to roll downstream upon the lower contacts 70 may urge the non-aligned bodies such as disc caps counterclockwise as seen in Figs. 5-9 and 9. Accordingly, a lead-spring deflector 112 (Fig. 9) i9 attaching to the support 80 and has a free depending portion engageable with the component body to limit the counterclockwise rotation thereof to less than 90, as illustrated by the disc cap C shown in Fig. 9.
After a testing cycle, if a component has been found acceptable, the pick-off fingers 26 previously engaging its leads L will again propel them downstream as indicated in Figs. 7 and 9. In order to maintain the coaxial lead portions in parallel relation and substantially non-skewed, widthwise spaced guides 114,114 are affixed to the support 80 and respectively have lead-engaging under surfaces inclined downwardly in the direction of feeding to deflect the leads downward into their respective carrier "pockets" between the leading and trailing side plates 22,24. Resilient deflector sheets 116,116 (Figs. 7,9) for instance of rubber, are suspended from the bar 100 to engage, stabilize, ~0 and deflect the component leads L, in conjunction with the guides 114,114 so that the leads are returned into their respective carrier pockets. The upper surface of a body such as a disc cap which has been tested is prevented from any further counterclockwise motion by engagement with a central resilient deflector 120 secured at its upper end to the bar 100. Consequently the restraints mentioned insure that all components are tested while momentarily stationary and then redeposited in appropriate orientation within their conveyor "pockets",respectively, prior to further treatment, such as retaping at the station 12.
It may be noted that the present disclosure, as contrasted with that of the cited Patent No. 4,119,206,makes unnecessary the provision ~ '5~
of an auxiliary test station for electrically pretesting replacement components C prior to their substitution in the component sequence.
Briefly to review operation of the machine and more especially the functioninS;
of the test station 18, it will be assumed that the carriers 20 are each loaded with a component C picked off from the dispensers 14, respectively, by the successive pairs of fingers 26 for forwarding toward the test station by the conveyor 10. Electronic means (not shown) preferably is provided for determining the order in which components are to be fed, assuming a predetermined order is desired, as well as establishing a proper program of testing at the station 18 for the selected component sequence. It will be appreciated that the invention not only assures that the station 18 makes rapid and reliable electric tests of the appropriate type for each component fed, but that only acceptable components are passed on for further processing, for instance taping and reeling at the station 12.
Upon engagement of the successive coaxial lead portions of a component C with the ramp portions 66, the pair of fingers 26 engaging those lead portions, respectively, raises the component on the ramp to the horizontal rail portions 68. Timing of the four-bar linkage 46,50 and 52 is such that the forked pickers 62,62, as indicated in Fig . 5, are lowered over the leads L before reaching the locality of intersection of the ramps 66 with the rail portions 68,68. Now the pickers 62 accelerate downstream ahead of the fingers 26 which had been propelling the component in order to present its leads between the contact sets 70,72. It is to be observed that, by way of distinction over the disclosure in the citedPatent No.4, 119, 206, wherein the leads had to fully stop prior to contact engagement therewith, the relatively closed lead contact sets 70,72 are yieldingly opened heightwise for the electrical testing by the arrival and contact-displacing motion of the leads before they are released from the pickers62. This is to say that the leads are brought to rest upon the lower contacts 70, the knife edges 99 thereof as well as the knife edges 94 of the upwardly .-~i3~ yieldable contact 72 transversely penetrating any oxidized exterior of the leads - 9 ~ s~
as they are caused to stop. This arrangement advantageously provides a greater percentage of the sequencer verifying cycle to be available during which a component can be tested, and provides a good electrical contact for an accurate and reliable test while imposing only a low, non-lead bending operating force.
Should resistance (due to compression of the springs 90, 90) to arrest the leads at the station 18 be insufficient, the stop surface 92, of the support 80 acts positively to position the leads for static testing . The pickers 62, 62 are raised and retracted (to the right as seen in Figs . 1, 2, 5 and 7) from the test station to repeat a transfer cycle for a succeeding component during completion of the electric test of the component delivered to the station 18.
