BR112012022653A2 - gerar parâmetros de pulso em um analisador de partículas - Google Patents
gerar parâmetros de pulso em um analisador de partículasInfo
- Publication number
- BR112012022653A2 BR112012022653A2 BR112012022653A BR112012022653A BR112012022653A2 BR 112012022653 A2 BR112012022653 A2 BR 112012022653A2 BR 112012022653 A BR112012022653 A BR 112012022653A BR 112012022653 A BR112012022653 A BR 112012022653A BR 112012022653 A2 BR112012022653 A2 BR 112012022653A2
- Authority
- BR
- Brazil
- Prior art keywords
- particle
- pulse
- particle analyzer
- investigation
- generate pulse
- Prior art date
Links
- 239000002245 particle Substances 0.000 title abstract 8
- 238000000034 method Methods 0.000 abstract 3
- 238000001514 detection method Methods 0.000 abstract 2
- 238000011835 investigation Methods 0.000 abstract 2
- 238000005259 measurement Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/10—Investigating individual particles
- G01N15/14—Optical investigation techniques, e.g. flow cytometry
- G01N15/1429—Signal processing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/10—Investigating individual particles
- G01N15/14—Optical investigation techniques, e.g. flow cytometry
- G01N15/1425—Optical investigation techniques, e.g. flow cytometry using an analyser being characterised by its control arrangement
- G01N15/1427—Optical investigation techniques, e.g. flow cytometry using an analyser being characterised by its control arrangement with the synchronisation of components, a time gate for operation of components, or suppression of particle coincidences
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/10—Investigating individual particles
- G01N15/14—Optical investigation techniques, e.g. flow cytometry
- G01N15/1456—Optical investigation techniques, e.g. flow cytometry without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals
- G01N15/1459—Optical investigation techniques, e.g. flow cytometry without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals the analysis being performed on a sample stream
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/10—Investigating individual particles
- G01N15/14—Optical investigation techniques, e.g. flow cytometry
- G01N15/1434—Optical arrangements
- G01N2015/1438—Using two lasers in succession
Landscapes
- Chemical & Material Sciences (AREA)
- Dispersion Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Signal Processing (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Abstract
gerar parâmetros de pulso em um analisador de partículas. a presente invenção refere-se a um método apra gerar parâmetros de medição para uma amostra de partículas em um analisador de partículas. o método inclui investigar a amostra de partículas com um investigador de disparo e um ou mais investigadores secundários posicionados respectivamente ao longo do comprimento de uma área de investigação, gerando pulsos respectivos com base na investigação de uma primeira partícula da amostra de partículas, determinar uma janela de detecção de pulso primário com base em um pulso de disparo, determinar um intervalo de busca para encontrar um pulso secundário com base em fatores incluindo a janela de detecção do pulso primário e um atraso laser, ajustar o intervalo de busca para a variação do atraso de laser baseada dinamicamente na investigação da primeira partícula, indentificar o pulso secundário no intervalo de busca ajustado, e processar o pulso secundário para determinar um valor de pico do pulso secundário. também é provido um aparelho corespondente.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US31261610P | 2010-03-10 | 2010-03-10 | |
US61/312,616 | 2010-03-10 | ||
PCT/US2011/027716 WO2011112697A1 (en) | 2010-03-10 | 2011-03-09 | Generating pulse parameters in a particle analyzer |
Publications (2)
Publication Number | Publication Date |
---|---|
BR112012022653A2 true BR112012022653A2 (pt) | 2016-11-01 |
BR112012022653B1 BR112012022653B1 (pt) | 2020-03-10 |
Family
ID=44123329
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BR112012022653-3A BR112012022653B1 (pt) | 2010-03-10 | 2011-03-09 | Método de geração de parâmetros de medição e analisador de partículas |
Country Status (9)
Country | Link |
---|---|
US (1) | US8754390B2 (pt) |
EP (1) | EP2545357B1 (pt) |
JP (1) | JP5711276B2 (pt) |
KR (1) | KR101805941B1 (pt) |
CN (1) | CN102792147B (pt) |
AU (1) | AU2011224429B2 (pt) |
BR (1) | BR112012022653B1 (pt) |
SG (1) | SG183932A1 (pt) |
WO (1) | WO2011112697A1 (pt) |
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KR101805941B1 (ko) * | 2010-03-10 | 2017-12-06 | 베크만 컬터, 인코포레이티드 | 입자 분석기에서의 펄스 파라미터 발생 |
US20140220621A1 (en) | 2011-08-25 | 2014-08-07 | Sony Corporation Of America | Characterization of motion-related error in a stream of moving micro-entities |
US9677990B2 (en) | 2014-04-30 | 2017-06-13 | Particles Plus, Inc. | Particle counter with advanced features |