Upon releasing a tested component C by elevation of the contacts 72 due to raising of the support 80 by operation of the rise on the cam 40, that component is returned to its conveyor carrier 20 as above explained provided the electric test at the station 18 has been satisfactorily passed. If not, the conveyor 10 has been stopped automatically and the defective component C will be discarded upon relatively lifting the upper portion of the test assembly, i . e . the supports 80, contacts 72, bar 100 and the lever 102 with its roll 104, whereupon a fresh component is substituted directly into the station 18 and the designated test parts lowered for a testing.
From the foregoing it will be apparent that the invention provides an ^
effective, uncomplicated electric component test station and one that can be employed to repeat testing at high rate with little or no difficulty attributable to contact failure.
~n
Vancelette, and assigned to the same assignee, relates to a component sequence testing station.
This invention relates to mechanism for testing elec-trical components.
More particularly, the invention is concerned with providing an improved testing station for reliably and auto-matically determining electrical acceptability of each of a series of electronic components which are to be processed one after another at a rapid rate.
While the present invention has application to mech-anism for verifying conformity of components electrically to predetermined standards and/or sequence, it is to be recog-nized that application of the invention is not limited to a sequence verifying arrangement, and utility of this inven-tion is to be appreciated whether testing is associated with intermittently operated equipment or continuously operated mechanism.
As noted in the above-cited patent, some U.S, prior art patents are 3,236,374 issued February 22, 1966, 2,896,314 issued July 28, 1959, 3,073,446 issued January 15, 1963, and 3,366,235 issued January 30, 1968. U.S. Patent No. 4,119,206 discloses, for instance, for use in a continuously operative component sequencing machine, a component test station ar-ranged to a component feeding means. The test station as therein illustrated, comprises, in addition to a means for accelerating successive delivery of each component to the station, pairs of cam-controlled electrical contacts respec-tively closeable on each lead when it has been positioned therebetween. The test station of the invention herein dis-closed, in addition to affording greater simplicity and re-- 1 - ~
~1~5~8 liability includes novel distinguishing features hereinafter to be described, and enables elimination of an auxiliary test station.
It is accordingly a main object of the present inven-tion to provide a test station for electrical components having leads, which station shall comprise effective lead engaging contacts requiring only low contact-operating force.
Another object is to provide an improved electric component test station automatically operable on successive lead-bearing components and including a novel lead contact-ing arrangement whereby increased test cycle time is gained and the stop and test position of each component is deter-mined.
Yet another object of the invention is to provide an automatic device or station for accurately determining elec-trical acceptability of electrical components by spaced en-gagements with their respective wire leads, the device or station having the lead contacts shaped to penetrate, during relative arresting of the leads thereby, any oxidized exterior of the leads prior to and during testing while requiring only low, non-lead bending, contact-operating force.
To these ends, and as herein shown, means is provided for feeding the leads of successive components along a path, and a station for testing the components, respectively, has at least one pair of electrical contacts adjacent to the path which are yieldingly separable on being engaged by a lead arriving therebetween. Preferably both contacts of each of two spaced pairs are formed with at least one abrad-ing or acute edge adapted to penetrate any oxidized exterior of the engaged lead. Each lead engaging blade is disposed transversely of the successive side-by-side component leads, the blades being aligned to insure good electrical contact at ~; ,, 59~
spaced localities during arresting of the lead wire and during the testing interval while the component is stopped.
Provision of each contact with a pair of such parallel blades aids in preventing skewing of the component from its path and avoids tendency, if any, to bend the leads during test.
According to a further broad aspect of the present in-vention, there is provided a machine for processing electronic components of a kind having portions of their leads extending coaxially. The machine comprises means for advancing the components along a path. A pair of electrical contact sets lie in the path and spaced apart from one another so that each set is engaged by one of the component leads. Each set in-cludes at least one lead-engaging member which is yieldably mounted and arranged to be displaced from a closed or sub-stantially closed position by an advancing lead so as to stop or substantially stop it, Means is provided for connecting the contact sets in electrical circuitry for determining acceptability of individual components according to predeter-mined electrical requirements and interrupting operation of the machine if a component is not acceptable. Means is also provided for releasing the component through the machine if it is acceptable.