US11579072B2 (en) | 2013-03-15 | 2023-02-14 | Particles Plus, Inc. | Personal air quality monitoring system |
US10983040B2 (en) | 2013-03-15 | 2021-04-20 | Particles Plus, Inc. | Particle counter with integrated bootloader |
US10352844B2 (en) | 2013-03-15 | 2019-07-16 | Particles Plus, Inc. | Multiple particle sensors in a particle counter |
CA2938674C (en) * | 2014-02-14 | 2021-04-27 | Perkinelmer Health Sciences, Inc. | Systems and methods for automated analysis of output in single particle inductively coupled plasma mass spectrometry and similar data sets |
MX2016011482A (es) * | 2014-03-06 | 2016-12-20 | Life Technologies Corp | Sistemas y metodos para el diagnostico de un sistema de fluidos y la determinacion de la configuracion del procesamiento de datos para un citometro de flujo. |
CN104977238B (zh) * | 2014-04-10 | 2018-02-16 | 深圳迈瑞生物医疗电子股份有限公司 | 脉冲延迟自适应校准装置、方法和细胞分析仪 |
EP3215855A4 (en) | 2014-11-06 | 2018-03-28 | Bio-Rad Laboratories, Inc. | Droplet velocity detection |
JP6596987B2 (ja) * | 2015-07-02 | 2019-10-30 | 富士電機株式会社 | 粒子計測装置 |
US9863864B2 (en) | 2015-09-15 | 2018-01-09 | Bio-Rad Technologies, Inc. | Threshold selector for flow cytometer |
US11988591B2 (en) | 2020-07-01 | 2024-05-21 | Particles Plus, Inc. | Modular optical particle counter sensor and apparatus |
CN112903569A (zh) * | 2021-01-20 | 2021-06-04 | 贝克曼库尔特生物科技(苏州)有限公司 | 用于计算液滴延迟时间的系统和方法以及分选装置 |
KR102325241B1 (ko) * | 2021-09-08 | 2021-11-11 | 대한민국 | 저출력 레이저 미세먼지 감지 시스템 및 방법 |
CN114327267B (zh) * | 2021-12-24 | 2023-08-22 | 深圳大普微电子科技有限公司 | 一种闪存控制器、延迟调整方法及存储设备 |
WO2023145551A1 (ja) * | 2022-01-31 | 2023-08-03 | ソニーグループ株式会社 | 生体試料分析システム、生体試料分析システムにおける光データ取得区間の設定方法、及び情報処理装置 |
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US4325483A (en) * | 1979-08-20 | 1982-04-20 | Ortho Diagnostics, Inc. | Method for detecting and controlling flow rates of the droplet forming stream of an electrostatic particle sorting apparatus |
US5056918A (en) * | 1989-03-03 | 1991-10-15 | Coulter Electronics Of New England, Inc. | Method and apparatus for particle size analysis |
US5104221A (en) * | 1989-03-03 | 1992-04-14 | Coulter Electronics Of New England, Inc. | Particle size analysis utilizing polarization intensity differential scattering |
US4953978A (en) * | 1989-03-03 | 1990-09-04 | Coulter Electronics Of New England, Inc. | Particle size analysis utilizing polarization intensity differential scattering |
JP3102935B2 (ja) * | 1991-11-20 | 2000-10-23 | シスメックス株式会社 | イメージングフローサイトメータ |
JPH0792077A (ja) * | 1993-09-24 | 1995-04-07 | Canon Inc | 粒子解析装置 |
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-
2011
- 2011-03-09 KR KR1020127023394A patent/KR101805941B1/ko active IP Right Grant
- 2011-03-09 CN CN201180012921.4A patent/CN102792147B/zh active Active
- 2011-03-09 SG SG2012065900A patent/SG183932A1/en unknown
- 2011-03-09 EP EP11710074.3A patent/EP2545357B1/en active Active
- 2011-03-09 WO PCT/US2011/027716 patent/WO2011112697A1/en active Application Filing
- 2011-03-09 BR BR112012022653-3A patent/BR112012022653B1/pt not_active IP Right Cessation
- 2011-03-09 AU AU2011224429A patent/AU2011224429B2/en not_active Ceased
- 2011-03-09 JP JP2012557209A patent/JP5711276B2/ja active Active
- 2011-03-10 US US13/044,685 patent/US8754390B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
EP2545357A1 (en) | 2013-01-16 |
AU2011224429A1 (en) | 2012-09-27 |
JP2013522601A (ja) | 2013-06-13 |
US8754390B2 (en) | 2014-06-17 |
JP5711276B2 (ja) | 2015-04-30 |
AU2011224429B2 (en) | 2014-09-04 |
CN102792147A (zh) | 2012-11-21 |
KR20130027463A (ko) | 2013-03-15 |
WO2011112697A1 (en) | 2011-09-15 |
EP2545357B1 (en) | 2021-06-02 |
US20110303859A1 (en) | 2011-12-15 |
SG183932A1 (en) | 2012-10-30 |
CN102792147B (zh) | 2015-05-13 |
BR112012022653B1 (pt) | 2020-03-10 |
KR101805941B1 (ko) | 2017-12-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
B06F | Objections, documents and/or translations needed after an examination request according [chapter 6.6 patent gazette] | ||
B06U | Preliminary requirement: requests with searches performed by other patent offices: procedure suspended [chapter 6.21 patent gazette] | ||
B09A | Decision: intention to grant [chapter 9.1 patent gazette] | ||
B16A | Patent or certificate of addition of invention granted [chapter 16.1 patent gazette] |
Free format text: PRAZO DE VALIDADE: 20 (VINTE) ANOS CONTADOS A PARTIR DE 09/03/2011, OBSERVADAS AS CONDICOES LEGAIS. |
|
B21F | Lapse acc. art. 78, item iv - on non-payment of the annual fees in time |
Free format text: REFERENTE A 11A ANUIDADE. |
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B24J | Lapse because of non-payment of annual fees (definitively: art 78 iv lpi, resolution 113/2013 art. 12) |
Free format text: EM VIRTUDE DA EXTINCAO PUBLICADA NA RPI 2661 DE 04-01-2022 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDA A EXTINCAO DA PATENTE E SEUS CERTIFICADOS, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013. |