The foregoing and other features of the invention will now be more particularly described in connection with an il-lustrative embodiment and with reference to the accompanying drawings thereof, in which:
Fig. 1 is a view in side elevation, with portions broken away, of a component sequencing and taping maching having sequence testing or verifying mechanism according to this invention disposed along a component conveyor, Fig. 2 is a view in side elevation, and on a larger scale of portions of the verifying and component transfer mechanism shown in Fig. 1 .~
~1~59~
Fig. 3 is a plan view of the transfer and verifying mechanism, Fig. 4 is a view in end elevation of parts shown in Fig. 3 but with portions broken away to show details of driving means, Fig. 5 is a view similar to Fig. 2 but showing the parts at different positions in a cycle, Fig. 6 is a view similar to Fig. S but indicating one component leaving the test stati on as another is about to be delivered thereto;
Fig. 7 is a perspective view of the component test station and associated transfer mechanism, Fig. 8 is an enlarged section showing a lead in test or contact-engaging position, and Fig. 9 is an enlarged view in vertical section showing the contacts in component testing position, and other com-ponents behind and ahead of that position.
Although the embodiment selected for purposes of il-lustration pertains to a machine programmed to produce elec-trically tested reels of sequenced components with lead-taped spacing to match requirements of component insertion machines, the invention is not thus limited in use. The drawings laregly correspond to those of the cited Patent No.
4,119,206 for ease of comparison.
For the sake of convenience, and not by way of limita-tion, the invention will hereinafter be described as embodied in machines of the general type disclosed in U.S. Patents 3,669,309 issued June 13, 1972 and 3,971,193 issued July 27, 1976. These employ a continuously operative endless con-veyor of chain-type generally designated 10 (Figs. 1,2,6 and 7) for carrying in uniformly spaced side-by-side relation a succession of components C (not necessarily alike physically .
~i .i 9~
or electrically) having at least partly coaxial leads L to be re-taped and then reeled at a station 12 (Fig. 1). It will be understood that the components C, initially fed by tape T from their respective dispensers 14 arranged along the conveyor, are successively indexed and individually re-leased to the conveyor according to programming means not herein shown.
In addition to the conveyor 10, the dispensers 14, and the station 12 being assumed essentially to correspond with the patented structure referred to, it is also herein assumed for purposes of convenience that component accelerative or transfer mechanism 16 (substantially corresponding to that generally designated 30 in the cited Patent No. 4,119,206)is employed to shift successive components in the direction of conveyor feed toward a novel component testing station gener-ally designated 18. The conveyor 10 and/or the transfer mechanism 16 thus clearly are incidental to supplying suc-cessive components C cyclically to the station 1~, but are not~essential to practice of the present invention, other component presenting means of various types and structure also being clearly useful therewith as different circumstances or testing conditions may require or make desirable.
The conveyor 10 comprises uniformly spaced, lead-engaging carriers 20 including, respectively, a pair of leading side plates 22 and a pair of trailing side plates 24. Pivotal relation of upstanding pick-off fingers 26 of the plates 24 to the leading plates 22 is controlled by cam means which, along the upper conveyor reach, constitutes a fixed, hori-zontal pair of parallel cam tracks 28 secured to the conveyor frame~ It will thus be understood that upon passing from beneath delivery ends of the series of dispensers 14, each pair of fingers 26 is rapidly advancing a component C (left-ward as seen in Fig. 1) toward the station 12, and it is important to ascertain prior to its arrival thereat if the component is acceptable for its intended use as determined by the test station 18.
~1~P59~
The transfer mechanism 16 (Figs. 2-5 and 7) is up-stream of the conveyor from the test station 18 which is itself upstream from the subsequent processing station, for instance that at the station 12. Though not herein fully shown, the conveyor 10 may be driven by power means including a drive chain 30 (Fig. 1) having operative connection to a timing belt 32 (Figs. 1-4) provided for actuating the trans-fer mechanism 16 and the test station 18 in synchronism as will next be described. For this purpose the belt 32 drives a gear 34 journalled B
thereof and each stud carries a locknut 98.
Each of the contact supports 80 is secured to a shiftable operating assembly comprising a bar 100 projecting transversely of the conveyor path from a lever 102. This lever at one end carries a follower roll 104 having a peripheral engagement with the cam 40, and at the other end is fulcrumed to the housing 38. A spring 106 (Figs. 2,7) normally maintains engagement of the roll 104 with the cam 40 cyclically to control rise and descent of the upper contacts 72 for engagement and transverse penetration of the successive leads. ~Towever, as indicated in Figs. 1 and 2, upon occasion such as the need to replace a faulty component found disqualified by electrical test at the station 18, an operator may simply turn the lever 102 clockwise to its dash-line position shown in Fig. 1. The spring 106 in cooperation with a stop pin 108 in the housing will then hold the lever 102 and the raised supports 80 in an out-of-the way positionwhile a fresh component C is manually substituted across the lower contacts 70,70 to be tested when the contacts 72 are again lowered into lead engaging ,position. It will be understood that failure of a component to quality as acceptable at the station 18 will at once deenergize the conveyor drive system, and that it will be automatically re-energized upon meeting predetermined electrical requirement. Appropriate test current and voltage for the respective components successively lead-engaged by the contacts 70,72 is administered by circuitry not herein shown, control and timing of the tests preferably being derived from computer-dictated pulsing. For convenience a compartmented receptacle (not shown) for supplying the different replacement components C is customarily provided adjacent to the test station.
Certain components, such as disc caps, which have bodies and lead portions which are non-aligned, i.e. have lead portions non-coaxial adjacent to their bodies, may require means for controlling the orientation of such bodies relative to their coaxial lead portions. Thus an elongated stationary thin strip 110 (Figs . 3, 7) anchored at one end to the conveyor frame, and extending parallel to and supported by its drive chain from a point upstream of the dispensers ~ 59~8 14 to the station 12, is arranged to prevent the bodies from rotating excessively (due to gravity) about their coaxial lead portions and becoming fouled in the chain. At the point of entry into the transfer mechanism 16, an extension 118 (Figs, 7,9) of the strip 110 engages non-aligned bodies such as those of disc caps to support them. On reaching the station 18 the coaxial lead portions L
being urged to roll downstream upon the lower contacts 70 may urge the non-aligned bodies such as disc caps counterclockwise as seen in Figs. 5-9 and 9. Accordingly, a lead-spring deflector 112 (Fig. 9) i9 attaching to the support 80 and has a free depending portion engageable with the component body to limit the counterclockwise rotation thereof to less than 90, as illustrated by the disc cap C shown in Fig. 9.
After a testing cycle, if a component has been found acceptable, the pick-off fingers 26 previously engaging its leads L will again propel them downstream as indicated in Figs. 7 and 9. In order to maintain the coaxial lead portions in parallel relation and substantially non-skewed, widthwise spaced guides 114,114 are affixed to the support 80 and respectively have lead-engaging under surfaces inclined downwardly in the direction of feeding to deflect the leads downward into their respective carrier "pockets" between the leading and trailing side plates 22,24. Resilient deflector sheets 116,116 (Figs. 7,9) for instance of rubber, are suspended from the bar 100 to engage, stabilize, ~0 and deflect the component leads L, in conjunction with the guides 114,114 so that the leads are returned into their respective carrier pockets. The upper surface of a body such as a disc cap which has been tested is prevented from any further counterclockwise motion by engagement with a central resilient deflector 120 secured at its upper end to the bar 100. Consequently the restraints mentioned insure that all components are tested while momentarily stationary and then redeposited in appropriate orientation within their conveyor "pockets",respectively, prior to further treatment, such as retaping at the station 12.
It may be noted that the present disclosure, as contrasted with that of the cited Patent No. 4,119,206,makes unnecessary the provision ~ '5~
of an auxiliary test station for electrically pretesting replacement components C prior to their substitution in the component sequence.
Briefly to review operation of the machine and more especially the functioninS;
of the test station 18, it will be assumed that the carriers 20 are each loaded with a component C picked off from the dispensers 14, respectively, by the successive pairs of fingers 26 for forwarding toward the test station by the conveyor 10. Electronic means (not shown) preferably is provided for determining the order in which components are to be fed, assuming a predetermined order is desired, as well as establishing a proper program of testing at the station 18 for the selected component sequence. It will be appreciated that the invention not only assures that the station 18 makes rapid and reliable electric tests of the appropriate type for each component fed, but that only acceptable components are passed on for further processing, for instance taping and reeling at the station 12.
Upon engagement of the successive coaxial lead portions of a component C with the ramp portions 66, the pair of fingers 26 engaging those lead portions, respectively, raises the component on the ramp to the horizontal rail portions 68. Timing of the four-bar linkage 46,50 and 52 is such that the forked pickers 62,62, as indicated in Fig . 5, are lowered over the leads L before reaching the locality of intersection of the ramps 66 with the rail portions 68,68. Now the pickers 62 accelerate downstream ahead of the fingers 26 which had been propelling the component in order to present its leads between the contact sets 70,72. It is to be observed that, by way of distinction over the disclosure in the citedPatent No.4, 119, 206, wherein the leads had to fully stop prior to contact engagement therewith, the relatively closed lead contact sets 70,72 are yieldingly opened heightwise for the electrical testing by the arrival and contact-displacing motion of the leads before they are released from the pickers62. This is to say that the leads are brought to rest upon the lower contacts 70, the knife edges 99 thereof as well as the knife edges 94 of the upwardly .-~i3~ yieldable contact 72 transversely penetrating any oxidized exterior of the leads - 9 ~ s~
as they are caused to stop. This arrangement advantageously provides a greater percentage of the sequencer verifying cycle to be available during which a component can be tested, and provides a good electrical contact for an accurate and reliable test while imposing only a low, non-lead bending operating force.
Should resistance (due to compression of the springs 90, 90) to arrest the leads at the station 18 be insufficient, the stop surface 92, of the support 80 acts positively to position the leads for static testing . The pickers 62, 62 are raised and retracted (to the right as seen in Figs . 1, 2, 5 and 7) from the test station to repeat a transfer cycle for a succeeding component during completion of the electric test of the component delivered to the station 18.
Upon releasing a tested component C by elevation of the contacts 72 due to raising of the support 80 by operation of the rise on the cam 40, that component is returned to its conveyor carrier 20 as above explained provided the electric test at the station 18 has been satisfactorily passed. If not, the conveyor 10 has been stopped automatically and the defective component C will be discarded upon relatively lifting the upper portion of the test assembly, i . e . the supports 80, contacts 72, bar 100 and the lever 102 with its roll 104, whereupon a fresh component is substituted directly into the station 18 and the designated test parts lowered for a testing.
From the foregoing it will be apparent that the invention provides an ^
effective, uncomplicated electric component test station and one that can be employed to repeat testing at high rate with little or no difficulty attributable to contact failure.
~n
Claims (11)
1. A machine for processing electronic components of a kind having portions of their leads extending coaxially, comprising means for advancing the components along a path, a pair of electrical contact sets lying in said path and spaced apart from one another so that each set is engaged by one of the component leads, each set including at least one lead-engaging member which is yieldably mounted and arranged to be displaced from a closed or substantially closed position by an advancing lead so as to stop or substantially stop it, means for connecting the contact sets in electrical circuitry for determining acceptability of individual components accord-ing to predetermined electrical requirements and interrupting operation of the machine if a component is not acceptable, and means for releasing the component through the machine if it is acceptable.
2. Mechanism for electrically testing components by engagement with their leads respectively, comprising:
a pair of separate lead engageable contact sets electrically connected to test circuitry, said contact sets each including a pair of closed or substantially closed con-tacts, one of which is fixed and the other of which is mov-able, yieldable and relatively separable from the other in response to movement into engagement therewith of a lead of a component, the movable contacts being in substantial align-ment with the fixed contacts, the engageable surfaces of the movable contacts being substantially convergent with the lead engageable surfaces of the fixed contacts and mounted for effecting substantially equal relative lead retardation of a pair of leads respectively, means for resiliently mounting the movable contacts to permit their displacement from closed or substantially closed positions to open positions upon lead arresting engage-ment therebetween whereby the component is arrested thereby to be tested.
a pair of separate lead engageable contact sets electrically connected to test circuitry, said contact sets each including a pair of closed or substantially closed con-tacts, one of which is fixed and the other of which is mov-able, yieldable and relatively separable from the other in response to movement into engagement therewith of a lead of a component, the movable contacts being in substantial align-ment with the fixed contacts, the engageable surfaces of the movable contacts being substantially convergent with the lead engageable surfaces of the fixed contacts and mounted for effecting substantially equal relative lead retardation of a pair of leads respectively, means for resiliently mounting the movable contacts to permit their displacement from closed or substantially closed positions to open positions upon lead arresting engage-ment therebetween whereby the component is arrested thereby to be tested.
3. Mechanism as in claim 1 wherein at least one of the contacts of each set is formed with an abrading edge arranged to transversely penetrate any oxidized exterior of the lead as it is being arrested.
4. Mechanism as in claim 2 wherein each of the contacts of the sets is provided with adjacent, parallel knife edges for penetratively engaging opposite sides of the respective leads during testing.
5. Mechanism as in claim 2 wherein the movable contact is mounted for pivotal movement about an axis extending sub-stantially parallel to the leads to be engaged thereby for testing.
6. Mechanism as in claim 2 and power means for present-ing successively between the fixed and movable contacts of the spaced sets the coaxial lead portions of the leads of a series of electrical components, means for cyclically separat-ing the movable contacts from the fixed contacts to interrupt said electrical connection to the test circuitry, and mechan-ism for operating said power means and said contact separating means in synchronism.
7. In a machine for processing electrical components having wire leads extending from their bodies in at least partly coaxial relation, the machine comprising:
a series of operating stations one of which is adapted to test the respective components in rapid sequence, the test station being electrically connected to circuitry for determining acceptability of the individual components according to appropriate requirements established therefor;
mechanism adjacent to said test station for advancing along a path therein, in parallel relation, the successive component coaxial leads, a pair of spaced contact sets arranged adjacent to said path, each set including a fixed lead-engageable con-tact and a movable contact positioned against the fixed con-tact by a spring-loaded electrically conductive pin bearing on the movable contact, the arrangement being such that the said lead advancing mechanism causes the leads of each compo-nent to engage and relatively open the movable contacts with respect to the closed contacts and against the influence of said spring-loaded pins thus to arrest each component body for testing between said sets.
a series of operating stations one of which is adapted to test the respective components in rapid sequence, the test station being electrically connected to circuitry for determining acceptability of the individual components according to appropriate requirements established therefor;
mechanism adjacent to said test station for advancing along a path therein, in parallel relation, the successive component coaxial leads, a pair of spaced contact sets arranged adjacent to said path, each set including a fixed lead-engageable con-tact and a movable contact positioned against the fixed con-tact by a spring-loaded electrically conductive pin bearing on the movable contact, the arrangement being such that the said lead advancing mechanism causes the leads of each compo-nent to engage and relatively open the movable contacts with respect to the closed contacts and against the influence of said spring-loaded pins thus to arrest each component body for testing between said sets.
8. A machine as in claim 5 wherein the contacts of each set are formed with adjacent knife edges adapted to transversely penetrate the oxidized exterior of each lead engaged thereby.
9. A machine as in claim 5 wherein power means is pro-vided to cyclically shift the movable contacts and said pins bodily toward and away from said path to facilitate removal of a component found faulty and replacement by a fresh component to be tested.
10. A machine as in claim 5 including in said test station, resilient restraint means for limiting angular orien-tation of component bodies relative to the axis of their co-axial lead portions.
11. A machine as in claim 5 wherein the movable contacts are pivotally carried by a support for movement about an axis extending generally parallel to coaxial lead portions of the components to be tested, and a lead-engageable surface of said support is formed with a lead engageable abutment extending parallel to said axis positively to stop and position relative to said fixed contacts any component not fully arrested by the upper and lower contacts.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US84890077A | 1977-11-07 | 1977-11-07 | |
| US848,900 | 1977-11-07 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA1105998A true CA1105998A (en) | 1981-07-28 |
Family
ID=25304579
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA304,379A Expired CA1105998A (en) | 1977-11-07 | 1978-05-30 | Component testing station |
Country Status (7)
| Country | Link |
|---|---|
| JP (1) | JPS5476175A (en) |
| CA (1) | CA1105998A (en) |
| DE (1) | DE2847617C2 (en) |
| GB (1) | GB2007851B (en) |
| HK (1) | HK44083A (en) |
| IT (1) | IT1100700B (en) |
| SG (1) | SG9183G (en) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2132777B (en) * | 1982-12-27 | 1986-09-17 | Usm Corp | Testing electric components |
| IT1195391B (en) * | 1983-03-04 | 1988-10-19 | Circuit Line Srl | AUTOMATIC ANALYZING MACHINE FOR PRINTED CIRCUITS |
| US4855672A (en) * | 1987-05-18 | 1989-08-08 | Shreeve Robert W | Method and process for testing the reliability of integrated circuit (IC) chips and novel IC circuitry for accomplishing same |
| KR100207994B1 (en) * | 1997-06-17 | 1999-07-15 | 윤종용 | Withstanding voltage inspection apparatus and automatic inspection method |
| CN103675561B (en) * | 2013-12-31 | 2016-05-11 | 上海亨井联接件有限公司 | Mouse full-automatic testing equipment |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE1179636B (en) * | 1960-05-24 | 1964-10-15 | Intermetall | Device for sorting electrical components |
| DE1765461B2 (en) * | 1968-05-22 | 1976-12-16 | Bossert, Anneliese, 7530 Pforzheim | SPRING CONTACT |
| US3669309A (en) * | 1970-06-02 | 1972-06-13 | Usm Corp | Machines for sequencing electronic components |
| JPS5313382B2 (en) * | 1974-07-10 | 1978-05-10 | ||
| US3971193A (en) * | 1975-04-23 | 1976-07-27 | Usm Corporation | Machines for sequencing diverse components |
| US4119206A (en) | 1977-05-13 | 1978-10-10 | Usm Corporation | Component sequence verifier |
-
1978
- 1978-05-30 CA CA304,379A patent/CA1105998A/en not_active Expired
- 1978-11-02 DE DE2847617A patent/DE2847617C2/en not_active Expired
- 1978-11-06 GB GB7843373A patent/GB2007851B/en not_active Expired
- 1978-11-07 JP JP13724578A patent/JPS5476175A/en active Granted
- 1978-11-07 IT IT29491/78A patent/IT1100700B/en active
-
1983
- 1983-03-02 SG SG91/83A patent/SG9183G/en unknown
- 1983-10-20 HK HK440/83A patent/HK44083A/en unknown
Also Published As
| Publication number | Publication date |
|---|---|
| IT1100700B (en) | 1985-09-28 |
| GB2007851B (en) | 1982-04-28 |
| IT7829491A0 (en) | 1978-11-07 |
| HK44083A (en) | 1983-10-28 |
| GB2007851A (en) | 1979-05-23 |
| DE2847617C2 (en) | 1985-12-05 |
| JPS6145788B2 (en) | 1986-10-09 |
| DE2847617A1 (en) | 1979-05-10 |
| JPS5476175A (en) | 1979-06-18 |
| SG9183G (en) | 1985-01-11 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MKEX | Expiry |